WO2008126164A1 - 電子部品試験装置及び電子部品の移載方法 - Google Patents

電子部品試験装置及び電子部品の移載方法 Download PDF

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Publication number
WO2008126164A1
WO2008126164A1 PCT/JP2007/054667 JP2007054667W WO2008126164A1 WO 2008126164 A1 WO2008126164 A1 WO 2008126164A1 JP 2007054667 W JP2007054667 W JP 2007054667W WO 2008126164 A1 WO2008126164 A1 WO 2008126164A1
Authority
WO
WIPO (PCT)
Prior art keywords
electronic component
testing apparatus
storing
transferring
pairs
Prior art date
Application number
PCT/JP2007/054667
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Yoshiyuki Masuo
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to PCT/JP2007/054667 priority Critical patent/WO2008126164A1/ja
Priority to TW097105700A priority patent/TW200907369A/zh
Publication of WO2008126164A1 publication Critical patent/WO2008126164A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
PCT/JP2007/054667 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法 WO2008126164A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP2007/054667 WO2008126164A1 (ja) 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法
TW097105700A TW200907369A (en) 2007-03-09 2008-02-19 Electronic component testing apparatus and method for transferring electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/054667 WO2008126164A1 (ja) 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法

Publications (1)

Publication Number Publication Date
WO2008126164A1 true WO2008126164A1 (ja) 2008-10-23

Family

ID=39863348

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/054667 WO2008126164A1 (ja) 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法

Country Status (2)

Country Link
TW (1) TW200907369A (enrdf_load_stackoverflow)
WO (1) WO2008126164A1 (enrdf_load_stackoverflow)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08292233A (ja) * 1995-04-25 1996-11-05 Hitachi Ltd Ｉｃハンドラ
JPH08334548A (ja) * 1995-06-07 1996-12-17 Tokyo Electron Ltd 検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08292233A (ja) * 1995-04-25 1996-11-05 Hitachi Ltd Ｉｃハンドラ
JPH08334548A (ja) * 1995-06-07 1996-12-17 Tokyo Electron Ltd 検査装置

Also Published As

Publication number Publication date
TW200907369A (en) 2009-02-16
TWI354800B (enrdf_load_stackoverflow) 2011-12-21

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