TW200907369A - Electronic component testing apparatus and method for transferring electronic component - Google Patents

Electronic component testing apparatus and method for transferring electronic component Download PDF

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Publication number
TW200907369A
TW200907369A TW097105700A TW97105700A TW200907369A TW 200907369 A TW200907369 A TW 200907369A TW 097105700 A TW097105700 A TW 097105700A TW 97105700 A TW97105700 A TW 97105700A TW 200907369 A TW200907369 A TW 200907369A
Authority
TW
Taiwan
Prior art keywords
electronic component
tested
test
storage
carrier
Prior art date
Application number
TW097105700A
Other languages
English (en)
Chinese (zh)
Other versions
TWI354800B (enrdf_load_stackoverflow
Inventor
Yoshiyuki Masuo
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200907369A publication Critical patent/TW200907369A/zh
Application granted granted Critical
Publication of TWI354800B publication Critical patent/TWI354800B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW097105700A 2007-03-09 2008-02-19 Electronic component testing apparatus and method for transferring electronic component TW200907369A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/054667 WO2008126164A1 (ja) 2007-03-09 2007-03-09 電子部品試験装置及び電子部品の移載方法

Publications (2)

Publication Number Publication Date
TW200907369A true TW200907369A (en) 2009-02-16
TWI354800B TWI354800B (enrdf_load_stackoverflow) 2011-12-21

Family

ID=39863348

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097105700A TW200907369A (en) 2007-03-09 2008-02-19 Electronic component testing apparatus and method for transferring electronic component

Country Status (2)

Country Link
TW (1) TW200907369A (enrdf_load_stackoverflow)
WO (1) WO2008126164A1 (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08292233A (ja) * 1995-04-25 1996-11-05 Hitachi Ltd Ｉｃハンドラ
JPH08334548A (ja) * 1995-06-07 1996-12-17 Tokyo Electron Ltd 検査装置

Also Published As

Publication number Publication date
TWI354800B (enrdf_load_stackoverflow) 2011-12-21
WO2008126164A1 (ja) 2008-10-23

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees