TWI339840B - Sputtering target and manufacturing method therefor, and optical recording medium and manufacturing method therefor - Google Patents
Sputtering target and manufacturing method therefor, and optical recording medium and manufacturing method thereforInfo
- Publication number
- TWI339840B TWI339840B TW095143066A TW95143066A TWI339840B TW I339840 B TWI339840 B TW I339840B TW 095143066 A TW095143066 A TW 095143066A TW 95143066 A TW95143066 A TW 95143066A TW I339840 B TWI339840 B TW I339840B
- Authority
- TW
- Taiwan
- Prior art keywords
- manufacturing
- method therefor
- recording medium
- optical recording
- sputtering target
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/085—Oxides of iron group metals
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/086—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
- G11B7/266—Sputtering or spin-coating layers
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Manufacturing Optical Record Carriers (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005337654 | 2005-11-22 | ||
JP2005339102 | 2005-11-24 | ||
JP2006034370 | 2006-02-10 | ||
JP2006037099 | 2006-02-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200733098A TW200733098A (en) | 2007-09-01 |
TWI339840B true TWI339840B (en) | 2011-04-01 |
Family
ID=38052390
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095143066A TWI339840B (en) | 2005-11-22 | 2006-11-21 | Sputtering target and manufacturing method therefor, and optical recording medium and manufacturing method therefor |
Country Status (3)
Country | Link |
---|---|
US (1) | US7488526B2 (zh) |
CN (1) | CN101191194B (zh) |
TW (1) | TWI339840B (zh) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1704058B1 (en) * | 2004-08-31 | 2010-06-30 | Ricoh Company, Ltd. | Write-once-read-many optical recording medium and sputtering target thereof |
JP4871062B2 (ja) * | 2006-03-01 | 2012-02-08 | 株式会社リコー | スパッタリングターゲット及びその製造方法、並びに追記型光記録媒体 |
JP4764858B2 (ja) * | 2007-01-30 | 2011-09-07 | 株式会社リコー | 光記録媒体、スパッタリングターゲット及びその製造方法 |
JP2008251147A (ja) * | 2007-03-07 | 2008-10-16 | Ricoh Co Ltd | 多層光情報媒体とその光情報処理装置、並びに実行プログラム及びそれを備えた情報媒体 |
US8124211B2 (en) * | 2007-03-28 | 2012-02-28 | Ricoh Company, Ltd. | Optical recording medium, sputtering target, and method for manufacturing the same |
US20090022932A1 (en) * | 2007-07-04 | 2009-01-22 | Toshishige Fujii | Optical recording medium |
JP4810519B2 (ja) * | 2007-09-14 | 2011-11-09 | 株式会社リコー | 多層式追記型光記録媒体及びその記録方法、記録装置 |
US8318243B2 (en) * | 2007-11-29 | 2012-11-27 | Ricoh Company, Ltd. | Method for manufacturing optical information recording medium |
JP4755680B2 (ja) * | 2007-12-12 | 2011-08-24 | 太陽誘電株式会社 | 光情報記録媒体およびその製造方法 |
EP2135973A1 (en) * | 2008-06-18 | 2009-12-23 | Centre National de la Recherche Scientifique | Method for the manufacturing of sputtering targets using an inorganic polymer |
JP2011084804A (ja) * | 2009-09-18 | 2011-04-28 | Kobelco Kaken:Kk | 金属酸化物−金属複合スパッタリングターゲット |
TWI400348B (zh) * | 2010-03-23 | 2013-07-01 | China Steel Corp | Transparent conductive film forming method |
US20130180850A1 (en) * | 2010-07-09 | 2013-07-18 | Oc Oerlikon Balzers Ag | Magnetron sputtering apparatus |
US8361651B2 (en) | 2011-04-29 | 2013-01-29 | Toyota Motor Engineering & Manufacturing North America, Inc. | Active material for rechargeable battery |
US9057126B2 (en) * | 2011-11-29 | 2015-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing sputtering target and method for manufacturing semiconductor device |
US8673493B2 (en) | 2012-05-29 | 2014-03-18 | Toyota Motor Engineering & Manufacturing North America, Inc. | Indium-tin binary anodes for rechargeable magnesium-ion batteries |
US8647770B2 (en) | 2012-05-30 | 2014-02-11 | Toyota Motor Engineering & Manufacturing North America, Inc. | Bismuth-tin binary anodes for rechargeable magnesium-ion batteries |
US20130327634A1 (en) * | 2012-06-08 | 2013-12-12 | Chang-Beom Eom | Misaligned sputtering systems for the deposition of complex oxide thin films |
US10676814B2 (en) * | 2017-09-28 | 2020-06-09 | The United States Of America As Represented By The Secretary Of The Navy | System and method for controlling the elemental composition of films produced by pulsed laser deposition |
TWI727322B (zh) * | 2018-08-09 | 2021-05-11 | 日商Jx金屬股份有限公司 | 濺鍍靶及磁性膜 |
CN114107901B (zh) * | 2020-08-28 | 2023-06-13 | 中国科学院半导体研究所 | 一种在半导体ZnO上外延制备四方相BiFeO3薄膜的方法及系统 |
CN113727517B (zh) * | 2021-09-03 | 2022-09-13 | 博敏电子股份有限公司 | 一种提升pcb板厚均匀性的方法及内层线路板流胶槽结构 |
CN114000106A (zh) * | 2021-10-15 | 2022-02-01 | 九江学院 | 一种低摩擦系数MoS2基复合固体润滑涂层及其制备方法 |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57205192A (en) * | 1981-06-12 | 1982-12-16 | Fuji Photo Film Co Ltd | Optical information recording medium |
US4792977A (en) | 1986-03-12 | 1988-12-20 | Beltone Electronics Corporation | Hearing aid circuit |
JP2578815B2 (ja) | 1987-07-08 | 1997-02-05 | 松下電器産業株式会社 | 直流スパッタリング法 |
JP2769153B2 (ja) | 1987-09-03 | 1998-06-25 | 松下電器産業株式会社 | 情報記録薄膜形成用スパッタリングターゲット |
JPH02265052A (ja) | 1989-04-06 | 1990-10-29 | Mitsui Petrochem Ind Ltd | 光記録媒体の製造方法 |
JPH06184740A (ja) | 1992-12-17 | 1994-07-05 | Hitachi Metals Ltd | 光磁気記録媒体用ターゲットおよびその製造方法 |
JPH0536142A (ja) | 1991-03-29 | 1993-02-12 | Sony Corp | 光磁気記録媒体 |
JPH06330297A (ja) | 1993-05-21 | 1994-11-29 | Vacuum Metallurgical Co Ltd | 誘電体薄膜形成用スパッタリングターゲット |
JP3684593B2 (ja) | 1993-07-28 | 2005-08-17 | 旭硝子株式会社 | スパッタリング方法およびその装置 |
JPH0867980A (ja) | 1993-07-28 | 1996-03-12 | Asahi Glass Co Ltd | 窒化ケイ素膜の製造方法 |
US5478456A (en) | 1993-10-01 | 1995-12-26 | Minnesota Mining And Manufacturing Company | Sputtering target |
JP3999003B2 (ja) | 1993-12-13 | 2007-10-31 | 株式会社リコー | 光記録媒体の製造方法 |
US6319368B1 (en) * | 1995-03-31 | 2001-11-20 | Ricoh Company, Ltd. | Sputtering target, method of producing the target, optical recording medium fabricated by using the sputtering target, and method of forming recording layer for the optical recording medium |
JP3098204B2 (ja) | 1997-03-07 | 2000-10-16 | ティーディーケイ株式会社 | 光磁気記録用合金ターゲット、その製造方法およびその再生方法 |
JPH1192922A (ja) | 1997-09-16 | 1999-04-06 | Toshiba Corp | 誘電体膜形成用スパッタリングターゲット、その製造方法および強誘電体メモリの製造方法 |
JPH11193457A (ja) | 1997-12-26 | 1999-07-21 | Japan Energy Corp | 磁性体スパッタリングターゲット |
JP2000264731A (ja) | 1999-03-15 | 2000-09-26 | Ricoh Co Ltd | 焼結体およびその製造方法ならびに該焼結体を用いる成膜方法および該焼成体により成膜した膜 |
US20010047838A1 (en) * | 2000-03-28 | 2001-12-06 | Segal Vladimir M. | Methods of forming aluminum-comprising physical vapor deposition targets; sputtered films; and target constructions |
TW556185B (en) * | 2000-08-17 | 2003-10-01 | Matsushita Electric Ind Co Ltd | Optical information recording medium and the manufacturing method thereof, record reproduction method and record reproduction device |
JP4198327B2 (ja) | 2000-11-13 | 2008-12-17 | 株式会社リコー | 光記録媒体の構造およびその製作方法 |
JP4307767B2 (ja) * | 2001-03-07 | 2009-08-05 | 株式会社リコー | 光情報記録媒体、及びこの媒体の情報記録方法 |
TW584849B (en) * | 2001-07-12 | 2004-04-21 | Matsushita Electric Ind Co Ltd | Optical information recording medium and recording method using the same |
US6713148B1 (en) * | 2002-10-08 | 2004-03-30 | Industrial Technology Research Institute | Optical information recording medium |
JP4577872B2 (ja) | 2003-04-15 | 2010-11-10 | 株式会社リコー | 追記型光記録媒体 |
EP1475793B1 (en) * | 2003-04-15 | 2007-12-05 | Ricoh Company, Ltd. | Write-once-read-many optical recording medium and process for recording and reproducing of the optical medium |
US7399511B2 (en) * | 2004-04-22 | 2008-07-15 | Tdk Corporation | Optical recording medium |
JP4865249B2 (ja) | 2004-08-31 | 2012-02-01 | 株式会社リコー | スパッタリングターゲットとその製造方法、及び光記録媒体 |
-
2006
- 2006-11-20 US US11/602,629 patent/US7488526B2/en not_active Expired - Fee Related
- 2006-11-21 TW TW095143066A patent/TWI339840B/zh not_active IP Right Cessation
- 2006-11-22 CN CN2006101309662A patent/CN101191194B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20070114129A1 (en) | 2007-05-24 |
CN101191194A (zh) | 2008-06-04 |
US7488526B2 (en) | 2009-02-10 |
TW200733098A (en) | 2007-09-01 |
CN101191194B (zh) | 2012-05-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |