TWI337834B - - Google Patents

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Publication number
TWI337834B
TWI337834B TW095145688A TW95145688A TWI337834B TW I337834 B TWI337834 B TW I337834B TW 095145688 A TW095145688 A TW 095145688A TW 95145688 A TW95145688 A TW 95145688A TW I337834 B TWI337834 B TW I337834B
Authority
TW
Taiwan
Prior art keywords
transistor
output transistor
output
gate
protection circuit
Prior art date
Application number
TW095145688A
Other languages
English (en)
Chinese (zh)
Other versions
TW200746926A (en
Inventor
Masanori Tsuchihashi
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Publication of TW200746926A publication Critical patent/TW200746926A/zh
Application granted granted Critical
Publication of TWI337834B publication Critical patent/TWI337834B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/711Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/60Protection against electrostatic charges or discharges, e.g. Faraday shields
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08Modifications for protecting switching circuit against overcurrent or overvoltage

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
TW095145688A 2005-12-07 2006-12-07 Electrostatic breakdown protection circuit and semiconductor integrated circuit device fabricated therewith TW200746926A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005353163A JP4926468B2 (ja) 2005-12-07 2005-12-07 静電破壊保護回路及びこれを備えた半導体集積回路装置

Publications (2)

Publication Number Publication Date
TW200746926A TW200746926A (en) 2007-12-16
TWI337834B true TWI337834B (enExample) 2011-02-21

Family

ID=38122772

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095145688A TW200746926A (en) 2005-12-07 2006-12-07 Electrostatic breakdown protection circuit and semiconductor integrated circuit device fabricated therewith

Country Status (6)

Country Link
US (1) US7859805B2 (enExample)
JP (1) JP4926468B2 (enExample)
KR (1) KR101236088B1 (enExample)
CN (1) CN101171680B (enExample)
TW (1) TW200746926A (enExample)
WO (1) WO2007066626A1 (enExample)

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Publication number Priority date Publication date Assignee Title
JP4866672B2 (ja) * 2006-07-27 2012-02-01 ルネサスエレクトロニクス株式会社 負荷駆動回路
FR2921773B1 (fr) * 2007-10-02 2011-04-22 Thales Sa Circuit de protection pour mosfet
US9520486B2 (en) 2009-11-04 2016-12-13 Analog Devices, Inc. Electrostatic protection device
US8553380B2 (en) * 2010-07-08 2013-10-08 Analog Devices, Inc. Apparatus and method for electronic circuit protection
US9508487B2 (en) * 2011-10-21 2016-11-29 Qualcomm Incorporated Systems and methods for limiting voltage in wireless power receivers
CN103281059A (zh) * 2013-06-14 2013-09-04 成都锐奕信息技术有限公司 防过热开关电路
JP6170807B2 (ja) * 2013-10-21 2017-07-26 アスモ株式会社 モータ制御装置
US10181719B2 (en) 2015-03-16 2019-01-15 Analog Devices Global Overvoltage blocking protection device
CN105844898A (zh) * 2016-04-11 2016-08-10 深圳市励创微电子有限公司 红外发射芯片、内部电路及其应用电路
TWI729538B (zh) * 2018-11-21 2021-06-01 大陸商上海瀚薪科技有限公司 一種整合箝制電壓箝位電路的碳化矽半導體元件
CN109950885B (zh) * 2019-03-13 2021-01-08 惠科股份有限公司 一种显示面板的静电防护装置、方法及显示装置

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US4418291A (en) * 1980-05-28 1983-11-29 Raytheon Company Logic gate having an isolation FET and noise immunity circuit
JPH0714144B2 (ja) 1989-04-17 1995-02-15 ローム株式会社 集積回路の出力回路
JPH05327456A (ja) * 1992-05-20 1993-12-10 Fujitsu Ltd 半導体集積回路装置
US5644460A (en) 1994-01-21 1997-07-01 National Semiconductor Corporation Multi-rail electrostatic discharge protection device
JP3588953B2 (ja) * 1997-02-03 2004-11-17 富士通株式会社 半導体集積回路装置
US6147538A (en) 1997-02-05 2000-11-14 Texas Instruments Incorporated CMOS triggered NMOS ESD protection circuit
JPH1154711A (ja) * 1997-08-04 1999-02-26 Nippon Precision Circuits Kk 半導体装置の静電保護回路
TW399337B (en) 1998-06-09 2000-07-21 Koninkl Philips Electronics Nv Semiconductor device
US5946177A (en) * 1998-08-17 1999-08-31 Motorola, Inc. Circuit for electrostatic discharge protection
JP3244065B2 (ja) 1998-10-23 2002-01-07 日本電気株式会社 半導体静電保護素子及びその製造方法
US6353520B1 (en) * 1999-06-03 2002-03-05 Texas Instruments Incorporated Shared 5 volt tolerant ESD protection circuit for low voltage CMOS process
JP2001358297A (ja) * 2000-06-14 2001-12-26 Nec Corp 静電保護回路
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JP3678208B2 (ja) * 2002-04-19 2005-08-03 株式会社デンソー 負荷駆動用半導体装置
US7313116B2 (en) * 2002-05-13 2007-12-25 Samsung Electronics Co., Ltd. Method of performing inter-RAT measurement for a handover from NB-TDD to GSM
US7535846B2 (en) * 2002-05-21 2009-05-19 Samsung Electronics Co., Ltd Method for handling inter-RAT measurement and report in a dual-mode user equipment
US20050277416A1 (en) * 2002-09-10 2005-12-15 Nokia Corporation Measurements in communications systems
CN100416822C (zh) * 2002-10-25 2008-09-03 联发科技股份有限公司 静电放电保护电路
US6978138B2 (en) * 2002-10-28 2005-12-20 Qualcomm Incorporated Inter-RAT cell reselection in a wireless communication network
TWI220312B (en) 2003-07-16 2004-08-11 Mediatek Inc Electrostatic discharge protection circuit
ES2304496T3 (es) * 2003-07-31 2008-10-16 Nokia Siemens Networks Gmbh Procedimiento de gestion de recursos de radio comun en una red telefonica celular multi-rat.
JP4317221B2 (ja) * 2003-08-22 2009-08-19 サムスン エレクトロニクス カンパニー リミテッド マルチメディアブロードキャスト/マルチキャストサービス(mbms)を提供する移動通信システムにおけるパケットデータを受信するためのセル再選択方法
KR100532463B1 (ko) * 2003-08-27 2005-12-01 삼성전자주식회사 정전기 보호 소자와 파워 클램프로 구성된 입출력 정전기방전 보호 셀을 구비하는 집적 회로 장치
KR101042803B1 (ko) * 2003-11-06 2011-06-20 삼성전자주식회사 이동통신시스템에서 방송 서비스를 위한 호출 방법
KR101114175B1 (ko) * 2004-02-13 2012-02-22 엘지전자 주식회사 이동통신 시스템에서 점대점 서비스의 송수신방법
TWI241010B (en) 2004-03-12 2005-10-01 Admtek Inc Electrostatic discharge clamping circuit for interface circuit of the mixed voltage source
WO2005094522A2 (en) * 2004-03-23 2005-10-13 Sarnoff Corporation Method and apparatus for protecting a gate oxide using source/bulk pumping
US7027276B2 (en) 2004-04-21 2006-04-11 Taiwan Semiconductor Manufacturing Co., Ltd. High voltage ESD protection circuit with low voltage transistors
KR20060041673A (ko) * 2004-08-16 2006-05-12 엘지전자 주식회사 방송 및 멀티캐스트(mbms) 서비스를 위한 무선 통신시스템 및 방법
KR101128231B1 (ko) * 2004-08-19 2012-03-26 엘지전자 주식회사 방송 및 멀티캐스트(mbms) 서비스를 위한 단말 분포 제어방법

Also Published As

Publication number Publication date
KR20080071894A (ko) 2008-08-05
JP4926468B2 (ja) 2012-05-09
CN101171680B (zh) 2010-10-13
KR101236088B1 (ko) 2013-02-21
TW200746926A (en) 2007-12-16
CN101171680A (zh) 2008-04-30
US7859805B2 (en) 2010-12-28
US20090080128A1 (en) 2009-03-26
WO2007066626A1 (ja) 2007-06-14
JP2007158154A (ja) 2007-06-21

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MM4A Annulment or lapse of patent due to non-payment of fees