TWI337834B - - Google Patents
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- Publication number
- TWI337834B TWI337834B TW095145688A TW95145688A TWI337834B TW I337834 B TWI337834 B TW I337834B TW 095145688 A TW095145688 A TW 095145688A TW 95145688 A TW95145688 A TW 95145688A TW I337834 B TWI337834 B TW I337834B
- Authority
- TW
- Taiwan
- Prior art keywords
- transistor
- output transistor
- output
- gate
- protection circuit
- Prior art date
Links
- 230000015556 catabolic process Effects 0.000 claims description 41
- 239000004065 semiconductor Substances 0.000 claims description 15
- 230000006378 damage Effects 0.000 claims description 12
- 230000005669 field effect Effects 0.000 claims description 11
- 239000013078 crystal Substances 0.000 claims description 8
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims 2
- 229910052742 iron Inorganic materials 0.000 claims 1
- 238000007747 plating Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- 230000003071 parasitic effect Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000002265 prevention Effects 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 229940054107 isochron Drugs 0.000 description 1
- MOYKHGMNXAOIAT-JGWLITMVSA-N isosorbide dinitrate Chemical compound [O-][N+](=O)O[C@H]1CO[C@@H]2[C@H](O[N+](=O)[O-])CO[C@@H]21 MOYKHGMNXAOIAT-JGWLITMVSA-N 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/711—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/60—Protection against electrostatic charges or discharges, e.g. Faraday shields
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Logic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005353163A JP4926468B2 (ja) | 2005-12-07 | 2005-12-07 | 静電破壊保護回路及びこれを備えた半導体集積回路装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200746926A TW200746926A (en) | 2007-12-16 |
| TWI337834B true TWI337834B (enExample) | 2011-02-21 |
Family
ID=38122772
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095145688A TW200746926A (en) | 2005-12-07 | 2006-12-07 | Electrostatic breakdown protection circuit and semiconductor integrated circuit device fabricated therewith |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7859805B2 (enExample) |
| JP (1) | JP4926468B2 (enExample) |
| KR (1) | KR101236088B1 (enExample) |
| CN (1) | CN101171680B (enExample) |
| TW (1) | TW200746926A (enExample) |
| WO (1) | WO2007066626A1 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4866672B2 (ja) * | 2006-07-27 | 2012-02-01 | ルネサスエレクトロニクス株式会社 | 負荷駆動回路 |
| FR2921773B1 (fr) * | 2007-10-02 | 2011-04-22 | Thales Sa | Circuit de protection pour mosfet |
| US9520486B2 (en) | 2009-11-04 | 2016-12-13 | Analog Devices, Inc. | Electrostatic protection device |
| US8553380B2 (en) * | 2010-07-08 | 2013-10-08 | Analog Devices, Inc. | Apparatus and method for electronic circuit protection |
| US9508487B2 (en) * | 2011-10-21 | 2016-11-29 | Qualcomm Incorporated | Systems and methods for limiting voltage in wireless power receivers |
| CN103281059A (zh) * | 2013-06-14 | 2013-09-04 | 成都锐奕信息技术有限公司 | 防过热开关电路 |
| JP6170807B2 (ja) * | 2013-10-21 | 2017-07-26 | アスモ株式会社 | モータ制御装置 |
| US10181719B2 (en) | 2015-03-16 | 2019-01-15 | Analog Devices Global | Overvoltage blocking protection device |
| CN105844898A (zh) * | 2016-04-11 | 2016-08-10 | 深圳市励创微电子有限公司 | 红外发射芯片、内部电路及其应用电路 |
| TWI729538B (zh) * | 2018-11-21 | 2021-06-01 | 大陸商上海瀚薪科技有限公司 | 一種整合箝制電壓箝位電路的碳化矽半導體元件 |
| CN109950885B (zh) * | 2019-03-13 | 2021-01-08 | 惠科股份有限公司 | 一种显示面板的静电防护装置、方法及显示装置 |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4418291A (en) * | 1980-05-28 | 1983-11-29 | Raytheon Company | Logic gate having an isolation FET and noise immunity circuit |
| JPH0714144B2 (ja) | 1989-04-17 | 1995-02-15 | ローム株式会社 | 集積回路の出力回路 |
| JPH05327456A (ja) * | 1992-05-20 | 1993-12-10 | Fujitsu Ltd | 半導体集積回路装置 |
| US5644460A (en) | 1994-01-21 | 1997-07-01 | National Semiconductor Corporation | Multi-rail electrostatic discharge protection device |
| JP3588953B2 (ja) * | 1997-02-03 | 2004-11-17 | 富士通株式会社 | 半導体集積回路装置 |
| US6147538A (en) | 1997-02-05 | 2000-11-14 | Texas Instruments Incorporated | CMOS triggered NMOS ESD protection circuit |
| JPH1154711A (ja) * | 1997-08-04 | 1999-02-26 | Nippon Precision Circuits Kk | 半導体装置の静電保護回路 |
| TW399337B (en) | 1998-06-09 | 2000-07-21 | Koninkl Philips Electronics Nv | Semiconductor device |
| US5946177A (en) * | 1998-08-17 | 1999-08-31 | Motorola, Inc. | Circuit for electrostatic discharge protection |
| JP3244065B2 (ja) | 1998-10-23 | 2002-01-07 | 日本電気株式会社 | 半導体静電保護素子及びその製造方法 |
| US6353520B1 (en) * | 1999-06-03 | 2002-03-05 | Texas Instruments Incorporated | Shared 5 volt tolerant ESD protection circuit for low voltage CMOS process |
| JP2001358297A (ja) * | 2000-06-14 | 2001-12-26 | Nec Corp | 静電保護回路 |
| CN1189941C (zh) * | 2001-07-27 | 2005-02-16 | 旺宏电子股份有限公司 | 静电放电保护电路 |
| JP3678208B2 (ja) * | 2002-04-19 | 2005-08-03 | 株式会社デンソー | 負荷駆動用半導体装置 |
| US7313116B2 (en) * | 2002-05-13 | 2007-12-25 | Samsung Electronics Co., Ltd. | Method of performing inter-RAT measurement for a handover from NB-TDD to GSM |
| US7535846B2 (en) * | 2002-05-21 | 2009-05-19 | Samsung Electronics Co., Ltd | Method for handling inter-RAT measurement and report in a dual-mode user equipment |
| US20050277416A1 (en) * | 2002-09-10 | 2005-12-15 | Nokia Corporation | Measurements in communications systems |
| CN100416822C (zh) * | 2002-10-25 | 2008-09-03 | 联发科技股份有限公司 | 静电放电保护电路 |
| US6978138B2 (en) * | 2002-10-28 | 2005-12-20 | Qualcomm Incorporated | Inter-RAT cell reselection in a wireless communication network |
| TWI220312B (en) | 2003-07-16 | 2004-08-11 | Mediatek Inc | Electrostatic discharge protection circuit |
| ES2304496T3 (es) * | 2003-07-31 | 2008-10-16 | Nokia Siemens Networks Gmbh | Procedimiento de gestion de recursos de radio comun en una red telefonica celular multi-rat. |
| JP4317221B2 (ja) * | 2003-08-22 | 2009-08-19 | サムスン エレクトロニクス カンパニー リミテッド | マルチメディアブロードキャスト/マルチキャストサービス(mbms)を提供する移動通信システムにおけるパケットデータを受信するためのセル再選択方法 |
| KR100532463B1 (ko) * | 2003-08-27 | 2005-12-01 | 삼성전자주식회사 | 정전기 보호 소자와 파워 클램프로 구성된 입출력 정전기방전 보호 셀을 구비하는 집적 회로 장치 |
| KR101042803B1 (ko) * | 2003-11-06 | 2011-06-20 | 삼성전자주식회사 | 이동통신시스템에서 방송 서비스를 위한 호출 방법 |
| KR101114175B1 (ko) * | 2004-02-13 | 2012-02-22 | 엘지전자 주식회사 | 이동통신 시스템에서 점대점 서비스의 송수신방법 |
| TWI241010B (en) | 2004-03-12 | 2005-10-01 | Admtek Inc | Electrostatic discharge clamping circuit for interface circuit of the mixed voltage source |
| WO2005094522A2 (en) * | 2004-03-23 | 2005-10-13 | Sarnoff Corporation | Method and apparatus for protecting a gate oxide using source/bulk pumping |
| US7027276B2 (en) | 2004-04-21 | 2006-04-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | High voltage ESD protection circuit with low voltage transistors |
| KR20060041673A (ko) * | 2004-08-16 | 2006-05-12 | 엘지전자 주식회사 | 방송 및 멀티캐스트(mbms) 서비스를 위한 무선 통신시스템 및 방법 |
| KR101128231B1 (ko) * | 2004-08-19 | 2012-03-26 | 엘지전자 주식회사 | 방송 및 멀티캐스트(mbms) 서비스를 위한 단말 분포 제어방법 |
-
2005
- 2005-12-07 JP JP2005353163A patent/JP4926468B2/ja not_active Expired - Fee Related
-
2006
- 2006-12-05 CN CN2006800156757A patent/CN101171680B/zh not_active Expired - Fee Related
- 2006-12-05 US US11/912,412 patent/US7859805B2/en active Active
- 2006-12-05 WO PCT/JP2006/324193 patent/WO2007066626A1/ja not_active Ceased
- 2006-12-05 KR KR1020077026346A patent/KR101236088B1/ko not_active Expired - Fee Related
- 2006-12-07 TW TW095145688A patent/TW200746926A/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR20080071894A (ko) | 2008-08-05 |
| JP4926468B2 (ja) | 2012-05-09 |
| CN101171680B (zh) | 2010-10-13 |
| KR101236088B1 (ko) | 2013-02-21 |
| TW200746926A (en) | 2007-12-16 |
| CN101171680A (zh) | 2008-04-30 |
| US7859805B2 (en) | 2010-12-28 |
| US20090080128A1 (en) | 2009-03-26 |
| WO2007066626A1 (ja) | 2007-06-14 |
| JP2007158154A (ja) | 2007-06-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |