TWI319198B - Adjustable termination resistor device ued in ic chip - Google Patents

Adjustable termination resistor device ued in ic chip

Info

Publication number
TWI319198B
TWI319198B TW095127156A TW95127156A TWI319198B TW I319198 B TWI319198 B TW I319198B TW 095127156 A TW095127156 A TW 095127156A TW 95127156 A TW95127156 A TW 95127156A TW I319198 B TWI319198 B TW I319198B
Authority
TW
Taiwan
Prior art keywords
ued
chip
termination resistor
resistor device
adjustable termination
Prior art date
Application number
TW095127156A
Other languages
English (en)
Other versions
TW200709234A (en
Inventor
Hsiao Chyi Lin
Lester Yeh
Original Assignee
Via Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Via Tech Inc filed Critical Via Tech Inc
Publication of TW200709234A publication Critical patent/TW200709234A/zh
Application granted granted Critical
Publication of TWI319198B publication Critical patent/TWI319198B/zh

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10Calibration or testing
    • H03M1/1009Calibration
    • H03M1/1014Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1019Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error by storing a corrected or correction value in a digital look-up table
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/50Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56Input signal compared with linear ramp

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)
TW095127156A 2005-08-19 2006-07-25 Adjustable termination resistor device ued in ic chip TWI319198B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US70997405P 2005-08-19 2005-08-19

Publications (2)

Publication Number Publication Date
TW200709234A TW200709234A (en) 2007-03-01
TWI319198B true TWI319198B (en) 2010-01-01

Family

ID=37656811

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095127156A TWI319198B (en) 2005-08-19 2006-07-25 Adjustable termination resistor device ued in ic chip

Country Status (3)

Country Link
US (1) US7345504B2 (zh)
CN (1) CN100403290C (zh)
TW (1) TWI319198B (zh)

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US7535250B2 (en) * 2005-08-22 2009-05-19 Micron Technology, Inc. Output impedance calibration circuit with multiple output driver models
US7434985B2 (en) * 2005-12-16 2008-10-14 Etron Technology, Inc. Calibrated built-in temperature sensor and calibration method thereof
KR100790821B1 (ko) * 2006-11-15 2008-01-03 삼성전자주식회사 반도체 메모리 장치에서의 온다이 터미네이션 회로
JP4973243B2 (ja) * 2007-03-06 2012-07-11 富士通セミコンダクター株式会社 半導体出力回路及び外部出力信号生成方法並びに半導体装置
KR100875673B1 (ko) * 2007-05-14 2008-12-24 주식회사 하이닉스반도체 온 다이 터미네이션 장치 및 이의 캘리브래이션 방법
US7830285B2 (en) * 2008-07-10 2010-11-09 Lantiq Deutschland Gmbh Circuit with calibration circuit portion
CN101990071B (zh) * 2009-07-29 2014-09-10 晨星软件研发(深圳)有限公司 可自动校准输出的解调器、方法及其电视接收器
CN102045054B (zh) * 2009-10-13 2013-04-24 晨星软件研发(深圳)有限公司 校准输出入电路的方法与相关装置
US7915951B1 (en) * 2009-11-02 2011-03-29 Nanya Technology Corp. Locally calibrated current source
US8237467B2 (en) * 2010-06-25 2012-08-07 National Semiconductor Corporation Resistor-programmable device at low voltage
JP5528378B2 (ja) * 2011-03-07 2014-06-25 ルネサスエレクトロニクス株式会社 半導体装置
CN102684634B (zh) * 2011-03-14 2015-05-20 瑞昱半导体股份有限公司 传送/接收电路以及传送/接收电路阻抗校正方法
TWI499885B (zh) 2012-11-23 2015-09-11 Realtek Semiconductor Corp 固定電流產生電路及相關的固定電流產生方法
CN103853226B (zh) * 2012-11-30 2016-06-01 瑞昱半导体股份有限公司 固定电流产生电路及固定电流产生方法
CN103226372A (zh) * 2013-04-15 2013-07-31 北京大学 利用片外电阻调谐的全片上工作的精确的电流参考源
CN103546114B (zh) * 2013-10-30 2016-08-24 华为技术有限公司 根据从设备的上拉电压调整总线上拉电压的电路及其方法
CN104601161A (zh) * 2014-12-09 2015-05-06 中国航空工业集团公司第六三一研究所 一种阻抗校正电路和方法
US9905995B2 (en) 2015-09-01 2018-02-27 Integrated Device Technology, Inc. Adjustable termination circuit for high speed laser driver
CN105680818A (zh) * 2016-02-24 2016-06-15 中国电子科技集团公司第二十四研究所 一种芯片片上电阻自校正电路及方法
US10380060B2 (en) * 2016-06-17 2019-08-13 Etron Technology, Inc. Low-pincount high-bandwidth memory and memory bus
TWI601378B (zh) * 2016-11-17 2017-10-01 瑞昱半導體股份有限公司 電阻校正電路與裝置
TWI634740B (zh) * 2017-01-18 2018-09-01 瑞昱半導體股份有限公司 阻抗匹配電路與應用阻抗匹配電路的積體電路
CN108536628B (zh) * 2017-03-03 2021-09-17 联发科技(新加坡)私人有限公司 阻抗匹配电路与接口电路
CN109302164B (zh) * 2017-07-25 2022-03-01 深圳市中兴微电子技术有限公司 一种滤波器带宽校准方法和装置
TWI750357B (zh) * 2018-03-23 2021-12-21 力智電子股份有限公司 電流鏡校正電路及電流鏡校正方法
WO2020097932A1 (zh) * 2018-11-16 2020-05-22 深圳市汇顶科技股份有限公司 一种阻抗调整电路、芯片及参考电压产生电路
CN110708033B (zh) * 2019-10-18 2023-03-31 中国电子科技集团公司第二十四研究所 用于带宽可重构滤波器的电阻自动校正方法及其电路
CN111142058B (zh) * 2020-01-02 2022-05-17 联芸科技(杭州)有限公司 电阻检测装置及方法
CN113851078B (zh) * 2020-09-03 2023-07-11 成都利普芯微电子有限公司 一种led显示屏恒流源分段模组及控制方法
CN112650344B (zh) * 2020-12-22 2022-07-29 成都华微电子科技股份有限公司 可配置终端匹配电阻校准电路
CN113253787A (zh) * 2021-06-17 2021-08-13 苏州裕太微电子有限公司 一种芯片内电阻校正电路
CN114460998A (zh) * 2022-01-06 2022-05-10 浙江科睿微电子技术有限公司 一种基准电流源电路的校准电路及校准方法
CN117170451A (zh) * 2023-09-27 2023-12-05 深圳市迪浦电子有限公司 一种自动追踪芯片基准电压并输出修调码的电路及方法

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US5493250A (en) * 1994-03-07 1996-02-20 U.S. Philips Corporation Adjustable resistance device including first and second arrangements of a resistor and a positive-feedback transconductor, and a control circuit for controlling the resistances of the first and second arrangements
JP3515025B2 (ja) * 1999-09-22 2004-04-05 株式会社東芝 半導体装置
KR100403633B1 (ko) * 2001-08-10 2003-10-30 삼성전자주식회사 임피던스 제어회로
KR100487526B1 (ko) * 2002-05-22 2005-05-03 삼성전자주식회사 반도체 장치
US6690211B1 (en) * 2002-11-28 2004-02-10 Jmicron Technology Corp. Impedance matching circuit
US6949949B2 (en) * 2002-12-17 2005-09-27 Ip-First, Llc Apparatus and method for adjusting the impedance of an output driver
CN1540472A (zh) * 2003-10-31 2004-10-27 广州威纳电子科技有限公司 恒电阻电子负载
CN100454435C (zh) * 2003-11-13 2009-01-21 威盛电子股份有限公司 动态随机存取存储器的输出驱动强度校正电路及方法
KR100597633B1 (ko) * 2004-01-06 2006-07-05 삼성전자주식회사 임피던스 컨트롤 장치 및 그에 따른 컨트롤 방법
CN100438335C (zh) * 2004-05-28 2008-11-26 威盛电子股份有限公司 半导体元件的自动协调电阻电容时间常数的电路及方法

Also Published As

Publication number Publication date
TW200709234A (en) 2007-03-01
CN1900923A (zh) 2007-01-24
CN100403290C (zh) 2008-07-16
US20070040716A1 (en) 2007-02-22
US7345504B2 (en) 2008-03-18

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