TWI319198B - Adjustable termination resistor device ued in ic chip - Google Patents
Adjustable termination resistor device ued in ic chipInfo
- Publication number
- TWI319198B TWI319198B TW095127156A TW95127156A TWI319198B TW I319198 B TWI319198 B TW I319198B TW 095127156 A TW095127156 A TW 095127156A TW 95127156 A TW95127156 A TW 95127156A TW I319198 B TWI319198 B TW I319198B
- Authority
- TW
- Taiwan
- Prior art keywords
- ued
- chip
- termination resistor
- resistor device
- adjustable termination
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M1/1019—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error by storing a corrected or correction value in a digital look-up table
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/50—Analogue/digital converters with intermediate conversion to time interval
- H03M1/56—Input signal compared with linear ramp
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Logic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Control Of Electrical Variables (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US70997405P | 2005-08-19 | 2005-08-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200709234A TW200709234A (en) | 2007-03-01 |
TWI319198B true TWI319198B (en) | 2010-01-01 |
Family
ID=37656811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095127156A TWI319198B (en) | 2005-08-19 | 2006-07-25 | Adjustable termination resistor device ued in ic chip |
Country Status (3)
Country | Link |
---|---|
US (1) | US7345504B2 (zh) |
CN (1) | CN100403290C (zh) |
TW (1) | TWI319198B (zh) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7535250B2 (en) * | 2005-08-22 | 2009-05-19 | Micron Technology, Inc. | Output impedance calibration circuit with multiple output driver models |
US7434985B2 (en) * | 2005-12-16 | 2008-10-14 | Etron Technology, Inc. | Calibrated built-in temperature sensor and calibration method thereof |
KR100790821B1 (ko) * | 2006-11-15 | 2008-01-03 | 삼성전자주식회사 | 반도체 메모리 장치에서의 온다이 터미네이션 회로 |
JP4973243B2 (ja) * | 2007-03-06 | 2012-07-11 | 富士通セミコンダクター株式会社 | 半導体出力回路及び外部出力信号生成方法並びに半導体装置 |
KR100875673B1 (ko) * | 2007-05-14 | 2008-12-24 | 주식회사 하이닉스반도체 | 온 다이 터미네이션 장치 및 이의 캘리브래이션 방법 |
US7830285B2 (en) * | 2008-07-10 | 2010-11-09 | Lantiq Deutschland Gmbh | Circuit with calibration circuit portion |
CN101990071B (zh) * | 2009-07-29 | 2014-09-10 | 晨星软件研发(深圳)有限公司 | 可自动校准输出的解调器、方法及其电视接收器 |
CN102045054B (zh) * | 2009-10-13 | 2013-04-24 | 晨星软件研发(深圳)有限公司 | 校准输出入电路的方法与相关装置 |
US7915951B1 (en) * | 2009-11-02 | 2011-03-29 | Nanya Technology Corp. | Locally calibrated current source |
US8237467B2 (en) * | 2010-06-25 | 2012-08-07 | National Semiconductor Corporation | Resistor-programmable device at low voltage |
JP5528378B2 (ja) * | 2011-03-07 | 2014-06-25 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
CN102684634B (zh) * | 2011-03-14 | 2015-05-20 | 瑞昱半导体股份有限公司 | 传送/接收电路以及传送/接收电路阻抗校正方法 |
TWI499885B (zh) | 2012-11-23 | 2015-09-11 | Realtek Semiconductor Corp | 固定電流產生電路及相關的固定電流產生方法 |
CN103853226B (zh) * | 2012-11-30 | 2016-06-01 | 瑞昱半导体股份有限公司 | 固定电流产生电路及固定电流产生方法 |
CN103226372A (zh) * | 2013-04-15 | 2013-07-31 | 北京大学 | 利用片外电阻调谐的全片上工作的精确的电流参考源 |
CN103546114B (zh) * | 2013-10-30 | 2016-08-24 | 华为技术有限公司 | 根据从设备的上拉电压调整总线上拉电压的电路及其方法 |
CN104601161A (zh) * | 2014-12-09 | 2015-05-06 | 中国航空工业集团公司第六三一研究所 | 一种阻抗校正电路和方法 |
US9905995B2 (en) | 2015-09-01 | 2018-02-27 | Integrated Device Technology, Inc. | Adjustable termination circuit for high speed laser driver |
CN105680818A (zh) * | 2016-02-24 | 2016-06-15 | 中国电子科技集团公司第二十四研究所 | 一种芯片片上电阻自校正电路及方法 |
US10380060B2 (en) * | 2016-06-17 | 2019-08-13 | Etron Technology, Inc. | Low-pincount high-bandwidth memory and memory bus |
TWI601378B (zh) * | 2016-11-17 | 2017-10-01 | 瑞昱半導體股份有限公司 | 電阻校正電路與裝置 |
TWI634740B (zh) * | 2017-01-18 | 2018-09-01 | 瑞昱半導體股份有限公司 | 阻抗匹配電路與應用阻抗匹配電路的積體電路 |
CN108536628B (zh) * | 2017-03-03 | 2021-09-17 | 联发科技(新加坡)私人有限公司 | 阻抗匹配电路与接口电路 |
CN109302164B (zh) * | 2017-07-25 | 2022-03-01 | 深圳市中兴微电子技术有限公司 | 一种滤波器带宽校准方法和装置 |
TWI750357B (zh) * | 2018-03-23 | 2021-12-21 | 力智電子股份有限公司 | 電流鏡校正電路及電流鏡校正方法 |
WO2020097932A1 (zh) * | 2018-11-16 | 2020-05-22 | 深圳市汇顶科技股份有限公司 | 一种阻抗调整电路、芯片及参考电压产生电路 |
CN110708033B (zh) * | 2019-10-18 | 2023-03-31 | 中国电子科技集团公司第二十四研究所 | 用于带宽可重构滤波器的电阻自动校正方法及其电路 |
CN111142058B (zh) * | 2020-01-02 | 2022-05-17 | 联芸科技(杭州)有限公司 | 电阻检测装置及方法 |
CN113851078B (zh) * | 2020-09-03 | 2023-07-11 | 成都利普芯微电子有限公司 | 一种led显示屏恒流源分段模组及控制方法 |
CN112650344B (zh) * | 2020-12-22 | 2022-07-29 | 成都华微电子科技股份有限公司 | 可配置终端匹配电阻校准电路 |
CN113253787A (zh) * | 2021-06-17 | 2021-08-13 | 苏州裕太微电子有限公司 | 一种芯片内电阻校正电路 |
CN114460998A (zh) * | 2022-01-06 | 2022-05-10 | 浙江科睿微电子技术有限公司 | 一种基准电流源电路的校准电路及校准方法 |
CN117170451A (zh) * | 2023-09-27 | 2023-12-05 | 深圳市迪浦电子有限公司 | 一种自动追踪芯片基准电压并输出修调码的电路及方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2848500B2 (ja) * | 1991-04-04 | 1999-01-20 | 三菱電機株式会社 | インタフェースシステム |
US5493250A (en) * | 1994-03-07 | 1996-02-20 | U.S. Philips Corporation | Adjustable resistance device including first and second arrangements of a resistor and a positive-feedback transconductor, and a control circuit for controlling the resistances of the first and second arrangements |
JP3515025B2 (ja) * | 1999-09-22 | 2004-04-05 | 株式会社東芝 | 半導体装置 |
KR100403633B1 (ko) * | 2001-08-10 | 2003-10-30 | 삼성전자주식회사 | 임피던스 제어회로 |
KR100487526B1 (ko) * | 2002-05-22 | 2005-05-03 | 삼성전자주식회사 | 반도체 장치 |
US6690211B1 (en) * | 2002-11-28 | 2004-02-10 | Jmicron Technology Corp. | Impedance matching circuit |
US6949949B2 (en) * | 2002-12-17 | 2005-09-27 | Ip-First, Llc | Apparatus and method for adjusting the impedance of an output driver |
CN1540472A (zh) * | 2003-10-31 | 2004-10-27 | 广州威纳电子科技有限公司 | 恒电阻电子负载 |
CN100454435C (zh) * | 2003-11-13 | 2009-01-21 | 威盛电子股份有限公司 | 动态随机存取存储器的输出驱动强度校正电路及方法 |
KR100597633B1 (ko) * | 2004-01-06 | 2006-07-05 | 삼성전자주식회사 | 임피던스 컨트롤 장치 및 그에 따른 컨트롤 방법 |
CN100438335C (zh) * | 2004-05-28 | 2008-11-26 | 威盛电子股份有限公司 | 半导体元件的自动协调电阻电容时间常数的电路及方法 |
-
2006
- 2006-07-25 TW TW095127156A patent/TWI319198B/zh active
- 2006-08-18 CN CNB2006101155522A patent/CN100403290C/zh active Active
- 2006-08-18 US US11/465,636 patent/US7345504B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
TW200709234A (en) | 2007-03-01 |
CN1900923A (zh) | 2007-01-24 |
CN100403290C (zh) | 2008-07-16 |
US20070040716A1 (en) | 2007-02-22 |
US7345504B2 (en) | 2008-03-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI319198B (en) | Adjustable termination resistor device ued in ic chip | |
TWI366860B (en) | Semiconductor device | |
EP1829102A4 (en) | SEMICONDUCTOR DEVICE | |
EP1760790A4 (en) | SEMICONDUCTOR COMPONENT | |
HK1101810A1 (en) | Card reading device | |
EP1710831A4 (en) | SEMICONDUCTOR DEVICE | |
EP1709688A4 (en) | SEMICONDUCTOR COMPONENT | |
EP1755165A4 (en) | SEMICONDUCTOR DEVICE | |
TWI370522B (en) | Semiconductor memory device | |
EP1913631A4 (en) | METHOD AND DEVICE FOR THREE DIMENSIONAL INTEGRATION ELEMENTS | |
EP1964506A4 (en) | IN VIVO IMAGE CAPTURE DEVICE | |
SG10201406279UA (en) | Epoxy resin composition and semiconductor device | |
TWI350964B (en) | Semiconductor device | |
EP1801871A4 (en) | SEMICONDUCTOR COMPONENT | |
TWI320422B (en) | Epoxy resin composition and semiconductor device | |
EP1734647A4 (en) | SEMICONDUCTOR COMPONENT AND MODULE THEREFOR | |
TWI369370B (en) | Epoxy resin composition and semiconductor device | |
EP1787242A4 (en) | SEMICONDUCTOR DEVICE | |
EP1830170A4 (en) | COMPONENTS MEASURING DEVICE | |
HK1105713A1 (en) | Chip resistor | |
EP1840784A4 (en) | SEMICONDUCTOR MEMORY MODULE | |
EP1830405A4 (en) | SEMICONDUCTOR COMPONENT | |
EP1886344A4 (en) | MEMORY ELEMENT AND SEMICONDUCTOR BLOCK | |
GB0328337D0 (en) | Reading device | |
EP1757926A4 (en) | ELECTROPHORETIC CHIP AND ELECTROPHORETIC DEVICE HAVING THE SAME |