TWI313055B - - Google Patents

Download PDF

Info

Publication number
TWI313055B
TWI313055B TW092126928A TW92126928A TWI313055B TW I313055 B TWI313055 B TW I313055B TW 092126928 A TW092126928 A TW 092126928A TW 92126928 A TW92126928 A TW 92126928A TW I313055 B TWI313055 B TW I313055B
Authority
TW
Taiwan
Prior art keywords
base
wiring
solid
opening
imaging device
Prior art date
Application number
TW092126928A
Other languages
English (en)
Chinese (zh)
Other versions
TW200423390A (en
Inventor
Koichi Yamauchi
Original Assignee
Panasonic Corporatio
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corporatio filed Critical Panasonic Corporatio
Publication of TW200423390A publication Critical patent/TW200423390A/zh
Application granted granted Critical
Publication of TWI313055B publication Critical patent/TWI313055B/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/15—Charge-coupled device [CCD] image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/804—Containers or encapsulations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161—Disposition
    • H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49121—Beam lead frame or beam lead device
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/49155—Manufacturing circuit on or in base
    • Y10T29/49158—Manufacturing circuit on or in base with molding of insulated base
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/49155—Manufacturing circuit on or in base
    • Y10T29/49165—Manufacturing circuit on or in base by forming conductive walled aperture in base
    • Y10T29/49167—Manufacturing circuit on or in base by forming conductive walled aperture in base with deforming of conductive path
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49174—Assembling terminal to elongated conductor
    • Y10T29/49176—Assembling terminal to elongated conductor with molding of electrically insulating material
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49204—Contact or terminal manufacturing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49204—Contact or terminal manufacturing
    • Y10T29/49208—Contact or terminal manufacturing by assembling plural parts
    • Y10T29/4922—Contact or terminal manufacturing by assembling plural parts with molding of insulation

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
TW092126928A 2003-04-28 2003-09-30 Solid-state photographing apparatus and its manufacturing method TW200423390A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003123841A JP3768972B2 (ja) 2003-04-28 2003-04-28 固体撮像装置およびその製造方法

Publications (2)

Publication Number Publication Date
TW200423390A TW200423390A (en) 2004-11-01
TWI313055B true TWI313055B (enExample) 2009-08-01

Family

ID=32985560

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092126928A TW200423390A (en) 2003-04-28 2003-09-30 Solid-state photographing apparatus and its manufacturing method

Country Status (7)

Country Link
US (2) US7154156B2 (enExample)
EP (1) EP1473777B1 (enExample)
JP (1) JP3768972B2 (enExample)
KR (1) KR100603918B1 (enExample)
CN (1) CN100433339C (enExample)
DE (1) DE60319678T2 (enExample)
TW (1) TW200423390A (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200514484A (en) * 2003-10-08 2005-04-16 Chung-Cheng Wang Substrate for electrical device and methods of fabricating the same
JP4290134B2 (ja) * 2005-03-14 2009-07-01 パナソニック株式会社 固体撮像装置と固体撮像装置の製造方法
CN100576552C (zh) * 2005-03-25 2009-12-30 住友化学株式会社 固体摄像装置和固体摄像元件收纳盒
US20090213232A1 (en) * 2005-04-01 2009-08-27 Matsushita Electric Industrial Co., Ltd. Image pickup device
JP4591168B2 (ja) * 2005-04-14 2010-12-01 パナソニック株式会社 立体構成電子回路ユニットとその製造方法
TWI320545B (en) * 2006-10-05 2010-02-11 Chipmos Technologies Inc Film type package for fingerprint sensor
JP4490406B2 (ja) * 2006-10-11 2010-06-23 浜松ホトニクス株式会社 固体撮像装置
KR100813625B1 (ko) * 2006-11-15 2008-03-14 삼성전자주식회사 반도체 소자 패키지
FR2913529B1 (fr) * 2007-03-09 2009-04-24 E2V Semiconductors Soc Par Act Boitier de circuit integre,notamment pour capteur d'image, et procede de positionnement
CN101123231B (zh) * 2007-08-31 2010-11-03 晶方半导体科技（苏州）有限公司 微机电系统的晶圆级芯片尺寸封装结构及其制造方法
US8120128B2 (en) * 2007-10-12 2012-02-21 Panasonic Corporation Optical device
US20090179290A1 (en) * 2008-01-15 2009-07-16 Huang Shuangwu Encapsulated imager packaging
US7795573B2 (en) * 2008-11-17 2010-09-14 Teledyne Scientific & Imaging, Llc Detector with mounting hub to isolate temperature induced strain and method of fabricating the same
JP4766162B2 (ja) * 2009-08-06 2011-09-07 オムロン株式会社 パワーモジュール
US8659105B2 (en) 2009-11-26 2014-02-25 Kyocera Corporation Wiring substrate, imaging device and imaging device module
US20130128109A1 (en) * 2010-06-28 2013-05-23 Kyocera Corporation Wiring substrate, image pickup device, and image pickup module
JP5731870B2 (ja) * 2011-03-29 2015-06-10 セイコーインスツル株式会社 電子部品パッケージ
JP2013128763A (ja) * 2011-11-21 2013-07-04 Bridgestone Corp シート用パッド
CN104321861B (zh) * 2012-05-31 2017-10-20 京瓷株式会社 电子元件搭载用基板以及电子装置
JP6414427B2 (ja) * 2013-10-03 2018-10-31 日亜化学工業株式会社 発光装置実装構造体
WO2015125777A1 (ja) * 2014-02-24 2015-08-27 オリンパス株式会社 撮像装置および撮像装置の製造方法
CN110475049B (zh) * 2018-05-11 2022-03-15 三星电机株式会社 相机模块及其制造方法
TWI677745B (zh) * 2018-12-05 2019-11-21 海華科技股份有限公司 影像擷取模組及可攜式電子裝置
US11774376B2 (en) 2019-12-26 2023-10-03 Canon Kabushiki Kaisha Power supply unit and radiation imaging apparatus including the same

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5223746A (en) * 1989-06-14 1993-06-29 Hitachi, Ltd. Packaging structure for a solid-state imaging device with selectively aluminium coated leads
JPH05243538A (ja) 1992-02-28 1993-09-21 Sharp Corp 固体撮像装置の製造方法
JP2746171B2 (ja) 1995-02-21 1998-04-28 日本電気株式会社 固体撮像装置及びその製造方法
DE69636920T2 (de) * 1995-08-02 2007-11-22 Matsushita Electric Industrial Co., Ltd., Kadoma Festkörperbildaufnahmegerät und herstellungsverfahren
JP4372241B2 (ja) * 1998-08-05 2009-11-25 パナソニック株式会社 固体撮像装置の製造方法
JP2001257330A (ja) 2000-03-09 2001-09-21 Sony Corp 固体撮像装置
JP4244096B2 (ja) 2000-04-14 2009-03-25 パナソニック株式会社 半導体装置およびその製造方法
US6384473B1 (en) * 2000-05-16 2002-05-07 Sandia Corporation Microelectronic device package with an integral window
JP2002004354A (ja) 2000-06-20 2002-01-09 Toto Ltd 棚付水栓
TW454309B (en) * 2000-07-17 2001-09-11 Orient Semiconductor Elect Ltd Package structure of CCD image-capturing chip
TW548843B (en) * 2001-02-28 2003-08-21 Fujitsu Ltd Semiconductor device and method for making the same
US6885107B2 (en) * 2002-08-29 2005-04-26 Micron Technology, Inc. Flip-chip image sensor packages and methods of fabrication

Also Published As

Publication number Publication date
TW200423390A (en) 2004-11-01
DE60319678D1 (de) 2008-04-24
US7154156B2 (en) 2006-12-26
US7367120B2 (en) 2008-05-06
US20040211986A1 (en) 2004-10-28
EP1473777A3 (en) 2005-01-05
JP3768972B2 (ja) 2006-04-19
KR100603918B1 (ko) 2006-07-24
EP1473777B1 (en) 2008-03-12
JP2004327916A (ja) 2004-11-18
EP1473777A2 (en) 2004-11-03
US20070069319A1 (en) 2007-03-29
DE60319678T2 (de) 2009-03-26
CN1542979A (zh) 2004-11-03
CN100433339C (zh) 2008-11-12
KR20040093360A (ko) 2004-11-05

Similar Documents

Publication Publication Date Title
TWI313055B (enExample)
JP3782405B2 (ja) 固体撮像装置およびその製造方法
CN100490162C (zh) 固体摄像装置及其制造方法
CN101310381B (zh) 半导体封装及其制造方法、半导体模块和电子设备
US7247509B2 (en) Method for manufacturing solid-state imaging devices
JP2005026426A (ja) 固体撮像装置およびその製造方法
TWI309084B (enExample)
JP2008277593A (ja) 回路基板、それを用いた光学デバイス、カメラモジュール、およびその製造方法
JP3838573B2 (ja) 固体撮像装置
JP4147171B2 (ja) 固体撮像装置およびその製造方法
CN118763090B (zh) 感光组件及其制备方法、摄像模组和电子设备
JP2006332686A (ja) 固体撮像装置
JP2004356226A (ja) 固体撮像装置の製造方法

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees