TWI308964B - Semiconductor device, test board for testing the same, and test system and method for testing the same - Google Patents
Semiconductor device, test board for testing the same, and test system and method for testing the same Download PDFInfo
- Publication number
- TWI308964B TWI308964B TW095124101A TW95124101A TWI308964B TW I308964 B TWI308964 B TW I308964B TW 095124101 A TW095124101 A TW 095124101A TW 95124101 A TW95124101 A TW 95124101A TW I308964 B TWI308964 B TW I308964B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- speed
- input
- semiconductor component
- data
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims description 471
- 239000004065 semiconductor Substances 0.000 title claims description 127
- 238000000034 method Methods 0.000 title claims description 6
- 238000013500 data storage Methods 0.000 claims description 57
- 238000006243 chemical reaction Methods 0.000 claims description 37
- 230000004044 response Effects 0.000 claims description 20
- 230000001360 synchronised effect Effects 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 10
- 238000010998 test method Methods 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims 2
- 235000017166 Bambusa arundinacea Nutrition 0.000 claims 1
- 235000017491 Bambusa tulda Nutrition 0.000 claims 1
- 241001330002 Bambuseae Species 0.000 claims 1
- 235000015334 Phyllostachys viridis Nutrition 0.000 claims 1
- 241000239226 Scorpiones Species 0.000 claims 1
- 229910052785 arsenic Inorganic materials 0.000 claims 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims 1
- 239000011425 bamboo Substances 0.000 claims 1
- 239000004744 fabric Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 230000003068 static effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 15
- 101000734572 Homo sapiens Phosphoenolpyruvate carboxykinase, cytosolic [GTP] Proteins 0.000 description 7
- 102100034796 Phosphoenolpyruvate carboxykinase, cytosolic [GTP] Human genes 0.000 description 7
- 238000012546 transfer Methods 0.000 description 7
- 101000734579 Homo sapiens Phosphoenolpyruvate carboxykinase [GTP], mitochondrial Proteins 0.000 description 6
- 102100034792 Phosphoenolpyruvate carboxykinase [GTP], mitochondrial Human genes 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 6
- 101100169873 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) DCK1 gene Proteins 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 238000011056 performance test Methods 0.000 description 3
- 241000282376 Panthera tigris Species 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 101100422614 Arabidopsis thaliana STR15 gene Proteins 0.000 description 1
- 241000282320 Panthera leo Species 0.000 description 1
- 101100141327 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) RNR3 gene Proteins 0.000 description 1
- XTKDAFGWCDAMPY-UHFFFAOYSA-N azaperone Chemical compound C1=CC(F)=CC=C1C(=O)CCCN1CCN(C=2N=CC=CC=2)CC1 XTKDAFGWCDAMPY-UHFFFAOYSA-N 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 101150112501 din1 gene Proteins 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000012353 t test Methods 0.000 description 1
- 238000012549 training Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56012—Timing aspects, clock generation, synchronisation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5602—Interface to device under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050062368A KR100714482B1 (ko) | 2005-07-11 | 2005-07-11 | 반도체 장치, 테스트 기판, 반도체 장치의 테스트 시스템및 반도체 장치의 테스트 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200702678A TW200702678A (en) | 2007-01-16 |
| TWI308964B true TWI308964B (en) | 2009-04-21 |
Family
ID=37680421
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095124101A TWI308964B (en) | 2005-07-11 | 2006-07-03 | Semiconductor device, test board for testing the same, and test system and method for testing the same |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7555686B2 (enExample) |
| JP (1) | JP2007024884A (enExample) |
| KR (1) | KR100714482B1 (enExample) |
| DE (1) | DE102006033188A1 (enExample) |
| TW (1) | TWI308964B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9437328B2 (en) * | 2012-11-30 | 2016-09-06 | Silicon Motion Inc. | Apparatus and method for applying at-speed functional test with lower-speed tester |
| JP6121853B2 (ja) * | 2013-09-18 | 2017-04-26 | 株式会社東芝 | 出力装置およびその診断方法 |
| CN105067988B (zh) * | 2015-07-02 | 2018-03-30 | 英特尔公司 | 集成电路、集成电路测试装置以及方法 |
| US10097341B1 (en) * | 2017-08-30 | 2018-10-09 | Keyssa Systems, Inc. | Testing of clock and data recovery circuits |
| TWI871453B (zh) * | 2020-05-14 | 2025-02-01 | 台灣積體電路製造股份有限公司 | 用於檢測有缺陷邏輯器件的方法和裝置 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01149543A (ja) * | 1987-12-04 | 1989-06-12 | Fujitsu Ltd | Ｆｉｆｏメモリ制御方法 |
| JPH02245681A (ja) * | 1989-03-17 | 1990-10-01 | Nec Corp | 複合型集積回路 |
| JPH0481080U (enExample) * | 1990-11-27 | 1992-07-15 | ||
| JPH0530778U (ja) * | 1991-10-02 | 1993-04-23 | 日本電気株式会社 | 故障ｌｓｉ検出システム |
| JP3453460B2 (ja) * | 1994-08-29 | 2003-10-06 | 松下電器産業株式会社 | 半導体集積回路 |
| JPH08262087A (ja) | 1995-03-20 | 1996-10-11 | Hitachi Shonan Denshi Co Ltd | 被測定物に対する周期的バーストデータによるデータ透過性試験装置 |
| US5633634A (en) | 1995-09-29 | 1997-05-27 | Ag Communication Systems Corporation | Data rate conversion circuit |
| JP2850817B2 (ja) * | 1995-12-20 | 1999-01-27 | 日本電気株式会社 | データハイウェイ用信号速度変換回路 |
| US5677914A (en) * | 1996-04-25 | 1997-10-14 | Hughes Electronics | Test vectro feed-thru |
| SE506817C2 (sv) | 1996-06-20 | 1998-02-16 | Ericsson Telefon Ab L M | Seriell-parallell- och parallell-seriellomvandlare innefattande frekvensdelare |
| JPH1073643A (ja) * | 1996-09-02 | 1998-03-17 | Mitsubishi Electric Corp | 半導体装置試験治具 |
| US5933739A (en) * | 1997-09-11 | 1999-08-03 | Vlsi Technology, Inc. | Self-aligned silicidation structure and method of formation thereof |
| JP3145976B2 (ja) * | 1998-01-05 | 2001-03-12 | 日本電気アイシーマイコンシステム株式会社 | 半導体集積回路 |
| JP2001289915A (ja) | 2000-04-11 | 2001-10-19 | Matsushita Electric Ind Co Ltd | 半導体装置 |
| DE10113458C2 (de) * | 2001-03-19 | 2003-03-20 | Infineon Technologies Ag | Testschaltung |
| JP2003004809A (ja) | 2001-06-20 | 2003-01-08 | Toshiba Microelectronics Corp | 半導体集積回路及び高速テストシステム |
| JP2003098221A (ja) * | 2001-09-25 | 2003-04-03 | Mitsubishi Electric Corp | 半導体装置、半導体装置の試験方法及び半導体装置の試験装置 |
| JP3871676B2 (ja) | 2001-10-05 | 2007-01-24 | 松下電器産業株式会社 | Ｌｓｉ検査方法および装置、並びにｌｓｉテスタ |
| KR20030049481A (ko) * | 2001-12-15 | 2003-06-25 | 삼성전자주식회사 | 저속의 테스트 장비와 인터페이스할 수 있는 반도체 장치및 이를 이용한 테스트 시스템 |
| KR100493027B1 (ko) * | 2002-10-01 | 2005-06-07 | 삼성전자주식회사 | 외부클럭의 주파수 체배기와 테스트 데이터의 출력버퍼를 구비하는 반도체 장치 및 반도체 장치의 테스트 방법 |
| US7401281B2 (en) * | 2004-01-29 | 2008-07-15 | International Business Machines Corporation | Remote BIST high speed test and redundancy calculation |
| JP2005337740A (ja) * | 2004-05-24 | 2005-12-08 | Matsushita Electric Ind Co Ltd | 高速インターフェース回路検査モジュール、高速インターフェース回路検査対象モジュールおよび高速インターフェース回路検査方法 |
| US7305598B1 (en) * | 2005-03-25 | 2007-12-04 | Amit Sanghani | Test clock generation for higher-speed testing of a semiconductor device |
-
2005
- 2005-07-11 KR KR1020050062368A patent/KR100714482B1/ko not_active Expired - Lifetime
-
2006
- 2006-07-03 TW TW095124101A patent/TWI308964B/zh active
- 2006-07-10 US US11/483,753 patent/US7555686B2/en active Active
- 2006-07-11 DE DE102006033188A patent/DE102006033188A1/de not_active Withdrawn
- 2006-07-11 JP JP2006190578A patent/JP2007024884A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| TW200702678A (en) | 2007-01-16 |
| US20070022334A1 (en) | 2007-01-25 |
| KR20070007627A (ko) | 2007-01-16 |
| JP2007024884A (ja) | 2007-02-01 |
| DE102006033188A1 (de) | 2007-02-15 |
| KR100714482B1 (ko) | 2007-05-04 |
| US7555686B2 (en) | 2009-06-30 |
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