TWI297189B - - Google Patents

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Publication number
TWI297189B
TWI297189B TW092112453A TW92112453A TWI297189B TW I297189 B TWI297189 B TW I297189B TW 092112453 A TW092112453 A TW 092112453A TW 92112453 A TW92112453 A TW 92112453A TW I297189 B TWI297189 B TW I297189B
Authority
TW
Taiwan
Prior art keywords
joined body
support
positioning
transfer mechanism
engagement device
Prior art date
Application number
TW092112453A
Other languages
English (en)
Chinese (zh)
Other versions
TW200308047A (en
Inventor
Masaru Suzuki
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW200308047A publication Critical patent/TW200308047A/zh
Application granted granted Critical
Publication of TWI297189B publication Critical patent/TWI297189B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Manipulator (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Automatic Assembly (AREA)
  • Decoration By Transfer Pictures (AREA)
TW092112453A 2002-05-29 2003-05-07 Probe-card conveying apparatus and delivering mechanism of bonded body TW200308047A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002155175A JP4134289B2 (ja) 2002-05-29 2002-05-29 プローブカード搬送装置及びアダプタ

Publications (2)

Publication Number Publication Date
TW200308047A TW200308047A (en) 2003-12-16
TWI297189B true TWI297189B (enExample) 2008-05-21

Family

ID=29561405

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092112453A TW200308047A (en) 2002-05-29 2003-05-07 Probe-card conveying apparatus and delivering mechanism of bonded body

Country Status (6)

Country Link
US (1) US6822464B2 (enExample)
JP (1) JP4134289B2 (enExample)
KR (1) KR100657058B1 (enExample)
CN (1) CN1328777C (enExample)
TW (1) TW200308047A (enExample)
WO (1) WO2003100847A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4391744B2 (ja) * 2002-12-27 2009-12-24 東京エレクトロン株式会社 移動式プローブカード搬送装置、プローブ装置及びプローブ装置へのプローブカードの搬送方法
JP2005265658A (ja) * 2004-03-19 2005-09-29 Tokyo Electron Ltd 複数種のテスタに対応可能なプローブ装置
JP2007147537A (ja) * 2005-11-30 2007-06-14 Tokyo Electron Ltd プローブカード移載補助装置及び検査設備
JP2007256117A (ja) * 2006-03-23 2007-10-04 Fujitsu Ltd プリント回路基板試験装置、プリント回路基板試験方法、プリント回路基板試験プログラム、プリント回路基板製造方法
KR100878211B1 (ko) * 2006-12-29 2009-01-13 세크론 주식회사 프로브스테이션 및 이를 이용한 웨이퍼 검사방법
KR100847577B1 (ko) * 2006-12-27 2008-07-21 세크론 주식회사 프로빙 검사장치
EP2237052A1 (en) * 2009-03-31 2010-10-06 Capres A/S Automated multi-point probe manipulation
KR101278890B1 (ko) * 2009-07-30 2013-06-26 가부시키가이샤 아드반테스트 프로브카드 홀딩장치 및 프로버
JP5384270B2 (ja) * 2009-09-21 2014-01-08 東京エレクトロン株式会社 ローダ
JP5196334B2 (ja) * 2010-11-29 2013-05-15 ワイアイケー株式会社 プローブカード固着ユニット
JP2013191737A (ja) 2012-03-14 2013-09-26 Tokyo Electron Ltd ウエハ検査装置
JP5918682B2 (ja) * 2012-10-09 2016-05-18 東京エレクトロン株式会社 プローブカード取り付け方法
JP6220596B2 (ja) * 2013-08-01 2017-10-25 東京エレクトロン株式会社 プローバ
JP6267928B2 (ja) * 2013-10-29 2018-01-24 東京エレクトロン株式会社 ウエハ検査装置の整備用台車及びウエハ検査装置の整備方法
JP6652361B2 (ja) * 2015-09-30 2020-02-19 東京エレクトロン株式会社 ウエハ検査装置及びウエハ検査方法
JP7539624B2 (ja) 2022-01-17 2024-08-26 株式会社東京精密 ウェハテストシステム及びプローバ

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1044379A (en) * 1974-12-28 1978-12-12 Sony Corporation Wafer transfer device
JPH07107909B2 (ja) * 1987-12-23 1995-11-15 東京エレクトロン株式会社 ウエハプローバ
US5290134A (en) * 1991-12-03 1994-03-01 Advantest Corporation Pick and place for automatic test handler
US5313156A (en) * 1991-12-04 1994-05-17 Advantest Corporation Apparatus for automatic handling
US5307011A (en) * 1991-12-04 1994-04-26 Advantest Corporation Loader and unloader for test handler
JP2606554Y2 (ja) * 1992-01-17 2000-11-27 株式会社東京精密 プロービング装置
JPH05337780A (ja) * 1992-06-09 1993-12-21 Mazda Motor Corp ワークの保持方法およびその装置
US5528158A (en) * 1994-04-11 1996-06-18 Xandex, Inc. Probe card changer system and method
JPH1058367A (ja) * 1996-08-23 1998-03-03 Advantest Corp Ｉｃ搬送装置
JP3689215B2 (ja) * 1997-02-20 2005-08-31 株式会社ルネサステクノロジ 半導体デバイスのテスト用搬送装置
TW369601B (en) * 1997-06-17 1999-09-11 Advantest Corp Probe card
US6034524A (en) * 1997-07-17 2000-03-07 International Business Machines Corporation Apparatus and method for testing flexible circuit substrates
JP4104099B2 (ja) 1999-07-09 2008-06-18 東京エレクトロン株式会社 プローブカード搬送機構

Also Published As

Publication number Publication date
TW200308047A (en) 2003-12-16
CN1328777C (zh) 2007-07-25
KR20050005737A (ko) 2005-01-14
US6822464B2 (en) 2004-11-23
KR100657058B1 (ko) 2006-12-13
JP4134289B2 (ja) 2008-08-20
JP2003344482A (ja) 2003-12-03
CN1620723A (zh) 2005-05-25
US20040164756A1 (en) 2004-08-26
WO2003100847A1 (fr) 2003-12-04

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Legal Events

Date Code Title Description
MK4A Expiration of patent term of an invention patent