TWI276830B - Photoelectric sensor - Google Patents

Photoelectric sensor Download PDF

Info

Publication number
TWI276830B
TWI276830B TW093128857A TW93128857A TWI276830B TW I276830 B TWI276830 B TW I276830B TW 093128857 A TW093128857 A TW 093128857A TW 93128857 A TW93128857 A TW 93128857A TW I276830 B TWI276830 B TW I276830B
Authority
TW
Taiwan
Prior art keywords
light
receiving element
detection
viewing angle
light receiving
Prior art date
Application number
TW093128857A
Other languages
English (en)
Chinese (zh)
Other versions
TW200604577A (en
Inventor
Shyoichi Mitsutake
Kazuyoshi Hamada
Original Assignee
Takenaka Electronic Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Takenaka Electronic Ind filed Critical Takenaka Electronic Ind
Publication of TW200604577A publication Critical patent/TW200604577A/zh
Application granted granted Critical
Publication of TWI276830B publication Critical patent/TWI276830B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/32—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers using masks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/10—Detecting, e.g. by using light barriers
    • G01V8/20—Detecting, e.g. by using light barriers using multiple transmitters or receivers

Landscapes

  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
  • Switches Operated By Changes In Physical Conditions (AREA)
TW093128857A 2004-07-22 2004-09-23 Photoelectric sensor TWI276830B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004213904A JP3935898B2 (ja) 2004-07-22 2004-07-22 光電センサ

Publications (2)

Publication Number Publication Date
TW200604577A TW200604577A (en) 2006-02-01
TWI276830B true TWI276830B (en) 2007-03-21

Family

ID=35905639

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093128857A TWI276830B (en) 2004-07-22 2004-09-23 Photoelectric sensor

Country Status (3)

Country Link
JP (1) JP3935898B2 (ja)
KR (1) KR100611129B1 (ja)
TW (1) TWI276830B (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008033204A1 (de) * 2008-07-15 2010-02-04 Trw Automotive Electronics & Components Gmbh Optischer Sensor
JP6003121B2 (ja) * 2012-03-15 2016-10-05 オムロン株式会社 反射型光電センサ
JP2019133960A (ja) * 2016-05-26 2019-08-08 シャープ株式会社 光センサ
CN108630561B (zh) * 2017-03-15 2021-10-15 北京北方华创微电子装备有限公司 基片表面的检测装置和检测方法、传片腔室
CN108132138A (zh) * 2017-11-23 2018-06-08 矽力杰半导体技术(杭州)有限公司 光学检测组件

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63275920A (ja) * 1987-05-07 1988-11-14 Shin Etsu Polymer Co Ltd 光検出装置
JP2660929B2 (ja) * 1989-04-19 1997-10-08 ファナック株式会社 Ｃｃｄ固体撮像素子を用いたアークセンサ
JPH0533085U (ja) * 1991-10-09 1993-04-30 アツミ電気株式会社 赤外線投光器及び赤外線受光器
JPH06160528A (ja) * 1992-11-25 1994-06-07 Matsushita Electric Works Ltd 偏光回帰型光電センサ
JPH0743465A (ja) * 1993-07-26 1995-02-14 Saraya Kk 光電センサ
JP3473658B2 (ja) * 1996-07-18 2003-12-08 アルプス電気株式会社 指紋読取り装置
JPH1137740A (ja) * 1997-07-24 1999-02-12 Glory Ltd 紙葉類の損傷検知装置
JPH11163080A (ja) * 1997-11-26 1999-06-18 Mecs Corp ロボットハンド
JP2002026375A (ja) * 2000-07-05 2002-01-25 Oputeikon:Kk 光反射型センサ
JP4357731B2 (ja) * 2000-10-31 2009-11-04 サンクス株式会社 反射型光電センサの検出ヘッド
JP2002267498A (ja) * 2001-03-14 2002-09-18 Olympus Optical Co Ltd 光検出器

Also Published As

Publication number Publication date
TW200604577A (en) 2006-02-01
JP3935898B2 (ja) 2007-06-27
JP2006040913A (ja) 2006-02-09
KR100611129B1 (ko) 2006-08-10
KR20060008201A (ko) 2006-01-26

Similar Documents

Publication Publication Date Title
JP4609531B2 (ja) 画像読取装置
EP2397840B1 (en) Image inspecting apparatus, image inspecting method, image forming apparatus
JP2009049876A (ja) 画像読取装置
JP2004355261A (ja) 紙幣画像検出装置
CN103065386A (zh) 图像传感器单元以及图像读取装置
US6246859B1 (en) Original sensing device and sensing device
JP4596690B2 (ja) 紙葉類蛍光検出センサ
JP3725843B2 (ja) 反射型センサ
TWI276830B (en) Photoelectric sensor
JP2008257395A (ja) 紙葉類処理装置
JP2018169725A (ja) 硬貨識別装置及び硬貨識別方法
JP2014068338A (ja) 照明装置、イメージセンサユニットおよび紙葉類識別装置
JP2014029301A (ja) 投受光センサ
JP4507304B2 (ja) 変位測定装置
TWI739337B (zh) 紙張鑑別裝置、白色基準資料的調整方法、程式、以及校正方法
US6897463B1 (en) Wafer carrier mapping sensor assembly
JPH0678104A (ja) イメージセンサー
WO2018142999A1 (ja) 画像採取装置、硬貨状媒体処理機及び画像採取方法
JPH11250308A (ja) 紙葉類反射センサ
JP5230327B2 (ja) 刻印読取り装置
JPH09224127A (ja) 原稿濃度検知装置
JPWO2019138878A1 (ja) 静電容量検出装置
US5903403A (en) Imaging system using a compound elliptical concentrator
US20060274385A1 (en) Imaging system for multiple document types
JP2003162748A (ja) 紙葉類蛍光検出センサ