TWI226938B - Objective - Google Patents

Objective Download PDF

Info

Publication number
TWI226938B
TWI226938B TW091113615A TW91113615A TWI226938B TW I226938 B TWI226938 B TW I226938B TW 091113615 A TW091113615 A TW 091113615A TW 91113615 A TW91113615 A TW 91113615A TW I226938 B TWI226938 B TW I226938B
Authority
TW
Taiwan
Prior art keywords
objective lens
lens
scope
objective
grating
Prior art date
Application number
TW091113615A
Other languages
English (en)
Chinese (zh)
Inventor
Hans-Jurgen Dobschal
Klaus Rudolf
Reinhard Steiner
Robert Brunner
Knut Hage
Original Assignee
Zeiss Carl Jena Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeiss Carl Jena Gmbh filed Critical Zeiss Carl Jena Gmbh
Application granted granted Critical
Publication of TWI226938B publication Critical patent/TWI226938B/zh

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/02Objectives

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Lenses (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
TW091113615A 2001-06-22 2002-06-21 Objective TWI226938B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10130212A DE10130212A1 (de) 2001-06-22 2001-06-22 Objektiv

Publications (1)

Publication Number Publication Date
TWI226938B true TWI226938B (en) 2005-01-21

Family

ID=7689120

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091113615A TWI226938B (en) 2001-06-22 2002-06-21 Objective

Country Status (6)

Country Link
US (1) US20040174607A1 (enExample)
EP (1) EP1397716A2 (enExample)
JP (1) JP4252447B2 (enExample)
DE (1) DE10130212A1 (enExample)
TW (1) TWI226938B (enExample)
WO (1) WO2003001272A2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8317345B2 (en) 2004-12-23 2012-11-27 Carl Zeiss Smt Gmbh Catoptric objectives and systems using catoptric objectives
US8411251B2 (en) 2006-12-28 2013-04-02 Carl Zeiss Smt Gmbh Optical element and illumination optics for microlithography
US8705005B2 (en) 2006-02-17 2014-04-22 Carl Zeiss Smt Gmbh Microlithographic illumination system

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10318560A1 (de) 2003-04-24 2004-11-11 Carl Zeiss Sms Gmbh Anordnung zur Inspektion von Objekten, insbesondere von Masken in der Mikrolithographie
DE10319269A1 (de) 2003-04-25 2004-11-25 Carl Zeiss Sms Gmbh Abbildungssystem für ein, auf extrem ultravioletter (EUV) Strahlung basierendem Mikroskop
DE102004009212B4 (de) * 2004-02-25 2015-08-20 Carl Zeiss Meditec Ag Kontaktelement für Laserbearbeitung und Laserbearbeitungsvorrichtung
DE102005062237A1 (de) * 2005-12-22 2007-07-05 Carl Zeiss Jena Gmbh Verfahren und Vorrichtung zur Untersuchung des Abbildungsverhaltens einer Abbildungsoptik
DE102007043896A1 (de) 2007-09-14 2009-04-02 Carl Zeiss Smt Ag Mikrooptik zur Messung der Position eines Luftbildes
WO2011158778A1 (ja) * 2010-06-16 2011-12-22 株式会社ニコン 顕微鏡対物レンズ
CN102959451B (zh) * 2010-08-25 2015-06-24 株式会社尼康 显微镜光学系统以及显微镜系统
DE102019124919B4 (de) 2019-09-17 2021-08-26 Ri Research Instruments Gmbh Mikroskopisches System zur Prüfung von Strukturen und Defekten auf EUV-Lithographie-Photomasken
US20220404262A1 (en) * 2019-11-06 2022-12-22 Sony Group Corporation Optical measurement device and lens structure
CN116670493A (zh) * 2021-01-14 2023-08-29 索尼集团公司 粒子分析器、粒子分析方法和光学测量装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4032259A1 (de) * 1990-10-11 1992-04-16 Jenoptik Jena Gmbh Mikroskopobjektiv
JPH04361201A (ja) * 1991-06-10 1992-12-14 Olympus Optical Co Ltd フレネルゾーンプレートを用いた光学系
US5349471A (en) * 1993-02-16 1994-09-20 The University Of Rochester Hybrid refractive/diffractive achromatic lens for optical data storage systems
JPH08286113A (ja) * 1995-04-17 1996-11-01 Olympus Optical Co Ltd 対物レンズ
JPH09197283A (ja) * 1996-01-12 1997-07-31 Olympus Optical Co Ltd 対物レンズ
US5995286A (en) * 1997-03-07 1999-11-30 Minolta Co., Ltd. Diffractive optical element, an optical system having a diffractive optical element, and a method for manufacturing a diffractive optical element
JP3746894B2 (ja) * 1998-02-05 2006-02-15 ペンタックス株式会社 色消しレンズ系
JP4097781B2 (ja) * 1998-05-13 2008-06-11 オリンパス株式会社 対物レンズ
JP3950571B2 (ja) * 1999-03-10 2007-08-01 キヤノン株式会社 撮影光学系
JP2001100017A (ja) * 1999-09-29 2001-04-13 Canon Inc 光学素子

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8317345B2 (en) 2004-12-23 2012-11-27 Carl Zeiss Smt Gmbh Catoptric objectives and systems using catoptric objectives
US8632195B2 (en) 2004-12-23 2014-01-21 Carl Zeiss Smt Gmbh Catoptric objectives and systems using catoptric objectives
US8705005B2 (en) 2006-02-17 2014-04-22 Carl Zeiss Smt Gmbh Microlithographic illumination system
US8411251B2 (en) 2006-12-28 2013-04-02 Carl Zeiss Smt Gmbh Optical element and illumination optics for microlithography

Also Published As

Publication number Publication date
EP1397716A2 (de) 2004-03-17
WO2003001272A2 (de) 2003-01-03
JP2004530937A (ja) 2004-10-07
JP4252447B2 (ja) 2009-04-08
DE10130212A1 (de) 2003-01-02
WO2003001272A3 (de) 2003-11-20
US20040174607A1 (en) 2004-09-09

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MM4A Annulment or lapse of patent due to non-payment of fees