TWI221099B - Coating film forming method - Google Patents
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- 239000011248 coating agent Substances 0.000 title claims abstract description 23
- 238000000576 coating method Methods 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000010438 heat treatment Methods 0.000 claims abstract description 16
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 8
- 239000001301 oxygen Substances 0.000 claims description 8
- 229910052760 oxygen Inorganic materials 0.000 claims description 8
- 238000010304 firing Methods 0.000 claims description 5
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 239000011229 interlayer Substances 0.000 abstract description 5
- 239000000463 material Substances 0.000 abstract 3
- 239000010410 layer Substances 0.000 abstract 2
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 230000002079 cooperative effect Effects 0.000 description 3
- 238000000280 densification Methods 0.000 description 3
- 101100327917 Caenorhabditis elegans chup-1 gene Proteins 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000006482 condensation reaction Methods 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- 238000006297 dehydration reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02337—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment by exposure to a gas or vapour
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/314—Inorganic layers
- H01L21/316—Inorganic layers composed of oxides or glassy oxides or oxide based glass
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
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Description
1221099 A7 _____ B7 五、發明説明(1 ) 【發明所屬的技術領域】 本發明是關於一種形成多晶矽或高熔點金屬間之層間 絕緣膜、或是鋁配線間之餍間絕緣膜的被膜形成方法。 【習知技術】 過去要在被處理物上形成層間絕緣膜一直都是使用 CVD(化學汽相沉積)方法,但是隨著被處理物上之配線間 的微細化發展,CVD方法已逐漸無法形成條件充分的被 膜。亦即’利用CVD方法所形成的被膜是形成保角形狀 (conformal),因此並無法充分埋入狹窄的配線之間。 於是,針對如何在被處理物上形成SOG被膜的方法 進行了 一番探討。然而,在使用開放型的一般杯膜來形成 S0G膜的情況下,例如第3圖所示,形成在線與間隙圖案 部之間隙部分底部的SOG被膜與其他部分所形成的SOG 被膜,在膜質上會產生疏密的差異。一般而言,形成在線 與間隙圖案部之間隙部分底部的SOG膜較稀疏,其他部 分則較緊密。 此處所謂的疏密差異是指例如在將「緊密部分」的密 度設爲1 00的情況下,「稀疏部分」的密度爲5 0,即使 是相同的SOG被膜,也會引起由於所塗布之部分的不同 以致密度有所不同的現象。 尤其在配線間的縱橫比較高的情況下,此疏密化現象 尤爲顯著。縱橫比較低的情況下,則幾乎不會發生疏密化 現象。 本紙張尺度適用中國國家標準(CNS ) A4規格(2】〇X297公釐) (請先閲讀背面之注意事項再填寫本頁)
、1T 經濟部智慧財產局員工消費合作社印製 -4- 1221099 A7 __ B7 _ 五、發明説明(2 ) 此外,在使用一般杯膜(開放型杯膜)的情況下,通常 在高縱橫尺寸部分也是塗布1次SOG以形成被膜,因而 不易解決疏密差異的問題。 爲了解決上述問題,本案申請人在日本特開平7-22 75 68號公報中揭示了:使所要塗布的被處理物之旋轉 分成兩次來進行,第1旋轉與第2旋轉的間隔是設定爲第 1旋轉之旋轉時間的1 〇倍以上,但是如第4圖所示,疏 密差異的問題仍無法獲得解決,縱橫比較高的部位仍然較 爲稀疏。 【發明所欲解決的課題】 如上所述的疏密化現象,由於稀疏部分會明顯降低元 件的可靠性,因此本身爲半導體元件之心臟的閘極部分尤 爲重要。所謂「稀疏」是指在被膜內部含有微小的空隙, 空隙中的氣體會因爲SOG塗布後之熱處理步驟中的加熱( 亦即烘烤)而膨脹,以致在SOG被膜產生裂縫。一旦如此 ,便無法發揮SOG絕緣膜的功能。 因此,本案發明的目的在於提供一種可縮小疏密部位 之面積並降低疏密度,且在配線間爲〇. 1 3 μηι以下的微細 部位也可形成均一層間被膜的被膜形成方法。 【用以解決課題的手段】 有關於爲了解決上述課題的本案發明之被膜形成方法 是在將可旋轉的內杯配置於外杯內,並且利用個別的蓋體 本紙張尺度適用中.國國家標準(CNS ) Α4規格(210Χ297公釐) (請先閲讀背面之注意事項再填寫本頁) 訂 經濟部智慧財產局員工消費合作社印製 -5- 1221099 A7 B7 五、發明説明(3 ) 密封這些外杯及內杯的上面開口,而且內杯用蓋體是支撐 成可與內杯一體旋轉的旋杯式塗布裝置的前述內杯內設置 一形成有配線的被處理物,在此被處理物的表面塗布 SOG之後,利用蓋體密封內杯及外杯的上面開口,並且 在此狀態下使內杯旋轉,藉此使SOG均一地擴散,在進 行複數次前述塗布之後,利用熱處理裝置對於已塗布有 SOG的前述被處理物進行烘烤。 因此,使用旋杯式塗布裝置塗布SOG時,形成密閉 狀態的旋杯內雖會因爲旋轉而形成若干減壓狀態,卻可確 保SOG形成用塗布液的溶劑環境,且可在塗布當中避免 SOG被膜表面的乾燥情況,因此SOG並不會失去其流動 性而可進入微細的配線間。亦即,藉由維持減壓狀態及 SOG的流動性,SOG大半會被迫埋入配線間,因此可降 低SOG被膜的疏密度。 再者,爲了在塗布階段獲得SOG的預定被膜,藉由 塗布複數次(最好是2至3次),即可減少在配線間之縱橫 比爲2以上之高縱橫比時便會產生不良效果的疏密差異。 例如,第1次塗布是形成薄薄的SOG膜厚,將所形成的 疏密區域(亦即疏密部位的面積)控制在最小限度,如此, 在進行第2次塗布前,實際上縱橫比已變小,因此可減少 疏密區域及疏密度。 而且,塗布步驟中的轉速是與其設定成以低速長時間 旋轉,倒不如設定成以高速(最好是3 000至5000rpm)短 時間(最好是1秒)旋轉較能降低疏密度。 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閱讀背面之注意事項再填寫本頁) 、訂 争· 經濟部智慧財產局員工消費合作社印製 -6 - 1221099 經濟部智慧財產局員工消費合作社印製 外杯 內杯 旋轉裝置 真空夾盤 回收通路 盡體 基板 A7 __B7 五、發明説明(4 ) 而且,烘烤的處理條件是將燒成溫度設定爲40(TC至 10 〇〇 °C,將燒成時間設定爲30分鐘至9〇分鐘,並且將熱 處理裝置內設定成氧氣較多的狀態,因此可促進S 0 G與 氧氣的反應,並且獲得疏密度得以降低的均一 SOG被膜 〇 【圖面的簡單說明】 第1圖是旋杯式塗布裝置的剖視圖。 第2圖是利用旋轉式杯膜塗布2次SOG後的被處理 物的剖視圖。 第3圖是利用一般杯膜塗布1次SOG後的被處理物 的剖視圖。 第4圖是疏密區域因縱橫比不同而產生之差異的剖視 圖。 【圖號說明】 1 2 3 4 5
6,7 W 本紙張尺度適用中國國家標準(CNS ) A4規格(210 X 297公釐) (請先閲讀背面之注意事項再填寫本頁)
1221099 A7 __ B7 五、發明説明(5 ) 【發明的實施形態】 (請先閱讀背面之注意事項再填寫本頁) 以下說明本發明的實施形態。第1圖是本發明實施所 使用的旋杯式塗布裝置的剖視圖,旋杯式塗布裝置是在環 狀外杯1內配置內杯2,並且將此內杯2安裝於旋轉裝置 3的軸,再使此內杯2以高速旋轉,並且在旋轉裝置3的 軸的上端設置用來吸附並固定半導體晶圓等之基板W的 真空夾盤4,在外杯1則形成有用來接收來自內杯2之排 出物(drain)的回收通路5。 第2圖是使用第1圖所示的旋杯式塗布裝置塗布2次 SOG後的被處理物的部分剖視圖。如圖面所示,第1次塗 布的SOG厚度是利用第3圖所示之一般杯膜塗布1次後 之厚度的一半以下,使所形成的疏密區域變小。然後,利 用第2次的SOG塗布來補足預定SOG被膜的厚度。如此 一來,稀疏的部分會變得很小。 然後,塗布有SOG的被處理物會被搬運至相鄰的熱 處理裝置,並且進行連續的熱處理。熱處理裝置有可一次 處理複數片被處理物的批次式以及每次處理一片的單片式 兩種。 經濟部智慧財產局員工消费合作社印製 單片式熱處理裝置是將被處理物載置於平板狀的加熱 裝置上來加熱,但由於熱源僅爲平板,因此在處理室內的 溫度分布會產生不均的現象,而不易進行均一的處理。另 一方面,批次式是將熱源配置成包圍裝置的周圍,因此可 藉由輻射熱均一地加熱處理室內。而且,藉由加熱30分 鐘以上,被處理物間的溫度不均便可獲得解決。 本紙張尺度適用中國國家標隼(CNS ) A4規格(210X297公釐) -8- 1221099 A7 __B7_^_ 五、發明説明(6 ) 熱處理裝置的處理條件是在可獲得輻射熱的狀態下, 將燒成溫設定爲400至1 000 °C,將處理時間設定爲30分 鐘以上90分鐘以下。而且,SOG溶液如果是在送入氧氣 或蒸氣(s t e a m ),使氧氣比大氣中多的狀態下進行熱處理 ,會使SOG溶液引起脫水縮合反應,而且H20會蒸發, 並且殘留緻密化的Si02膜。 SOG是溫度越高越容易活性化,因此會變得容易與 〇2結合,而可促進反應並且緻密化,但是若溫度過高, 會對於配線造成損害,因此並不理想。此外,所謂氧氣較 多的狀態是指在加熱處理室內中,存在有比大氣中更多( 至少在2 1 %以上)的氧氣。 【發明效果】 根據本發明,藉由使用旋杯式塗布裝置,使SOG在 被處理物上以高速旋轉,並且分成2至3次塗布多層,則 在縱橫比較高的配線間也可將絕緣膜的疏密化控制在最小 限度而塗布SOG。再者,藉由利用可獲得輻射熱的批次 式熱處理裝置,以400至1 000 °C、30分鐘以上90分鐘以 下,且在氧氣較多的狀態下燒成前述被處理物,即可獲得 疏密差異得以降低的緻密平坦化膜。 本紙張尺度適用中國國家標準(CNS ) Α4規格(210Χ297公釐) (請先閲讀背面之注意事項再填寫本頁}
*1T φ. 經濟部智慧財產局員工消費合作社印製 -9 -
Claims (1)
1221099 A8 B8 C8 D8 々、申請專利範圍 第9 1 1 22048號專利申請案 中文申請專利範圍修正本 民國92年12月19日修正 (請先閲背背面之注意事項再填寫本頁) 1 · 一種被膜形成方法,是在將可旋轉的內杯配置於外 杯內,並且利用個別的蓋體密封這些外杯及內杯的上面開 口’而且內杯用蓋體是支撐成可與內杯一體旋轉 '的旋杯式 塗布裝置的前述內杯內設置一形成有配線的被處理物,在 此被處理物的表面塗布SOG之後,利用蓋體密封內杯及 外杯的上面開□,並且在此狀態下使內杯旋轉,藉此使 SOG均一地擴散,在反覆複數次此塗布操作之後,利用 熱處理裝置烘烤塗布有S 0 G的前述被處理物。 2.如申請專利範圍第1項所記載的被膜形成方法,其 中,前述塗布中的轉速是3000至5000 rpm。 3 .如申請專利範圍第1項或第2項所記載的被膜形成 方法,其中,前述被處理物上的配線間之縱橫比爲2以上 〇 經濟部智慧財產局員工消費合作社印製 4 .如申請專利範圍第1項或第2項所記載的被膜形成 方法,其中,前述烘烤的處理條件是將燒成溫度設定爲 400 °C至100 (TC,將燒成時間設定爲30分鐘至90分鐘, 並且將熱處理裝置內設定成氧氣較多的狀態。 表紙張尺度適用中國國家標準(CNS ) A4規格(210X:297公嫠)
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JPH0330453A (ja) * | 1989-06-28 | 1991-02-08 | Sony Corp | 平坦化絶縁膜の形成方法 |
US5312512A (en) * | 1992-10-23 | 1994-05-17 | Ncr Corporation | Global planarization using SOG and CMP |
JP3280791B2 (ja) | 1994-02-17 | 2002-05-13 | 東京応化工業株式会社 | 塗膜形成方法 |
US5453406A (en) * | 1994-06-13 | 1995-09-26 | Industrial Technology Research Institute | Aspect ratio independent coating for semiconductor planarization using SOG |
US5554567A (en) * | 1994-09-01 | 1996-09-10 | Taiwan Semiconductor Manufacturing Company Ltd. | Method for improving adhesion to a spin-on-glass |
JP2994228B2 (ja) * | 1995-04-24 | 1999-12-27 | 東京応化工業株式会社 | 回転カップ式塗布装置及び塗布方法 |
JP3824334B2 (ja) * | 1995-08-07 | 2006-09-20 | 東京応化工業株式会社 | シリカ系被膜形成用塗布液及び被膜形成方法 |
US5985363A (en) * | 1997-03-10 | 1999-11-16 | Vanguard International Semiconductor | Method of providing uniform photoresist coatings for tight control of image dimensions |
KR19990039100A (ko) * | 1997-11-10 | 1999-06-05 | 윤종용 | Sog를 이용한 반도체 장치의 절연막 제조방법 |
KR100314806B1 (ko) * | 1998-10-29 | 2002-02-19 | 박종섭 | 스핀온글래스막형성방법 |
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JP2003100740A (ja) | 2003-04-04 |
US6872418B2 (en) | 2005-03-29 |
US20030059533A1 (en) | 2003-03-27 |
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