TW593756B - Method of forming chromium coated copper for printed circuit boards - Google Patents

Method of forming chromium coated copper for printed circuit boards Download PDF

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Publication number
TW593756B
TW593756B TW089120719A TW89120719A TW593756B TW 593756 B TW593756 B TW 593756B TW 089120719 A TW089120719 A TW 089120719A TW 89120719 A TW89120719 A TW 89120719A TW 593756 B TW593756 B TW 593756B
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Taiwan
Prior art keywords
copper
layer
item
chromium
patent application
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TW089120719A
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English (en)
Inventor
Jiang-Tao Wang
John Callahan
Dan Lillie
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Gould Electronics Inc
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/06Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/16Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
    • H05K1/167Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed resistors
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/02Pretreatment of the material to be coated
    • C23C14/024Deposition of sublayers, e.g. to promote adhesion of the coating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/02Pretreatment of the material to be coated
    • C23C14/024Deposition of sublayers, e.g. to promote adhesion of the coating
    • C23C14/025Metallic sublayers
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C28/00Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
    • C23C28/30Coatings combining at least one metallic layer and at least one inorganic non-metallic layer
    • C23C28/32Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one pure metallic layer
    • C23C28/321Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one pure metallic layer with at least one metal alloy layer
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    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C28/00Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
    • C23C28/30Coatings combining at least one metallic layer and at least one inorganic non-metallic layer
    • C23C28/32Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one pure metallic layer
    • C23C28/322Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one pure metallic layer only coatings of metal elements only
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C28/00Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
    • C23C28/30Coatings combining at least one metallic layer and at least one inorganic non-metallic layer
    • C23C28/32Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one pure metallic layer
    • C23C28/322Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one pure metallic layer only coatings of metal elements only
    • C23C28/3225Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one pure metallic layer only coatings of metal elements only with at least one zinc-based layer
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C28/00Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
    • C23C28/30Coatings combining at least one metallic layer and at least one inorganic non-metallic layer
    • C23C28/34Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates
    • C23C28/345Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates with at least one oxide layer
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    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C28/00Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
    • C23C28/30Coatings combining at least one metallic layer and at least one inorganic non-metallic layer
    • C23C28/34Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates
    • C23C28/345Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates with at least one oxide layer
    • C23C28/3455Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates with at least one oxide layer with a refractory ceramic layer, e.g. refractory metal oxide, ZrO2, rare earth oxides or a thermal barrier system comprising at least one refractory oxide layer
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/388Improvement of the adhesion between the insulating substrate and the metal by the use of a metallic or inorganic thin film adhesion layer
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/0179Thin film deposited insulating layer, e.g. inorganic layer for printed capacitor
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0302Properties and characteristics in general
    • H05K2201/0317Thin film conductor layer; Thin film passive component
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0335Layered conductors or foils
    • H05K2201/0355Metal foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0361Stripping a part of an upper metal layer to expose a lower metal layer, e.g. by etching or using a laser
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/12All metal or with adjacent metals
    • Y10T428/12431Foil or filament smaller than 6 mils
    • Y10T428/12438Composite

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Laminated Bodies (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Other Surface Treatments For Metallic Materials (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Chemical Treatment Of Metals (AREA)
  • Physical Vapour Deposition (AREA)

Description

五 、發明說明(】) 本發明係闕於一種處理 至銅箔之至少一側之方法。 法,更特別關於塗佈金屬 銅箱用於製造印刷電路^^ 需々要將銅箱附著至介電基材、,=印刷電路板時,一般 之洛片。雖然銅箔為極佳電j提供具尺寸和結構穩定性 題。例如,豸易被氧化和腐餘,體,但其使用存在固有問 軋,均對此類基材附著不良。,且銅自身無論製板或滾 或催化;|電基材分解。因此,且我們已知銅能狗加速 夕個保護層。 叙對銅箔表面施加一個或 我們知道,使鉻層沈積至銅 用。將薄鉻層沈積到銅表面冷對印刷電路板有多種應 法,另一種為真空沈積法。兩種方法,一種為電沈積 電沈積法有多種缺點。首,上 昂處理及廢除之環境有宝材’該方法使用難以及代價高 且低效。 ° ;斗。其次,該方法不精確,而 對於真空沈積法,為保證 之附著性。需要在直空沈:加鉻和銅之間有令人滿意 為克服此等以:,去氧化鋼。 ' 形成經金屬塗佈銅:::,本發明藉由真空沈積提供-種 程。 万法’而無需徹底嚴格之預處理製
第5頁 593/30 五、發明說明(2) 本發明之較佳且 法,其包括以 /、體貝施例提供一種塗佈金屬至銅層之方 表面穩定I f驟··對銅層表面塗佈穩定層,以使銅層 合物,且具^ ^疋層包括氧化鋅、氧化鉻、氧化鎳或其混 銅層之穩埃和約7〇埃間之厚度;然使金屬沈積至 鐵、銦、鋅、上,該沈積金屬選自由鋁、鎳、鉻、銅、 群。-種本文二^、銳、鵪、鍅、铜及其合金組成之 本發明另3 =明讀合金為鎳—鉻合金。 定層組成之片材 七:種由銅層和位於該銅表面上之穩 穩定層^提供氣相沈積金屬 埃間之厚度。然後在該 之ΪΪ明—個目的為提供用於製造印刷電路板之經鉻塗佈 本电明另—個目的兔担μ 鉻塗佈之銅層之方法為^ 一種由真空沈積法形成上述短 行徹底、嚴格洗该方法在沈積鉻前無需對銅表面; 本發明又一個目的為提供一 之方法。 、種使金屬真空沈積至鋼表面 本發明進—舟&说 _ ,自以下較佳具體實施例二:圖=續方:。 等及其它目的將更加明顯。 、加申請專利範圍,此 本發明對某些部分和各=置 布置以及較佳具體實施例 593756 五、發明說明(3) 採取實際形式,並由專利說明書詳述及形成部分之 明,其中·· 寸圖說 圖1為根據本發明將金屬塗佈至銅箔表面一 圖; 乃凌之示意 圖2為圖1流線2 - 2之擴展截面圖,以顯示銅箔 圖3為圖1流線3-3之擴展截面圖,以顯示圖2 ’ 定層之銅箔片;及 〃上具穩 圖4為圖1流線4-4之擴展截面圖,以顯示其 相沈積金屬之銅片。 /、“、、’侧具氣 圭具體實施例 本發明係關於將金屬塗佈至銅表面之方法。 ’’金屬’’指能夠由本文揭示方法真空沈積之金在本文中, 發明特別用於將鉻塗至銅箔上,並著重對其#及合金。本 但 應瞭解,所揭示方法亦可將其它金屬塗至^ ^出描述, 金 鎳、銅、鐵、銦、鋅、鈕、錫、飢、 Γ名上,如銘 螞、锆、鈕 可用兩種技術之一製造本發明使用之 製方法機械減小銅或鋼合金條或錠掣,。可用( 而製造電沈積箱片係首先將銅離子;;:製或 h f “、…· ..... ,尤積到旋轉陴0 積鋼_ t A極鼓 ^ ^ 有利用 該銅箔一般具有自約0 · 0 0 0 2英寸至约 。銅箔厚度有時用重量表示,本私明> 02英寸之幹 0 21 ΛΑ 1 , ^ ^ h 明之绽 P ^ % 厚 銦及其合 上,然後將經沈積猪自陰極剝離。^ ^ =到旋轉陰 發明。 沈積鋼箔右^ 用於本 度 1/8至、力14盎司/平方英尺(〇z/ft2) 片〜報
〜蕙夏或厚泠 "有約 逻。椏士 位有用 W756
之鋼落具有1/3、1/2或2盎司/平方英尺之重量。 電沈積銅箔具有光滑或光亮侧(鼓)和粗糙或 積生長前)侧。由本發明塗佈之稃定M / “、、/ (銅沈 =但有時用於雙側。#一個具體實施例中之 去塗佈之層係塗至該箔片之光亮侧。 ^月方 由本發明方法塗佈層覆蓋箱片之單側或 剖面分布表面"、"低剖面分布表面"或"才虽低剖面^表丰 面所用具體實施例包括使用具低剖面分布表面和極面 表面之猪片。在本文中’"標準剖面分布表面"指猪 H具大於10.2微米之Rtm(IPC_MF_i5〇F)。"低剖面分布表 =扎箱表面具小於10. 2微米之K ipc_mf_15〇f)。"極低 纠面分布表面”指剖面具有小於5· }微米之R^(Ipc—mf — = 0F)。Rtm(I PC-MF-15OF)之含義為自5個連續樣品測量之 =大峰-谷垂直尺寸,可用英格蘭、列斯特、朗克—泰勒— 赫森公司(Rank Tayl〇r H〇bs〇n,Ltd·,Leicester,
EngUnd)銷售之SURTR〇NIC(商標)3型剖面分布儀測量。 热於此藝者應瞭解,本發明不僅用於其表面上具穩定層 之銅猪,而且用於經沈積或附著其它基材之銅層,以及沈 積後或經附著至另一種基材之前或之後其表面塗佈穩定層 之銅層。此類基材包括但不限於聚醯亞胺(見美國專利第 5,685,970號及第5,681,443號,二者明確以參考之方式併 於本文)’其它聚合性基材、有機基材、鋁(參閱以參考方 式併於本文之美國專利第5,丨53, 〇5〇號),金屬基材(參閱 以參考方式併於本文之美國專利第5, 674, 596號)或銅和
第8頁 593756 五、發明說明(5) UVAR之層合物。 具$ ^ ^考附圖’其中顯示内容僅用於說明本發明之較佳 ^ -實施例’而未用以限制其範圍。圖1為用於將金屬塗 之=表面之一般連續製造方法丨〇示意圖,其顯示本發明 供二^具肢實施例。在所示之較佳具體實施例中,輥11提 圖、。5箱1 2 ^ 一般連續條帶。圖2為銅箔1 2之放大截面視 二5亥銅箔1 2具有光亮側1 4和烏澤側1 6。(為便於在圖中 σ兄明’銅箔1 2之烏澤側1 6顯得誇張。) 銅治、1 2較佳能夠經受第一清潔製程(在繪圖中指定為 &,以+自其表面除去氧化物。在所示之具體實施例中, 二=—2藉助導輥26輸入槽22,且繞於導輕24上。槽22内包 ‘=匕膜自銅,表面上移除之清潔溶液。較佳是用酸 ^ 2將氧化膜自銅㈣表面上移除。冑潔銅箔12之典型 中“ 包括10—80克/升之H2S04。在一個具體實施例 中,用50克/升ISCM將氧化銅自銅箔12除去。 f :潔製程20後,鉑猪經歷清清洗製程3 12上::下方布置噴洗元件32,並用水喷洗銅羯 面;Ϊ洗元件32下方布置之槽3“其收集喷洗水。 在>月潔製謂和清洗製程3〇後 40。鉑箔12導入槽42,且園婊^道, 、工疋衣私 導輕46與導親44定位。該槽42含有1周圍°銅兔12經由 個較佳具體實施例i該ί =溶液。在本發明一 用於電解溶液之鋅離子原;含辞離子和鉻離子。
ZnS〇4、ZnC〇3、ZnCr〇4等、。用於带解'?,其實例包括 ^^解溶液之鉻離子源可為 五、發明說明(6) 任:六,絡鹽或化合物,其實例包括Μ,、Cr〇3等。 佳:η解:谷液中鋅離子之濃度-般為約〇· 1至約2克/升,較 , 至約0 · 6克/升,更佳約0 · 4至約〇 · 5克/升。電解溶 L 子之濃度一般為約〇.3至約5克/升,較佳約0 5至 、,、勺3克/升’更佳約0.5至约1〇克/升。 · 積在2 :個具體實施例中,亦可使氧化鎳或鎳金屬自身沈 編鋅或氧化鉻或二者-起沈積形成穩定:。 用於电解洛液之鎳離子源可為任何一種以下物暂★甘 人 物:Ni2S04、NiC〇3等 為7種以下物1或其混合 升电解/谷液中錄離子之濃度一般為約〇· 2克/升至约U克/ 專一二具實:例中’可使用其它穩定劑層,如美國 考之f式二本 如約1至約50克/升 更佳約1 2至約1 8克 1較佳約4至約5, 、、曲:電解溶液可包含其它習知添加劑 /辰又之Na2S〇4,較佳約10至約20克/升 /升。該電解溶液之?11 一般為約3至約6 更佳約4 · 8至5 . 〇。 該電解溶液之溫度一般為 。。至爾,更佳約心=。:至約10°c,較佳約25 1二乂所示’陽極48與鋼落1 2各側相鄰布置,以认+扪 >白12電流密度。導輕46為陰極親,^布置—以給予銅 對陽極48施加能量時,由氧化 1、 由电源(未顯示) 沈積於銅箔12之铖A f/ u和乳化鉻組成之穩定層49 白12之經暴路先党側14和烏澤側16。圖3為光亮 593756 發明說明(7) 側1 4和烏澤側1 6具穩定層4 9之銅箔1 2截面圖。 該電流密度一般為約!至約丨〇〇安培/英尺;^ " 較佳約25至約50安培/英尺2,更佳約3〇安培 用多個陽極時,電流密度可在各陽極間變化。、 ‘心 更:=時ΓΓ為約1至約30秒,較佳約5至約2。秒, 處理時間‘ "3至固二體實施例t,於光亮或光滑側之總 1約5;^。自約3至約1〇秒,於烏澤側之總處理時間為約! 在一個具體實施例中,電解溶中 耳比為約0.2至約1〇…μ $于對鋅離子之莫 車乂佺約1至約5,更佳約1. 4。 χ明中,塗佈鋼箔1 2之穩定層4 9厚度俜介於 至約70埃之間,軔4认〇λ 予沒你"於約5埃 二/ 间 1乂佳約20埃至50埃之間。 天 f =述較佳具體實施例中,該 鋅組成。在本發明另_ 和氧化 士、、么从产 方面中,该穩疋層4 9只由惫儿 '。二:氧化鉻穩定層之浴化學和方法條件如下組 Η0克/升以〇3溶液, · 較佳5克/升CrOq pH-2 >谷液溫度:2 5 ίο-:。安培/英尺2進行5]。秒鐘 或次〉貝處理·· 1 0秒鐘 穩定製程40後,μ …Λ Λ 程,在圖中指定為50 ;穩定銅羯12經過清洗製 側,並將水噴至鋼;。噴洗元件52布置於㈣12之上下 ' >自12(具穩定層49)清洗’以自其去除任
第11頁 593756 五、發明說明(9) 及利範圍中,除非另外指明,所有份數和百分數均 以重1計,所有溫度均為攝氏度,所有壓力均為大氣壓。 將未電沈積處理之1/3去gi/# 益司/夬尺2銅箔雙側用穩定層如 下預處理。 穩定處理: 0.53 克 / 升鋅(如2ns〇) , 〇 R + 7 … 、謂4; ϋ· 6克/升鉻(如Cr03),1 1克/升 硫酸鈉 3 浴液p Η : 5. 〇
浴液溫度:42 °C 電流密度 電鍍時間 烏澤側8 - 1 5安培/英尺2 光亮側2 - 2 · 5安培/英尺2 光亮側:6 - 8秒 烏澤侧:3 - 4秒 然後如下將鉻塗佈至穩定層·· 鉻濺射: 測射機 功率:5-8千瓦 馨 線性速度Μ.4至2.2英尺/分鐘 鉻層厚度:烏澤側,1, 2 0 0埃 光澤側,1,3 0 0埃 一 實例2 »用銅鑛覆聚酿亞胺之雙側[丨8微米銅/ 5 〇微米聚醯亞胺薄 膜/5微米銅;該產品為一種由古德電子公司(G〇uld
第13頁 593756 五、發明說明(ίο)
Electronics Inc.)製造之Gould(商標)撓曲產物]’如下 進行處理: 穩定處理: 0.53克/升鋅(如ZnS04),〇·6克/升鉻(如Cr03,11克/升 硫酸鋅
浴液p Η : 5. 0 浴液溫度:4 2 °C 電流密度:2 5安培/英尺2,雙側 電鍍時間:單側或雙側:3-8秒 然後如下將鉻塗佈至穩定層: 鉻濺射: 1 4"測射機 功率:5-8千瓦 線性速度:1 · 8至2 · 8英尺/分鐘 鉻層厚度:1 8微米銅側’ 1,0 0 0埃 5微米銅侧’未塗佈鉻層 實例3 用銅鍍覆聚醯亞胺薄膜之雙側(1 8微米銅/5〇微米聚驢亞 胺薄膜/ 5微米銅··該產物為古德電子公司製造之Gou 1 d (商 標)撓曲產物),如下進行處理: 穩定處理: 5克/升鉻(如Cr03)
浴液pH : 2· 0 浴液溫度:25 °C
第14頁 593756 五、發明說明(11) 浸漬處理 然後如下將鉻塗佈至穩定層·· 鉻濺射: 14’’測射機 功率·· 5-8千瓦 線性速度:1 · 8至2. 8英尺/分鐘 鉻層厚度·· 1 8微米銅侧,1,〇 〇 〇埃 實例4
如下用穩定層預處理經電鍍於丨N VAr上之雙側8微米銅層 穩定處理: 〇·53克/升鋅(如ZnS04),0.6克/升絡(如Cr03),11克/升 硫酸鋼 浴液pH : 5. 〇 浴液溫度:4 2 °C 電流密度:2 5安培/英尺2 電錢時間· 3 - 4秒 然後如下將鉻塗佈至穩定層: 鉻濺射:
14π測射機 功率:5-8千瓦 線性速度· 1 · 8至2 · 8英尺/分鐘 鉻層厚度:8微米鋼側,丨,〇 〇 〇埃 以前所述為本發明之具體實施例。應瞭解,該具體實施 例僅作為說明描述,熟諳此藝者可在不離開本發明之主旨
第15頁 593756 五、發明說明(12) 和範圍内實施多種變動和修改。例如,如果製程1 0為電成 形製程之擴展,使其中生成純銅並引入製程流線1 0,那麼 可不需要清潔製程2 0。另外,雖然前述方法與銅有關進行 描述,但本發明亦可將金屬(如鉻)塗佈至經塗於聚合物之 銅上。所有此類修改和變動均應處於本發明申請專利範圍 及其等價範圍内。
第16頁

Claims (1)

  1. 593756 • , .· '、: ·, ..::厂 ΐ.Γ'·, -μ--'· , ,. 卜.‘ r i ' 93. 5. -7 /?.; Γ〆 Β案號 89120719 年 5> 月 曰__ 丨、.…'...-.....-.. 六、申請專利範® 1 . 一種塗佈金屬至銅層之方法,其包括以下步驟: 由塗佈穩定層使銅層表面穩定,該穩定層包括氧化鋅、 氧化鉻、鎳、氧化錄或其混合物,且具有約5埃和約7 0埃 間之厚度;及 將一金屬沈積至該銅層之穩定化表面上,該金屬選自由 ‘ 鋁、鎳、鉻、銅、銦、鋅、鈕、錫、釩、鎢、锆、鉬及其 合金組成之群。 2 · 根據申請專利範圍第1項之方法,其中該銅層係選自 ’ 由銅箔,位於聚醯亞胺上之銅層及位於INVAR上之銅層組 -成之群。 3. 根據申請專利範圍第2項之方法,其中該金屬為鉻。讀. 4. 根據申請專利範圍第3項之方法,其中該穩定層係由 氧化鋅和氧化鉻之混合物組成。 5 . 根據申請專利範圍第4項之方法,其中該銅箔具有閃 光側和烏澤側,且該鉻係塗佈至該烏澤側或該閃光側。 6 . 根據申請專利範圍第3項之方法,其中該穩定層係由~ 氧化鉻組成。 . 7. 根據申請專利範圍第6項之方法,其中該銅箔具有閃 光側和烏澤側,且該鉻係塗佈至該烏澤側或該閃光侧。 8. 根據申請專利範圍第1項之方法,其中該銅層為一般 連續條帶,且該穩定層和氣相沈積金屬係以一般連續方法¢1 塗佈。 9. 一種片材,該片材包括: 一銅層;
    O:\66\66668-930507.ptc 第19頁 593756 _案號 89120719 年芗月 日_魅_ 六、申請專利範圍 一位於該銅表面之穩定層,該穩定層包括氧化鋅、氧化 鉻或其混合物,且具有5埃和7 0埃間之厚度;及 一位於該穩定層上之氣相沈積金屬。 10. 根據申請專利範圍第9項之片材,其中該金屬係選 自由鋁、鎳、鉻、銅、鐵、銦、鋅、钽、錫、釩、鎢、 锆、鉬及其合金組成之群。 11. 根據申請專利範圍第1 0項之片材,其中該金屬為 鉻。 12. 根據申請專利範圍第1 1項之片材,其中該穩定層係 由氧化鋅和氧化鉻組成。 13. 根據申請專利範圍第1 1項之片材,其中該穩定層係❻ 由氧化鉻組成。 14. 根據申請專利範圍第1 0項之片材,其中該鉻具有5 0 埃至5,0 0 0埃間之厚度。 15. 根據申請專利範圍第1 0項之片材,其中該氣相沈積 金屬係濺射於該穩定層上。 — 16. 根據申請專利範圍第1 5項之片材,其中該穩定層係 以電沈積法塗佈。 17. 根據申請專利範圍第1 5項之片材,其中該穩定層係 以機械浸潰方法塗佈。 18. 根據申請專利範圍第1 0項之片材,其中該銅箔係經 電沈積。
    O:\66\66668-930507.ptc 第20頁
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Families Citing this family (19)

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Publication number Priority date Publication date Assignee Title
EP1261241A1 (en) * 2001-05-17 2002-11-27 Shipley Co. L.L.C. Resistor and printed wiring board embedding those resistor
US7129161B2 (en) 2001-07-19 2006-10-31 Trikon Holdings Limited Depositing a tantalum film
US6589413B2 (en) * 2001-08-09 2003-07-08 Gould Electronics Inc. Method of making a copper on INVAR® composite
JP4379854B2 (ja) * 2001-10-30 2009-12-09 日鉱金属株式会社 表面処理銅箔
JP2004040073A (ja) * 2002-01-11 2004-02-05 Shipley Co Llc 抵抗器構造物
US6824880B1 (en) 2003-05-15 2004-11-30 Ga-Tek, Inc. Process for improving adhesion of resistive foil to laminating materials
KR100593741B1 (ko) * 2004-08-02 2006-06-30 도레이새한 주식회사 구리 삼성분계 화합물을 타이층으로 사용한연성회로기판용 적층구조체
US20060086620A1 (en) * 2004-10-21 2006-04-27 Chase Lee A Textured decorative plating on plastic components
WO2008054366A2 (en) * 2005-09-08 2008-05-08 Bilello John C Amorphous metal film and process for applying same
JP5479668B2 (ja) * 2006-12-26 2014-04-23 古河電気工業株式会社 表面処理銅箔
US8303792B1 (en) 2007-08-29 2012-11-06 Magnecomp Corporation High strength electrodeposited suspension conductors
WO2009063764A1 (ja) * 2007-11-14 2009-05-22 Nippon Mining & Metals Co., Ltd. 抵抗膜層を備えた銅箔
WO2010044391A1 (ja) 2008-10-14 2010-04-22 日鉱金属株式会社 電気抵抗膜付き金属箔及びその製造方法
CN102365165A (zh) 2009-03-25 2012-02-29 吉坤日矿日石金属株式会社 带电阻膜的金属箔及其制造方法
ES2338627B1 (es) 2009-08-28 2011-06-08 Zanini Auto Grup S.A. Tratamiento de piezas con zonas de acabado metalizado de aspecto diferenciado.
JP2012201980A (ja) 2011-03-28 2012-10-22 Jx Nippon Mining & Metals Corp 電気抵抗層付き金属箔及びその製造方法
WO2012132592A1 (ja) 2011-03-28 2012-10-04 Jx日鉱日石金属株式会社 電気抵抗膜を備えた金属箔及びその製造方法
WO2012132593A1 (ja) 2011-03-31 2012-10-04 Jx日鉱日石金属株式会社 電気抵抗層を備えた金属箔及び同金属箔を用いたプリント回路用基板
TWI745566B (zh) * 2017-03-29 2021-11-11 美商康寧公司 基板塗覆設備和方法

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2662957A (en) 1949-10-29 1953-12-15 Eisler Paul Electrical resistor or semiconductor
BE503299A (zh) 1949-10-29
US3368919A (en) 1964-07-29 1968-02-13 Sylvania Electric Prod Composite protective coat for thin film devices
US3489656A (en) 1964-11-09 1970-01-13 Western Electric Co Method of producing an integrated circuit containing multilayer tantalum compounds
US3621442A (en) 1968-11-07 1971-11-16 Allen Bradley Co Terminal connection of electronic devices
US3742120A (en) 1970-10-28 1973-06-26 Us Navy Single layer self-destruct circuit produced by co-deposition of tungstic oxide and aluminum
US3864825A (en) 1972-06-12 1975-02-11 Microsystems Int Ltd Method of making thin-film microelectronic resistors
FR2210881B1 (zh) 1972-12-14 1976-04-23 Honeywell Bull
US3857683A (en) 1973-07-27 1974-12-31 Mica Corp Printed circuit board material incorporating binary alloys
US4164607A (en) 1977-04-04 1979-08-14 General Dynamics Corporation Electronics Division Thin film resistor having a thin layer of resistive metal of a nickel, chromium, gold alloy
US4203025A (en) 1977-08-19 1980-05-13 Hitachi, Ltd. Thick-film thermal printing head
DE2833919C2 (de) 1978-08-02 1982-06-09 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Herstellung von elektrischen Schichtschaltungen auf Kunststoffolien
JPS587077A (ja) 1981-07-02 1983-01-14 東急建設株式会社 サツシの取付方法
JPS5895301A (ja) 1981-12-01 1983-06-06 Matsushita Electric Ind Co Ltd レ−ザ−全反射鏡
DE3151630C2 (de) 1981-12-28 1986-07-03 Endress U. Hauser Gmbh U. Co, 7867 Maulburg Feuchtigkeitsfühler und Verfahren zu seiner Herstellung
US4396900A (en) 1982-03-08 1983-08-02 The United States Of America As Represented By The Secretary Of The Navy Thin film microstrip circuits
JPS5916084A (ja) 1982-07-19 1984-01-27 Nitto Electric Ind Co Ltd 入力タブレツト
JPS60119784A (ja) 1983-12-01 1985-06-27 Kanegafuchi Chem Ind Co Ltd 絶縁金属基板の製法およびそれに用いる装置
JPS6135973A (ja) 1984-07-30 1986-02-20 Hitachi Ltd 感熱ヘツド
US4892776A (en) 1987-09-02 1990-01-09 Ohmega Electronics, Inc. Circuit board material and electroplating bath for the production thereof
US5243320A (en) 1988-02-26 1993-09-07 Gould Inc. Resistive metal layers and method for making same
US5038132A (en) 1989-12-22 1991-08-06 Texas Instruments Incorporated Dual function circuit board, a resistor element therefor, and a circuit embodying the element
US5039570A (en) 1990-04-12 1991-08-13 Planar Circuit Technologies, Inc. Resistive laminate for printed circuit boards, method and apparatus for forming the same
US5172473A (en) 1990-05-07 1992-12-22 International Business Machines Corporation Method of making cone electrical contact
KR100297179B1 (ko) 1990-07-02 2002-12-26 올린 코포레이션 구리또는구리계합금호일을크롬-아년이온으로전착처리하여당해호일에내변색성을부여하는방법및구리또는구리계합금호일에변색방지막을전착시키기위한염기성전해질수용액
JP2932397B2 (ja) * 1990-11-14 1999-08-09 日本真空技術株式会社 プリント基板の製造方法
JP2794968B2 (ja) 1991-02-22 1998-09-10 富士ゼロックス株式会社 通信装置
JP2537108B2 (ja) 1991-03-14 1996-09-25 日本電解株式会社 プリント回路用銅箔及びその製造方法
US5128008A (en) 1991-04-10 1992-07-07 International Business Machines Corporation Method of forming a microelectronic package having a copper substrate
JP2755058B2 (ja) * 1991-11-14 1998-05-20 日立化成工業株式会社 印刷配線板用金属箔とその製造法並びにこの金属箔を用いた配線板の製造法
TW230290B (zh) * 1991-11-15 1994-09-11 Nikko Guruder Foreer Kk
JPH0787270B2 (ja) 1992-02-19 1995-09-20 日鉱グールド・フォイル株式会社 印刷回路用銅箔及びその製造方法
JPH05275817A (ja) * 1992-07-17 1993-10-22 Japan Energy Corp 銅箔の製造方法
JP2717911B2 (ja) * 1992-11-19 1998-02-25 日鉱グールド・フォイル株式会社 印刷回路用銅箔及びその製造方法
US5552234A (en) * 1993-03-29 1996-09-03 Japan Energy Corporation Copper foil for printed circuits
JPH09500762A (ja) 1993-07-21 1997-01-21 オーメガ エレクトロニクス インコーポレーテッド バリア層を伴う回路基板材料
TW326423B (en) 1993-08-06 1998-02-11 Gould Inc Metallic foil with adhesion promoting layer
JP3329572B2 (ja) * 1994-04-15 2002-09-30 福田金属箔粉工業株式会社 印刷回路用銅箔およびその表面処理方法
TW289900B (zh) 1994-04-22 1996-11-01 Gould Electronics Inc
JP3527786B2 (ja) 1995-03-01 2004-05-17 株式会社日立グローバルストレージテクノロジーズ 多層磁気抵抗効果膜および磁気ヘッド
US5863666A (en) 1997-08-07 1999-01-26 Gould Electronics Inc. High performance flexible laminate
US5885436A (en) * 1997-08-06 1999-03-23 Gould Electronics Inc. Adhesion enhancement for metal foil
US5908544A (en) * 1997-09-04 1999-06-01 Gould Electronics, Inc. Zinc-chromium stabilizer containing a hydrogen inhibiting additive
US6132589A (en) * 1998-09-10 2000-10-17 Ga-Tek Inc. Treated copper foil and process for making treated copper foil

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KR100352280B1 (ko) 2002-09-12
CN1315591A (zh) 2001-10-03
EP1123988B1 (en) 2008-07-09
EP1123988A1 (en) 2001-08-16
JP3311338B2 (ja) 2002-08-05
DE60039407D1 (de) 2008-08-21
US6489034B1 (en) 2002-12-03
CA2322363C (en) 2004-09-14
JP2001220689A (ja) 2001-08-14
CN1280448C (zh) 2006-10-18
KR20010077901A (ko) 2001-08-20

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