TW419750B - Composition and process for forming electrically insulating thin films - Google Patents
Composition and process for forming electrically insulating thin films Download PDFInfo
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- TW419750B TW419750B TW087104836A TW87104836A TW419750B TW 419750 B TW419750 B TW 419750B TW 087104836 A TW087104836 A TW 087104836A TW 87104836 A TW87104836 A TW 87104836A TW 419750 B TW419750 B TW 419750B
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- 238000000034 method Methods 0.000 title claims abstract description 34
- 239000010409 thin film Substances 0.000 title claims description 10
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- 239000011248 coating agent Substances 0.000 claims abstract description 10
- 230000003993 interaction Effects 0.000 claims abstract description 10
- 239000010408 film Substances 0.000 claims description 59
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 47
- 239000007789 gas Substances 0.000 claims description 26
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical group CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 claims description 13
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- 229920003209 poly(hydridosilsesquioxane) Polymers 0.000 claims description 6
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- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 claims 2
- 229910052814 silicon oxide Inorganic materials 0.000 claims 2
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 claims 1
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- 238000001704 evaporation Methods 0.000 abstract description 3
- -1 argon sesquioxetane Chemical compound 0.000 description 16
- 239000000377 silicon dioxide Substances 0.000 description 16
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- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
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- 238000004528 spin coating Methods 0.000 description 9
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
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- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
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- 238000005227 gel permeation chromatography Methods 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
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- 238000001035 drying Methods 0.000 description 2
- 238000010292 electrical insulation Methods 0.000 description 2
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- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000002243 precursor Substances 0.000 description 2
- 229910052702 rhenium Inorganic materials 0.000 description 2
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 2
- 239000004576 sand Substances 0.000 description 2
- 150000004756 silanes Chemical class 0.000 description 2
- ZYVYEJXMYBUCMN-UHFFFAOYSA-N 1-methoxy-2-methylpropane Chemical compound COCC(C)C ZYVYEJXMYBUCMN-UHFFFAOYSA-N 0.000 description 1
- OMAUSUKGZFZKBA-UHFFFAOYSA-N 5,5,6-trimethylheptane-1,6-diamine Chemical compound CC(C)(N)C(C)(C)CCCCN OMAUSUKGZFZKBA-UHFFFAOYSA-N 0.000 description 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- MDBCDXQNSQPIMD-UHFFFAOYSA-N C1(=CC=CC=2C3=CC=CC=C3CC12)[Si](O[Si](C1=CC=CC=2C3=CC=CC=C3CC12)(C1=CC=CC=2C3=CC=CC=C3CC12)C1=CC=CC=2C3=CC=CC=C3CC12)(C1=CC=CC=2C3=CC=CC=C3CC12)C1=CC=CC=2C3=CC=CC=C3CC12 Chemical compound C1(=CC=CC=2C3=CC=CC=C3CC12)[Si](O[Si](C1=CC=CC=2C3=CC=CC=C3CC12)(C1=CC=CC=2C3=CC=CC=C3CC12)C1=CC=CC=2C3=CC=CC=C3CC12)(C1=CC=CC=2C3=CC=CC=C3CC12)C1=CC=CC=2C3=CC=CC=C3CC12 MDBCDXQNSQPIMD-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 239000002671 adjuvant Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- DYBUJQJSUPEUGR-UHFFFAOYSA-N argon platinum Chemical compound [Ar].[Pt] DYBUJQJSUPEUGR-UHFFFAOYSA-N 0.000 description 1
- WHEATZOONURNGF-UHFFFAOYSA-N benzocyclobutadiene Chemical compound C1=CC=C2C=CC2=C1 WHEATZOONURNGF-UHFFFAOYSA-N 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 239000013590 bulk material Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000012700 ceramic precursor Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
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- 238000004132 cross linking Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- FJWRGPWPIXAPBJ-UHFFFAOYSA-N diethyl(dimethyl)silane Chemical compound CC[Si](C)(C)CC FJWRGPWPIXAPBJ-UHFFFAOYSA-N 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
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- 238000004090 dissolution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 239000003759 ester based solvent Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 238000010571 fourier transform-infrared absorption spectrum Methods 0.000 description 1
- 238000005194 fractionation Methods 0.000 description 1
- 150000004687 hexahydrates Chemical class 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 239000012771 household material Substances 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
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- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 238000012966 insertion method Methods 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
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- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000006068 polycondensation reaction Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 239000010948 rhodium Substances 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- SCPYDCQAZCOKTP-UHFFFAOYSA-N silanol Chemical compound [SiH3]O SCPYDCQAZCOKTP-UHFFFAOYSA-N 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 238000000935 solvent evaporation Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- CZDYPVPMEAXLPK-UHFFFAOYSA-N tetramethylsilane Chemical compound C[Si](C)(C)C CZDYPVPMEAXLPK-UHFFFAOYSA-N 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H01L21/02134—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material comprising hydrogen silsesquioxane, e.g. HSQ
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B3/00—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties
- H01B3/18—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of organic substances
- H01B3/30—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of organic substances plastics; resins; waxes
- H01B3/46—Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of organic substances plastics; resins; waxes silicones
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/312—Organic layers, e.g. photoresist
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Organic Chemistry (AREA)
- Wood Science & Technology (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Formation Of Insulating Films (AREA)
- Paints Or Removers (AREA)
- Organic Insulating Materials (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Description
M濟部中央樣隼局員工消費合作.杜印策 419750 A7 -_______B7 五、發明説明(i 本發明係關於一種形成電絕緣薄膜之組合物’及一種形 成電絕緣薄膜之方法。更特定言《,本發明係關於形成具 有低介電常數之絕緣薄膜之组合物與方法。 已知砂石之絕緣薄膜係在電子裝置中作為保護層及作為 電絕緣層使用。包含樹脂與溶劑之组合物濕式塗料,係一 般性地且纽地採用於此4請巾。例如,美料利4,756,奶 陳述一種以碎石薄膜塗覆電子裝置之方法,其係將氩珍倍 半氧㈣脂之溶劑溶液塗敷於基材±,蒸發溶㉟,然後在 150°C至聊。(:之溫度下加熱,α達成轉化成似陶竞之梦 石。 當裝置具有縮小之尺寸且變得更高度地整合時,此等絕 緣層需要較低之介電常數。例如,日本應用物理學會及相 關學會第43版擴大摘要,第654頁,摘要26哪已報告藉由氮 矽倍半氧燒樹脂之熟化所獲得薄膜’具有介電常數為Μ。 但是,低,2.7之介電常數為在具有設計尺度比〇ι8微米窄 义下-代高度積體電路中之電絕緣薄膜所需要的。迄今尚 未發現安^且兩度可再現地在適合高度積體電路之電絕緣 薄膜中、例如在碎石薄膜中,產生此種低介電常數之方 法。 ,另一方面,一般已知絕緣薄膜之介電常數’可經由將此 薄膜作成多孔性結構而予降低。例如,美國專利,⑼已 報告經由使用氫㈣半氧燒樹脂之烘烤產物作為高度積體 料中之介電|,以形成具有多孔性結構之絕緣薄膜。但 疋,此項專利並未揭示形成多孔性結構之特定方法。因 -4- 本錄尺度適財ϋϋ家料(CNS )崎格(mx297公瘦 (請先閱請背面之注意事續再填寫本頁) 衣. 419750 A7 -----—______B7 五、發明説明(2 ) 此,,如上文所概述,能夠形成具有低介電常數(例如具有介 電常數實質上低於2.7)之電絕緣薄膜之組合物與方法,迄今 仍然未知。 、本發明(-項目的係為提供一種可製造具有低介電常數 之電絕緣薄膜之組合物與方法。 本發明係關於-種可形成絕緣薄膜之组合物,其包含 ㈧電絕緣可熟化樹脂,選自包括電絕緣可熟化無機樹 脂與電絕緣可熟化有機樹脂, ⑻溶劑:及 (C)至少一種溶劑可溶之物質(排除使用於成份⑻之溶 劑),其在加熱時或經由與樹脂(A)之交互作用’可在 0C至800 C之溫度範圍内產生氣體或進行揮發作用。 該可形成絕緣薄膜之组合物包含 (A) 電絕緣可熟化無機或有機樹脂, (B) 溶劑,及 (C) 至少一種洛劑可溶之物質(排除使用於成份(b)之溶 劑),其在加熱時或經由與樹脂(A)之交互作用,可在〇它 至800 C之溫度範圍内產生氣體或進行揮發作用。 經濟部中央標準局員工消費合作社印製 ---------氏------T -'-Ύ-'0 (請先閱讀背面之注意事項再填寫本頁) 樹脂(A)可為無機性或有機性,然其並不重要,只要其為 溶劑可溶者、於塗敷後可藉加熱予以熟化、並提供絕緣作 用者即可。此樹脂之實例為烷氧基矽烷之部份水解物,無 機樹脂,譬如矽石先質樹脂、例如氫矽倍半氧烷樹脂;及 聚醯亞胺樹脂,氟碳樹脂,苯并環丁締樹脂及氟化聚烯丙 基醚a此树脂可採取單一樹脂或兩種或多種樹脂混合物之 __ -5- 本紙張又度適用中國國家標準(CNS ) A4規格(210X29^楚) ' 經濟部中央橾準局員工消費合作社印装 419750 A7 __ _B7 五、發明説明(3 ). 形式。會熟化成矽石之樹脂對於提供特別良好之電絕緣性 質而了係較佳者。於矽石先質樹脂中,特佳係使用於非逆 蚀刻方法中之氫矽倍半氧烷樹脂。 於本發明中使用之氫矽倍半氧烷樹脂為聚矽氧烷,其主 要骨架係由三官能性矽氧烷單位HSi〇3/2所組成,且為一種 具有通式(HSl〇3")n之聚合物,其中下標η為整數。從分子 結構觀點見之,此氫矽倍半氧烷樹脂包括所謂梯型聚矽氧 烷與籠型聚矽氧烷0梯型聚矽氧烷之末端可經由下列基團 封端:例如,羥基,三有機矽烷氧基、譬如三^基矽烷氧 基,或二有機氫矽烷氧基、譬如二甲基氫矽烷氧基。 製備氫矽倍半氧烷樹脂之方法,事實上乃已知,且通常 涉及三氣矽烷之水解作用,及接著進行聚縮合作用(參閱美 國專利第3,615,272號,及日本專利申請案特許公開(公開或 未經審查),特開昭59-189126 (189,120/1984)與特開昭6〇_ 42426 (42,426/1985))。 於本發明中使用之溶劑(Β)應為可溶解樹脂(Α)、然却不會 引致其中之化學變化者,同樣地,其並不重要。可用溶; 之實例為芳族溶劑,譬如甲苯、二甲苯等;脂族溶劑,譬 如己烷、庚烷 '辛烷等;酮溶劑,譬如甲基乙基酮、曱基 異丁基酮等;脂族酯溶劑,譬如醋酸丁酯、醋酸異戍酯 等;及矽酮溶劑,譬如直鏈之曱基矽氧烷,例如六曱基二 矽氧烷與1山3,3-四甲基二矽氧烷,環狀矽氧烷,例: 1,1,3,3,5,5,7,7-八甲基四環矽氧烷與丨,3,5,7•四甲基四環矽氧 烷,及矽烷,譬如四甲基矽烷與二甲基二乙基矽烷。甲基 __ - 6 · 本纸张尺度適用中國國家標準(CNS ) Α4規格(210x2^缝) ---— (請先閱讀背面之注意事項再填寫本頁) —訂 419750 A7 B7 經濟部中央標準局貝工消費合作社印繁 五、發明説明(4 ) 異丁基網與珍氧溶劑係為較佳的。此溶劑可採取單一溶劑 或兩種或多種溶劑混合物之形式。 成份(C)之功能在於降低電絕緣薄膜之介電常數。成份(c) 係於樹脂(A)熟化期間或之後’經由產生氣體或進行揮發作 用·較佳亦自系統中排出·以行使此項功能。此氣體產生或 揮發作用,係藉由加熱或與樹脂⑷之交互作用而引致。此 氣體產生或揮發作用,較佳亦自系統中排出,其效應係為 在電絕緣薄膜中留下空隙或自由空間’並藉以較低絕緣薄 膜之介電常數。使氣體自成份(c)產生之溫度,必須可與用 以形成電絕緣薄膜之方法相容,且係在Ot至8〇〇。〇之範圍 内,較佳為25°c至400。(:。由於大部份溶劑會在塗覆於基材 上之後立即蒸發,且自成份(c)產生氣體較佳係於其後發 生,故自成份(C)產生氣體之開始溫度,較佳係高於溶劑⑻ 之沸點。 由成份(C)所涵蓋之揮發物質,舉例如下,但不限於有 機固體’譬如聯;^、秦、慈等,及油類,譬如碎g同油等。 當氩矽倍半氧烷樹脂作為樹脂(A)使用時,矽酮油較佳係以 相容性考量為基礎》 藉由自行分解而產生氣體之成份,舉例如下,但不限 於’有機過氧化物,譬如過氧化二苯甲醯等。 經由與樹脂交互作用而產生氣體之成份,可舉例如下, 胺類’例如N,N,N|,N,-四甲基-l,6-己二胺,當樹脂含有細 時’於此種情況中係產生氫氣。 成份(D)係於視需要之情況下,當其變得必須在相對較低 本紙張尺度適用中國國家標準(CNS ) Αϋ規格(210X 297公釐} ;----^-----1^ (請先閏讀背面之注意事項再填寫本頁) 419750 A7 B7 經濟部中央標準局員工消费合作社印掣 五、發明説明( 溫度下先行引致樹脂(A)之部份交聯時使用。當氫矽倍半氧 烷樹脂作為(A)使用時,成份(D)較佳為鉑觸媒’譬如氫氟 鉑酸或铑觸媒。對每1,000,000重量份之樹脂(A)而言,此等 觸媒通常係於1至500重量份下使用。此外,依特定狀況而 定,一種輔助劑,例如安定劑、譬如界面活性劑,可存在 於组合物中’以幫助成份(c)分散。 S氩硬倍半氧炫樹脂作為(A)使用時,加熱此组合物會造 成電絕緣薄膜之形成,例如矽石薄膜。於本文中使用之妙 石係指二氧化矽(Si〇2),且包括非晶質矽石及未完全不含矽 燒醇及/或氫之非晶質矽石》在添加陶瓷先質之情況中, 此矽石亦含有其相應之化合物。 可使用於根據本發明方法中之基材之實例為陶瓷基材、 各種金屬基材及電子裝置,較佳為電子裝置。 一種形成電絕緣薄膜之方法,包括 ⑴將可形成絕緣薄膜之組合物塗覆於基材之表面,該组合 物包含 / (A) 電絕緣可熟化無機或有機樹脂, (B) 溶劑,及 (C) 至少一種溶劑可溶之物質,排除使用於成份⑻之溶 劑,其在加熱時或經由與樹脂(A)之交互作用,可在〇 °(:至800°(:之溫度範圍内產生氣體或進行揮發作用; (Π)蒸發溶劑(B);及 (III)接著加熱基材,以在該樹脂(A)熟化期間或熟化後,自 成份(C)產生氣體》 -8 - 木紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (婧先閱讀背面之注意事項再填寫本頁j I Λ衣·
-'1T 且可舉例如下:靜置於 在減壓下或於氣流下。 由於溶劑係在旋轉期間 419750 A7 B7 五、發明说明(6) 於此方法中,係將包含成份(八)至((::)之可形成絕緣薄膜之 組合物’塗覆於基材表面上,然後蒸發溶劑(B),及接著將 基材加熱,以在樹脂⑷熟化期間或熟化後,自成份(c)產 生範體。可應用之塗覆方法之實例為旋轉塗覆、浸潰、喷 霧及流動塗覆。 使溶劑(B)蒸發之技術並不重要 環境或高溫下,及在空氣中乾燥 當使用旋轉塗覆作為塗覆技術時 被逐出’故乾燥時間通常不需要。 加熱溫度並不重要,只要使用可引致成份(c)氣化之溫度 即可。但是’當期望電絕緣薄膜熔解以使基材平面化時, 加熱必須進行至高於樹脂(A)熔點之溫度。再次地,用於此 加熱之裝置並不重要’且一般已知之加熱器譬如烘箱、熱 板等,均可使用於本發明。 於此方法中,係使成份(C)氣化,並將其一部份逐出系 統,其會在電絕緣薄膜中造成相應形成之空隙與多孔性結 構或自由空間。 另一種形成電絕緣薄膜之方法,包括 (I)將可形成絕緣薄膜之組合物塗覆於基衬之表面,該組合 物包含 (A) 電絕緣可熟化無機或有機樹脂, (B) 溶劑,及 (C) 至少一種溶劑可落之物質’排除使用於成份⑻之溶 劑,其在加熱時或經由與樹脂(A)之交互作用,可在〇 -9- {請先閱讀背面之注意事項再填寫本頁)
*1T 經濟部中央標準局員Η消費合作社印袈 - 千 ΪΓ 419750 A7 B7 經濟部中央標準局員工消费合作社印製 五、發明説明(7) °C至800°C之溫度範圍.内產生氣體或進行揮發作用; (Π)蒸發溶劑(B); (III) 接著在溫度低於會自成份(C)提供徹底氣體產生之溫& 下,加熱基材,並達成樹脂(A)之部份熟化;及 (IV) 然後完成自成份(C)之氣體產生。 此方法包括以可形成絕緣薄膜之組合物塗覆基材,該組 合物包含如上述之成份(A)至(C),接著蒸發溶劑(B),然後 加熱基材。用以達成溶劑蒸發及加熱之方法,可與上文第 一種方法相同。 然後使樹脂(A)在低於會造成自成份(C)徹底或完全產生氣 體之溫度下部份熟化。在此步驟後,係接著完成自成份(c) 之氣體產生。用以引致此樹脂(A)部份熟化之方法,包括在 成份(A)將會熟化之溫度下靜置一段規定時間,曝露至紫外 線輻射或電子束中等等》自成份(C)產生氣體,可藉由例如 在減壓下加熱基材而完成。 该可形成絕緣薄膜之组合物,具有熟化成低介電常數絕 緣薄膜之能力,且因此可用於需要此種性質之應用上。根 據本發明之組合物,特別可用於半導體裝置中之中間絕緣 薄膜之形成* 宥例 提出下述實例,以使熟悉此項技藝之人士者可瞭解及認 知本文中所陳述之發明,應明瞭的是,此等實例不應用以 限制申請專利範圍中所定義之本發明範圍。 矽石之轉化率係使用F〇urier變換紅外線吸收光譜分析,經 _ -10. 本紙張^度適用中國國家標準(CNS ) A4規格(21〇x297公缓)"' ----" (請先閲讀背面之注意事項再填寫本頁) 訂 419750 A7 B7 _ 五、發明説明(8)
由度量薄膜中之殘留SiH%加以評估a於薄膜中之殘留SiH % ’係使用旋轉塗覆後之100% SiH量計算而得。 介電常數係於25°C與1百萬赫茲下,對於在具有電阻係數 為1〇·2 Ω · cm之矽晶圓上所形成之試樣進行度量。此度量 法係藉由插入法、使用鋁電極及阻抗分析器進行操作a 膏例1 氩矽倍半氧烷樹脂係藉日本專利公告(K〇k〇ku)特公眧47_ 31838 (美國專利第3,615,272號)之實例1中所述之方法合成。 藉凝膠滲透層析(GPC)分析氫矽倍半氧烷樹脂產物,獲得數 目平均分子量為1,540,及重量平均分子量為77〇5。根據曰 本專利申請案特許公開(公開專利案或未經審查)Hei6_ 157760 (157,760/1"4)(美國專利第5,4i6,l9〇號)之實例i中所述之 方法’使氩碎倍半氧坑樹脂接受分子量分級分離。藉Gpc 为析所回收溶離份(_Ή-樹脂溶離份")中之氫碎倍半氧虎樹 脂’獲得數目平均分子量為5,830,及重量平均分子量為 U,200。在GPC度量法中之條件為:
儀器:802A,得自Tosoh公司 管柱:G3000/G4000/G5000/G6000 載體溶劑:甲苯 柱溫:30°C 分子量標準物:聚苯乙締 檢測:差示折射計 試樣:2重量%固體(甲苯溶液) 將H-樹脂溶離份溶解於甲基異丁基酮中,以製備^重量 _ -11 - 本紙浪尺度適用中國國家標準(CMS ) A4規格(210^97公竣)~~~'--- (诗先閱讀背面之注意事項再填寫本頁) I木· Ί訂 經濟部中央標準局員工消费合作社印製 419750 A7 B7 9 五、發明説明( 請 先 閱 讀 背 δ 之 注 意 事 項 再 填 % 本 頁 % (固體)溶液。於其中添加10重量%聯苯,以甲基異丁基 酮溶液為基準,以及1〇〇 ppm重量之氩氣鉑酸六水合物以 H-樹脂溶離份為基準。製造具有6,4〇〇埃厚度之薄膜,其方 式是將溶液旋轉塗覆於矽晶圓上’在5〇〇rpm之初步旋轉下 歷經3秒,然後在3,〇〇〇 rpm之主要旋轉下歷經1〇秒,接著在 室溫下靜置ίο分鐘。將晶圓於空氣流中、在25(rc石英烘箱 中烘烤1小時’移除並使其在室溫下靜置1〇分鐘。此時, 薄膜在甲基異丁基酮中之溶解度係低於旋轉塗覆後者。使 晶圓在400°C石英烘箱中、於含丨〇 ppm氧之氮氣流下退火丨小 時’取出I使其在室溫下靜置丨〇分鐘。在薄膜中之殘留别只 %為78%,確認轉化至矽石確已發生。於薄膜中未發現異 常、意即裂缝等《此矽石薄膜之介電常數為24。 f例2 經濟部中央標準局員工消費合作社印裝 使實例1中製成之溶離份’溶解於甲基異丁基酮中,以製 備22重1%(固體)溶液。於其中添加卯爪重量之n,n,N, N,· 四甲基-1,6-己二胺’以甲基異丁基酮溶液為基準。在其製 備後’ 1即將此溶液旋轉塗覆於碎晶圓上,在印⑺之初 步旋轉下歷經3秒,然後在3,〇〇〇 rpm之主要旋轉下歷經 秒。此時薄膜在甲基異丁基酮中顯示低溶解度。在室溫下 靜置10分鐘,獲得具有6,11〇埃厚度之薄膜。將晶圓於空氣 流下、在〗00°C石英烘箱中烘烤1小時,移除並使其在室溫 下靜置10分鐘。此時,薄膜顯示在甲基異丁基酮申幾乎無 溶解。然後,使晶圓在400°C石英烘箱中,於含10 ppm氧之 氮氣流下退火1小時,取出並使其在室溫下靜置1〇分鐘。 -12- 本紙張尺度適用中國國家標準(CNS ) Α4規格(2丨ΟΧ297公爱) /Π 9750 Α7 Β7 五、發明説明(1〇) 在薄膜t之殘留siH%為32%,確認轉化至矽石確已發生β 於薄膜中未發現異常、意即裂縫等。此矽石薄膜之介電常 數為2.4。 將實例1中所製成之Η-樹脂溶離份溶解於甲基異丁基酬 中’以製備22重量% (固體)溶液。於其中添加5〇 ppm重量 之過氧化二苯甲醯,以甲基異丁基酮溶液為基準。製造具 有6,100埃厚度之薄膜,其方式是將溶液旋轉塗覆於矽晶圓 上,在500 rpm之初步旋轉下歷經3秒,然後在3 〇〇〇印⑺之主 要旋轉下歷經10秒,接著在室溫下靜置丨〇分鐘β將晶圓於 芝氣流下,在15〇eC石英烘箱中烘烤1小時,移除並使其在 至m下靜置1〇分鐘。此時,薄膜在甲基異丁基辆中之溶解 度係低於旋轉塗覆後者。使晶圓在4〇〇它石英烘箱中、於含 10 ppm乳之氮氣流下退火1小時,取出並使其在宣溫下靜置 10分鐘。在薄膜中之殘留SiH%為41%,確認轉化至矽石確 已發生》於薄膜中未發現異常、意即裂縫等。此矽石薄膜 之介電常數為2.4。 實例4 氟化聚缔丙基醚樹脂,係根據第十二屆國際几幻多階互 連會議之1995會刊第U6頁上所述之方法合成。藉Gpc分析 才4脂產物’獲得數目平均分子量為2,54〇,及重量平均分子 量為9,390。使此樹脂溶解於甲基異丁基酮中,以製備%重 量% (固體)溶液。於其中添加1〇重量%聯苯,以曱基異丁 基嗣溶液為基準。製備具有6,120埃厚度之薄膜,其方式是 -13- 本紙張尺度適用中國國家標準(CNS ) Α4規格(210X297公楚) (請先閲讀背面之注意事項再填寫本頁) 、?τ 經濟部中央標準局員工消費合作社印製 419750 A7 B7 五、發明説明(Μ) {請先聞讀背面之注意事項再填舄本頁} 將溶液旋轉塗覆於妙晶回上’在500 rpm之初步旋轉下歷經3 秒,然後在3,000 rpm之主要旋轉下歷經1〇秒,接著在室溫下 靜置10分鐘。將晶圓於空氣流下,在250°C石英烘箱中烘烤 1小時,移除並使其在室溫下靜置1〇分鐘。此時,薄摸在 甲基異丁基酮中之溶解度係低於旋轉塗覆後。使晶圓在4〇〇 C石英烘箱中、於含1〇 ppm氧之氮氣流下退火1小時,取出 並在室溫下保持10分鐘,發現薄膜在甲基異丁基酮中之溶 解度已遭受進一步減退β此薄膜具有介電常數為2 4。 典較實例τ 將實例1中所製成之H-樹脂溶離份溶解於甲基異丁基_ 中’以製備22重量%(固體)溶液。製造具有6,078埃厚度之 薄膜’其方式是將溶液旋轉塗覆於矽晶圓上,在5〇〇 rpm之 初步旋轉下歷經3秒,然後在3,〇〇〇 φΙΏ之主要旋轉下歷經1〇 秒’接著在室溫下靜置10分鐘β使晶圓在40〇°C石英烘箱 中、於含10 ppm氧之氮氣流下退火1小時,取出並使其在室 溫下保持10分鐘。在薄膜中之殘留SiH%為75%,確認轉化 至石夕石確已發生,於薄膜中發現裂縫之產生。此矽石薄膜 之介電常數為2.8。 绥濟部中央標準局員工消費合作社印装 比較實W 2 將實例1中所製成之H-樹脂溶離份溶解於甲基異丁基酮 中’以製備35重量%(固體)溶液。製造具有13,200埃厚度之 薄膜*其方式是將溶液旋轉塗覆於矽晶圓上,在500 rpm之 初步旋轉下歷經3秒,然後在2,000 rpm之主要旋轉下歷經1〇 秒’接著在室溫下靜置1〇分鐘。使晶圓在400t石英烘箱 -14 - 本紙張尺度適用中國國家標準(CMS ) A4規格(210.X 297公釐) 4^9750 A7 B7 12 五、發明説明( 中、於含10 ppm氧之氮氣流下退火1小時,取出並在室溫下 保持10分鐘。在薄膜中之殘留SiH%為75% ,確認轉化至碎 石確已發生’於薄膜中發現裂縫產生。此 常數為2‘卜 此砂石薄膜之介電 (請先閱讀背面之注意事項再填寫本頁)
經濟部中央標準局員工消費合作社印製 -15- 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐)
Claims (1)
- 419T50 A8 B8 C8 D8 洛劑(B)為嗣溶 經濟部中央標準局員工消费合作社印裝 中請專利範圍 ι 一種形成電絕緣薄膜之組合物,其包含 (A)電絕緣可熟化樹脂’選自電絕緣可熟化無機樹脂 電絕緣可熟化有機樹脂, 5 ⑻溶劑,及 (C)至少一種溶劑可溶之物質,選自 (1)在0 C至80(TC之溫度下加熱時會產生氣體之物質. (H)經由與樹脂(A)之交互作用會產生氣體之物質,或 (iii)在〇t至800eC範圍之溫度下進行揮發作用之物質' 2.如申請專利範圍第丨項之組合物,其中樹脂(⑸為氫矽倍 半氧烷樹脂·> ° 3·如申請專利範園第丨項之組合物,其中溶劑係選自由芳 族溶劑;脂族溶劑;酮溶劑;脂族酯溶劑;矽氧溶劑及 妙燒所组成之群。 4.如申請專利範圍第1項之組合物,其中 劑D 5. 如申請專利範圍第4項之組合物,其中溶劑為甲基異丁 基酮。 6. 如申請專利範圍第丨項之組合物,其中溶劑為矽氧溶 劑。 7. 如申請專利範圍第i項之組合物,其另外包含(D)熟化· 加速觸媒。 8. 如申請專利範圍第7項之组合物,其中(D)係選自鉑化合 物或過渡金屬化合物。 9·如申請專利範圍第1項之組合物,其中成份(c)為(i)在〇 -16- 本紙張尺度適用申國圉家樣隼(CNS ) A4規格(21〇X297公釐) In - ------ -HI. ]— I I - --- - I I Γ Ηςτ f請先閲碛背面之注意事項再填本I} 經濟部中央棣準局貝工消費合作社印装 Α8 Β8 C8 D8 π、申請專利範圍 °C至80(TC之溫度下加熱時會產生氣體之物質。 10.如申請專利範圍第9項之組合物,其中成份(c)為有機過 氧化物》 Η.如申請專利範園第i項之组合物,其中成份(c)為⑼經由 與樹脂(A)之交互作用會產生氣體之物質。 12.如申清專利範圍第丨丨項之組合物,其中樹脂(八)為氫矽 倍半氧烷樹脂,而成份(C)為胺。 13·如申請專利範圍第1項之组合物,其中成价(C)為(iii)在〇 C至800°C範圍之溫度下進行揮發之物質β Μ.如申請專利範圍第13項之组合物,其中成份(c)係選自 由聯苯、莕、蒽及碎酮油所組成之群。 15. —種形成電絕緣薄膜之方法,其包括 (I) 將申請專利範圍第1項之電絕緣組合物塗覆於基材 之表面; (II) 蒸發溶劑(B);及 (III) 接著加熱基材,以在該樹脂(A)熟化期間或熟化後, 自成份(C)產生氣體。 16. 如申請專利範圍第15項之方法,其中基材為電子裝置β 17·如申請專利範圍第15項之方法,其中樹脂(Α)為氫矽倍 半氧燒樹脂。 18· —種形成電絕緣薄膜之方法,其包括 (I)以可形成絕緣薄膜之組合物塗覆基材之表面,該組 合物包含 (Α)電絕緣可熟化無機或有機樹脂, ____-17- 本紙張尺度逋用中國國家標準(CNS ) Α4規格(210Χ297公釐) I - —II · 私 I - I H (請先閲讀背面之注意事項再填寫本頁) 、1· ο 5 7 9 41 ABCD 六、申請專利範園 (B)溶劑,及 (c)至少一種溶劑可溶之物質,排除使用於成份(B)之 溶劑’其在加熱時或經由與樹脂(A)之交互作用, 可在〇 C至800°c之溫度範圍内產生氣體或進行揮發 作用; Λ (Π)蒸發溶劑(Β); (III) 接著在溫度低於會自成份(c)提供徹底氣體產生之溫 度下’加熱基材’並達成樹脂之部份熟化;及 (IV) 然後完成自成份(c)之氣體產生。 19. 如申請專利範圍第〖8項之方法,其中基材為電子裝置。 20. 如申請專利範圍第18項之方法,其中樹脂(A)為氫矽倍 半氧烷樹脂》 一, f請先聞讀背面之注意事項再填寫本頁) M濟部中央標準局員工消費合作社印製 I張 -紙 本 準 標 家 國 國 中 用 適 8 1 釐 公 7 ft T.t 印 申請曰期 II 案 號 87104836 ., 類 別 it Tr/tvxfT (以上各櫊由本局填註)Λ4 C4 419750 ^/^9^6月說明書修正本 雲I專利説明書 發明 新型 發明 創作形成電絕緣薄膜之組合物及方法 英文 COMPOSITION AND PROCESS FOR FORMING ELECTRICALLY INSULATING THIN FILMS 姓 名 國 籍 住、居所i國籍 住,居所 (事務所)彦 司昭利I林勝村 1* 9- οα 4. 佐佐木基 5. 澤清隆 裝 1,2·3·4·5‘均曰本 1. 曰本國千葉縣市原市西柚須台1丁目6號 2. 曰本國千葉縣市原市青葉台2丁目20-2 3. 曰本國千葉縣市原市東立見台3丁目1-14 4. 曰本國千葉縣市原市茅原台4-55-1 5. 曰本國千葉縣市原市西柚須台1 丁目6號 曰本商道康寧特雷矽力康股份有限公司 曰本 曰本國東京都千代田區丸之内1-1-3 AIG大道4樓 田邊英一 本纸张足度適圬中確w家捸準() Λ4ϋ格(2丨(丨公斧 訂 線
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TWI404469B (zh) * | 2004-03-17 | 2013-08-01 | Dow Corning Toray Silicone | 用於光學裝置之金屬基電路基板及該基板之製法 |
Families Citing this family (19)
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JPH1140558A (ja) * | 1997-07-22 | 1999-02-12 | Sony Corp | 誘電体膜の製造方法 |
US6231989B1 (en) | 1998-11-20 | 2001-05-15 | Dow Corning Corporation | Method of forming coatings |
TW508975B (en) * | 1999-03-29 | 2002-11-01 | Seiko Epson Corp | Composition, film manufacturing method, as well as functional device and manufacturing method therefor |
JP2001214127A (ja) | 2000-01-31 | 2001-08-07 | Dow Corning Toray Silicone Co Ltd | 電気絶縁性薄膜形成性樹脂組成物、および電気絶縁性薄膜の形成方法 |
JP2001247819A (ja) * | 2000-03-03 | 2001-09-14 | Dow Corning Toray Silicone Co Ltd | 電気絶縁性架橋薄膜形成性有機樹脂組成物、および電気絶縁性架橋薄膜の形成方法 |
JP2001291427A (ja) * | 2000-04-06 | 2001-10-19 | Dow Corning Toray Silicone Co Ltd | 電気絶縁性薄膜形成性樹脂組成物、および電気絶縁性薄膜の形成方法 |
US6605993B2 (en) | 2000-05-16 | 2003-08-12 | Fujitsu Limited | Operational amplifier circuit |
US6271273B1 (en) * | 2000-07-14 | 2001-08-07 | Shipley Company, L.L.C. | Porous materials |
WO2002031596A1 (en) | 2000-10-12 | 2002-04-18 | University Of North Carolina At Chapel Hill | Co2-processes photoresists, polymers, and photoactive compounds for microlithography |
US6740685B2 (en) * | 2001-05-30 | 2004-05-25 | Honeywell International Inc. | Organic compositions |
JP3886779B2 (ja) | 2001-11-02 | 2007-02-28 | 富士通株式会社 | 絶縁膜形成用材料及び絶縁膜の形成方法 |
WO2003060979A2 (en) * | 2002-01-15 | 2003-07-24 | Honeywell International Inc. | Organic compositions for low dielectric constant materials |
JP4092220B2 (ja) * | 2003-01-31 | 2008-05-28 | Necエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
US8901268B2 (en) | 2004-08-03 | 2014-12-02 | Ahila Krishnamoorthy | Compositions, layers and films for optoelectronic devices, methods of production and uses thereof |
JP2009060007A (ja) * | 2007-09-03 | 2009-03-19 | Sekisui Chem Co Ltd | シルセスキオキサン系絶縁膜の製造方法 |
EP2216380A1 (en) * | 2007-11-16 | 2010-08-11 | Sumitomo Chemical Company, Limited | Coating liquid used in coating method for discharging coating liquid through slit-shaped discharge outlet |
US8557877B2 (en) | 2009-06-10 | 2013-10-15 | Honeywell International Inc. | Anti-reflective coatings for optically transparent substrates |
US8864898B2 (en) | 2011-05-31 | 2014-10-21 | Honeywell International Inc. | Coating formulations for optical elements |
WO2016167892A1 (en) | 2015-04-13 | 2016-10-20 | Honeywell International Inc. | Polysiloxane formulations and coatings for optoelectronic applications |
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US3615272A (en) * | 1968-11-04 | 1971-10-26 | Dow Corning | Condensed soluble hydrogensilsesquioxane resin |
JPS59189126A (ja) * | 1983-04-13 | 1984-10-26 | Fujitsu Ltd | ポリジハイドロジエンシロキサンの製造方法 |
JPS6042426A (ja) * | 1983-08-19 | 1985-03-06 | Fujitsu Ltd | ポリジハイドロジェンシロキサンの製法 |
US4756977A (en) * | 1986-12-03 | 1988-07-12 | Dow Corning Corporation | Multilayer ceramics from hydrogen silsesquioxane |
US5380553A (en) * | 1990-12-24 | 1995-01-10 | Dow Corning Corporation | Reverse direction pyrolysis processing |
US5840774A (en) * | 1991-02-28 | 1998-11-24 | Research Foundation Of State University Of New York | Low density microporous polymers and process |
US5238787A (en) * | 1991-04-22 | 1993-08-24 | Dow Corning Corporation | Photodelineable coatings from hydrogen silsesquioxane resin |
JP3153367B2 (ja) * | 1992-11-24 | 2001-04-09 | ダウ・コ−ニング・コ−ポレ−ション | ポリハイドロジェンシルセスキオキサンの分子量分別方法 |
US5548159A (en) * | 1994-05-27 | 1996-08-20 | Texas Instruments Incorporated | Porous insulator for line-to-line capacitance reduction |
US5618878A (en) * | 1995-04-07 | 1997-04-08 | Dow Corning Corporation | Hydrogen silsesquioxane resin coating composition |
TW367273B (en) * | 1996-12-20 | 1999-08-21 | Dow Corning | Method of producing low dielectric ceramic-like materials |
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1997
- 1997-03-31 JP JP09647697A patent/JP3415741B2/ja not_active Expired - Fee Related
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1998
- 1998-03-30 KR KR1019980010949A patent/KR19980080834A/ko active IP Right Grant
- 1998-03-30 DE DE69807770T patent/DE69807770T2/de not_active Expired - Fee Related
- 1998-03-30 SG SG1998000661A patent/SG74621A1/en unknown
- 1998-03-30 EP EP98105810A patent/EP0869516B1/en not_active Expired - Lifetime
- 1998-03-31 US US09/052,379 patent/US6074695A/en not_active Expired - Fee Related
- 1998-03-31 US US09/120,384 patent/US6149966A/en not_active Expired - Fee Related
- 1998-05-20 TW TW087104836A patent/TW419750B/zh active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI404469B (zh) * | 2004-03-17 | 2013-08-01 | Dow Corning Toray Silicone | 用於光學裝置之金屬基電路基板及該基板之製法 |
Also Published As
Publication number | Publication date |
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US6074695A (en) | 2000-06-13 |
SG74621A1 (en) | 2000-08-22 |
KR19980080834A (ko) | 1998-11-25 |
JPH10283843A (ja) | 1998-10-23 |
EP0869516B1 (en) | 2002-09-11 |
US6149966A (en) | 2000-11-21 |
JP3415741B2 (ja) | 2003-06-09 |
EP0869516A1 (en) | 1998-10-07 |
DE69807770D1 (de) | 2002-10-17 |
DE69807770T2 (de) | 2003-05-22 |
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