TW398136B - High speed readout architecture for analog storage - Google Patents
High speed readout architecture for analog storage Download PDFInfo
- Publication number
- TW398136B TW398136B TW087120266A TW87120266A TW398136B TW 398136 B TW398136 B TW 398136B TW 087120266 A TW087120266 A TW 087120266A TW 87120266 A TW87120266 A TW 87120266A TW 398136 B TW398136 B TW 398136B
- Authority
- TW
- Taiwan
- Prior art keywords
- cell
- pair
- multiplexer
- signal
- array
- Prior art date
Links
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- 238000005070 sampling Methods 0.000 claims description 27
- 230000002596 correlated effect Effects 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 8
- 210000000352 storage cell Anatomy 0.000 claims description 7
- 230000003213 activating effect Effects 0.000 claims description 3
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Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/987,131 US6366320B1 (en) | 1997-12-08 | 1997-12-08 | High speed readout architecture for analog storage arrays |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW398136B true TW398136B (en) | 2000-07-11 |
Family
ID=25533061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW087120266A TW398136B (en) | 1997-12-08 | 1998-12-07 | High speed readout architecture for analog storage |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6366320B1 (https=) |
| EP (1) | EP1038390B1 (https=) |
| JP (1) | JP4444499B2 (https=) |
| KR (1) | KR100403290B1 (https=) |
| AU (1) | AU1453599A (https=) |
| DE (1) | DE69827034T2 (https=) |
| TW (1) | TW398136B (https=) |
| WO (1) | WO1999030484A1 (https=) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6847399B1 (en) * | 1998-03-23 | 2005-01-25 | Micron Technology, Inc. | Increasing readout speed in CMOS APS sensors through block readout |
| US7674293B2 (en) * | 2004-04-22 | 2010-03-09 | Facet Solutions, Inc. | Crossbar spinal prosthesis having a modular design and related implantation methods |
| US6463566B1 (en) * | 2000-02-04 | 2002-10-08 | Massachusetts Institute Of Technology | Dynamic double sampling charge integrator |
| US7154548B2 (en) * | 2001-01-29 | 2006-12-26 | Valley Oak Semiconductor | Multiplexed and pipelined column buffer for use with an array of photo sensors |
| US7088394B2 (en) * | 2001-07-09 | 2006-08-08 | Micron Technology, Inc. | Charge mode active pixel sensor read-out circuit |
| US6982758B2 (en) * | 2001-07-23 | 2006-01-03 | Micron Technology, Inc. | Flexy-power amplifier: a new amplifier with built-in power management |
| US6838787B2 (en) * | 2002-01-16 | 2005-01-04 | Eastman Kodak Company | Variable bandwidth correlated doubling sampling circuits for image sensors |
| US7068319B2 (en) * | 2002-02-01 | 2006-06-27 | Micron Technology, Inc. | CMOS image sensor with a low-power architecture |
| EP1429542A1 (en) * | 2002-12-11 | 2004-06-16 | Dialog Semiconductor GmbH | Fixed pattern noise compensation with low memory requirements |
| US6953923B2 (en) * | 2003-02-18 | 2005-10-11 | Omnivision Technologies, Inc. | CMOS image sensor having reduced numbers of column readout circuits |
| US7821555B2 (en) * | 2003-04-21 | 2010-10-26 | Micron Technology, Inc. | Multi path power for CMOS imagers |
| US20040246354A1 (en) * | 2003-06-04 | 2004-12-09 | Hongli Yang | CMOS image sensor having high speed sub sampling |
| KR100656666B1 (ko) * | 2004-09-08 | 2006-12-11 | 매그나칩 반도체 유한회사 | 이미지 센서 |
| US20060170788A1 (en) * | 2005-02-03 | 2006-08-03 | Transchip, Inc. | Image sensor with balanced switching noise |
| US7545834B1 (en) | 2006-01-10 | 2009-06-09 | Pericom Semiconductor Corp. | Multiple channel switch using differential de-mux amplifier and differential mux equalizer |
| US7342212B2 (en) * | 2006-03-31 | 2008-03-11 | Micron Technology, Inc. | Analog vertical sub-sampling in an active pixel sensor (APS) image sensor |
| US20070285547A1 (en) * | 2006-05-30 | 2007-12-13 | Milligan Edward S | CMOS image sensor array optimization for both bright and low light conditions |
| JP4458113B2 (ja) * | 2007-05-02 | 2010-04-28 | ソニー株式会社 | データ転送回路、固体撮像素子、およびカメラシステム |
| US20090091648A1 (en) * | 2007-10-09 | 2009-04-09 | Shengmin Lin | Multi-resolution Image Sensor Array with High Image Quality Pixel Readout Circuitry |
| US20110286271A1 (en) * | 2010-05-21 | 2011-11-24 | Mediatek Inc. | Memory systems and methods for reading data stored in a memory cell of a memory device |
| US9191582B1 (en) * | 2011-04-29 | 2015-11-17 | Bae Systems Information And Electronic Systems Integration Inc. | Multi-mode high speed sensor |
| KR102410898B1 (ko) * | 2021-02-23 | 2022-06-22 | 광주과학기술원 | 전류 모드 라인 드라이버 장치 및 이의 동작 방법 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4237383A (en) * | 1978-09-20 | 1980-12-02 | Rca Corporation | High speed loading of output register of CCD array system |
| US4322752A (en) * | 1980-01-16 | 1982-03-30 | Eastman Technology, Inc. | Fast frame rate sensor readout |
| US4734583A (en) * | 1986-10-16 | 1988-03-29 | General Electric Company | Readout circuit for dual-gate CID imagers with charge sharing corrected for subtractive error |
| US4862276A (en) * | 1988-10-07 | 1989-08-29 | Wang Samuel C | Push-pull readout of dual gate cid arrays |
| US5351309A (en) * | 1992-06-30 | 1994-09-27 | National Science Council | Image edge sensor |
| US5471515A (en) | 1994-01-28 | 1995-11-28 | California Institute Of Technology | Active pixel sensor with intra-pixel charge transfer |
| US5736886A (en) * | 1996-02-06 | 1998-04-07 | Analog Devices, Inc. | Input clamping method and apparatus with a correlated double-sampling circuit |
| US5877715A (en) * | 1997-06-12 | 1999-03-02 | International Business Machines Corporation | Correlated double sampling with up/down counter |
-
1997
- 1997-12-08 US US08/987,131 patent/US6366320B1/en not_active Expired - Lifetime
-
1998
- 1998-11-09 JP JP2000524917A patent/JP4444499B2/ja not_active Expired - Fee Related
- 1998-11-09 DE DE69827034T patent/DE69827034T2/de not_active Expired - Lifetime
- 1998-11-09 EP EP98958504A patent/EP1038390B1/en not_active Expired - Lifetime
- 1998-11-09 AU AU14535/99A patent/AU1453599A/en not_active Abandoned
- 1998-11-09 WO PCT/US1998/023872 patent/WO1999030484A1/en not_active Ceased
- 1998-11-09 KR KR10-2000-7006125A patent/KR100403290B1/ko not_active Expired - Fee Related
- 1998-12-07 TW TW087120266A patent/TW398136B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| AU1453599A (en) | 1999-06-28 |
| DE69827034T2 (de) | 2005-09-08 |
| US6366320B1 (en) | 2002-04-02 |
| JP2001526498A (ja) | 2001-12-18 |
| KR100403290B1 (ko) | 2003-10-30 |
| DE69827034D1 (de) | 2004-11-18 |
| EP1038390A4 (en) | 2001-02-28 |
| JP4444499B2 (ja) | 2010-03-31 |
| KR20010032808A (ko) | 2001-04-25 |
| EP1038390A1 (en) | 2000-09-27 |
| EP1038390B1 (en) | 2004-10-13 |
| WO1999030484A1 (en) | 1999-06-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |