KR100403290B1 - 아날로그 기억장치 어레이를 위한 고속 독출 아키텍처 - Google Patents

아날로그 기억장치 어레이를 위한 고속 독출 아키텍처 Download PDF

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Publication number
KR100403290B1
KR100403290B1 KR10-2000-7006125A KR20007006125A KR100403290B1 KR 100403290 B1 KR100403290 B1 KR 100403290B1 KR 20007006125 A KR20007006125 A KR 20007006125A KR 100403290 B1 KR100403290 B1 KR 100403290B1
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South Korea
Prior art keywords
cell
signal
pair
array
output
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KR10-2000-7006125A
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English (en)
Korean (ko)
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KR20010032808A (ko
Inventor
레이젠드란 네어
마크 에이. 베일리
모르테자 아프가이
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인텔 코오퍼레이션
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
KR10-2000-7006125A 1997-12-08 1998-11-09 아날로그 기억장치 어레이를 위한 고속 독출 아키텍처 Expired - Fee Related KR100403290B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US8/987,131 1997-12-08
US08/987,131 1997-12-08
US08/987,131 US6366320B1 (en) 1997-12-08 1997-12-08 High speed readout architecture for analog storage arrays

Publications (2)

Publication Number Publication Date
KR20010032808A KR20010032808A (ko) 2001-04-25
KR100403290B1 true KR100403290B1 (ko) 2003-10-30

Family

ID=25533061

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2000-7006125A Expired - Fee Related KR100403290B1 (ko) 1997-12-08 1998-11-09 아날로그 기억장치 어레이를 위한 고속 독출 아키텍처

Country Status (8)

Country Link
US (1) US6366320B1 (https=)
EP (1) EP1038390B1 (https=)
JP (1) JP4444499B2 (https=)
KR (1) KR100403290B1 (https=)
AU (1) AU1453599A (https=)
DE (1) DE69827034T2 (https=)
TW (1) TW398136B (https=)
WO (1) WO1999030484A1 (https=)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6847399B1 (en) * 1998-03-23 2005-01-25 Micron Technology, Inc. Increasing readout speed in CMOS APS sensors through block readout
US7674293B2 (en) * 2004-04-22 2010-03-09 Facet Solutions, Inc. Crossbar spinal prosthesis having a modular design and related implantation methods
US6463566B1 (en) * 2000-02-04 2002-10-08 Massachusetts Institute Of Technology Dynamic double sampling charge integrator
US7154548B2 (en) * 2001-01-29 2006-12-26 Valley Oak Semiconductor Multiplexed and pipelined column buffer for use with an array of photo sensors
US7088394B2 (en) * 2001-07-09 2006-08-08 Micron Technology, Inc. Charge mode active pixel sensor read-out circuit
US6982758B2 (en) * 2001-07-23 2006-01-03 Micron Technology, Inc. Flexy-power amplifier: a new amplifier with built-in power management
US6838787B2 (en) * 2002-01-16 2005-01-04 Eastman Kodak Company Variable bandwidth correlated doubling sampling circuits for image sensors
US7068319B2 (en) * 2002-02-01 2006-06-27 Micron Technology, Inc. CMOS image sensor with a low-power architecture
EP1429542A1 (en) * 2002-12-11 2004-06-16 Dialog Semiconductor GmbH Fixed pattern noise compensation with low memory requirements
US6953923B2 (en) * 2003-02-18 2005-10-11 Omnivision Technologies, Inc. CMOS image sensor having reduced numbers of column readout circuits
US7821555B2 (en) * 2003-04-21 2010-10-26 Micron Technology, Inc. Multi path power for CMOS imagers
US20040246354A1 (en) * 2003-06-04 2004-12-09 Hongli Yang CMOS image sensor having high speed sub sampling
KR100656666B1 (ko) * 2004-09-08 2006-12-11 매그나칩 반도체 유한회사 이미지 센서
US20060170788A1 (en) * 2005-02-03 2006-08-03 Transchip, Inc. Image sensor with balanced switching noise
US7545834B1 (en) 2006-01-10 2009-06-09 Pericom Semiconductor Corp. Multiple channel switch using differential de-mux amplifier and differential mux equalizer
US7342212B2 (en) * 2006-03-31 2008-03-11 Micron Technology, Inc. Analog vertical sub-sampling in an active pixel sensor (APS) image sensor
US20070285547A1 (en) * 2006-05-30 2007-12-13 Milligan Edward S CMOS image sensor array optimization for both bright and low light conditions
JP4458113B2 (ja) * 2007-05-02 2010-04-28 ソニー株式会社 データ転送回路、固体撮像素子、およびカメラシステム
US20090091648A1 (en) * 2007-10-09 2009-04-09 Shengmin Lin Multi-resolution Image Sensor Array with High Image Quality Pixel Readout Circuitry
US20110286271A1 (en) * 2010-05-21 2011-11-24 Mediatek Inc. Memory systems and methods for reading data stored in a memory cell of a memory device
US9191582B1 (en) * 2011-04-29 2015-11-17 Bae Systems Information And Electronic Systems Integration Inc. Multi-mode high speed sensor
KR102410898B1 (ko) * 2021-02-23 2022-06-22 광주과학기술원 전류 모드 라인 드라이버 장치 및 이의 동작 방법

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4862276A (en) * 1988-10-07 1989-08-29 Wang Samuel C Push-pull readout of dual gate cid arrays

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4237383A (en) * 1978-09-20 1980-12-02 Rca Corporation High speed loading of output register of CCD array system
US4322752A (en) * 1980-01-16 1982-03-30 Eastman Technology, Inc. Fast frame rate sensor readout
US4734583A (en) * 1986-10-16 1988-03-29 General Electric Company Readout circuit for dual-gate CID imagers with charge sharing corrected for subtractive error
US5351309A (en) * 1992-06-30 1994-09-27 National Science Council Image edge sensor
US5471515A (en) 1994-01-28 1995-11-28 California Institute Of Technology Active pixel sensor with intra-pixel charge transfer
US5736886A (en) * 1996-02-06 1998-04-07 Analog Devices, Inc. Input clamping method and apparatus with a correlated double-sampling circuit
US5877715A (en) * 1997-06-12 1999-03-02 International Business Machines Corporation Correlated double sampling with up/down counter

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4862276A (en) * 1988-10-07 1989-08-29 Wang Samuel C Push-pull readout of dual gate cid arrays

Also Published As

Publication number Publication date
AU1453599A (en) 1999-06-28
TW398136B (en) 2000-07-11
DE69827034T2 (de) 2005-09-08
US6366320B1 (en) 2002-04-02
JP2001526498A (ja) 2001-12-18
DE69827034D1 (de) 2004-11-18
EP1038390A4 (en) 2001-02-28
JP4444499B2 (ja) 2010-03-31
KR20010032808A (ko) 2001-04-25
EP1038390A1 (en) 2000-09-27
EP1038390B1 (en) 2004-10-13
WO1999030484A1 (en) 1999-06-17

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