TW341719B - Surface position detecting method and scanning exposure method using the same - Google Patents
Surface position detecting method and scanning exposure method using the sameInfo
- Publication number
- TW341719B TW341719B TW086102271A TW86102271A TW341719B TW 341719 B TW341719 B TW 341719B TW 086102271 A TW086102271 A TW 086102271A TW 86102271 A TW86102271 A TW 86102271A TW 341719 B TW341719 B TW 341719B
- Authority
- TW
- Taiwan
- Prior art keywords
- surface position
- position detecting
- same
- scanning exposure
- measurement
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
- G03F9/7026—Focusing
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/70458—Mix-and-match, i.e. multiple exposures of the same area using a similar type of exposure apparatus, e.g. multiple exposures using a UV apparatus
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
- G03F9/7034—Leveling
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP06899896A JP3754743B2 (ja) | 1996-03-01 | 1996-03-01 | 表面位置設定方法、ウエハ高さ設定方法、面位置設定方法、ウエハ面位置検出方法および露光装置 |
JP06899996A JP3518826B2 (ja) | 1996-03-01 | 1996-03-01 | 面位置検出方法及び装置並びに露光装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW341719B true TW341719B (en) | 1998-10-01 |
Family
ID=26410182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086102271A TW341719B (en) | 1996-03-01 | 1997-02-25 | Surface position detecting method and scanning exposure method using the same |
Country Status (5)
Country | Link |
---|---|
US (1) | US5920398A (zh) |
EP (2) | EP0793073B1 (zh) |
KR (1) | KR100266729B1 (zh) |
DE (2) | DE69738335T2 (zh) |
TW (1) | TW341719B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI576187B (zh) * | 2013-08-28 | 2017-04-01 | Omron Tateisi Electronics Co | Laser processing device |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6559465B1 (en) * | 1996-08-02 | 2003-05-06 | Canon Kabushiki Kaisha | Surface position detecting method having a detection timing determination |
JPH10326733A (ja) * | 1997-05-23 | 1998-12-08 | Mitsubishi Electric Corp | スリットスキャン式投影露光装置及び投影露光方法並びにこれを用いた半導体装置の製造方法 |
JP3454497B2 (ja) * | 1997-07-15 | 2003-10-06 | キヤノン株式会社 | 投影露光方法および装置 |
US20060060781A1 (en) * | 1997-08-11 | 2006-03-23 | Masahiro Watanabe | Charged-particle beam apparatus and method for automatically correcting astigmatism and for height detection |
US6208407B1 (en) * | 1997-12-22 | 2001-03-27 | Asm Lithography B.V. | Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement |
US6750950B1 (en) | 1998-06-29 | 2004-06-15 | Nikon Corporation | Scanning exposure method, scanning exposure apparatus and making method for producing the same, and device and method for manufacturing the same |
US6057170A (en) * | 1999-03-05 | 2000-05-02 | Memc Electronic Materials, Inc. | Method of measuring waviness in silicon wafers |
TW490596B (en) * | 1999-03-08 | 2002-06-11 | Asm Lithography Bv | Lithographic projection apparatus, method of manufacturing a device using the lithographic projection apparatus, device manufactured according to the method and method of calibrating the lithographic projection apparatus |
JP2001075294A (ja) * | 1999-07-08 | 2001-03-23 | Nikon Corp | 面位置検出方法及び装置、並びに露光方法及び装置、露光装置の製造方法、半導体デバイス製造方法 |
JP4725822B2 (ja) * | 2000-07-10 | 2011-07-13 | 株式会社ニコン | 光学的位置ずれ検出装置 |
JP3619141B2 (ja) * | 2000-11-10 | 2005-02-09 | キヤノン株式会社 | 投影露光装置及びデバイス製造方法 |
JP4613357B2 (ja) * | 2000-11-22 | 2011-01-19 | 株式会社ニコン | 光学的位置ずれ測定装置の調整装置および方法 |
US6993206B2 (en) * | 2001-03-22 | 2006-01-31 | Nikon Corporation | Position detector and attitude detector |
US6581193B1 (en) | 2001-06-13 | 2003-06-17 | Kla-Tencor | Apparatus and methods for modeling process effects and imaging effects in scanning electron microscopy |
JP2003086492A (ja) * | 2001-09-12 | 2003-03-20 | Canon Inc | 露光装置及びその制御方法並びにデバイスの製造方法 |
JP3870058B2 (ja) * | 2001-10-05 | 2007-01-17 | キヤノン株式会社 | スキャン露光装置及び方法並びにデバイスの製造方法 |
US6691052B1 (en) | 2002-01-30 | 2004-02-10 | Kla-Tencor Corporation | Apparatus and methods for generating an inspection reference pattern |
JP3913079B2 (ja) * | 2002-02-28 | 2007-05-09 | キヤノン株式会社 | 面位置検出装置及び方法並びに露光装置と該露光装置を用いたデバイスの製造方法 |
DE10253919B4 (de) * | 2002-11-19 | 2004-09-23 | Infineon Technologies Ag | Verfahren zur Justage eines Substrates in einem Gerät zur Durchführung einer Belichtung |
JP4652667B2 (ja) * | 2003-02-13 | 2011-03-16 | キヤノン株式会社 | 面位置計測方法及び走査型露光装置 |
JP2004247487A (ja) * | 2003-02-13 | 2004-09-02 | Canon Inc | 走査露光装置 |
US7072024B2 (en) | 2004-01-20 | 2006-07-04 | Nikon Corporation | Lithographic projection method and apparatus |
US6980279B2 (en) | 2004-01-22 | 2005-12-27 | Nikon Corporation | Interferometer system for measuring a height of wafer stage |
JP2006305963A (ja) * | 2005-04-28 | 2006-11-09 | Seiko Epson Corp | 画像処理、補正値取得方法、印刷装置製造方法及び印刷方法 |
KR100689841B1 (ko) * | 2006-02-13 | 2007-03-08 | 삼성전자주식회사 | 반도체 제조장치용 레벨링 알고리듬 및 관련된 장치 |
US20110109889A1 (en) * | 2006-12-21 | 2011-05-12 | Asml Netherlands B.V. | Method for positioning a target portion of a substrate with respect to a focal plane of a projection system |
NL2004055C2 (en) * | 2010-01-05 | 2011-07-06 | Mapper Lithography Ip Bv | Method for measuring target surface topology and lithography system. |
CN103885295B (zh) * | 2012-12-19 | 2016-09-28 | 上海微电子装备有限公司 | 一种曝光装置及其调焦调平方法 |
CN108369390B (zh) | 2015-12-15 | 2021-05-18 | Asml荷兰有限公司 | 光刻设备和器件制造方法 |
Family Cites Families (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58143206A (ja) * | 1982-02-19 | 1983-08-25 | Canon Inc | 位置検知信号処理装置 |
JPS5963504A (ja) * | 1982-10-02 | 1984-04-11 | Canon Inc | 位置合わせ信号検出装置 |
US4794648A (en) * | 1982-10-25 | 1988-12-27 | Canon Kabushiki Kaisha | Mask aligner with a wafer position detecting device |
US4655599A (en) * | 1982-11-15 | 1987-04-07 | Canon Kabushiki Kaisha | Mask aligner having a photo-mask setting device |
JP2622573B2 (ja) * | 1988-01-27 | 1997-06-18 | キヤノン株式会社 | マーク検知装置及び方法 |
JP2657505B2 (ja) * | 1988-01-27 | 1997-09-24 | キヤノン株式会社 | マーク位置検出装置およびマーク配置方法 |
US4906326A (en) * | 1988-03-25 | 1990-03-06 | Canon Kabushiki Kaisha | Mask repair system |
JPH01284793A (ja) * | 1988-05-11 | 1989-11-16 | Canon Inc | 基板支持装置 |
EP0345097B1 (en) * | 1988-06-03 | 2001-12-12 | Canon Kabushiki Kaisha | Exposure method and apparatus |
EP0357425B1 (en) * | 1988-09-02 | 1996-11-06 | Canon Kabushiki Kaisha | An exposure apparatus |
EP0357423B1 (en) * | 1988-09-02 | 1995-03-15 | Canon Kabushiki Kaisha | An exposure apparatus |
JP2627543B2 (ja) * | 1988-09-05 | 1997-07-09 | キヤノン株式会社 | Sor露光システム |
JP2631395B2 (ja) * | 1988-09-09 | 1997-07-16 | キヤノン株式会社 | 露光装置の制御方法 |
JP2728898B2 (ja) * | 1988-10-05 | 1998-03-18 | キヤノン株式会社 | 露光装置 |
JPH0652707B2 (ja) * | 1988-10-11 | 1994-07-06 | キヤノン株式会社 | 面位置検出方法 |
US5543921A (en) * | 1989-05-08 | 1996-08-06 | Canon Kabushiki Kaisha | Aligning method utilizing reliability weighting coefficients |
US5231291A (en) * | 1989-08-01 | 1993-07-27 | Canon Kabushiki Kaisha | Wafer table and exposure apparatus with the same |
EP0412756B1 (en) * | 1989-08-07 | 1995-10-25 | Canon Kabushiki Kaisha | Exposure apparatus |
JP2777915B2 (ja) * | 1989-08-30 | 1998-07-23 | キヤノン株式会社 | 位置合わせ機構 |
JP2731955B2 (ja) * | 1989-09-07 | 1998-03-25 | キヤノン株式会社 | X線露光装置 |
US5285488A (en) * | 1989-09-21 | 1994-02-08 | Canon Kabushiki Kaisha | Exposure apparatus |
JP2829642B2 (ja) * | 1989-09-29 | 1998-11-25 | キヤノン株式会社 | 露光装置 |
DE69033002T2 (de) * | 1989-10-02 | 1999-09-02 | Canon K.K. | Belichtungsvorrichtung |
JP2766935B2 (ja) * | 1989-10-20 | 1998-06-18 | キヤノン株式会社 | X線露光装置 |
JP2785146B2 (ja) * | 1990-02-09 | 1998-08-13 | キヤノン株式会社 | 自動焦点調整制御装置 |
DE69128655T2 (de) * | 1990-03-02 | 1998-05-07 | Canon K.K., Tokio/Tokyo | Belichtungsgerät |
JP2860578B2 (ja) * | 1990-03-02 | 1999-02-24 | キヤノン株式会社 | 露光装置 |
US5172402A (en) * | 1990-03-09 | 1992-12-15 | Canon Kabushiki Kaisha | Exposure apparatus |
US5168512A (en) * | 1990-03-13 | 1992-12-01 | Canon Kabushiki Kaisha | Method of manufacture of semiconductor devices |
JP2830492B2 (ja) * | 1991-03-06 | 1998-12-02 | 株式会社ニコン | 投影露光装置及び投影露光方法 |
JP2910327B2 (ja) * | 1991-05-31 | 1999-06-23 | キヤノン株式会社 | 面位置検出装置及びそれを用いた半導体素子の製造方法 |
US5347118A (en) * | 1992-01-17 | 1994-09-13 | Canon Kabushiki Kaisha | Aligning method and apparatus detecting misalignment using image signals from image pickup |
EP0585041B1 (en) * | 1992-08-19 | 2000-11-02 | Canon Kabushiki Kaisha | Registration method usable with a projection optical system, exposure apparatus therefor and method of manufacturing a semiconductor device by using such exposure apparatus |
US5477304A (en) * | 1992-10-22 | 1995-12-19 | Nikon Corporation | Projection exposure apparatus |
JP3002351B2 (ja) * | 1993-02-25 | 2000-01-24 | キヤノン株式会社 | 位置合わせ方法および装置 |
JP3282751B2 (ja) * | 1993-07-14 | 2002-05-20 | 株式会社ニコン | 走査型露光装置、及び該装置を用いる素子製造方法 |
JP3500618B2 (ja) * | 1994-03-28 | 2004-02-23 | 株式会社ニコン | 走査型露光装置 |
JPH07335524A (ja) * | 1994-06-06 | 1995-12-22 | Canon Inc | 位置合わせ方法 |
-
1997
- 1997-02-25 US US08/805,749 patent/US5920398A/en not_active Expired - Lifetime
- 1997-02-25 TW TW086102271A patent/TW341719B/zh not_active IP Right Cessation
- 1997-02-27 EP EP97301291A patent/EP0793073B1/en not_active Expired - Lifetime
- 1997-02-27 DE DE69738335T patent/DE69738335T2/de not_active Expired - Lifetime
- 1997-02-27 DE DE69717516T patent/DE69717516T2/de not_active Expired - Lifetime
- 1997-02-27 EP EP01204135A patent/EP1195647B1/en not_active Expired - Lifetime
- 1997-02-28 KR KR1019970006614A patent/KR100266729B1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI576187B (zh) * | 2013-08-28 | 2017-04-01 | Omron Tateisi Electronics Co | Laser processing device |
Also Published As
Publication number | Publication date |
---|---|
US5920398A (en) | 1999-07-06 |
EP0793073A2 (en) | 1997-09-03 |
KR100266729B1 (ko) | 2000-09-15 |
DE69738335D1 (de) | 2008-01-10 |
DE69738335T2 (de) | 2008-10-09 |
DE69717516T2 (de) | 2003-07-31 |
KR970067748A (ko) | 1997-10-13 |
EP1195647A1 (en) | 2002-04-10 |
EP0793073B1 (en) | 2002-12-04 |
DE69717516D1 (de) | 2003-01-16 |
EP1195647B1 (en) | 2007-11-28 |
EP0793073A3 (en) | 1998-09-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |