AU7660000A - Method and device for detecting defects in and on transparent objects - Google Patents

Method and device for detecting defects in and on transparent objects

Info

Publication number
AU7660000A
AU7660000A AU76600/00A AU7660000A AU7660000A AU 7660000 A AU7660000 A AU 7660000A AU 76600/00 A AU76600/00 A AU 76600/00A AU 7660000 A AU7660000 A AU 7660000A AU 7660000 A AU7660000 A AU 7660000A
Authority
AU
Australia
Prior art keywords
detecting defects
transparent objects
transparent
objects
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU76600/00A
Inventor
Christian Dullin
Wolfgang Fried
Thomas Koerbs
Herbert Schulze
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Friedrich Schiller Universtaet Jena FSU
Original Assignee
Friedrich Schiller Universtaet Jena FSU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Friedrich Schiller Universtaet Jena FSU filed Critical Friedrich Schiller Universtaet Jena FSU
Publication of AU7660000A publication Critical patent/AU7660000A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
AU76600/00A 1999-09-29 2000-09-28 Method and device for detecting defects in and on transparent objects Abandoned AU7660000A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE1999148140 DE19948140A1 (en) 1999-09-29 1999-09-29 Method and device for detecting defects in and on transparent objects
DE19948140 1999-09-29
PCT/EP2000/009489 WO2001023870A1 (en) 1999-09-29 2000-09-28 Method and device for detecting defects in and on transparent objects

Publications (1)

Publication Number Publication Date
AU7660000A true AU7660000A (en) 2001-04-30

Family

ID=7924689

Family Applications (1)

Application Number Title Priority Date Filing Date
AU76600/00A Abandoned AU7660000A (en) 1999-09-29 2000-09-28 Method and device for detecting defects in and on transparent objects

Country Status (3)

Country Link
AU (1) AU7660000A (en)
DE (1) DE19948140A1 (en)
WO (1) WO2001023870A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10139514A1 (en) * 2001-08-10 2003-02-20 Bosch Gmbh Robert Transmission detector for window body, especially vehicle windscreen, has optics forming images of sections of body surface on detector whose maximum separation is comparable with free body aperture
DE10140660A1 (en) * 2001-08-24 2003-03-13 Visolution Gmbh Systemloesunge Method for opto-electronic measurement of object surfaces, whereby a color camera scans the surface, with the resulting images stored and evaluated, such that reflective surfaces and surfaces with uniform color can be processed
DE10209593B4 (en) * 2002-03-05 2005-03-24 Schott Ag Method for quality control and cut optimization of optical raw materials
DE102004017237B4 (en) * 2004-04-05 2006-04-06 Schott Ag Method and device for the quantitative determination of the optical quality of a transparent material
US20060066846A1 (en) * 2004-09-29 2006-03-30 Telco Testing Systems, Llc Apparatus and method for detection of contaminant particles or component defects
JP2014170016A (en) * 2014-06-24 2014-09-18 Koito Mfg Co Ltd Foreign matter inspection device and foreign matter inspection method for vehicular lamp
DE102014013237B4 (en) * 2014-09-05 2018-07-05 Audi Ag Method for operating a test device for automated testing of the functionality of a vehicle
US9970884B1 (en) 2017-04-28 2018-05-15 Hong Kong Applied Science and Technology Research Institute Company Limited Apparatus and a method for inspecting a light transmissive optical component
DE102020206753B4 (en) 2020-05-29 2023-10-19 Carl Zeiss Smt Gmbh Method and device for determining a contamination state of a surface of a facet element

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3925049A (en) * 1974-07-10 1975-12-09 Ppg Industries Inc Flat glass inspection system and method
US4306808A (en) * 1979-12-14 1981-12-22 Ford Aerospace & Communications Corp. Glass flaw inspection system
DE3926349A1 (en) * 1989-08-09 1991-02-14 Sick Optik Elektronik Erwin Optical defect inspection arrangement for flat transparent material - passes light via mirror forming image of illumination pupil on camera lens of photoreceiver
DE3937559A1 (en) * 1989-09-02 1991-03-14 Flachglas Ag METHOD FOR DETECTING OPTICAL ERRORS IN DISC FROM A TRANSPARENT MATERIAL, ESPECIALLY FROM GLASS
DE4139094A1 (en) * 1991-11-28 1993-06-03 Wolf & Beck Gmbh Dr Fault points automatic detection for flat glass, for bubbles and scratches - by transmitting light beam through sample and registering illuminated section through lens on photoelectric receiver for light diffused, reflected or deflected
JP3149338B2 (en) * 1995-06-15 2001-03-26 旭光学工業株式会社 Optical member inspection method
DE19809505A1 (en) * 1997-03-05 1998-09-17 Asahi Optical Co Ltd Test unit for determining optical faults or contamination on optical element, e.g. lens
DE19824623A1 (en) * 1997-07-19 1999-02-11 Univ Ilmenau Tech Technical surface characterisation device
DE19731545C1 (en) * 1997-07-23 1999-05-27 Basler Gmbh Device and method for optically detecting the deformation of a surface
DE19741384A1 (en) * 1997-09-19 1999-03-25 Heuft Systemtechnik Gmbh Method for recognizing random dispersive material, impurities and other faults in transparent objects

Also Published As

Publication number Publication date
WO2001023870A1 (en) 2001-04-05
DE19948140A1 (en) 2001-04-05

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase