TW202538958A - 陶瓷基座 - Google Patents
陶瓷基座Info
- Publication number
- TW202538958A TW202538958A TW113134798A TW113134798A TW202538958A TW 202538958 A TW202538958 A TW 202538958A TW 113134798 A TW113134798 A TW 113134798A TW 113134798 A TW113134798 A TW 113134798A TW 202538958 A TW202538958 A TW 202538958A
- Authority
- TW
- Taiwan
- Prior art keywords
- ceramic plate
- ceramic
- thermocouple
- heater circuit
- thermocouple insertion
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional [2D] plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional [2D] plane, e.g. plate-heater non-flexible
- H05B3/28—Heating elements having extended surface area substantially in a two-dimensional [2D] plane, e.g. plate-heater non-flexible heating conductor embedded in insulating material
- H05B3/283—Heating elements having extended surface area substantially in a two-dimensional [2D] plane, e.g. plate-heater non-flexible heating conductor embedded in insulating material the insulating material being an inorganic material, e.g. ceramic
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0432—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0602—Temperature monitoring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/72—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7624—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/72—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
- H10P72/722—Details of electrostatic chucks
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
- Resistance Heating (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| WOPCT/JP2023/043646 | 2023-12-06 | ||
| PCT/JP2023/043646 WO2025120767A1 (ja) | 2023-12-06 | 2023-12-06 | セラミックサセプタ |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW202538958A true TW202538958A (zh) | 2025-10-01 |
Family
ID=95939819
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW113134798A TW202538958A (zh) | 2023-12-06 | 2024-09-13 | 陶瓷基座 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20250193971A1 (https=) |
| JP (1) | JP7812936B2 (https=) |
| TW (1) | TW202538958A (https=) |
| WO (1) | WO2025120767A1 (https=) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5183058B2 (ja) * | 2006-07-20 | 2013-04-17 | アプライド マテリアルズ インコーポレイテッド | 急速温度勾配コントロールによる基板処理 |
| JP5009064B2 (ja) * | 2007-06-27 | 2012-08-22 | 太平洋セメント株式会社 | セラミックスヒーター |
| JP4450106B1 (ja) * | 2008-03-11 | 2010-04-14 | 東京エレクトロン株式会社 | 載置台構造及び処理装置 |
| US20120211484A1 (en) * | 2011-02-23 | 2012-08-23 | Applied Materials, Inc. | Methods and apparatus for a multi-zone pedestal heater |
| JP6530220B2 (ja) * | 2015-03-30 | 2019-06-12 | 日本特殊陶業株式会社 | セラミックヒータ及びその制御方法、並びに、静電チャック及びその制御方法 |
| US10020218B2 (en) * | 2015-11-17 | 2018-07-10 | Applied Materials, Inc. | Substrate support assembly with deposited surface features |
| JP7422024B2 (ja) * | 2020-07-07 | 2024-01-25 | 新光電気工業株式会社 | セラミックス構造体、静電チャック、基板固定装置 |
| JP7477389B2 (ja) * | 2020-07-27 | 2024-05-01 | 日本特殊陶業株式会社 | 保持装置 |
| JP2023149343A (ja) * | 2022-03-31 | 2023-10-13 | 日本特殊陶業株式会社 | 電極埋設部材、および基板保持部材 |
-
2023
- 2023-12-06 WO PCT/JP2023/043646 patent/WO2025120767A1/ja active Pending
- 2023-12-06 JP JP2024556215A patent/JP7812936B2/ja active Active
-
2024
- 2024-09-13 TW TW113134798A patent/TW202538958A/zh unknown
- 2024-10-03 US US18/905,235 patent/US20250193971A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2025120767A1 (ja) | 2025-06-12 |
| US20250193971A1 (en) | 2025-06-12 |
| JP7812936B2 (ja) | 2026-02-10 |
| JPWO2025120767A1 (https=) | 2025-06-12 |
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