TW201802060A - 電壓非線性電阻元件及其製法 - Google Patents
電壓非線性電阻元件及其製法 Download PDFInfo
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Abstract
本發明之課題,係在氧化鋅區域接合其它金屬氧化物區域結構之電壓非線性電阻元件,相較於先前,將電壓非線性指數增大。本發明之解決手段,係提供一種電壓非線性電阻元件10,其包括電壓非線性電阻體(簡稱為電阻體)20、及一對電極14、16夾入上述電阻體20。電阻體20,係將以氧化鋅作為主成分之第1層21、相同地以氧化鋅作為主成分之第2層22及以與氧化鋅不同的金屬氧化物作為主成分之第3層23層積而成之結構。第2層22係接合在第1層21,其厚度較第1層21為薄,其體積電阻率較第1層21為高。第3層23係接合在第2層22。
Description
本發明係關於一種電壓非線性電阻元件及其製法。
電壓非線性電阻元件(可變電阻元件),係使用一對電極夾入電壓非線性電阻體的結構之元件,其作為保護電子電路等避免受到異常電壓的影響之元件,廣泛地利用在濕度感測器、溫度感測器等的各種感測器。作為此種電壓非線性電阻元件,專利文獻1係揭示一種具有以氧化鋅作為主成分的區域、及含有鉍-鹼土類-銅的複合氧化物的區域之接合部之元件。上述電壓非線性電阻元件係藉由以下的製法來製造。首先,將氧化鋅粉體使用習知的成形方法而成型,在大氣中以1250℃煅燒2小時。隨後,將燒結體的兩面進行研磨,而且特別是針對其中一面使用氧化鋁微粉進行鏡面研磨。隨後,使用有機溶劑充分地洗淨後,使用高頻濺鍍裝置在氧化鋅燒結體之經鏡面研磨的面上,形成Bi-鹼土類-Cu氧化物的濺鍍膜。其次,在870℃的氧氣環境中進行熱處理24小時。
[專利文獻1]日本特公平7-111922號公報
電壓非線性指數,係將電壓非線性電阻元件並聯地連接在欲保護的電路時,作為表示正常動作時在電路側流動的電流量之指標。因為電壓非線性指數越大,正常動作時電流在電路側流動越大,所以能夠謀求省能源化。但是、專利文獻1的電壓非線性電阻元件之電壓非線性指數只有約8,而有無法充分地謀求省能源化之問題。
本發明係為了解決此種課題而進行,其主要目的係在氧化鋅區域接合其它金屬氧化物區域的結構之電壓非線性電阻元件,相較於先前,將電壓非線性指數增大。
本發明的電壓非線性電阻元件,其包括:以氧化鋅作為主成分之第1層;接合在前述第1層且以氧化鋅作為主成分,相較於前述第1層,厚度較薄且體積電阻率較高之第2層;及接合在前述第2層中與前述第1層接合側之相反側且以與氧化鋅為不同的金屬氧化物作為主成分之第3層。
在上述電壓非線性電阻元件,在以氧化鋅作為主成分之第1層以及與氧化鋅不同的金屬氧化物作為主成分之第3層之間,存在以氧化鋅作為主成分,相較於第1層,厚度較薄且體積電阻率較高之第2層。藉由上述第2層的存在,相較於先前,電壓非線性指數為變大。其結果,通常時、亦即低電壓時,電流係不容易在與需要保護的電路並聯地連接之電壓非
線性電阻元件流動,而能夠謀求省能源化。
又,所謂主成分,係指含有最多之成分,例如質量比例為最高的成分。
在本發明的電壓非線性電阻元件,前述第1層的體積電阻率為1×10-2Ωcm以下,前述第2層的體積電阻率係以1×103Ωcm以下為佳。如此的情況,電壓非線性指數為充分地變大。以第1層的體積電阻率為6×10-4Ωcm以下,第2層的體積電阻率為2×10-3Ωcm以下為較佳。如此的情況,對與需要保護的電路並聯地連接之電壓非線性電阻元件施加突波電壓(surge voltage)時,能夠使較大的電流在電壓非線性電阻元件流動。因此,提高電路的保護效果。
在本發明的電壓非線性電阻元件,前述第2層的厚度係以0.2~300nm為佳。如此的情況,電壓非線性指數為充分地變大。
在本發明的電壓非線性電阻元件,前述第1層亦可含有選自由Al、Ga及In所組成群組之至少1種金屬元素的氧化物。藉由添加此種三價金屬離子,能夠使以氧化鋅作為主成分之第1層的體積電阻率較容易地成為低電阻。
在本發明的電壓非線性電阻元件,前述第3層係以含有選自由Sr、Bi及Pr所組成群組之1種金屬元素的氧化物作為主成分、及選自由Si、Cr、Mn、Co、Ni、Zn、Sb及La所組成群組之至少1種金屬元素的氧化物為佳。如此的情況,藉由變化添加在主成分的金屬氧化物之其它金屬氧化物的金屬種類和添加量,而能夠成為具有各種特性之電壓非線性電阻元件。
本發明的電壓非線性電阻元件之製法,係製造上述任一電壓非線性電阻元件之方法,包括下列步驟:(a)將亦可含有選自由Al、Ga及In所組成群組之至少1種金屬元素之氧化鋅粉末的成形體,在非氧化環境下煅燒而製造氧化鋅陶瓷基板之步驟;(b)藉由將在前述氧化鋅陶瓷基板在氧化環境下煅燒,使前述氧化鋅陶瓷基板的表層變化成為體積電阻率比前述氧化鋅陶瓷基板內部更高的層,而使前述氧化鋅陶瓷基板的內部及表層各自成為前述第1層及前述第2層、或藉由將相較於以氧化鋅作為主成分之前述氧化鋅陶瓷基板、厚度較薄且體積電阻率較高的氧化鋅層成膜在前述氧化鋅陶瓷基板的表面,而使前述氧化鋅陶瓷基板的內部及表層各自成為前述第1層及前述第2層之步驟;及(c)將前述第3層形成在前述第2層表面之步驟。
藉由上述製法,能夠容易地製造上述電壓非線性電阻元件。
10‧‧‧電壓非線性電阻元件
14、16‧‧‧電極
20‧‧‧電阻體
21‧‧‧第1層
21a‧‧‧第1層的側面
21b‧‧‧第1層的下面
22‧‧‧第2層
23‧‧‧第3層
31‧‧‧氧化鋅陶瓷薄板
第1圖係電壓非線性電阻元件10之剖面圖。
第2圖係電壓非線性電阻元件10之製造製程圖。
針對本發明之適合的實施形態,以下將參照圖式進行說明。第1圖係本實施形態的電壓非線性電阻元件10之
剖面圖。
電壓非線性電阻元件10,係具備電壓非線性電阻體(簡稱為電阻體)20、及將上述電阻體20夾入之一對電極14、16。
電阻體20係將以氧化鋅作為主成分之第1層21、及相同地以氧化鋅作為主成分之第2層22、及以與氧化鋅不同的金屬氧化物作為主成分之第3層23層積而成之構造之物。第2層22係接合在第1層21,其厚度較第1層21為薄,其載體濃度較第1層21為低。第3層23係接合在第2層22。又,第1層21的側面21a及下面21b,可與第1層21為相同組成,亦可與第2層22為相同組成。
第1層21的體積電阻率,係以1.0×10-2Ωcm以下為佳,較佳為1.0×10-3Ωcm以下,更佳為6.0×10-4Ωcm以下。第2層22的體積電阻率係比第1層21的體積電阻率為高,以1×103Ωcm以下為佳,較佳為3×102Ωcm以下,更佳為2×10-3Ωcm以下。第2層22的厚度、沒有特別限定,以0.2~300nm為佳,以0.2~10nm為較佳,以1~10nm為更佳。第1層21亦可含有由選自由Al、Ga及In所組成群組之至少1種金屬元素的氧化物。第3層23係以含有選自由Sr、Bi及Pr所組成群組之1種金屬元素的氧化物作為主成分、及選自由Si、Cr、Mn、Co、Ni、Za、Sb及La所組成群組之至少1種金屬元素的氧化物為佳。
電極14係以接觸第1層21的外表面之方式形成,電極16係以接觸第3層23的外表面之方式形成。電極14、16係只要與氧化鋅陶瓷顯示良好的歐姆(Ohmic)性之導電性的材料,沒有特別限定,例如可舉出金、銀、白金、鋁等。
其次,以下說明電壓非線性電阻元件10的製造例。第2圖係電壓非線性電阻元件10之製造製程圖。
‧氧化鋅陶瓷薄板的製造(請參照第2圖的步驟(a))
氧化鋅陶瓷薄板31的體積電阻率,係以1.0×10-2Ωcm以下為佳,較佳為1.0×10-3Ωcm以下,更佳為6.0×10-4Ωcm以下。如此形成的氧化鋅陶瓷薄板31,係能夠藉由使Al、Ga、In等的三價離子固溶在氧化鋅陶瓷作為摻雜劑、或將氧化鋅粉末在非氧化環境下煅燒而導入氧缺陷來得到。為了得到使摻雜劑固溶而成之氧化鋅陶瓷薄板31,係首先將Al2O3、Ga2O3、In2O3等的三價金屬氧化物粉末以0.05~2.0質量%的方式混合在氧化鋅粉末,且以成為預定形狀的成形體之方式成形。其次,將上述成形體在非氧化環境(例如氮氣環境、氬氣環境等)下,以900~1200℃保持數小時後,進一步升溫至1300~1500℃而煅燒數小時。藉由如此進行,而能夠較容易地得到氧化鋅陶瓷薄板31。為了成為目標載體濃度、體積電阻率等,係調整混合在氧化鋅粉末之三價金屬氧化物粉末的質量%、或調整煅燒溫度即可。又,原料所使用的氧化鋅粉末,其平均粒徑(雷射繞射法,以下相同)係以0.02~5μm為佳。三價金屬氧化物粉末之平均粒徑係以0.01~0.5μm為佳。另一方面,為了將氧化鋅粉末在非氧化環境下煅燒而得到體積電阻率較低的氧化鋅陶瓷薄板31,係例如將氧化鋅粉末在非氧化環境(例如氮氣環境、氬氣環境等)下,以1300~1500℃保持數小時而煅燒。如此形成的氧化鋅陶瓷薄板31,亦能夠從使用同樣的方法而製成之氧化鋅陶瓷塊切取。
‧高體積電阻層的製造(參照第2圖的步驟(b))
(其1)
將氧化鋅陶瓷薄板31在氧化環境(例如氧氣環境、大氣環境等)進行煅燒,使氧化鋅陶瓷薄板各面的表層,變化成為體積電阻率比氧化鋅陶瓷薄板內部更高的層。其結果,氧化鋅陶瓷薄板31內部係成為第1層21,各面的表層係成為第2層22。第1層21及第2層22的體積電阻率係如上述。煅燒溫度係以600~1000℃為佳,較佳為700~900℃。煅燒時間,係以第1層21及第2層22的體積電阻率落入上述的數值範圍之方式適當地設定即可,例如可在0.1~1小時的範圍設定。
(其2)
在氧化鋅陶瓷薄板31的上方的面,成膜形成以氧化鋅作為主成分且相較於氧化鋅陶瓷薄板31,厚度較薄且體積電阻率較高之氧化鋅層。其結果,氧化鋅陶瓷薄板31及氧化鋅層係各自成為第1層21及第2層22。第1層21及第2層22的體積電阻率係如上述。氧化鋅層為氧化鋅單體的情況,例如亦可將氧化鋅作為標靶且藉由濺鍍在氧化鋅陶瓷薄板上形成氧化鋅層。除了濺鍍以外,亦可使用真空蒸鍍、離子鍍等。氧化鋅層含有副成分的情況時,氧化鋅之外的副成分也可作為標靶,藉由多元同時濺鍍而在氧化鋅陶瓷薄板上形成氧化鋅層。或者,亦可將含有氧化鋅粉末之膏狀物在氧化鋅陶瓷薄板塗佈、乾燥,而且藉由在較低溫(例如200~700℃,較佳為200~500℃)進行熱處理而成為氧化鋅層。
‧金屬氧化物層的製造(參照第2圖的步驟(c))
金屬氧化物層(第3層23)可為氧化鉍單體,亦可為以氧化
鉍作為主成分且含有其它氧化物(例如Sb2O3、Cr2O3、MnO、CoO、ZnO、SiO2等)作為副成分。氧化鉍層為氧化鉍單體時,例如可以氧化鉍作為標靶,藉由濺鍍在第2層22上形成氧化鉍層作為第3層23。除了濺鍍以外,亦可使用真空蒸鍍、離子鍍等。或者,亦可將含有氧化鉍粉末之膏狀物在第2層22塗佈、乾燥,而且藉由在較低溫(例如200~700℃,較佳為200~500℃)進行熱處理而形成氧化鉍層作為第3層23。另一方面,氧化鉍層含有副成分的情況時,氧化鉍以外的副成分也可作為標靶,藉由多元同時濺鍍而在第2層22上形成氧化鉍層作為第3層23。或者,亦可將除了氧化鉍粉末以外亦含有副成分的粉末之膏狀物在第2層22塗佈、乾燥,而且藉由在較低溫進行熱處理而形成作為第3層23的氧化鉍層。亦可使用氧化鍶和氧化鐠代替氧化鉍。
‧電極14、16的製造(參照第2圖的步驟(d))
電極14、16,係能夠將電極材料藉由蒸鍍或濺鍍在由第1層21~第3層23所構成之電阻體20的兩面而製造。作為電極材料,可舉出金、銀、白金、鋁等。或者,亦可準備板狀電極14、16,將其透過導電性接合材而接合在電阻體20的各面。
依照以上所詳述的電壓非線性電阻元件10,係在以氧化鋅作為主成分之第1層21、及以與氧化鋅不同的金屬氧化物作為主成分之第3層23之間,設置以氧化鋅作為主成分且相較於第1層21,厚度較薄且體積電阻率較高的第2層22。藉由設置上述第2層22,電壓非線性指數係變為比先前更大。其結果,通常時、亦即低電壓時,電流係不容易在與需要保護
的電路並聯地連接之電壓非線性電阻元件10流動,而能夠謀求省能源化。
又,本發明係完全不受上述的實施形態限定,只要屬於本發明的技術範圍,能夠以各種態樣實施。
例如,在上述的電壓非線性電阻元件10,係將電極14、16設置在1個電阻體20的兩面,但是亦可將電極設置在層積有複數個電阻體20之積層體的兩面。藉由使用如此的積層型電阻體,能夠控制可變電阻器電壓,而能夠得到在用途上適合的可變電阻器電壓之電壓非線性電阻元件。
[實施例1]
在氧化鋅(平均粒徑1.5μm)添加1質量%氧化鎵(平均粒徑0.02μm),進行濕式混合後,蒸發乾燥且使用孔徑75μm的篩網進行篩選通過後,進行成形。將成形體脫脂後,在N2環境下以1100℃保持5小時後,進而升溫至1300℃進行煅燒5小時以製造氧化鋅陶瓷塊。上述氧化鋅陶瓷塊的體積電阻率為6.0×10-4Ωcm。又,體積電阻率係使用四端子法而測定。
將所得到的氧化鋅陶瓷塊,以5mm×5mm×1mm的板狀切取,而得到氧化鋅陶瓷薄板。將上述薄板的上方的面進行研磨、洗淨後,藉由在氧氣環境下以800℃保持0.5小時,而得到各面表層經氧化的氧化鋅陶瓷薄板。表層之體積電阻率為2.0×10-3Ωcm,厚度為0.2(nm)。氧化鋅陶瓷薄板之中,除了表層以外之內部係相當於第1層,表層係相當於第2層。又,第2層的體積電阻率係使用四端子法(端子間距離10μm)而測
定。第2層的厚度係如以下而求取。亦即,另外將氧化鋅陶瓷薄板在氧(18O)環境下,於與上述相同條件(800℃、0.5小時)保持後,使用2次離子質譜儀而測定氧化鋅陶瓷薄板之18O的深度方向分布,來求取第2層的厚度。相對於氧化鋅陶瓷薄板中的氧原子係由16O所構成,因為在16O的同位素(isotope)之18O的環境下進行熱處理時被18O氧化,所以第2層的厚度係能夠從18O的深度方向分布來求取。
其次,使用由鉍、錳、鈷所構成的氧化物作為標靶(作為金屬元素比,係鉍:錳:鈷=60:20:20),進行高頻電漿濺鍍,而在氧化鋅陶瓷薄板上方的面成膜形成由鉍、錳、鈷所構成之氧化物的濺鍍膜(厚度0.3μm)。上述濺鍍膜係相當於第3層。如此進行而得到由3層結構所構成之電阻體。濺鍍係使用ULVAC機工製RFS-200。成膜條件係如以下所述。標靶尺寸:直徑80mm、RF輸出功率:40W、氣壓(O2):5.0Pa、成膜時間:120分鐘。
將Al蒸鍍電極設置在所得到的電阻體之兩面,以得到電壓非線性電阻元件。對上述電壓非線性電阻元件之兩電極施加電壓而測定電流-電壓特性。又,將設置在氧化鋅陶瓷薄板側之電極作為陽極,而將設置在氧化鉍的濺鍍膜之電極作為陰極。電流-電壓特性係依據IEC61051-1且使用Agilent Technologies公司製、Agilent B2901A而測定。從電流-電壓特性,使用下述式(1)而求取1μA~1mA的電壓非線性指數。式(1)中,V1μA為電流1μA時的電壓,V1mA為電流1mA時的電壓。如此進行而求得的電壓非線性指數為24。將實施例1
的特徵和電壓非線性指數顯示在表1。又,表1亦顯示後述實施例2~4、比較例1~3的特徵和電壓非線性指數。
電壓非線性指數=log(1μA/1mA)/log(V1μA/V1mA)‧‧‧(1)
[實施例2]
係在實施例1中,除了將上方的面經研磨洗淨後的氧化鋅陶瓷薄板在氧氣環境下以900℃保持0.5小時以外,係與實施例1同樣地進行而製造電壓非線性電阻元件。第2層的厚度為2nm。從所得到的元件之電流-電壓特性,求取1μA~1mA間的電壓非線性指數時為24。將實施例2的特徵和電壓非線性指數顯示在表1。
[實施例3]
係在實施例1中,除了將添加在氧化鋅之氧化鎵的量變更成為0.05質量%以外,係與實施例1同樣地進行而製造電壓非線性電阻元件。第1層及第2層的體積電阻率係各自為6×10-3Ωcm、3×10-2Ωcm。從所得到的元件之電流-電壓特性,求取1μA~1mA的電壓非線性指數時為18。將實施例3的特徵和電壓非線性指數顯示在表1。
[實施例4]
使用與實施例1同樣的方法製造氧化鋅陶瓷塊,從其切取氧化鋅陶瓷薄板。其次,使用氧化鋅作為標靶進行高頻電漿濺鍍,而在氧化鋅陶瓷薄板上方的面成膜形成厚度為300nm之氧化鋅的濺鍍膜。氧化鋅陶瓷薄板係相當於第1層,氧化鋅的濺鍍膜係相當於第2層。濺鍍係使用ULVAC機工製RFS-200。成膜條件係如以下所述。標靶尺寸:直徑80mm、RF輸出功率:40W、氣體壓(N2):5.0Pa、成膜時間:150分鐘。
如此進行而得到的氧化鋅濺鍍膜之體積電阻率為3×102(Ωcm),厚度為300(nm)。其次,使用與實施例1同樣的方法將由鉍、錳、鈷所構成之氧化物成膜在氧化鋅濺鍍膜上。上述濺鍍膜係相當於第3層。如此進行而得到由3層結構所構成之電阻體。將Al蒸鍍電極設置在所得到的電阻體之兩面而得到電壓非線性電阻元件。從上述元件之電流-電壓特性,求取1μA~1mA間的電壓非線性指數時為11。將實施例4的特徵和電壓非線性指數顯示在表1。
又,體積電阻率,係在與實施例2相同組成、成膜條件之氧化鋅濺鍍膜形成在玻璃基板上,使用上述附氧化鋅濺鍍膜的玻璃基板且藉由東陽Technica公司製(商品名:ResiTest8300)而測定。第2層的厚度係使用TEM(穿透式電子顯微鏡)觀察3層結構體而測定。在TEM,第1層與第2層之氧化鋅的結晶方位不同,所以能夠區別兩層的境界,而且因為第2層與第3層之元素種類不同,所以能夠區別邊界。
[實施例5]
係在實施例1中,除了在成膜形成第3層時,將由鉍、鈷所構成的氧化物(作為金屬元素比,係鉍:鈷=50:50)使用作為標靶以外,係與實施例1同樣地進行而製造電壓非線性電阻元件。從上述元件之電流-電壓特性,求取1μA~1mA間的電壓非線性指數時為11。將實施例5的特徵和電壓非線性指數顯示在表1。
[實施例6]
係在實施例1中,除了在成膜形成第3層時,將由鐠、鈷所形成的氧化物(作為金屬元素比,係鐠:鈷=50:50)使用作為標靶以外,係與實施例1同樣地進行而製造電壓非線性電阻元件。從上述元件之電流-電壓特性,求取1μA~1mA間的電壓非線性指數時為10。將實施例6的特徵和電壓非線性指數顯示在表1。
[比較例1]
係在實施例1中,除了將氧化鋅陶瓷薄板各面的表層進行氧化之步驟省略以外,係使用與實施例1同樣的方法製造電阻體。上述電阻體係為無第2層之2層結構體。將Al蒸鍍電極設置在上述電阻體的兩面,而得到電壓非線性電阻元件。從上述元件的電流-電壓特性,求取1μA~1mA間的電壓非線性指數時為3。將比較例1的特徵和電壓非線性指數顯示在表1。
[比較例2]
係在實施例1中,除了不添加氧化鎵,而只使用氧化鋅作為氧化鋅陶瓷塊的原料製造氧化鋅陶瓷塊,且從上述塊狀物切取氧化鋅陶瓷薄板以外,係使用與實施例1同樣的方法製造電壓非線性電阻元件。相較於氧化鋅陶瓷薄板的內部(第1層),氧化鋅陶瓷薄板表層(第2層)之體積電阻率為較低。從所得到
之電壓非線性電阻元件的電流-電壓特性,求取1μA~1mA間的電壓非線性指數時為8。將比較例2的特徵和電壓非線性指數顯示在表1。
[比較例3]
係在實施例2中,除了在將氧化鋅的濺鍍膜成膜在氧化鋅陶瓷薄板上方的面時,將濺鍍膜的厚度設為1mm以外,係使用與實施例2同樣的方法製造電壓非線性電阻元件。從上述元件的電流-電壓特性,求取1μA~1mA間的電壓非線性指數時為7。將比較例3的特徵和電壓非線性指數顯示在表1。
又,上述的實施例僅僅作為本發明的一個例子,本發明之範圍不受上述實施例限定。
10‧‧‧電壓非線性電阻元件
14、16‧‧‧電極
20‧‧‧電阻體
21‧‧‧第1層
21a‧‧‧第1層的側面
21b‧‧‧第1層的下面
22‧‧‧第2層
23‧‧‧第3層
Claims (7)
- 一種電壓非線性電阻元件,其具備包括:以氧化鋅作為主成分之一第1層;接合在該第1層,以氧化鋅作為主成分,相較於該第1層厚度較薄體積電阻率較高之一第2層;及接合在該第2層中與該第1層接合側之相反側,以與氧化鋅為不同的金屬氧化物作為主成分之一第3層。
- 如申請專利範圍第1項所述之電壓非線性電阻元件,其中該第1層的體積電阻率為1×10-2Ωcm以下,該第2層的體積電阻率較該第1層的體積電阻率高且為1×103Ωcm以下。
- 如申請專利範圍第1或2項所述之電壓非線性電阻元件,其中該第2層的厚度為0.2~300nm。
- 如申請專利範圍第1至3項中之任一項所述之電壓非線性電阻元件,其中該第1層係含有選自由Al、Ga及In所組成群組之至少1種金屬元素的氧化物。
- 如申請專利範圍第1至4項中之任一項所述之電壓非線性電阻元件,其中該第3層係含有選自由Sr、Bi及Pr所組成群組之1種金屬元素的氧化物作為主成分、及選自由Si、Cr、Mn、Co、Ni、Zn、Sb及La所組成群組之至少1種金屬元素的氧化物。
- 一種電壓非線性電阻元件之製法,係製造如申請專利範圍第1至5項中之任一項所述之電壓非線性電阻元件之方法,其包括:(a)將可含有選自由Al、Ga及In所組成群組之至少1種金 屬元素之氧化鋅粉末的成形體,在非氧化環境下煅燒而製造氧化鋅陶瓷基板之步驟;(b)藉由將該氧化鋅陶瓷基板在氧化環境下煅燒,使該氧化鋅陶瓷基板的表層變化成為體積電阻率比該氧化鋅陶瓷基板內部更高的層,而使該氧化鋅陶瓷基板的內部及表層各自成為該第1層及該第2層之步驟,及(c)將該第3層形成在該第2層表面之步驟。
- 一種電壓非線性電阻元件之製法,係製造如申請專利範圍第1至5項中之任一項所述之電壓非線性電阻元件之方法,其包括:(a)將可含有選自由Al、Ga及In所組成群組之至少1種金屬元素之氧化鋅粉末的成形體,在非氧化環境下煅燒而製造氧化鋅陶瓷基板之步驟;(b)藉由將相較於以氧化鋅作為主成分之前述氧化鋅陶瓷基板、厚度較薄且體積電阻率較高的氧化鋅層成膜在前述氧化鋅陶瓷基板的表面,而使該氧化鋅陶瓷基板的內部及表層各自成為該第1層及該第2層之步驟;及(c)將該第3層形成在該第2層表面之步驟。
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