TW201330162A - Apparatus for manufacturing organic el device, and apparatus for forming film - Google Patents

Apparatus for manufacturing organic el device, and apparatus for forming film Download PDF

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TW201330162A
TW201330162A TW102102345A TW102102345A TW201330162A TW 201330162 A TW201330162 A TW 201330162A TW 102102345 A TW102102345 A TW 102102345A TW 102102345 A TW102102345 A TW 102102345A TW 201330162 A TW201330162 A TW 201330162A
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substrate
chamber
processing
comb
transport
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TW102102345A
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Tadashi Wakabayashi
Nobuhiro Nirasawa
Kenji Yumiba
Yukio Ochiai
Mikio Asada
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Hitachi High Tech Corp
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/568Transferring the substrates through a series of coating stations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67742Mechanical parts of transfer devices
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Robotics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electroluminescent Light Sources (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE: An apparatus for manufacturing organic EL device and an apparatus for forming a film are provided to implement an organic EL device having a cluster structure and short length. CONSTITUTION: In an apparatus for manufacturing organic EL device and an apparatus for forming a film, a vacuum chamber comprises a processing unit depositing a material on a substrate(6). A transfer chamber loads and unloads a substrate. A transfer chamber transfers the substrate between the transfer chamber and the processing unit. The processing unit is installed in one vacuum chamber or a plurality of vacuum chamber. At least two processing units are adjacent to each other on one side of the transfer unit. The processing unit includes a substrate controller rotating the substrate to face with a shadow mask.

Description

有機電激發光裝置之製造裝置及角度修正機構 Manufacturing device and angle correcting mechanism of organic electroluminescent device

本發明係有關有機電激發光裝置之製造裝置及角度修正機構,特別是有關運送大型基板,適合於經由蒸鍍法之製造的有機電激發光裝置之製造裝置及修正基板姿勢之角度修正機構。 The present invention relates to a manufacturing apparatus and an angle correcting mechanism for an organic electroluminescence device, and more particularly to a manufacturing apparatus for an organic electroluminescence device that is suitable for transporting a large substrate, and is suitable for manufacturing an organic electroluminescence device by a vapor deposition method, and an angle correction mechanism for correcting the posture of the substrate.

作為顯示裝置,有機電激發光裝置乃備受注目,作為其製造之有力的方法,有著真空蒸鍍法。對於在製造有機電激發光裝置,不只單形成發光材料層(電激發光層),以電極夾持之構造,而於陽極之上方,為了形成電洞植入層或輸送層,於陰極之上方,為了形成電子植入層或輸送層等之材料乃作為薄膜所成之多層構造,有機電激發光裝置之製造裝置乃採取具有複數處理室之群組乃複數連接之構成。作為如此之以往技術係有下記之構成。 As a display device, an organic electroluminescence device is attracting attention, and as a powerful method for manufacturing it, there is a vacuum evaporation method. For fabricating an organic electroluminescent device, not only a layer of luminescent material (electroluminescent layer) but also an electrode sandwiching structure is formed above the anode, in order to form a hole implant layer or a transport layer above the cathode. In order to form a multilayer structure in which a material such as an electron-implanting layer or a transport layer is formed as a thin film, the manufacturing apparatus of the organic electroluminescent device is constructed by a group having a plurality of processing chambers and a plurality of connections. As such a prior art, there is a constitution as follows.

[專利文獻1]日本特開2003-027213號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2003-027213

但,在以往的群組構造中,各處理部乃配置成放射狀,且各群組間的處理部呈未干擾地間隔加以配置之故,有必要加長各群組間的距離,而有作為線全體有變長之課題。特別是,近來使用在顯示裝置之基板尺寸亦對於1500mm×1850mm,以及線長更加變長。另外,放射狀之配置係對於群組及處理部間產生無效空間而空間效率差。 However, in the conventional group structure, each processing unit is arranged in a radial shape, and the processing units between the groups are arranged at intervals without interference, and it is necessary to lengthen the distance between the groups, and it is necessary to The whole line has a long-term problem. In particular, the substrate size recently used in the display device is also 1500 mm × 1850 mm, and the line length is further lengthened. Further, the radial arrangement is ineffective in generating space between the group and the processing unit.

然而,在本發明之群組係指:具有設置於運送基板之方向的至少單側之複數的基板處理部與基板運入出部之構成。 However, the group of the present invention refers to a configuration in which a plurality of substrate processing units and substrate carrying-in portions are provided on at least one side of the direction in which the substrate is transported.

隨之,本發明之第一目的係提供:具有群組構造,可縮短線長之有機電激發光裝置之製造裝置或同製造方法,或者成膜裝置或成膜方法者。 Accordingly, a first object of the present invention is to provide a manufacturing apparatus or a manufacturing method, or a film forming apparatus or a film forming method, which has a group structure and can shorten a line length of an organic electroluminescence device.

另外,本發明之第二目的係提供:具有群組構造,空間效率佳之有機電激發光裝置之製造裝置或/及同製造方法,或者成膜裝置或成膜方法者。 Further, a second object of the present invention is to provide a manufacturing apparatus or the same manufacturing method, or a film forming apparatus or a film forming method, which has a group structure, a space efficiency, and an organic electroluminescence device.

本發明係為了達成上述之目的,至少有下述特徵。 The present invention has at least the following features in order to achieve the above object.

本發明係具有經由第1之梳齒狀柄,運入基板的運入口、和經由第2之梳齒狀柄,運出前述基板的運出口、和支持前述基板之複數之支持柱、和固定複數之前述支持柱,支持前述基板加以旋轉的支持柱旋轉台、和將前述支持柱旋轉台,在與前述基板平行之平面內加以旋轉之旋轉驅動手段、和避免與複數之前述支持柱、和前述第1之梳 齒狀柄與前述第2之梳齒狀柄之至少一方之干涉的迥避手段之角度修正機構為第1特徵。 The present invention has an inlet for transporting the substrate via the first comb-shaped shank, a transport port for transporting the substrate via the second comb-shaped shank, and a plurality of support columns for supporting the substrate, and fixing a plurality of the support columns, a support column rotating table that supports the rotation of the substrate, and a rotary driving means for rotating the support column rotating table in a plane parallel to the substrate, and avoiding the plurality of support columns, and The first comb The angle correcting means of the means for avoiding interference between the toothed shank and at least one of the second comb-shaped shanks is the first feature.

又,前述迥避手段係令複數之前述支持柱,不與前述第1之梳齒狀柄與前述第2之梳齒狀柄之至少一方之干涉地,配置呈矩陣狀者亦可。 Further, the above-described avoidance means may be such that the plurality of support columns are arranged in a matrix without interfering with at least one of the first comb-shaped shank and the second comb-shaped shank.

更且,前述迥避手段係具有:使載置前述基板之前述支持柱旋轉台上下的上下驅動手段、和平行設於前述支持柱旋轉台之上部,具有複數之凸部,於前述凸部間,可插入前述第1之梳齒狀柄與前述第2之梳齒狀柄,具備使複數之前述支持可動之溝的基板載置台亦可。 Further, the above-described avoidance means includes: a vertical driving means for vertically positioning the support column rotating table on which the substrate is placed, and a plurality of convex portions provided in parallel with the upper portion of the support column rotating table, and having a plurality of convex portions between the convex portions The comb-shaped shank of the first and the second comb-shaped shank may be inserted, and a plurality of substrate mounting stages for supporting the movable groove may be provided.

另外,本發明係為了達成上述之目的,具有備有將蒸鍍材料蒸鍍於基板之處理部的真空處理室、和將前述基板運入或運出,具有第1特徵之角度修正機構之收授室、和將前述基板運送在前述收授室與前述處理部之間的運送手段、之真空處理室之有機電激發光裝置之製造裝置為第2特徵。 Further, in order to achieve the above object, the present invention has a vacuum processing chamber provided with a processing portion for vapor-depositing a vapor deposition material on a substrate, and an angle correction mechanism having the first feature for carrying in or out the substrate. The teaching apparatus of the organic electroluminescent device of the teaching room and the conveying means for transporting the substrate between the receiving chamber and the processing unit and the vacuum processing chamber is the second feature.

更且,本發明係複數具有備有將蒸鍍材料蒸鍍於基板之處理部的真空處理室、和將前述基板運入或運出之收授室、和將前述基板運送在前述收授室與前述處理部之間的運送手段之真空處理室的群組;有別於前述收授室,具備運入前述基板之運入負載室和運出前述基板之運出負載室,且,在構成從前述運入負載室運送前述基板於運出負載室之運送系統的運送 部中,設置具有第1特徵之角度修正機構之有機電激發光裝置之製造裝置為第3特徵。 Furthermore, the present invention has a vacuum processing chamber having a processing portion for vapor-depositing a vapor deposition material on a substrate, and a receiving chamber for transporting or transporting the substrate, and transporting the substrate in the receiving room. a group of vacuum processing chambers for transporting means between the processing unit and the receiving chamber; and a transport load chamber that carries the substrate into the load chamber and transports the load from the substrate, and is configured Transportation of the transport system carrying the aforementioned substrate to and from the load chamber from the aforementioned loading into the load chamber In the portion, the manufacturing apparatus of the organic electroluminescence device having the angle correction mechanism of the first feature is the third feature.

如根據本發明,可提供具有群組構造,可縮短線長之有機電激發光裝置之製造裝置或同製造方法,或者成膜裝置或成膜方法者。 According to the present invention, it is possible to provide a manufacturing apparatus or a manufacturing method having a group structure, an organic electroluminescence device capable of shortening the line length, or a film forming apparatus or a film forming method.

另外,如根據本發明,可提供具有群組構造,空間效率佳之有機電激發光裝置之製造裝置或同製造方法,或者成膜裝置或成膜方法者。 Further, according to the present invention, it is possible to provide a manufacturing apparatus or a manufacturing method, or a film forming apparatus or a film forming method, which has a group structure, a space efficiency, and an organic electroluminescence device.

1‧‧‧處理室 1‧‧‧Processing room

1bu‧‧‧真空蒸鍍室 1bu‧‧‧vacuum evaporation chamber

2‧‧‧運送室 2‧‧‧Transportation room

3‧‧‧負載群組 3‧‧‧Load group

4‧‧‧收授室 4‧‧‧Receiving room

4H‧‧‧角度修正機構 4H‧‧‧ Angle Correction Mechanism

4D‧‧‧收授室之載置台 4D‧‧‧The reception desk of the reception room

4P‧‧‧收授室之基板支持銷 4P‧‧‧Substitute support pins

5‧‧‧運送機械手臂 5‧‧‧Transporting robotic arm

6‧‧‧基板 6‧‧‧Substrate

7‧‧‧蒸鍍部 7‧‧‧Decanting Department

8‧‧‧調整部 8‧‧‧Adjustment Department

9‧‧‧處理收授部 9‧‧‧Handling Department

10‧‧‧閘閥 10‧‧‧ gate valve

11‧‧‧間隔板 11‧‧‧ Spacer

31‧‧‧負載室 31‧‧‧Load room

81‧‧‧遮蔽罩 81‧‧‧ mask

71‧‧‧蒸鍍源 71‧‧‧vapor deposition source

100‧‧‧有機電激發光裝置之製造裝置 100‧‧‧Manufacturing device for organic electroluminescent device

A~D‧‧‧群組 A~D‧‧‧ group

圖1乃顯示本發明之實施形態之有機電激發光裝置之製造裝置的圖。 Fig. 1 is a view showing a manufacturing apparatus of an organic electroluminescence device according to an embodiment of the present invention.

圖2乃顯示本發明之實施形態之運送室2與處理室1之構成的概要的圖。 Fig. 2 is a view showing an outline of a configuration of a transport chamber 2 and a processing chamber 1 according to an embodiment of the present invention.

圖3乃顯示本發明之實施形態之運送室與處理室之構成的模式圖與動作說明圖。 Fig. 3 is a schematic view and an operation explanatory view showing a configuration of a transport chamber and a processing chamber according to an embodiment of the present invention.

圖4乃說明角度修正機構之必要性的圖。 Fig. 4 is a view for explaining the necessity of the angle correcting mechanism.

圖5乃顯示在本發明之第1實施形態的角度修正機構之第1實施例的圖。 Fig. 5 is a view showing a first embodiment of the angle correction mechanism according to the first embodiment of the present invention.

圖6乃顯示在本發明之第1實施形態的角度修正機構之第2實施例的圖。 Fig. 6 is a view showing a second embodiment of the angle correction mechanism according to the first embodiment of the present invention.

圖7乃顯示本發明之第1實施形態之處理室1之處理 流程的圖。 Figure 7 is a view showing the processing of the processing chamber 1 according to the first embodiment of the present invention. Diagram of the process.

圖8乃顯示遮蔽罩之一例圖。 Figure 8 is a view showing an example of a mask.

圖9乃說明本發明之(3)之實施形態的圖。 Fig. 9 is a view for explaining an embodiment of (3) of the present invention.

將發明之第1實施形態,使用圖1至圖7加以說明。有機電激發光裝置之製造裝置係不只單形成發光材料層(電激發光層),以電極夾持之構造,而於陽極之上方,形成電洞植入層或輸送層,於陰極之上方,形成電子植入層或輸送層等之各種材料乃作為薄膜所成之多層構造,以及洗淨基板。圖1乃顯示其製造裝置之一例的圖。 The first embodiment of the invention will be described with reference to Figs. 1 to 7 . The manufacturing device of the organic electroluminescence device not only forms a layer of luminescent material (electroluminescence layer), but also has a structure of electrode clamping, and above the anode, a hole implantation layer or a transport layer is formed above the cathode. Various materials forming an electron inlay layer or a transport layer are used as a multilayer structure formed of a film, and a substrate is cleaned. Fig. 1 is a view showing an example of a manufacturing apparatus.

在本實施形態之有機電激發光裝置之製造裝置100係大致由運入處理對象之基板6(以下,單稱作基板)之負載群組3,處理前述基板6之4個的群組(A~D),各群組2間或群組與負載群組3,或者與接下來之工程(密封工程)之間之所設置之5個的收授室4所構成。對於接下來之工程的後方,為了運出基板而至少有如後述之負載室31的卸載室(未圖示)。 In the manufacturing apparatus 100 of the organic electroluminescence device of the present embodiment, the group of the substrate 6 is processed by the load group 3 of the substrate 6 (hereinafter referred to as a substrate) to be processed. ~D), consisting of 2 groups or groups and load group 3, or 5 sets of receiving rooms 4 between the next project (sealing project). At the rear of the next process, at least the unloading chamber (not shown) of the load chamber 31 to be described later is provided in order to carry out the substrate.

負載群組3係由為了於前後維持真空而具有閘閥10之負載室31,和從前述負載室31接受基板6,旋轉將基板6運入於收授室4a之運送機械手臂5R所成。各負載室31及各收授室4係於前後具有閘閥10,控制該閘閥10之開關而維持真空的同時,於負載群組3或接下來的群組等,收授基板。 The load group 3 is formed by a load chamber 31 having a gate valve 10 for maintaining a vacuum before and after, and a transfer robot 3R that receives the substrate 6 from the load chamber 31 and rotates the substrate 6 into the reception chamber 4a. Each of the load chambers 31 and the receiving chambers 4 has a gate valve 10 in front and rear, and controls the gate valve 10 to maintain a vacuum, and the substrate is received in the load group 3 or the next group.

有機電激發光裝置之製造裝置100係並非放射狀形狀,而將具有長方形或正方形之形狀的群組,對於圖1箭頭所示之運送方向而言串聯地配置。各群組(A~D)係擁有具有一台之運送機械手臂5之運送室2,和從運送機械手臂5接受基板,在進行特定處理之圖面上,配置於上下之2個處理室1(第1添加字a~d係顯示群組,第2添加字u,d係顯示上側下側。在以下英文字添加字,小寫係顯示場所,大寫係顯示構成要素)。對於各處理室,係有對於箭頭所示之運送方向而言平行地加以配置之2個的處理部。例如,如後述,對於真空蒸鍍室之處理室1bu,係有處理部1buL與1buR。在其他之處理室亦相同。在圖1中,因符號成為繁雜之故,只對於處理室1bu與1cu附加添加字L(左側),R(右側)。對於運送室2與處理室1之各處理部係設置有閘閥10。 The manufacturing apparatus 100 of the organic electroluminescence device is not a radial shape, but a group having a rectangular or square shape is arranged in series with respect to the transport direction indicated by the arrow in FIG. 1 . Each group (A to D) has a transport chamber 2 having one transport robot arm 5, and a substrate that receives the substrate from the transport robot 5, and is disposed on the upper and lower processing chambers 1 on a plane for performing specific processing. (The first added words a to d are display groups, the second added words u, and d are displayed on the lower side. The following words are added to the English word, the lower case is displayed, and the upper case is displayed.) Each of the processing chambers has two processing units arranged in parallel with respect to the transport direction indicated by the arrow. For example, as will be described later, the processing units 1buL and 1buR are provided in the processing chamber 1bu of the vacuum deposition chamber. The same is true in other processing rooms. In Fig. 1, since the symbols are complicated, only the word L (left side) and R (right side) are added to the processing chambers 1bu and 1cu. A gate valve 10 is provided in each of the processing chambers 2 and the processing chamber 1 .

圖2係顯示運送室2與處理室1之構成的概要。處理室1之構成係根據處理內容而有所差異,但以舉例說明以真空蒸鍍發光材料,形成電激發光層之真空蒸鍍室1bu。圖3係乃其運送室2b與真空蒸鍍室1bu之構成的模式圖與動作說明圖。在圖2之運送機械手臂5係可將全體移動於上下(參照圖3之箭頭53),具有可旋轉於左右之連桿構造之橫桿51,對於前端係於上下二段具有2條基板運送用之梳狀柄部52。經由作為上下二段之時,上係作為運入用,下係作為運出用,可以一個動作同時進行運出入處理者。作為2條柄部或作為1條柄部係經由處理內容 而決定。在以後的說明中,為了將說明作為簡單,以1條柄部進行說明。 FIG. 2 is a view showing the outline of the configuration of the transport chamber 2 and the processing chamber 1. The configuration of the processing chamber 1 differs depending on the processing contents, but a vacuum vapor deposition chamber 1bu in which an electroluminescent layer is formed by vacuum evaporation of the luminescent material is exemplified. Fig. 3 is a schematic view and an operation explanatory view showing a configuration of a transport chamber 2b and a vacuum vapor deposition chamber 1bu. In the transport robot arm 5 of Fig. 2, the whole body can be moved up and down (see arrow 53 in Fig. 3), and the crossbar 51 can be rotated to the left and right link structures, and the front end is supported by two substrates in the upper and lower sections. A comb-like handle 52 is used. When the upper and lower stages are used, the upper system is used for the transport, and the lower system is used for the transport, and the operator can be transported to and from the processor at the same time. Processing content as two handles or as one handle And decided. In the following description, in order to simplify the description, one handle will be described.

另一方面,真空蒸鍍室1bu係大致由使發光材料蒸發,蒸鍍於基板6之蒸鍍部7,和蒸鍍於基板6之必要部分之調整部8,以及進行運送機械手臂5與基板之收授,將基板6移動於蒸鍍部7之處理收授部9所成。對於調整部8與處理收授部9,係設置位於左側處理部之8L,9L,和位於右側處理部之8R,9R。處理收授部9係具有不會與運送機械手臂5之梳狀柄部52干擾而可收授基板6,具有固定基板6之手段94的梳狀柄部91,和使前述梳狀柄部91旋轉而使基板6直立,移動於調整部8或蒸鍍部7而使其對面之基板面控制手段92。作為前述固定之手段,考慮為真空中之情況,使用電磁吸附或夾持之手段等。 On the other hand, the vacuum vapor deposition chamber 1bu is substantially formed by evaporating the luminescent material, vapor-deposited on the vapor deposition portion 7 of the substrate 6, and the adjustment portion 8 which is required to be vapor-deposited on the substrate 6, and the transfer robot 5 and the substrate. The substrate 6 is moved to the processing and receiving unit 9 of the vapor deposition unit 7. The adjustment unit 8 and the process receiving unit 9 are provided with 8L and 9L located in the left processing unit and 8R and 9R located in the right processing unit. The processing and receiving unit 9 has a comb-shaped handle portion 91 that can receive the substrate 6 without interfering with the comb-shaped handle portion 52 of the transport robot arm 5, and has a means 94 for fixing the substrate 6, and the comb-shaped handle portion 91 The substrate surface control means 92 is rotated so that the substrate 6 is erected and moved to the adjustment portion 8 or the vapor deposition portion 7 to face it. As means for the above fixing, it is considered to be a case of vacuum, and a means of electromagnetic adsorption or clamping is used.

調整部8係具有圖8所示之光罩81M,框體81F所成之遮蔽罩81,和經由基板上之定位標記84而進行基板6與遮蔽罩81位置調整之圖2所示的調整驅動部83。 The adjustment unit 8 has a mask 81M as shown in FIG. 8, a mask 81 formed by the frame 81F, and an adjustment drive shown in FIG. 2 for adjusting the position of the substrate 6 and the mask 81 via the positioning marks 84 on the substrate. Section 83.

蒸鍍部7係具有使蒸發源71,沿著軌道76上移動於上下方向之上下驅動手段72,和使蒸發源71沿著軌道75上進行左右的調整部間移動之左右驅動基座74。蒸發源71係於內部具有蒸鍍材料之發光材料,經由加熱控制前述蒸鍍材料(未圖示)之時而得到安定之蒸發速度,如圖3之導出圖所示,成為從排列成線狀之複數的噴射噴嘴73加以噴射之構造。因應必要係呈得到安定之蒸鍍地,添加劑亦同時加熱而蒸鍍。 The vapor deposition unit 7 has a left and right drive base 74 that moves the evaporation source 71 along the rail 76 in the up-and-down direction up/down driving means 72 and the evaporation source 71 to move between the left and right adjustment sections along the rail 75. The evaporation source 71 is a luminescent material having a vapor deposition material therein, and when the vapor deposition material (not shown) is controlled by heating, a stable evaporation rate is obtained, and as shown in the diagram of FIG. 3, it is arranged in a line shape. The plurality of injection nozzles 73 are configured to be sprayed. If necessary, it is stabilized vapor deposition, and the additive is simultaneously heated and evaporated.

在以上實施形態中,運送機械手臂5係為了盡可能將具有於真空中的機構作為簡單化,以全體的上下移動,和基座部的旋轉,和使梳狀柄部52伸縮成放射狀之3自由度所加以構成。因此,如圖4所示,基板6乃以虛線所示地平行地運入於收授室4b,運送機械手臂5b則將基板6直接運送於處理收授部9buL時,基板6係在對於處理收授部9buL而言,具有某角度α L之狀態傾斜地加以設置。對於應付此等,係必須(1)如圖4之實線所示,長方形的基板6乃對於處理收授部1buL而言呈平行重疊地,由運送系統修正前述之α L,或(2)增加運送機械手臂5之自由度,或(3)在蒸鍍部進行修正。 In the above embodiment, the transport robot 5 is configured to simplify the mechanism having a vacuum as much as possible, to move the entire body up and down, and to rotate the base portion, and to expand and contract the comb-shaped handle portion 52 into a radial shape. 3 degrees of freedom are constructed. Therefore, as shown in FIG. 4, the substrate 6 is transported in parallel to the receiving room 4b as indicated by a broken line, and when the transport robot 5b transports the substrate 6 directly to the processing and receiving unit 9buL, the substrate 6 is processed. The receiving unit 9buL is provided with a state of a certain angle α L obliquely. In order to cope with this, it is necessary to (1) as shown by the solid line in FIG. 4, the rectangular substrate 6 is overlapped in parallel with respect to the processing and receiving portion 1buL, and the aforementioned α L is corrected by the transport system, or (2) Increase the degree of freedom of transporting the robot arm 5, or (3) correct it in the vapor deposition section.

首先,說明(1)之本實施形態。因此,於上述之實施形態之說明,在其中構成運送系統係指:負載群組3之負載室31,運送機械手臂5R,收授室4,運送室2之運送機械手臂5及處理室1之處理收授部9。至少需要在其中任一處進行修正。但,真空室內係需要盡可能作為簡單的構造,在負載室31或收授室4進行修正者為佳。負載室31或收授室4之構造係基本上為相同之故,將收授室4作為例。 First, the present embodiment of (1) will be described. Therefore, in the above description of the embodiment, the transport system is constituted by the load chamber 31 of the load group 3, the transport robot 5R, the reception room 4, the transport robot 5 of the transport chamber 2, and the processing chamber 1. The receiving section 9 is processed. At least one of the corrections needs to be made. However, it is preferable that the vacuum chamber is as simple as possible, and it is preferable to perform correction in the load chamber 31 or the reception room 4. The configuration of the load chamber 31 or the reception chamber 4 is substantially the same, and the reception chamber 4 is taken as an example.

圖5乃作為角度修正機構之第1實施例,顯示在收授室4之角度修正機構的圖。圖5(a)係將運送機械手臂5之梳狀柄部52插入於收授室4時,從上方俯視的圖,圖5(b)係顯示收授室4之側面圖。 Fig. 5 is a view showing the angle correcting mechanism of the receiving room 4 as a first embodiment of the angle correcting means. Fig. 5(a) is a plan view from above when the comb-shaped handle 52 of the transport robot 5 is inserted into the reception room 4, and Fig. 5(b) is a side view showing the reception room 4.

收授室4係具有設置於兩側面之基板運入出口的閘閥 10I,10E,和具有複數之支持銷4P的載置台4D,和角度修正機構4H,前述角度修正機構4H係由支持載置台4D之載置台支持部4S,和使前述載置台支持部4S左右地旋轉之旋轉驅動馬達4KM,和密封載置台支持部4S之磁氣封條4J所構成。 The receiving room 4 has a gate valve that is disposed at the exit of the substrate disposed on both sides 10I, 10E, and a mounting table 4D having a plurality of support pins 4P, and an angle correcting mechanism 4H, wherein the angle correcting mechanism 4H is supported by the mounting table support portion 4S of the mounting table 4D, and the mounting table supporting portion 4S is left and right The rotary rotary drive motor 4KM and the magnetic seal 3J of the seal stage support portion 4S are formed.

在如此之機構,以圖5(a)之虛線所示,想定群組A之運送機械手臂5a乃將基板6,於無旋轉狀態之載置台4D,以平行於其載置台之狀態加以載置之後,運送機械手臂5b乃呈重疊於圖4所示之處理收授部1buL地進行運送之情況。此情況,如前述,於處理收授部9buL,從運送機械手臂5b而視,以使基板6,α L度之旋轉於右的狀態進行運送即可。 In such a mechanism, as shown by the broken line in FIG. 5(a), the transport robot arm 5a of the group A is placed on the mounting table 4D in the non-rotating state, and placed in a state parallel to the mounting table. Thereafter, the transport robot arm 5b is transported by being superimposed on the processing and receiving unit 1buL shown in FIG. In this case, as described above, the processing and receiving unit 9buL may be transported from the transport robot arm 5b so that the rotation of the substrate 6 by α L degrees is right.

當看到其動作流程時,首先,在閘閥10E關閉狀態開啟閘閥10I,經由運送機械手臂5a之梳狀柄部52a,從閘閥的開口部10IK運入基板,載置於載置台4D。在前述梳狀柄部52a退出後,關閉閥體10IB之同時,使載置台4D,經由前述角度修正機構4H而α L度旋轉於右。之後,開啟閘閥10E,從其開口部10EK插入運送機械手臂5b之梳狀柄部52b,抬起基板6而運出。運送機械手臂5a係將其基座,旋轉在處理收授部1buL之方向,調節連桿長度同時而將基板6載置於處理收授部9buL。 When the operation flow is seen, first, the gate valve 10I is opened in the closed state of the gate valve 10E, and the substrate is transported from the opening portion 10IK of the gate valve via the comb-shaped shank portion 52a of the transport robot arm 5a, and placed on the mounting table 4D. After the comb-shaped shank portion 52a is withdrawn, the valve body 10IB is closed, and the mounting table 4D is rotated by α to the right by the angle correction mechanism 4H. Thereafter, the gate valve 10E is opened, the comb-shaped shank portion 52b of the transport robot arm 5b is inserted from the opening portion 10EK, and the substrate 6 is lifted up and transported. The transport robot arm 5a rotates the base thereof in the direction of the process receiving portion 1buL, and adjusts the length of the link while placing the substrate 6 on the process receiving portion 9buL.

在以上的說明中,說明將基板6以平行的狀態運入於收授室4,設置於載置台4D之情況,但基板6乃具有角度β加以設置之情況係對於基板6之梳狀柄部52b而言之 角度乃呈α L地。控制載置台4D之角度。 In the above description, the case where the substrate 6 is carried in the parallel state to the receiving chamber 4 and is placed on the mounting table 4D will be described. However, the case where the substrate 6 has the angle β is provided for the comb-shaped handle of the substrate 6. In terms of 52b The angle is α L. Control the angle of the stage 4D.

在本實施例中,載置台4D乃在進行角度修正之後,可將運送機械手臂5b不會與支持銷4P干擾而插入於載置台4D與基板6之間地,決定支持銷4P之粗度,間隔及梳狀柄部52之梳柄的條數,寬度等。在圖5(a)中,以實線顯示角度修正後之基板6與此時之支持銷4P的狀態,虛線乃顯示角度修正前之狀態。 In the present embodiment, after the angle correction is performed, the mounting table 4D can be inserted between the mounting table 4D and the substrate 6 without interfering with the support pin 4P, and the thickness of the support pin 4P can be determined. The number and width of the combs of the spacer and the comb-shaped handle 52 are equal to each other. In Fig. 5(a), the state of the substrate 6 after the angle correction and the support pin 4P at this time are displayed in a solid line, and the broken line indicates the state before the angle correction.

圖6乃顯示在收授室4之角度修正機構的第2實施例的圖。 Fig. 6 is a view showing a second embodiment of the angle correcting mechanism in the receiving room 4.

在第1實施例中,經由前述之支持銷的尺寸,限制運送機械手臂5b之運送範圍,即運入角度α L等。如後述,各群組的構成乃相同,對於運送之基板的尺寸為一定之情況,可將角度α L等作為一定者。如此之情況係第1實施例乃機構為簡單而優越。但在並非如此之情況,在第1實施例中,出現多少的限制。因此,第2實施例之角度修正機構4H係具有未使載置台4D旋轉,而只使基板6旋轉之機構。其結果,運送機械手臂5b之運入路徑形狀係不變,均可對應於任何的角度,可縮小梳狀柄部52b之梳柄寬度,而擴大可對應之基板尺寸者。 In the first embodiment, the conveyance range of the transport robot 5b, that is, the carry-in angle α L or the like is restricted via the size of the aforementioned support pin. As will be described later, the configuration of each group is the same, and when the size of the substrate to be transported is constant, the angle α L or the like can be made constant. In this case, the first embodiment is that the mechanism is simple and superior. However, in the case where this is not the case, in the first embodiment, how many restrictions occur. Therefore, the angle correcting mechanism 4H of the second embodiment has a mechanism that rotates only the substrate 6 without rotating the mounting table 4D. As a result, the shape of the transport path of the transport robot 5b is constant, and it can be adjusted to any angle, and the width of the comb handle 52b can be reduced, and the corresponding substrate size can be enlarged.

在圖6,角度修正機構係由支持銷4P,和固定前述支持銷之支持銷旋轉台4KD,和將前述支持銷旋轉台4KD,藉由旋轉台支持部4SJ,旋轉於左右之旋轉驅動馬達4KM,和使其移動於上下之上下驅動馬達4JM所構成。然而,4V係對於旋轉台支持部4SJ之上下移動而言之密封用 波紋管。另一方面,載置台4D乃固定,其橫剖面係如圖6(a)所示,具有支持基板6之凸部4DT。另外,對於載置台4D,係有作為可旋轉支持銷4P之各支持銷或對於支持銷群而言之可動溝4SK。 In Fig. 6, the angle correcting mechanism is a support pin 4P, and a support pin rotating table 4KD for fixing the support pin, and the support pin rotating table 4KD is rotated by the rotary table support portion 4SJ to the right and left rotary drive motor 4KM. And make it move up and down the upper drive motor 4JM. However, the 4V system is used for sealing the upper and lower movements of the rotary table support 4SJ. Bellows. On the other hand, the mounting table 4D is fixed, and its cross section has a convex portion 4DT of the support substrate 6 as shown in Fig. 6(a). Further, the mounting table 4D is provided with a support pin as a rotatable support pin 4P or a movable groove 4SK for a support pin group.

在如此之機構中,首先,運送機械手臂5a乃運入於收授室4b,將基板6載置於載置台4D之凸部4DT。此時,支持銷4P係與支持銷旋轉台4KD同時位於最下位位置。之後,使支持銷旋轉台4KD上升,以支持銷4P支持基板6,以期望角度,例如α L,使支持銷旋轉台4KD旋轉,在其狀態,使支持銷旋轉台4KD下降,載置基板6於載置台4D。接著,使運送機械手臂5b運入,把持基板6而從收授室4b運出。 In such a mechanism, first, the transport robot arm 5a is carried into the reception chamber 4b, and the substrate 6 is placed on the convex portion 4DT of the mounting table 4D. At this time, the support pin 4P is located at the lowest position at the same time as the support pin rotating table 4KD. Thereafter, the support pin rotating table 4KD is raised to support the pin 4P supporting the substrate 6, and the support pin rotating table 4KD is rotated at a desired angle, for example, α L , and the supporting pin rotating table 4KD is lowered in the state thereof, and the substrate 6 is placed. On the mounting table 4D. Next, the transport robot 5b is carried in, and the substrate 6 is gripped and transported from the reception room 4b.

如以上,在本實施例中,對於運送機械手臂5b,即使成為任何角度,亦可經常將載置台4D之凸部4DT間作為運出路徑者。然而,在本實施例中,以細長之凸部4DT,載置基板6,但亦可以配置呈直線狀之支持銷而載置。 As described above, in the present embodiment, even if the transport robot arm 5b is at any angle, the convex portion 4DT of the mounting table 4D can often be used as the transport path. However, in the present embodiment, the substrate 6 is placed on the elongated convex portion 4DT, but a linear support pin may be placed and placed.

如以上說明,如根據本實施形態,可提供於收授室,由於設置改變基板之運送角度的角度修正機構者,可串聯地連結具有長方形之處理室的群組構造,可縮短全體線長之有機電激發光裝置之製造裝置及同製造方法。 As described above, according to the present embodiment, it is possible to provide the angle correction mechanism for changing the conveyance angle of the substrate, and to connect the group structure having the rectangular processing chambers in series, thereby shortening the entire line length. A manufacturing apparatus of an organic electroluminescence device and a method of manufacturing the same.

另外,如根據本實施形態,可提供可實現具有上述之群組構造的線構成,空間效率佳之有機電激發光裝置之製造裝置或同製造方法者。 Further, according to the present embodiment, it is possible to provide a manufacturing apparatus or a manufacturing method of an organic electroluminescence device which can realize a line configuration having the above-described group structure and which is excellent in space efficiency.

在以上之說明,例如不考慮α R,α L之關係而進行 過明。 In the above description, for example, the relationship between α R and α L is not considered. Too clear.

隨之,如將角度修正機構設置於各收授部4,可對應於各群組或各處理室的尺寸或者基板尺寸。 Accordingly, if the angle correcting mechanism is provided in each of the receiving portions 4, it can correspond to the size of each group or each processing chamber or the substrate size.

在一連串的處理,於在圖1之各處理室彼此,或者於一個之處理室之中,如圖3所示,可將複數之處理部彼此,作成同一形狀,同一配置者。 In a series of processes, as shown in FIG. 3, in each of the processing chambers of FIG. 1, or in one of the processing chambers, a plurality of processing units can be formed in the same shape and in the same arrangement.

例如,在圖1之實施形態中,群組A~D係同一形狀,同一配置,並且配置於各群組之上下的2個處理室亦對於運送方向而言為線對稱,並且在一個之處理室的2個處理部亦於運送方向,對於垂直線而言為線對稱。因此,運送機械手臂5係配置於運送室,嚴格來說配置於群組的中位置。其結果,在圖4之α R、aL係成為α R=-α L=α,在處理室1bd中,係成為與處理室1bu交叉的關係,在處理收授部9bdR中,採取α的值,在處理收授部9bdL中,採取-α的值。 For example, in the embodiment of FIG. 1, the groups A to D are of the same shape and the same arrangement, and the two processing chambers disposed above each group are also line symmetrical with respect to the transport direction, and are processed in one. The two processing sections of the chamber are also in the transport direction and are line symmetrical for the vertical lines. Therefore, the transport robot 5 is disposed in the transport chamber and is disposed strictly in the middle of the group. As a result, α R and α L in FIG. 4 are α R=−α L=α, and in the processing chamber 1bd, the relationship with the processing chamber 1bu is crossed, and in the processing receiving unit 9bdR, the value of α is taken. In the processing and receiving unit 9bdL, the value of -α is taken.

.因此,首先第1,收授室4之角度修正機構係如為同一尺寸基板之處理,無需採取連續的值,如採取一定角度±α的2值的數值即可。此情況,第1實施形態之第1實施例乃成為有效。 Therefore, firstly, the angle correcting mechanism of the receiving room 4 is a process of the same size substrate, and it is not necessary to take a continuous value, for example, a value of two values of a certain angle ±α. In this case, the first embodiment of the first embodiment is effective.

在此情況,在同一群組內,於具有從α至-α或從-α至α之處理收授部,運送基板6時,有必要在其群組接觸之收授室4,進行角度修正。 In this case, in the same group, when the substrate 6 is transported from the process receiving portion from α to -α or from -α to α, it is necessary to perform angle correction in the reception room 4 in contact with the group. .

在圖1所示之實施形態中,如後述,在同一處理室內之2個處理部之處理係為同一。隨之,在同一群組內中, 運送於具有從α至α或從-α至-α之處理收授部。更且,各群組的修正角度乃在±α而如為同一,某基板係在所有補正角度α,接下來的基板係在所有補正角度-α,從有機電激發光裝置之製造裝置100之運入口至運出口加以處理,運送。此情況,盡可能在上流側如進行一次角度修正即可,如前述前提條件未改變,無需在下流進行角度修正。當然,對於前述前提條件改變時,係必要設置角度修正機構。 In the embodiment shown in Fig. 1, as will be described later, the processing of the two processing units in the same processing chamber is the same. Then, in the same group, It is transported to a processing department having a process from α to α or from -α to -α. Moreover, the correction angle of each group is ±α and is the same, a substrate is at all correction angles α, and the next substrate is at all correction angles -α, from the manufacturing apparatus 100 of the organic electroluminescent device. Transport to the port of transport to handle and transport. In this case, it is only necessary to perform an angle correction on the upstream side as much as possible. If the foregoing preconditions are not changed, it is not necessary to perform angle correction in the downstream. Of course, it is necessary to set the angle correction mechanism when the aforementioned preconditions are changed.

作為在本實施形態之候補係負載室31與收授室4a。在負載室31中,亦可設置與收授室同樣的機構,但亦可於負載室31運入基板6時,預先具有±α之角度而運入。另外,如對於負載室31,並不運入各基板,而以複數片收納之卡匣單位加以運入,對於上側的負載室31,係亦可配置具有α之角度的卡匣,對於下側的負載室31,係亦可配置具有-α之角度的卡匣。 The candidate load chamber 31 and the reception room 4a in the present embodiment are used. Although the same mechanism as that of the reception room may be provided in the load chamber 31, it may be carried in an angle of ±α in advance when the load chamber 31 carries the substrate 6. Further, as for the load chamber 31, the substrates are not carried in, but are carried in units of cassettes in which a plurality of sheets are accommodated, and for the upper load chamber 31, cassettes having an angle of α may be arranged, and for the lower side, The load chamber 31 may also be provided with a cassette having an angle of -α.

如根據本實施形態,因可並聯地具有2個同一線路之故,在外觀上全體生產線有變長者,但在對於生產量而言之單位長度係比較於以往可縮短者。 According to the present embodiment, since the two lines can be connected in parallel, the entire production line is long in appearance, but the unit length for the production amount can be shortened compared with the conventional one.

接著,(2)說明對於增加運送機械手臂之自由度的方法之實施形態。設置使圖5所示之運送機械手臂5之梳狀柄部52左右旋轉的自由度。例如,於與梳狀柄部52之橫桿的連接部52J,設置其自由度。新設置移動於真空室內之機構者並不理想,但可得到與前述第1實施形態同樣的效果。 Next, (2) describes an embodiment of a method for increasing the degree of freedom in transporting the robot arm. The degree of freedom in rotating the comb-shaped shank 52 of the transport robot 5 shown in FIG. 5 to the left and right is provided. For example, the degree of freedom is set at the connecting portion 52J of the crossbar of the comb-shaped handle 52. It is not preferable to newly install a mechanism that moves in the vacuum chamber, but the same effects as those of the first embodiment described above can be obtained.

於說明在(3)之蒸鍍部進行修正的方法之前,使用圖7,說明圖1至圖3所示之處理室1乃將收授室4或在其上流進行角度修正之基板6,運入於處理收授部9,進行真空蒸鍍,至運出為止之處理流程。本流程處理後係如前述,運送於位於同一群組的對角線上之處理部,進行同樣的蒸鍍處理。 Before explaining the method of correcting the vapor deposition section in (3), the processing chamber 1 shown in FIGS. 1 to 3 will be described as the substrate 6 in which the reception chamber 4 or the upward flow angle correction is performed, using FIG. The processing is carried out in the processing and receiving unit 9, and vacuum evaporation is performed until the processing is performed. After the process, the process is carried out on the diagonal of the same group as described above, and the same vapor deposition process is performed.

在本實施形態之真空蒸鍍裝置之基本思考方法係將上面運送之基板6,直立成垂直,運送至調整部8,進行蒸鍍。運送時基板6之下面乃如為蒸鍍面,有必要進行反轉,但上面為蒸鍍面之故,只直立成垂直即可。 In the vacuum vapor deposition apparatus of the present embodiment, the substrate 6 is vertically erected and transported to the adjustment unit 8 to perform vapor deposition. The lower surface of the substrate 6 during transport is a vapor deposition surface, and it is necessary to invert it. However, the upper surface is a vapor deposition surface, and it is only erected vertically.

接著,對於本實施形態,參照圖3的同時,使用圖7詳細說明真空蒸鍍處理流程。在圖3中,存在有基板6時係以實線表示。 Next, in the present embodiment, the vacuum vapor deposition process flow will be described in detail with reference to FIG. In FIG. 3, when the substrate 6 is present, it is indicated by a solid line.

首先,在R線中,運入基板6R,將基板6R直立成垂直,移動至調整部8R,在基板6與遮蔽罩81進行位置調整(StepR1至StepR3)。此時,基板係將蒸鍍面作為上方之上面運送之故,無需進行反轉而可馬上進行位置調整。位置調整係如圖3之導出圖所示,以CCD相機86照攝,設置於基板6之定位標記84乃呈出現於設置在光罩81M的窗85之中心地,經由將遮蔽罩81R,以前述調整驅動部83控制之時而進行。本蒸鍍乃如為發光成紅(R)色之材料,如圖8所示,於對應於光罩81M之R的部分開有窗,並蒸鍍其部分。此窗的尺寸係根據顏色有所差異,但平均為寬度為50μm、高度為150μm程度。光罩 81M之厚度乃40μm、往後有成為更薄之傾向。 First, in the R line, the substrate 6R is carried, the substrate 6R is erected vertically, and moved to the adjustment portion 8R, and the substrate 6 and the mask 81 are positionally adjusted (StepR1 to StepR3). At this time, since the substrate is transported as the upper surface of the vapor deposition surface, the position adjustment can be performed immediately without reversing. The position adjustment is as shown in the export diagram of FIG. 3, and is photographed by the CCD camera 86. The positioning mark 84 provided on the substrate 6 is present at the center of the window 85 provided in the mask 81M, via the mask 81R. The adjustment drive unit 83 performs the control. This vapor deposition is, for example, a material that emits red (R) color. As shown in FIG. 8, a portion corresponding to the R of the mask 81M is opened with a window, and a portion thereof is vapor-deposited. The size of this window varies depending on the color, but the average width is 50 μm and the height is 150 μm. Mask The thickness of 81M is 40 μm, and there is a tendency to become thinner in the future.

如位置調整結束,將蒸鍍源71移動於R線側(StepL0)、之後使線狀之蒸鍍源71移動於上或下而進行蒸鍍(StepR4)。於R線蒸鍍中,在L線,R線同樣,進行StepR1至StepR3之處理。即,運入其他的基板6L,將該基板6L直立成垂直,移動至調整部8L,進行與遮蔽罩81L之位置調整。當結束R線的基板6R的蒸鍍時,蒸鍍源71移動於L線(StepR4)、蒸鍍位於L線之基板6(StepL4)。此時,蒸鍍源71乃從R線的蒸鍍範圍完全出現之前,基板6R乃從調整部8R離開時,因有不需要加以蒸鍍之可能性之故,於完全出現之後,開始從基板6R之處理室1的運出動作,之後進入新的基板6R之準備。為了迴避前述不需要之蒸鍍,而於線之間設置間隔板11。然而,圖3乃顯示StepR4及StepL1之狀態。即,在R線中,開始蒸鍍,在L線中,於真空蒸鍍室1bu,運入基板之狀態。 When the position adjustment is completed, the vapor deposition source 71 is moved to the R line side (StepL0), and then the linear vapor deposition source 71 is moved up or down to perform vapor deposition (Step R4). In the R-line vapor deposition, the processing of StepR1 to StepR3 is performed in the same manner as the L line and the R line. In other words, the other substrate 6L is carried, the substrate 6L is erected vertically, and moved to the adjustment portion 8L to adjust the position of the shield cover 81L. When the vapor deposition of the substrate 6R of the R line is completed, the vapor deposition source 71 moves to the L line (StepR4), and the substrate 6 on the L line is vapor-deposited (Step L4). At this time, when the vapor deposition source 71 is completely out of the vapor deposition range of the R line, when the substrate 6R is separated from the adjustment portion 8R, there is a possibility that vapor deposition is not required, and after the complete appearance, the substrate is started. The processing operation of the processing chamber 1 of 6R is followed by preparation for entering the new substrate 6R. In order to avoid the aforementioned unnecessary vapor deposition, a partition plate 11 is provided between the lines. However, Figure 3 shows the states of StepR4 and StepL1. In other words, in the R line, vapor deposition is started, and in the L line, the substrate is transferred to the vacuum deposition chamber 1bu.

之後,經由連續進行上述流程之時,除了蒸發部7之移動時間,可不會浪費使用蒸鍍材料而進行蒸鍍。對於蒸鍍所需之時間與其他處理時間係略1分鐘,如將蒸發源71之移動時間作為5秒時,以往係1分鐘的浪費之蒸鍍時間乃在本實施形態中,可縮短成5秒。如根據上述本實施形態,如圖6所示,真空蒸鍍室1bu之處理基板1枚之處理周期係實質上成為蒸鍍時間+蒸發源71之移動時間,可使生產性提昇。如以前述條件評估處理時間,對於以 往的2分鐘而言,在本發明中係成為1分5秒,可將對於1室之生產性提昇成約2倍。 Thereafter, when the above-described flow is continuously performed, in addition to the moving time of the evaporation portion 7, vapor deposition can be performed without using a vapor deposition material. When the time required for vapor deposition is slightly shorter than the other processing time, and if the moving time of the evaporation source 71 is 5 seconds, the vapor deposition time of the conventional one minute is reduced to 5 in the present embodiment. second. According to the above-described embodiment, as shown in FIG. 6, the processing cycle of one processing substrate in the vacuum vapor deposition chamber 1bu is substantially the vapor deposition time + the moving time of the evaporation source 71, and the productivity can be improved. If the processing time is evaluated by the aforementioned conditions, In the case of 2 minutes in the present invention, in the present invention, it is 1 minute and 5 seconds, and the productivity for 1 chamber can be increased to about 2 times.

以上(1)(2)實施形態係對於將所有基板6之蒸鍍面作為上面而運送,呈可以直立之遮蔽罩進行蒸鍍地,將基板直立之情況加以說明。在其他的蒸鍍方法中,有著基板,遮蔽罩均作為水平進行之方法。此情況的多數係如圖9所示,將蒸鍍面作為下面,從下方進行蒸鍍處理。如此之情況係在(3)之蒸鍍部進行補正之方法亦為有效。 The above (1) and (2) embodiments are described in which the vapor deposition surface of all the substrates 6 is transported as an upper surface, and the substrate can be vapor-deposited in an upright shield to erect the substrate. In other vapor deposition methods, there are substrates, and the masks are all performed horizontally. In many cases, as shown in Fig. 9, the vapor deposition surface is used as the lower surface, and the vapor deposition treatment is performed from below. In this case, the method of correcting in the vapor deposition section of (3) is also effective.

在如此之實施形態中,為了將基板處理面運送於下面,將基板6放入於專用的容器,把持基板的兩端而運送。角度調節機構係可適用上述實施形態所示之方法。 In such an embodiment, in order to transport the substrate-treated surface to the lower surface, the substrate 6 is placed in a dedicated container, and both ends of the substrate are transported. The angle adjustment mechanism can be applied to the method described in the above embodiment.

另外,因將基板作成垂直而蒸鍍之故,遮蔽罩之位置調整機構等變為複雜,使處理室1內之處理收授部9旋轉情況係為困難,但基板處理面乃水平之情況,將圖5所示之機構設置於處理收授部9,以及修正角如為一定,如圖9所示,經由將調整部7,配合其角度而設置,將蒸發源71,配合其角度而使其掃描之時,實質上亦可進行角度修正者。 In addition, since the substrate is formed to be vertical and vapor-deposited, the position adjustment mechanism of the mask is complicated, and it is difficult to rotate the processing and receiving unit 9 in the processing chamber 1. However, the substrate processing surface is horizontal. The mechanism shown in FIG. 5 is provided in the process receiving portion 9, and the correction angle is constant. As shown in FIG. 9, the adjustment portion 7 is provided at an angle thereof, and the evaporation source 71 is matched with the angle thereof. At the time of scanning, the angle correction can be performed substantially.

經由本實施形態,亦可得到與先前之實施形態相同的效果。 According to this embodiment, the same effects as those of the previous embodiment can be obtained.

隨之,不論對於經由不同之蒸鍍面姿勢之遮蔽罩的姿勢為如何而可適用本發明。 Accordingly, the present invention can be applied regardless of the posture of the mask through different vapor deposition surface postures.

另外,在上述說明中,以例說明過有機電激發光裝置,但亦可適用於與有機電激發光裝置相同背景之進行蒸鍍 處理的成膜裝置及成膜方法。 Further, in the above description, the organic electroluminescence device has been described by way of example, but it is also applicable to evaporation in the same background as the organic electroluminescence device. Film forming apparatus and film forming method for processing.

4H‧‧‧角度修正機構 4H‧‧‧ Angle Correction Mechanism

4D‧‧‧收授室之載置台 4D‧‧‧The reception desk of the reception room

4P‧‧‧收授室之基板支持銷 4P‧‧‧Substitute support pins

4S‧‧‧載置台支持部 4S‧‧‧Station Support Department

4J‧‧‧磁氣封條 4J‧‧‧Magnetic seal

4KM‧‧‧旋轉驅動馬達 4KM‧‧‧Rotary drive motor

6‧‧‧基板 6‧‧‧Substrate

10I、10E‧‧‧閘閥 10I, 10E‧‧‧ gate valve

10IK‧‧‧開口部 10IK‧‧‧ openings

10IB‧‧‧關閉閥體 10IB‧‧‧Close the valve body

10EK‧‧‧開口部 10EK‧‧‧ openings

52‧‧‧梳狀柄部 52‧‧‧ comb handle

52J‧‧‧連接部 52J‧‧‧Connecting Department

Claims (8)

一種角度修正機構,其特徵係具有:經由第1之梳齒狀柄,運入基板的運入口、和經由第2之梳齒狀柄,運出前述基板的運出口、和支持前述基板之複數之支持柱、和固定複數之前述支持柱,支持前述基板加以旋轉的支持柱旋轉台、和將前述支持柱旋轉台,在與前述基板平行之平面內加以旋轉之旋轉驅動手段、和避免與複數之前述支持柱、和前述第1之梳齒狀柄與前述第2之梳齒狀柄之至少一方之干涉的迴避手段。 An angle correction mechanism comprising: a transport inlet that is carried into a substrate via a first comb-shaped shank; an transport port that transports the substrate via a second comb-shaped shank, and a plurality of supports for the substrate a supporting column, and a fixed plurality of the supporting columns, a supporting column rotating table supporting the rotation of the substrate, and a rotating driving means for rotating the support column rotating table in a plane parallel to the substrate, and avoiding and plural The support column and the avoiding means for interfering with at least one of the first comb-shaped shank and the second comb-shaped shank. 如申請專利範圍第1項之角度修正機構,其中,前述迴避手段係令複數之前述支持柱,不與前述第1之梳齒狀柄與前述第2之梳齒狀柄之至少一方之干涉地,配置呈矩陣狀者。 The angle correction mechanism of claim 1, wherein the avoidance means is such that the plurality of support columns do not interfere with at least one of the first comb-shaped shank and the second comb-shaped shank , configured in a matrix. 如申請專利範圍第1項之角度修正機構,其中,前述迴避手段係具有:使載置前述基板之前述支持柱旋轉台上下的上下驅動手段、和平行設於前述支持柱旋轉台之上部,具有複數之凸部,於前述凸部間,可插入前述第1之梳齒狀柄與前述第2之梳齒狀柄,具備使複數之前述支持可動之溝的基板載置台。 The angle correction mechanism according to claim 1, wherein the avoidance means includes: an upper and lower driving means for vertically positioning the support column rotating table on which the substrate is placed, and a parallel upper portion of the support column rotating table; The plurality of convex portions may be inserted between the convex portions and the second comb-shaped shank, and include a plurality of substrate mounting tables for supporting the movable grooves. 如申請專利範圍第1項至第3項之任一項之角度 修正機構,其中,前述迴避手段係具有:垂直設於前述支柱旋轉台的旋轉台支持部、和旋轉前述旋轉台支持部之旋轉驅動馬達、和真空密封前述旋轉台支持部的密封手段。 If you apply for any of the scope of items 1 to 3 of the patent scope The correction mechanism includes: a turntable support portion that is vertically provided on the pillar turntable; a rotary drive motor that rotates the turntable support portion; and a sealing means that vacuum-seals the turntable support portion. 如申請專利範圍第3項之角度修正機構,其中,前述旋轉驅動手段係具有:垂直設於前述支柱旋轉台的旋轉台支持部、和旋轉前述旋轉台支持部之旋轉驅動馬達、和真空密封前述旋轉台支持部的密封手段;前述上下驅動手段係具有:上下前述旋轉台支持部的上下驅動馬達、和設於前述密封手段,可進行前述旋轉台支持部之上下的密封脂蛇腹。 The angle correction mechanism according to claim 3, wherein the rotation driving means includes: a rotary table support portion that is vertically provided on the support column rotary table; a rotary drive motor that rotates the rotary table support portion; and a vacuum seal The sealing means of the turntable support portion includes: a vertical drive motor that supports the rotary table support portion up and down, and a sealing means provided on the rotary table support portion to perform a sealing grease belly. 如申請專利範圍第1項至第3項之任一項之角度修正機構,其中,於前述運入口與前述運出口,各別設置閘閥者。 The angle correction mechanism according to any one of the items 1 to 3, wherein the gate valve is separately provided at the inlet and the outlet. 一種有機電激發光裝置之製造裝置,其特徵係具有:備有將蒸鍍材料蒸鍍於基板之處理部的真空處理室、和將前述基板運入或運出,具有申請專利範圍第1項至第6項任一項記載之角度修正機構之收授室、和將前述基板運送在前述收授室與前述處理部之間的運送手段、之真空處理室者。 A manufacturing apparatus of an organic electroluminescence device, comprising: a vacuum processing chamber in which a vapor deposition material is vapor-deposited on a processing portion of a substrate; and the substrate is carried in or out, and has a patent application scope item 1 The reception room of the angle correction mechanism according to any one of the sixth aspect, and the transportation means for transporting the substrate between the reception room and the processing unit, and a vacuum processing room. 一種有機電激發光裝置之製造裝置,其特徵係複數具有:備有將蒸鍍材料蒸鍍於基板之處理部的真空處理室、和將前述基板運入或運出之收授室、和將前述基板運送在前述收授室與前述處理部之間的運送手段之真空處理室的群組;有別於前述收授室,具備運入前述基板之運入負載室和運出前述基板之運出負載室,且,在構成從前述運入負載室運送前述基板於運出負載室之運送系統的運送部中,設置如申請專利範圍第1項至第6項之任一項記載之角度修正機構。 A manufacturing apparatus for an organic electroluminescence device, characterized in that: a vacuum processing chamber in which a vapor deposition material is vapor-deposited on a processing portion of a substrate; and a reception chamber in which the substrate is carried in or out, and a group of vacuum processing chambers for transporting the substrate between the receiving chamber and the processing unit; and different from the receiving chamber, having a transporting load into the load chamber and transporting the substrate The load chamber is provided, and an angle correction according to any one of the first to sixth aspects of the patent application is provided in a transport unit that constitutes a transport system that transports the substrate from the transport load chamber to the transport load chamber. mechanism.
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