TW201226946A - Array test apparatus - Google Patents
Array test apparatus Download PDFInfo
- Publication number
- TW201226946A TW201226946A TW100124117A TW100124117A TW201226946A TW 201226946 A TW201226946 A TW 201226946A TW 100124117 A TW100124117 A TW 100124117A TW 100124117 A TW100124117 A TW 100124117A TW 201226946 A TW201226946 A TW 201226946A
- Authority
- TW
- Taiwan
- Prior art keywords
- unit
- glass panel
- blowing
- magnetic member
- gas
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 61
- 239000011521 glass Substances 0.000 claims abstract description 124
- 238000007664 blowing Methods 0.000 claims description 78
- 238000005259 measurement Methods 0.000 claims description 2
- 230000003442 weekly effect Effects 0.000 claims description 2
- 239000007787 solid Substances 0.000 claims 1
- 238000010276 construction Methods 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 80
- 239000010410 layer Substances 0.000 description 30
- 230000005684 electric field Effects 0.000 description 19
- 239000000758 substrate Substances 0.000 description 15
- 239000004973 liquid crystal related substance Substances 0.000 description 13
- 230000007547 defect Effects 0.000 description 9
- 239000000382 optic material Substances 0.000 description 8
- 238000004891 communication Methods 0.000 description 5
- 239000010408 film Substances 0.000 description 4
- 239000004983 Polymer Dispersed Liquid Crystal Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- 210000002858 crystal cell Anatomy 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- 150000002367 halogens Chemical class 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 206010011469 Crying Diseases 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 230000000739 chaotic effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Theoretical Computer Science (AREA)
- Liquid Crystal (AREA)
- Gas-Filled Discharge Tubes (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020100139196A KR101207029B1 (ko) | 2010-12-30 | 2010-12-30 | 어레이 테스트 장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201226946A true TW201226946A (en) | 2012-07-01 |
Family
ID=46413658
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100124117A TW201226946A (en) | 2010-12-30 | 2011-07-07 | Array test apparatus |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR101207029B1 (ko) |
| CN (1) | CN102568359A (ko) |
| TW (1) | TW201226946A (ko) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102235475B1 (ko) * | 2019-05-14 | 2021-04-05 | 주식회사 탑 엔지니어링 | 어레이 테스터 |
| KR102190482B1 (ko) * | 2019-05-14 | 2020-12-15 | 주식회사 탑 엔지니어링 | 어레이 테스터 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5432461A (en) * | 1991-06-28 | 1995-07-11 | Photon Dynamics, Inc. | Method of testing active matrix liquid crystal display substrates |
| US5465052A (en) * | 1991-09-10 | 1995-11-07 | Photon Dynamics, Inc. | Method of testing liquid crystal display substrates |
| KR20090082737A (ko) * | 2008-01-28 | 2009-07-31 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치용 모듈레이터 |
| CN101299125B (zh) * | 2008-07-03 | 2010-10-13 | 塔工程有限公司 | 阵列测试器 |
| JP2010014552A (ja) | 2008-07-03 | 2010-01-21 | Top Engineering Co Ltd | アレイテスト装備 |
| KR101470591B1 (ko) * | 2008-08-04 | 2014-12-11 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치 |
| KR101002429B1 (ko) * | 2008-10-06 | 2010-12-21 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치 |
| KR100911331B1 (ko) | 2008-12-30 | 2009-08-07 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치 및 상기 어레이 테스트 장치의 기판 일지점 위치 측정 방법 |
| KR100911330B1 (ko) | 2008-12-30 | 2009-08-07 | 주식회사 탑 엔지니어링 | 어레이 테스트 장치와, 상기 어레이 테스트 장치의 기판 일지점 위치 측정 방법과, 카메라 어셈블리에 촬상된 특정 위치좌표 측정 방법 |
-
2010
- 2010-12-30 KR KR1020100139196A patent/KR101207029B1/ko active IP Right Grant
-
2011
- 2011-07-04 CN CN2011101848531A patent/CN102568359A/zh active Pending
- 2011-07-07 TW TW100124117A patent/TW201226946A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| KR101207029B1 (ko) | 2012-11-30 |
| CN102568359A (zh) | 2012-07-11 |
| KR20120077293A (ko) | 2012-07-10 |
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