TW201126151A - Method and system for inspecting light emitting diode - Google Patents

Method and system for inspecting light emitting diode Download PDF

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Publication number
TW201126151A
TW201126151A TW99101338A TW99101338A TW201126151A TW 201126151 A TW201126151 A TW 201126151A TW 99101338 A TW99101338 A TW 99101338A TW 99101338 A TW99101338 A TW 99101338A TW 201126151 A TW201126151 A TW 201126151A
Authority
TW
Taiwan
Prior art keywords
light
emitting diode
detecting
pick
arm
Prior art date
Application number
TW99101338A
Other languages
English (en)
Chinese (zh)
Inventor
Yu-Tsai Yang
Yu-Fong Yang
Original Assignee
Gallant Prec Machining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gallant Prec Machining Co Ltd filed Critical Gallant Prec Machining Co Ltd
Priority to TW99101338A priority Critical patent/TW201126151A/zh
Priority to JP2010076110A priority patent/JP2011151340A/ja
Priority to KR1020100054397A priority patent/KR20110085830A/ko
Publication of TW201126151A publication Critical patent/TW201126151A/zh

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Led Devices (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW99101338A 2010-01-19 2010-01-19 Method and system for inspecting light emitting diode TW201126151A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW99101338A TW201126151A (en) 2010-01-19 2010-01-19 Method and system for inspecting light emitting diode
JP2010076110A JP2011151340A (ja) 2010-01-19 2010-03-29 発光ダイオードの検査方法とシステム
KR1020100054397A KR20110085830A (ko) 2010-01-19 2010-06-09 발광다이오드의 검사방법과 시스템

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99101338A TW201126151A (en) 2010-01-19 2010-01-19 Method and system for inspecting light emitting diode

Publications (1)

Publication Number Publication Date
TW201126151A true TW201126151A (en) 2011-08-01

Family

ID=44538033

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99101338A TW201126151A (en) 2010-01-19 2010-01-19 Method and system for inspecting light emitting diode

Country Status (3)

Country Link
JP (1) JP2011151340A (ko)
KR (1) KR20110085830A (ko)
TW (1) TW201126151A (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI466210B (ko) * 2011-12-30 2014-12-21
TWI567369B (zh) * 2014-04-07 2017-01-21 Pioneer Corp The semiconductor light-emitting device of the measuring device
TWI687363B (zh) * 2019-08-02 2020-03-11 鴻勁精密股份有限公司 電子元件作業設備

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102435958B (zh) * 2011-10-24 2013-07-24 天津市中环电子计算机有限公司 一种气动双板光纤led指示灯测试仪
CN102508175B (zh) * 2011-10-24 2013-10-16 天津市中环电子计算机有限公司 一种气动单板光纤led指示灯测试仪

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2780744B2 (ja) * 1992-11-06 1998-07-30 信越半導体株式会社 ＧａＡｌＡｓ発光素子の製造方法
AU7730800A (en) * 1999-09-29 2001-04-30 Color Kinetics Incorporated Systems and methods for calibrating light output by light-emitting diodes
US20060075631A1 (en) * 2004-10-05 2006-04-13 Case Steven K Pick and place machine with improved component pick up inspection
JP2006234497A (ja) * 2005-02-23 2006-09-07 Seiwa Electric Mfg Co Ltd 光学特性測定装置
JP4566153B2 (ja) * 2006-05-01 2010-10-20 パナソニック株式会社 電子部品装着装置と面発光デバイスの実装方法
JP2008076126A (ja) * 2006-09-20 2008-04-03 Oputo System:Kk 測光装置及び測光方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI466210B (ko) * 2011-12-30 2014-12-21
TWI567369B (zh) * 2014-04-07 2017-01-21 Pioneer Corp The semiconductor light-emitting device of the measuring device
TWI687363B (zh) * 2019-08-02 2020-03-11 鴻勁精密股份有限公司 電子元件作業設備

Also Published As

Publication number Publication date
KR20110085830A (ko) 2011-07-27
JP2011151340A (ja) 2011-08-04

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