TW200936251A - Coating machine and fixing method of a substrate - Google Patents

Coating machine and fixing method of a substrate Download PDF

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Publication number
TW200936251A
TW200936251A TW097138880A TW97138880A TW200936251A TW 200936251 A TW200936251 A TW 200936251A TW 097138880 A TW097138880 A TW 097138880A TW 97138880 A TW97138880 A TW 97138880A TW 200936251 A TW200936251 A TW 200936251A
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Taiwan
Prior art keywords
substrate
pressure
holding
coating
platform
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TW097138880A
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Chinese (zh)
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TWI458564B (en
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Toshihiro Mori
Sadahiko Ito
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Toray Eng Co Ltd
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C5/00Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
    • B05C5/02Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C13/00Means for manipulating or holding work, e.g. for separate articles
    • B05C13/02Means for manipulating or holding work, e.g. for separate articles for particular articles
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Coating Apparatus (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

A coating device capable of setting the attraction of adsorption substrates being able to restrain the working cycle of the coating device in long-term when does not generate uneven coating and a method of maintaining the substrate. The coating device comprises: a substrate maintaining device for generating attraction in attraction hole formed on surface of the worktable and adsorbing and maintaining the substrate on the surface of the worktable and a coating unit for moving relative to the substrate and ejecting the coating solution; the substrate maintaining device comprises a pressure adjusting part for adjusting the pressure attached to the substrate to adjust the attraction to the substrate; the pressure adjusting part can be adjusted into initial pressure and maintaining pressure; the initial pressure adsorbs the substrate just loaded on the surface of the worktable; the maintaining pressure maintains the state of the substrate maintaining in the surface of the worktable after the initial pressure adsorbing the substrate; the maintaining pressure is set to be less than the initial pressure.

Description

200936251 六、發明說明: 【發明所屬之技術領域】 本發明是關於塗佈塗佈液於基板(3111^1;1*31^)上之塗佈 裝置(coating machine)及其基板的保持方法。 【先前技術】 在液晶顯示器(liquid crystal display)或電衆顯示 器(plasma display)等的平面面板顯示器(flat panel ❹display)使用有在玻璃基板(glass substrate)上塗佈有 光阻(resist)液者(稱為塗佈基板)。該塗佈基板是藉由均 勻地塗佈光阻液之塗佈裝置形成。 該塗佈裝置具有:承載有基板的平台(stage);吐出有 光阻液之塗佈單元(coating unit),藉由一邊由塗佈單元 吐出光阻液,一邊使塗佈單元移動,以在基板上形成有均 勻厚度的光阻液膜。 在這種塗佈裝置中’使基板保持於平台之手段(means) © —般已知有藉由在平台形成有吸附孔,使負壓產生於該吸 附孔’使基板吸附保持於平台上(例如參照專利文獻1)。 具體上,藉由吸附孔與負壓產生裝置被連接,設定該負壓 產生裝置於低壓(高真空側),以在吸附孔產生負壓。而且, 藉由基板一被供給至平台就以負壓產生裝置進行高速排 氣’急速地使負壓產生於吸附孔,使吸附基板於平台所需 的吸附時間縮短’謀求塗佈裝置的週期時間(c y c 1 e t i m e ) 的提高。 200936251 [專利文獻1]日本國特開2〇〇6 — 281〇91號公報 【發明内容】 但疋,在上述塗佈裝置中藉由以負壓產生裝置進行高 速排氣,在吸附孔產生大的負壓(高真空侧壓力若在這 種大的吸引力產生的狀態下進行塗佈,則有在相當於吸附 孔的基板部分中產生塗佈不均之虞的問題。 因此,若設定(設定為大氣壓側)俾產生於吸附孔的負 ❹壓變弱’則在負壓產生裝置中無法進行高速減,使設定 壓力產生於吸附孔的時間變長。亦即,使基板吸附於平台 所需的時間變長,其結果有塗佈裝置的週期時間長期化之 問題。 本發明乃是鑑於上述問題點所進行的創作,其目的為 提供一種塗佈裝置及其基板保持方法,即使是設定吸附基 板的吸引力為不產生塗佈不均程度的情形,也能抑制塗佈 裝置的週期時間長期化。 ® "為了解決上述課題,本發明的塗佈裝置包含:承載基板 之平台;使吸引力產生於形成於前述平台的表面之吸引 孔,並使基板吸附保持於平台的表面之基板保持手段;以 及一邊對被保持於前述平台的表面之基板相對地移動,一 邊吐出塗佈液之塗佈單元,其特徵為:前述基板保持手段具 有可調知對基板的吸引力之壓力調節部,該壓力調節部可 調節成吸附剛被承載於平台的表面後的基板之初期壓,與 藉由該初期壓使基板吸附後,維持基板被保持於平台的表 4 200936251 面的狀態之保持壓,該保持壓是設定為比前述初期壓小 依照該塗佈裝置,透過在吸附被承載於平台的基板 情形下,使負壓(比大氣壓小的壓力)產生於吸w孔並急 地吸附,在壓力到達初期壓後’藉由前述壓力調節部調 成比初期壓小的保持壓,可保持所吸附的基板於平台上 因此,因在藉由塗佈單元塗佈塗佈液於基板上的情形下 可在藉由比初期壓小的保持壓吸附保持的基板上進行 佈,故與如以往般在吸附被承载於平台的基板之初期壓 ❹進行塗佈的情形比較,可抑制在相當於吸引孔的部分產 塗佈不均。而且,因即使是藉由比初期壓小的保持壓保 基板於平台的構成,也能在吸附基板時以高速產生初 壓,故可解除塗佈裝置的週期時間長期化之問題。 而且能以如下之構成:前述基板保持手段具有:使吸 力產生於前述吸引孔之吸引力產生裝置;以及連通並連 該吸引力產生裝置與前述吸引孔之配管,前述壓力調節 刀別各自具備:調節成前述初期壓之配管路徑;以及調節 C)别述保持壓之配管路徑。 依照該構成’僅藉由切換配管路徑可容易切換吸引 中的初期壓的產生與保持壓的產生。因此,可提高初期 與保持壓的切換響應性。 而且能以如下之構成:在連結於前述吸引孔之附近 配管裝設有壓力計,在該壓力計到達初期壓的情形下被 節成前述保持壓。 依照該構成’因壓力計配設於配管的吸引孔附近, 的 迷 節 0 塗 下 生 持 期 引 接 部 成 孔 壓 的 調 故 5 200936251 與安裝於其 影響並精度 為了解 法,是包含4 之平台;使 之基板保持 基板相對地 前述基板保 0對基板的吸 被吸附於平 調節成比該 依照該 於平台的基 附,在壓力 初期壓小的 板之初期壓 ©孔的部分產 的保持壓保 速產生初期 題。 【發明的功 依照本-定吸附基板 吸引力產生於前述平台 手段,以及一邊對被保 移動,一邊吐出塗佈液 持手段具有可藉由調節 引力之壓力調節部,在 台的表面的基板之壓力 初期壓小的保持壓並保 塗佈裝置的基板保持方 板的情形下,使負壓產 到達初期壓後’藉由前 保持壓’與如以往般在 下進行塗佈的情形比較 生塗佈不均。而且,因 持基板於平台的構成, 壓’故可解除塗佈裝置 效】 卜明的塗佈裝置及其基板保 的吸引力為不產生塗佈不均 他的配管部分的情形比較,可抑制壓力損失的 佳地计測吸引孔中的壓力。 決上述課題,本發明的塗佈裝置的基板保持方 p下構件之塗佈裝置的基板保持方法:承載基板 的表面並吸附保持基板 持於前述平台的表面之 之塗佈單元’其特徵為: 附加於基板的壓力調節 藉由該壓力調節部使對 到達預定的初期壓後, 持有基板。 法’透過在吸附被承載 生於吸引孔並急速地吸 述壓力調節部調節成比 吸附被承载於平台的基 ’可抑制在相當於吸引 即使是藉由比初期壓小 也能在吸附基板時以高 的週期時間長期化之問 持方法’即使是設 程度的情形,也能 6 200936251 抑制塗佈裝置的週期時間長期化 【實施方式】 使用圖面說明與本發明有關的實施的形態。 圖1是概略地顯示本發明的一實施形態中 之斜視圖’圖2是顯示塗佈單元的腳部附近之置 示塗佈裝置的配管系統之圖。 是顯 如圖卜圖3所示,塗佈裝置是將藥液或 〇狀物(以下稱為塗佈液)之塗佈膜形成於基板丨〇上寻的液 基台2 ;用以承載基板1 〇之平a 9〗 ’具備:200936251 VI. Description of the Invention: [Technical Field] The present invention relates to a coating machine for coating a coating liquid on a substrate (3111^1; 1*31^) and a method for holding the same. [Prior Art] A flat panel display such as a liquid crystal display or a plasma display uses a resist liquid coated on a glass substrate. (referred to as coated substrate). The coated substrate is formed by a coating device that uniformly coats the photoresist. The coating device has a stage on which a substrate is carried, a coating unit that discharges a photoresist, and the coating unit is moved while discharging the photoresist from the coating unit. A photoresist film having a uniform thickness is formed on the substrate. In such a coating device, a means for holding a substrate on a platform is generally known to have an adsorption hole formed in a platform, and a negative pressure is generated in the adsorption hole to adsorb and hold the substrate on the platform ( For example, refer to Patent Document 1). Specifically, the suction pressure is connected to the negative pressure generating means, and the negative pressure generating means is set at a low pressure (high vacuum side) to generate a negative pressure in the adsorption hole. Further, when the substrate is supplied to the stage, the high-pressure exhaust is performed by the negative pressure generating means to rapidly generate the negative pressure in the adsorption hole, so that the adsorption time required for adsorbing the substrate on the stage is shortened, and the cycle time of the coating device is sought. (cyc 1 etime ) is improved. [Patent Document 1] Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. The negative pressure (the high vacuum side pressure is applied in a state in which such a large suction force occurs, there is a problem that coating unevenness occurs in the substrate portion corresponding to the adsorption hole. Therefore, if it is set ( When the pressure is set to the atmospheric pressure side, the negative pressure generated by the adsorption hole is weakened, so that the high pressure is not reduced in the negative pressure generating device, and the set pressure is generated in the adsorption hole for a long time. That is, the substrate is adsorbed to the platform. The time required is prolonged, and as a result, there is a problem that the cycle time of the coating device is prolonged. The present invention has been made in view of the above problems, and an object thereof is to provide a coating device and a substrate holding method thereof, even if it is set The attraction force of the adsorption substrate is such that the coating unevenness does not occur, and the cycle time of the coating device can be prevented from being prolonged. In order to solve the above problems, the coating device of the present invention comprises a platform for carrying the substrate; a substrate holding means for causing attraction to be formed on the surface of the platform, and holding the substrate on the surface of the platform; and moving relative to the substrate held on the surface of the platform a coating unit for discharging a coating liquid, wherein the substrate holding means has a pressure adjusting portion that can adjust an attractive force to the substrate, and the pressure adjusting portion can be adjusted to adsorb the surface just after being carried on the surface of the platform. The initial pressure of the substrate is maintained at a state in which the substrate is held by the surface of the table 4 200936251 after the substrate is adsorbed by the initial pressure, and the holding pressure is set to be smaller than the initial pressure according to the coating device. In the case of adsorbing the substrate carried on the platform, a negative pressure (a pressure smaller than atmospheric pressure) is generated in the suction hole and is rapidly adsorbed, and after the pressure reaches the initial pressure, the pressure adjustment portion is adjusted to the initial pressure. The small holding pressure can keep the adsorbed substrate on the platform. Therefore, in the case where the coating liquid is coated on the substrate by the coating unit, Since the cloth is placed on the substrate held by the pressure-holding adsorption which is smaller than the initial pressure, it is possible to suppress the coating of the portion corresponding to the suction hole as compared with the case where the film is applied by the initial stage of adsorption of the substrate supported on the stage. Further, since the initial pressure is generated at a high speed when the substrate is adsorbed by holding the substrate on the stage by holding the substrate at a lower pressure than the initial pressure, the problem of prolonging the cycle time of the coating device can be eliminated. Further, the substrate holding means may include: an attraction generating device that generates suction force in the suction hole; and a pipe that connects and connects the suction force generating device and the suction hole, and each of the pressure adjusting blades includes: A piping path that is adjusted to the initial pressure; and a piping path that adjusts C) to maintain the pressure. According to this configuration, the generation of the initial pressure and the generation of the holding pressure in the suction can be easily switched only by switching the piping path. Therefore, the switching responsiveness of the initial stage and the holding pressure can be improved. Further, it is configured such that a pressure gauge is attached to the pipe adjacent to the suction hole, and the holding pressure is set when the pressure gauge reaches the initial pressure. According to the configuration, the pressure gauge is placed in the vicinity of the suction hole of the pipe, and the singularity of the splicing portion of the splicing section is applied to the hole. The substrate holding substrate is fixed to the substrate, and the suction of the substrate is adsorbed to a holding pressure which is adjusted to be higher than the initial pressure of the plate at the initial pressure of the plate according to the base attached to the platform. The pre-warning problem arises. [The work of the invention is based on the above-described platform means for attracting the suction force of the substrate, and the substrate for holding the coating liquid while the protective liquid is held, and having a pressure adjusting portion capable of adjusting the attractive force, the substrate on the surface of the stage When the initial pressure is small and the holding pressure is small and the substrate holding plate of the coating device is held, the negative pressure production is brought to the initial pressure, and the front holding pressure is compared with the conventional coating. Uneven. Further, since the substrate is placed on the stage, the pressure of the substrate can be released, so that the coating device and the substrate are attracted to each other, and the suction portion of the substrate is not affected. The pressure loss is preferably measured in the suction hole. In the above-mentioned problem, the substrate holding method of the coating device of the substrate holding unit p of the coating device of the present invention is a coating unit that carries the surface of the substrate and adsorbs and holds the substrate on the surface of the platform. The pressure adjustment applied to the substrate holds the substrate after the pressure adjustment portion reaches the predetermined initial pressure. The method of 'transferring the pressure-adjusting portion to the pressure-adjusting portion and adjusting the pressure-adjusted portion to be adsorbed on the base of the platform can suppress the attraction even if it is smaller than the initial pressure. In the case where the cycle time is long, the cycle time of the coating device can be prolonged even if the degree is set. [Embodiment] The embodiment of the present invention will be described with reference to the drawings. Fig. 1 is a perspective view schematically showing an embodiment of the present invention. Fig. 2 is a view showing a piping system of the coating device in the vicinity of the leg portion of the coating unit. As shown in FIG. 3, the coating device is a liquid substrate 2 formed by forming a coating film of a chemical liquid or a sputum (hereinafter referred to as a coating liquid) on a substrate raft; 1 〇之平 a 9〗 'With:

<十。21,以及對該平A 動於特定方向而構成之塗佈單元3〇。 σ 1可移 此外’在以下的說明中是以塗佈單元3〇移動 X軸方向’以與X轴方向在水平面上正交的方向 為 向,以正交於X轴及Υ軸方向之雙方的 袖方 行說明。 …軸方向來進 在前述基台2於其中央部分配置有平 口 21。該平台 91 ❹是承載所搬進的基板10。而且,在該平Α 〇 13 21配設有基板保 持手段4 0,藉由該基板保持手段4 〇你其Λ 、 又4υ使基板10被保持。具<Ten. 21, and a coating unit 3〇 configured to move in a specific direction. σ 1 is movable. In the following description, the coating unit 3 〇 is moved in the X-axis direction by a direction orthogonal to the X-axis direction on the horizontal plane, and is orthogonal to both the X-axis and the Υ-axis direction. The sleeves are lined up. The axial direction is advanced. The base 2 is provided with a flat opening 21 at its central portion. The platform 91 is the substrate 10 on which the loading is carried. Further, the substrate holding means 40 is disposed on the flat plate 13 21, and the substrate holding means 4 holds the substrate 10 while the substrate holding means 4 is held. With

體上’藉由使吸引力產生於形成在平A Q 的表面的複數個 吸引孔21 a,可使基板1 0吸附保持於平A。 0 21的表面。 亦即,該基板保持手段40具有真空泵(vacuum pump)81 (本發明的吸引力產生襞置)鱼遠 運通並連接該真空泵 8“參照圖3)與吸引孔2U之配管5〇, #由使真空泵以動 作,經由配管5 0使負壓(比大氣壓小的厭 $ J的壓力)產生於吸引孔 200936251 2 1 a ’可保持基板i 〇。 而且’基板保持手段40具有壓力調節部41,在本實施 形態中可藉由該壓力調節部4 1調節成初期壓與保持壓。此 處’初期壓是指使剛被承載於平台2 1的表面後的基板i 〇 吸附於平台21的表面時的壓力’藉由真空泵81進行高速 排氣’急速地使負壓產生於吸引孔2 1 a並瞬間地吸附基板 10用的壓力。而且,保持壓是指在藉由初期壓吸附基板1〇 後,用以維持基板1 〇被保持在平台2丨的表面之狀態的壓 ❹力,是比初期壓小,被吸附於平台2 i的基板i 〇不會產生 偏移的壓力。 壓力調節部41是調節成初期壓的配管(主配管51)與 調節成保持壓的配管(副配管5 2)藉由各自的配管路徑構 成。具體上如圖3所示’在調節成初期壓的主配管51配設 有主閥(mainvalve)51a,藉由開關該主閥51a可連通或遮 蔽真空泵81與吸引孔21a。因此,藉由在使該主閥51a全 開的狀態下使真空录81動作’以在吸引孔21 a產生初期 ◎壓。據此,可對被承載於平台21的表面之基板10附加初 期壓並吸附。 而且,在調節成保持壓的副配管5 2配設有副閥(s u b valve)52a 與副調節器(sub regulator)52b。該副閥 52a 是與主閥51 a相同’藉由開關該副閥5 2 a,·^透過副配管 52連通或遮蔽真空泵81與吸引孔21 a。而且,副調節器5 2b 是設定俾配管成為預定的壓力,在本實施形態中是設定俾 副調節器52b的設定壓力成為保持壓。因此,因藉由在使 200936251 副閥5 2 a全開的狀態下使真空泵8 1動作,壓力藉由副調節 器52b控制,故在吸引孔2ia產生保持壓。此外,若在使 主閥51a及副閥52a全開的狀態下使真空泵81動作,則藉 由透過主配管5 1被吸引而在吸引孔2 1 a產生初期壓。 而且’在配管50配設有壓力計53。該壓力計53是計 測配管5 0内的壓力’在本實施形態中是配設於平台2 1正 下方的吸引孔2 1 a附近的配管5 0部分。據此,可抑制壓力 損失等的影響,可精度佳地計測吸引孔2丨a的壓力狀態。 〇 而且’在平台21配設有使基板10進行升降動作之基板 升降機構。具體上’在平台21的表面形成有複數個銷孔(p in hole)’在該銷孔埋設有可在z軸方向進行升降動作之頂出 銷(lift pin)(未圖示)。亦即,藉由若在由平台21的表面 使頂出銷突出的狀態下基板1 0被搬進,則頂出銷的尖端部 分抵接基板10並可保持基板1〇,使頂出銷下降並使其收容 於銷孔,可將基板10承載於平台21的表面。 而且’藉由於在平台21的表面承載基板1〇的狀態下使 ❿頂出銷上升’使頂出鎖的尖端部分抵接基1G,能以複數 根頂出銷的尖端部分保持基板】。於預定的高度位置。據 可極力地抑制與基板10的接觸部分而保持,可不使基 板1 0損傷而平順地進行更換。 一且塗佈單疋30是塗佈塗佈液於基板1〇上。該塗佈 早元30如圖1、圖9 α - 圏2所示,具有與基台2連結的腳部31和 延伸於Y軸方向的M 1 . $ 縫喷嘴部(slit nozzle part)34,在跨 過基台2上於γ紅+ 、1袖方向的狀態下可移動於X轴方向而被安 200936251 端部分分別設置有延伸 31被滑動自如地安裝於 裝有線性馬達(1 inear 裝。具體上’在基台2的γ轴方向兩 於X軸方向的軌條(rail)22,腳部 該執條22。而且,在腳部31安 m〇t〇r)33’藉由驅動控制該線性馬達33使塗佈單元3〇移動 於X轴方向,可在任意的位置停止。 在塗佈單元3〇的腳部31如圖2所示安裝有塗佈塗佈液 之開縫喷嘴部34。具體上’在該聊部31配設有延伸於z轴 方向的軌條37與沿著該轨條37滑動之滑塊(sHder)35,此 ❹等滑塊35與開縫喷嘴部34是被連結。而且,在滑塊”安 裝有藉由词服馬達36(參照圖4)驅動的滾珠螺桿(1)311 screw)機構,藉由驅動控制該伺服馬達36使滑塊35移動於 Z轴方向,並且可在任意的位置停止。亦即,開縫喷嘴部3 4 疋對被保持於平台21的基板1〇可接離(attach and detach) 地被支撐》 開縫噴嘴部34是塗佈塗佈液並在基板1〇上形成塗佈 膜。該開縫喷嘴部34是具有延伸於單向的形狀之柱狀構 ❹件’與塗佈單元30的行走(running)方向大致正交而配設。 在該開縫喷嘴部34形成有延伸於長度方向的開縫喷嘴 (si it nozzle)34a ’供給至開縫喷嘴部34的塗佈液是由開 縫嗔嘴34a遍及長度方向一樣地被吐出。因此,藉由在由該 開縫喷嘴34a使塗佈液吐出的狀態下使塗佈單元3〇行走於 X軸方向,遍及開縫噴嘴34a的長度方向在基板1〇上形成 有一定厚度的塗佈膜。 接著,針對上述塗佈裝置的控制系統之構成,使用圖4 200936251 所示的方塊圖來說明。 圖4是顯示配設於該塗佈裝置之控制裝置9〇的控制系 統之方塊圖。如圖4所示,該塗佈裝置配設有控制上述的各 種單元的驅動之控制裝置90。該控制裝置90具有:控制本 體部91、驅動控制部92、壓力控制部93、輸入/輸出裝置 控制部9 4、外部裝置控制部9 5。 控制本體部91具備:執行邏輯運算之週知的CPU ;預先 5己憶控制該CPU之種種的程式等之R〇jj(Read-Only Memory: ❹唯讀記憶體);在裝置動作中一時地記憶種種的資料(data) 之RAM(Random Access Memory:隨機存取記憶體);記憶種 種的程式或0S( Ope rating System:作業系統)並且記憶生產 程式等的各種資料之HDD(HardDisk:硬碟)等。而且,控制 本體部91具有:主控制部91 a、判定部91 b、記憶部91 c。 主控制部91 a是為了依照預先記憶的程式執行一連串 的塗佈動作,透過驅動控制部9 2驅動控制各單元的伺服馬 達36、線性馬達33等的驅動裝置。 〇 判定部91 b是判定在吸附保持基板1 0的情形下,使吸 引力產生的壓力狀態是否適當。亦即,判定藉由壓力計53 檢測的壓力是否到達初期壓。具體上,在後述的記憶部9 i c 記憶有預先設定的初期壓資料’判斷所檢測的壓力是否為該 初期壓。在假設到達初期壓的情形下,透過後述的壓力控制 部93控制,俾主閥51 a成為閉狀態。據此,藉由連通吸引 孔2 1 a與真空泵8 1的配管5 0僅被切換至副配管5 2,使產 生於吸引孔21 a的壓力被調節成以副調節器52b設定的保持 200936251 壓。而且,在壓力計53未到達初期壓的情形下,主閥5ia 及副閥52a的狀態在原封不動的狀態下被維持。 §己憶部91c是用以儲存有各種資料’並且一時地儲存運 算結果等。具體上,記憶有初期壓、保持壓等的資料。 驅動控制部92是根據來自控制本體部9丨的控制信號 驅動控制線性馬達33、伺服馬達36等。具體上,藉由控制 線ϋ馬達3 3及伺服馬達3 6使塗佈單元3 〇的移動及開縫喷 嘴部34的升降動作等被驅動控制。The substrate 10 can be adsorbed and held at a flat A by causing attraction to occur in a plurality of suction holes 21a formed on the surface of the flat AQ. 0 21 surface. In other words, the substrate holding means 40 has a vacuum pump 81 (the attraction generating device of the present invention), and the vacuum pump 8 (see FIG. 3) is connected to the piping 5 of the suction hole 2U. The vacuum pump operates to generate a negative pressure (pressure less than the atmospheric pressure) via the pipe 50 to the suction hole 200936251 2 1 a ' to hold the substrate i 〇. Moreover, the substrate holding means 40 has the pressure adjusting portion 41. In the present embodiment, the pressure adjusting portion 41 can be adjusted to the initial pressure and the holding pressure. Here, the initial pressure refers to the case where the substrate i 刚 immediately after being carried on the surface of the stage 21 is adsorbed on the surface of the stage 21. The pressure 'high-speed exhaust by the vacuum pump 81' rapidly generates a negative pressure in the suction hole 21a and instantaneously adsorbs the pressure for the substrate 10. Further, the holding pressure means that after the initial pressure adsorption of the substrate 1 The pressing force for maintaining the state in which the substrate 1 is held on the surface of the stage 2 is a pressure that is smaller than the initial pressure and is not displaced by the substrate i 吸附 adsorbed on the stage 2 i. The pressure adjusting unit 41 is a pipe that is adjusted to the initial pressure ( The main pipe 51) and the pipe (the sub pipe 5 2) adjusted to maintain the pressure are constituted by respective pipe paths. Specifically, as shown in FIG. 3, the main pipe 51 adjusted to the initial pressure is provided with a main valve (mainvalve). 51a, the vacuum pump 81 and the suction hole 21a can be connected or shielded by the main valve 51a. Therefore, the vacuum recording 81 is operated in a state where the main valve 51a is fully opened to generate an initial pressure in the suction hole 21a. According to this, the initial pressure can be applied to the substrate 10 carried on the surface of the stage 21 and adsorbed. Further, the sub-pipe 5 2 adjusted to maintain the pressure is provided with a sub valve 52a and a sub-regulator (sub). The sub-valve 52a is the same as the main valve 51a. By the switch, the sub-valve 5 2 a, the second sub-pipe 52 communicates or shields the vacuum pump 81 from the suction hole 21 a. Moreover, the sub-regulator 5 2b In the present embodiment, the set pressure of the 俾 sub regulator 52b is set to the holding pressure. Therefore, the vacuum pump 8 1 is operated by fully opening the 200936251 sub valve 5 2 a. The pressure is controlled by the sub-regulator 52b, so it is sucking When the vacuum pump 81 is operated in a state where the main valve 51a and the sub-valve 52a are fully opened, the initial pressure is generated in the suction hole 21a by being sucked through the main pipe 51. A pressure gauge 53 is disposed in the pipe 50. The pressure gauge 53 is a portion of the pipe 50 in the vicinity of the suction hole 2 1 a disposed directly below the platform 2 1 in the measurement pipe 50. According to this, it is possible to suppress the influence of pressure loss or the like, and it is possible to accurately measure the pressure state of the suction hole 2丨a. Further, the substrate 21 is provided with a substrate elevating mechanism for moving the substrate 10 up and down. Specifically, a plurality of pin holes are formed on the surface of the stage 21, and a lift pin (not shown) capable of lifting and lowering in the z-axis direction is embedded in the pin hole. That is, if the substrate 10 is carried in a state where the ejector pin is protruded from the surface of the stage 21, the tip end portion of the ejector pin abuts against the substrate 10 and can hold the substrate 1〇, so that the ejector pin is lowered. The substrate 10 is carried on the surface of the platform 21 by being housed in the pin hole. Further, the base portion of the ejector pin can be held by the tip end portion of the plurality of ejector pins by abutting the tip end portion of the ejector lock in a state where the substrate is loaded on the surface of the stage 21, and the tip end portion of the ejector lock abuts against the base 1G. At a predetermined height position. According to the contact portion with the substrate 10, the contact portion can be suppressed as much as possible, and the substrate 10 can be smoothly replaced without being damaged. The coating unit 30 is coated with a coating liquid on the substrate 1 . The coating early 30 has a leg portion 31 coupled to the base 2 and an M 1 .s slit nozzle portion 34 extending in the Y-axis direction as shown in FIGS. 1 and 9 α - 圏2. In the state of crossing the base 2 in the γ red + and 1 sleeve directions, the X-axis direction can be moved, and the end portion of the 200936251 end portion is provided with an extension 31 which is slidably attached to a linear motor (1 inear mount). Specifically, 'the rail 22 in the X-axis direction in the γ-axis direction of the base 2, and the foot 22 in the foot. Moreover, the drive is controlled at the foot 31 by m〇t〇r) 33'. The linear motor 33 moves the coating unit 3A in the X-axis direction and can be stopped at an arbitrary position. The slit nozzle portion 34 to which the coating liquid is applied is attached to the leg portion 31 of the coating unit 3A as shown in Fig. 2 . Specifically, the rail portion 37 extending in the z-axis direction and the slider (sHder) 35 sliding along the rail 37 are disposed in the chat portion 31, and the slider 35 and the slit nozzle portion 34 are link. Further, the slider "" is attached with a ball screw (1) 311 screw) driven by the word motor 36 (refer to FIG. 4), and the servo motor 36 is driven to move the slider 35 in the Z-axis direction, and It can be stopped at any position. That is, the slit nozzle portion 34 is supported by the substrate 1 held by the stage 21, and is attached and detached. The slit nozzle portion 34 is a coating liquid. A coating film is formed on the substrate 1A. The slit nozzle portion 34 is disposed so as to have a columnar structure that extends in a unidirectional shape and is substantially orthogonal to the running direction of the coating unit 30. In the slit nozzle portion 34, the coating liquid supplied to the slit nozzle portion 34, which is formed by a slit nozzle 34a' extending in the longitudinal direction, is discharged by the slit nozzle 34a in the same length direction. Therefore, the coating unit 3 is moved in the X-axis direction while the coating liquid is discharged by the slit nozzle 34a, and a coating having a constant thickness is formed on the substrate 1A in the longitudinal direction of the slit nozzle 34a. Cloth film. Next, the composition of the control system of the above coating device is used. Figure 4 is a block diagram showing the control system arranged in the coating device of the coating device. As shown in Figure 4, the coating device is equipped with the above control A control device 90 for driving various units. The control device 90 includes a control main unit 91, a drive control unit 92, a pressure control unit 93, an input/output device control unit 94, and an external device control unit 9.5. The control main unit 91 A well-known CPU that performs logical operations; R〇jj (Read-Only Memory) that recalls various programs of the CPU in advance; and memorizes various kinds of data at a time during device operation (data) RAM (Random Access Memory); HDD (Hard Disk: Hard Disk) of various kinds of data such as a program or an OS (Ope rating system) that memorizes production programs, etc. The control main unit 91 includes a main control unit 91a, a determination unit 91b, and a storage unit 91c. The main control unit 91a is configured to perform a series of coating operations in accordance with a program stored in advance, and is driven and controlled by the drive control unit 92. The drive unit of the servo motor 36 and the linear motor 33 of the unit. The 〇 determination unit 91b determines whether or not the pressure state of the suction force is appropriate when the substrate 10 is adsorbed and held. That is, it is determined by the pressure gauge 53. Specifically, the detected pressure is stored in the memory unit 9 ic, which will be described later, and it is determined whether or not the detected pressure is the initial pressure. When the initial pressure is reached, it is transmitted through the following. The pressure control unit 93 controls the 俾 main valve 51 a to be in a closed state. According to this, the pipe 50 that communicates with the suction pump 2 1 a and the vacuum pump 8 1 is switched only to the sub-pipe 5 2, so that the pressure generated in the suction hole 21 a is adjusted to the hold set by the sub-regulator 52 b 200936251 . Further, when the pressure gauge 53 does not reach the initial pressure, the state of the main valve 5ia and the sub-valve 52a is maintained in a state of being intact. § The memory unit 91c is for storing various materials' and storing the calculation results at a time. Specifically, the memory has information such as initial pressure and holding pressure. The drive control unit 92 drives and controls the linear motor 33, the servo motor 36, and the like in accordance with a control signal from the control main unit 9A. Specifically, the movement of the coating unit 3 及 and the lifting operation of the slit nozzle portion 34 are driven and controlled by the control coil motor 3 3 and the servo motor 36.

GG

壓力控制部93是檢測配管50内的壓力,而且,根據來 自控制本體部91的控制信號控制產生於吸引孔21a的壓The pressure control unit 93 detects the pressure in the pipe 50, and controls the pressure generated in the suction hole 21a based on the control signal from the control body unit 91.

力。具體上,藉由來自壓力計53的信號檢測吸引孔2U 附近的配管50内的壓力。…在透過壓力計53顯示初 期壓,由控制本體部91傳來切換至保持壓的意旨之信號的 情形下,藉由控制主閥51a的驅動,俾主閥5U由開狀態 變成閉狀態,以控制配管50内(正確為吸引孔2U附近) 成為保持壓。 輸入/輸出裝置控制部94是控制鍵盤(keyb〇ard)83、 觸控面板(touch panel )82等的各輸入/輸出裝置。且體 2,可由鍵盤83及觸控面板82進行塗佈動作的條件設定 等,可適宜地進行初期廢 ' 保持壓等的設定。而且,當由初 ::調節成保持壓,在配管50内應被調節但不成為保持壓 主^下’在觸控面板上進行警告顯示並對操作者催 〇" ° 控制本體部91的控制 外部裝置控制部95是根據來自 200936251 信號進行外部裝置的驅動控制。在本實施形態中是與真空泵 '81連接,藉由使該真空泵81驅動,可產生負壓於吸引孔21a。 接著,針對該塗佈裝置中的動作,一邊參照圖5所示的 流程圖,一邊說明。 首先,在步驟S1中基板1〇的搬進被進行。具體上,在 由平台21的表面突出複數根頂出銷的狀態下待機,藉由未 圖示的機械手(robot hand)使基板1〇被承載於頂出銷的尖 端部分。 〇 接著在步驟S2中基板10被承載於平台21。具體上, 由在頂出銷的尖端部分承載有基板1〇的狀態使頂出銷下降 並將基板10承載於平台21的表面。此時,藉由未圖示的定 位手段使基板1 〇被定位於預定的位置。 接者,藉由步驟S3~S5使基板10被保持在平台21上。 首先^由步驟S3使基板吸附動作被進行,基板ι〇被吸附 在平口 1上具體上,藉由在使主間5 ia及副_ 52a成開 狀態的狀態下,使真空泵81驅動並進行高速排氣,急速地 ©使吸引力產生於吸引孔21a。亦即,透過配管5〇内的大氣 藉由真空泵Μ,皮由主配管51急速地吸引,在吸引孔m 心速地產生負壓,瞬間地基板1 〇被吸附於平台21上。 而且’配管5。内的壓力是否到達初期壓被判斷(步驟 S4)。具體上,壓力計53是否到達初期壓被判斷,在達 :期壓的情形下前進到NO的方向’基板吸附動作繼續被進 的情形下前進到YES的 而且’在壓力計53到達初期壓 200936251 方向’基板的吸附保持動作被進行(步驟S5)o具體上,主 閥51a由開狀態被切換至閉狀態。亦即,藉由真空泵81與 吸引孔21a被遮斷’吸引孔213與真空泵81之配管路徑僅 成為副配管52,吸引孔21a中的壓力被調節成以副調節器 5 2b設定的保持壓。因此,基板丨〇被以保持壓吸附保持在 平台21上。 接者’在步驟S6中塗佈動作被進行。亦即,藉由一邊 使塗佈單元30行走於特定的方向,一邊使塗佈液吐出,使 ❸塗佈膜形成於基板1〇的表面。 接著’在步驟S7中基板10的取出被進行❶亦即,在 藉由S6中的塗佈動作在基板1〇表面形成有塗佈膜後,使真 空泵81停止,使吸引孔21a中的壓力返回到大氣壓。而且, 藉由使頂出銷上升,以頂出銷的尖端部分保持基板1 〇,基 板10的遞送被進行於未圖示的機械手,由平台21的表面排 出基板10。 依照這種塗佈裝置及其基板保持方法,透過在吸附被承 ©載於平台21的基板10的情形下,使負壓產生於吸引孔2ia 並急速地吸附,在吸附基板10的壓力到達初期壓後,藉由 前述壓力調節部41調節成比初期壓小的保持壓,可保持所 吸附的基板10於平台21上。因此’因在藉由塗佈單元30 塗佈塗佈液於基板10上的情形下’可在藉由比初期壓小的 保持壓吸附保持的基板1Q上進行塗佈,故與如以往般在吸 附被承載於平台21的基板10之初期壓下進行塗佈的情形 比較’可抑制在相當於吸引孔21&的部分產生塗佈不均。force. Specifically, the pressure in the pipe 50 near the suction hole 2U is detected by a signal from the pressure gauge 53. When the initial pressure is displayed by the pressure gauge 53, and a signal for switching to the holding pressure is transmitted from the control main body portion 91, the main valve 5U is turned from the open state to the closed state by controlling the driving of the main valve 51a. The inside of the control pipe 50 (correctly in the vicinity of the suction hole 2U) becomes a holding pressure. The input/output device control unit 94 is a control input/output device such as a keyboard (keyb) 83, a touch panel 82, and the like. Further, the body 2 can be set by the keyboard 83 and the touch panel 82, and the setting of the initial waste "holding pressure" can be appropriately performed. Further, when the initial:: is adjusted to the holding pressure, it should be adjusted in the pipe 50 but does not become the holding pressure. The warning display is displayed on the touch panel and the operator is urged to control the body portion 91. The control external device control unit 95 performs drive control of the external device based on the signal from 200936251. In the present embodiment, the vacuum pump '81 is connected, and by driving the vacuum pump 81, a negative pressure is generated in the suction hole 21a. Next, the operation in the coating apparatus will be described with reference to the flowchart shown in Fig. 5 . First, the loading of the substrate 1 is performed in step S1. Specifically, in a state where a plurality of ejector pins are protruded from the surface of the stage 21, the substrate 1 is placed on the tip end portion of the ejector pin by a robot hand (not shown).基板 Next, the substrate 10 is carried on the stage 21 in step S2. Specifically, the ejector pin is lowered and the substrate 10 is carried on the surface of the stage 21 by the state in which the substrate 1 is carried at the tip end portion of the ejector pin. At this time, the substrate 1 is positioned at a predetermined position by a positioning means (not shown). Then, the substrate 10 is held on the stage 21 by steps S3 to S5. First, the substrate adsorption operation is performed in step S3, and the substrate ITO is adsorbed on the flat opening 1. Specifically, the vacuum pump 81 is driven and high-speed in a state where the main chamber 5 ia and the sub- 52a are opened. Exhaust, the attraction is generated in the suction hole 21a. In other words, the air in the inside of the pipe 5 is evacuated by the main pipe 51 by the vacuum pump, and the negative pressure is generated at the center of the suction hole m, and the substrate 1 is instantaneously adsorbed on the stage 21. And 'Pipe 5. Whether or not the internal pressure reaches the initial pressure is judged (step S4). Specifically, whether or not the pressure gauge 53 reaches the initial pressure is judged, and proceeds to the direction of NO in the case of the period pressure: 'the substrate adsorption operation continues to be advanced, and proceeds to YES, and the pressure gauge 53 reaches the initial pressure 200936251. The suction holding operation of the direction 'substrate is performed (step S5) o Specifically, the main valve 51a is switched from the open state to the closed state. In other words, the vacuum pump 81 and the suction hole 21a are blocked. The piping path of the suction hole 213 and the vacuum pump 81 is only the sub-pipe 52, and the pressure in the suction hole 21a is adjusted to the holding pressure set by the sub-regulator 52b. Therefore, the substrate crucible is held on the stage 21 by maintaining pressure adsorption. The pick-up is performed in step S6. In other words, the coating liquid is discharged while the coating unit 30 is traveling in a specific direction, and the ruthenium coating film is formed on the surface of the substrate 1 . Then, in step S7, the removal of the substrate 10 is performed, that is, after the coating film is formed on the surface of the substrate 1 by the coating operation in S6, the vacuum pump 81 is stopped, and the pressure in the suction hole 21a is returned. To atmospheric pressure. Further, by raising the ejector pin, the substrate 1 is held by the tip end portion of the ejector pin, and the delivery of the substrate 10 is performed on a robot (not shown), and the substrate 10 is discharged from the surface of the stage 21. According to the coating apparatus and the substrate holding method thereof, the negative pressure is generated in the suction hole 2ia and rapidly adsorbed when the substrate 10 is loaded on the stage 21, and the pressure of the adsorption substrate 10 reaches the initial stage. After the pressing, the pressure adjusting portion 41 is adjusted to a holding pressure smaller than the initial pressure, whereby the adsorbed substrate 10 can be held on the stage 21. Therefore, 'the coating liquid 30 is applied onto the substrate 10 by the coating unit 30' can be applied on the substrate 1Q held by the holding pressure holding smaller than the initial pressure, so that it is adsorbed as in the past. When the coating is carried out by the initial pressing of the substrate 10 placed on the stage 21, it is possible to suppress coating unevenness in the portion corresponding to the suction holes 21 &

Q 【圖式間單說明】 是顯示與本發明的實施形雉 办態有關的塗佈裝置之斜 視圖 200936251 而且,因即使是藉由比初期壓小的保持㈣持純1〇於平 口 21的構成’也施在吸附基板lQ時以高速產生初期麼, 故可解除塗佈裝置的週期時間長期化之問題。 而且,在上述實施形態中雖然是針對藉由配設主配管 51與剎配s 5 2並切換此等主配管51與副配管5 2的配管 路徑,切換初期屋與保持麼的例子來說明,惟也可以是僅 以具有主閥5la與調筋恶夕—加* β — /、巧即器之個配管50,藉由控制該調節 器的調:切換初期歷與保持壓之構成。依照該構成,與上述 實施^比較,雖㈣於切換初期壓與保持壓需要 因配管路”成-個,故塗佈裝置全體的空間 一 圖 圖2是顯示塗佈單元的腳部附近之概略圖。 示塗佈裝置的真空泵與配管系統之 圖是顯示上述塗佈裝置的控制系統之方塊圖。 圖5是顯示上述塗佈裝置的動作之流程圖。 【主要元件符號說明】 2:基台 1 0 :基板 21:平台 200936251 21a:吸引孔 2 2、3 7 :軌條 3 0 :塗佈單元 3 1 :腳部 3 3 :線性馬達 34:開縫喷嘴部 3 4a:開縫喷嘴 3 5 :滑塊 0 36:伺服馬達 40:基板保持手段 41 :壓力調節部 5 0 :配管 5 1 :主配管 5 1 a :主閥 52 :副配管 5 2 a :副閥 Q 5 2b·.副調節器 53:壓力計 81 :真空泵 8 2 :觸控面板 83 :鍵盤 90:控制裝置 91 :控制本體部 91 a :主控制部 16 200936251 9 1 b :判定部 9 1 c :記憶部 9 2 :驅動控制部 9 3 :壓力控制部 94:輸入/輸出裝置控制部 9 5 :外部裝置控制部Q [Illustration of the drawings] is a perspective view showing a coating apparatus relating to the embodiment of the present invention. 200936251 Further, even if it is kept at a lower level than the initial pressure (4), it is purely 1 〇 in the flat opening 21 When the substrate 1Q is adsorbed, the initial stage is generated at a high speed, so that the cycle time of the coating device can be released for a long period of time. In addition, in the above-described embodiment, an example is described in which the main pipe 51 and the brake s 5 2 are disposed, and the piping paths of the main pipe 51 and the sub pipe 5 2 are switched, and the initial house and the holding are switched. However, it is also possible to control only the adjustment of the regulator by switching the initial period and the holding pressure by the piping 50 having the main valve 5la and the ribs-plus-β-/. According to this configuration, compared with the above-described embodiment, (4) the initial pressure and the holding pressure are required to be connected to each other. Therefore, the space of the entire coating apparatus is shown in Fig. 2, which is a schematic view showing the vicinity of the foot of the coating unit. Fig. 5 is a block diagram showing a control system of the above coating apparatus. Fig. 5 is a flow chart showing the operation of the above coating apparatus. [Description of main components] 2: Abutment 1 0 : Substrate 21: Platform 200936251 21a: suction hole 2 2, 3 7 : rail 3 0 : coating unit 3 1 : leg 3 3 : linear motor 34: slit nozzle portion 3 4a: slit nozzle 3 5 : Slider 0 36: Servo motor 40: Substrate holding means 41: Pressure regulating unit 5 0 : Piping 5 1 : Main piping 5 1 a : Main valve 52 : Sub-pipe 5 2 a : Sub-valve Q 5 2b ·. 53: pressure gauge 81: vacuum pump 8 2 : touch panel 83 : keyboard 90 : control device 91 : control main body portion 91 a : main control portion 16 200936251 9 1 b : determination portion 9 1 c : memory portion 9 2 : drive Control unit 9 3 : Pressure control unit 94 : Input/output device control unit 9 5 : External device control unit

1717

Claims (1)

200936251 . 七、申請專利範圍: 1、 一種塗佈裝置,包含: 承載基板之平台; 使吸引力產生於形成於該平台的表面之吸 基板吸附保持於平台的表面之基板保持手段; 一邊對被保持於該平台的表面之基板相對 邊吐出塗佈液之塗佈單元, 其特徵為:該基板保持手段具有可調節對 ©力之壓力調節部,該壓力調節部可調節成吸附 平台的表面後的基板之初期壓,與藉由該初期 附後,維持基板被保持於平台的表面的狀態之 保持壓是設定為比該初期壓小。 2、 如申請專利範圍第1項之塗佈裝置,其 持手段具有:使吸引力產生於該吸引孔之吸 置;以及連通並連接該吸引力產生裝置與該 管,該壓力調節部分別各自具備:調節成該初期 ◎徑;以及調節成該保持壓之配管路徑。 3、 如申请專利範圍第1項或第2項之塗佈 在連結於該吸引孔之附近的配管裝設有壓力計 計到達初期壓的情形下被調節成該保持壓。 4、 一種塗佈裝置的基板保持方法,是包含 塗佈裝置的基板保持方法:承載基板之平台;使 於該平台的表面並吸附保持基板之基板保持手 邊對被保持於該平台的表面之基板相對地移鸯 引孔,並使 以及 地移動,一 基板的吸引 剛被承載於 壓使基板吸 保持壓,該 中該基板保 引力產生裝 吸引孔之配 壓之配管路 裝置,其中 ’在該壓力 -如下構件之 -吸引力產生 •段;以及一 > ’ 一邊吐出 200936251 · 塗佈液之塗佈單元, 其特徵為:該基板保持手段具有可藉由調 板的壓力調節對基板的吸引力之壓力調節部, 在藉由該壓力調節部使對被吸附於平台的 之壓力到達預定的初期壓後,調節成比該初期 壓並保持有基板。 節附加於基 表面的基板 壓小的保持200936251. VII. Patent application scope: 1. A coating device comprising: a platform for carrying a substrate; a substrate holding means for attracting the suction substrate formed on the surface of the platform to be held on the surface of the platform; a coating unit for discharging a coating liquid on a substrate opposite to a surface of the platform, wherein the substrate holding means has a pressure adjusting portion that can adjust the force of the pressure, and the pressure adjusting portion can be adjusted to adsorb the surface of the platform The initial pressure of the substrate and the holding pressure in a state in which the substrate is held on the surface of the stage by the initial attachment are set to be smaller than the initial pressure. 2. The coating device of claim 1, wherein the holding means has: attracting an attraction force to the suction hole; and connecting and connecting the attraction generating device and the tube, the pressure regulating portions respectively The method includes: adjusting the initial ◎ diameter; and adjusting the piping path to the holding pressure. 3. Coating according to item 1 or item 2 of the patent application range is adjusted to the holding pressure in the case where the pipe connected to the suction hole is provided with a pressure gauge reaching the initial pressure. 4. A substrate holding method for a coating device, which is a substrate holding method including a coating device: a platform for supporting a substrate; and a substrate for holding and holding the substrate on a surface of the platform and holding the substrate held on the surface of the platform Relatively moving the boring hole and moving it, the attraction of a substrate is just carried by the pressure to hold the substrate, and the substrate protects the force to produce a pipe fitting device for accommodating the suction hole, wherein Pressure - the following components - the attraction generation section; and a > ' while discharging the 200936251 · coating liquid coating unit, characterized in that the substrate holding means has the attraction of the substrate by the pressure adjustment of the palette The pressure adjusting unit adjusts the pressure applied to the stage to a predetermined initial pressure by the pressure adjusting unit, and adjusts the holding of the substrate to the initial pressure. The substrate attached to the base surface is kept at a small pressure 1919
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