TWI458565B - Coating machine and coating method - Google Patents
Coating machine and coating method Download PDFInfo
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- TWI458565B TWI458565B TW097138873A TW97138873A TWI458565B TW I458565 B TWI458565 B TW I458565B TW 097138873 A TW097138873 A TW 097138873A TW 97138873 A TW97138873 A TW 97138873A TW I458565 B TWI458565 B TW I458565B
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- 238000000576 coating method Methods 0.000 title claims description 171
- 239000011248 coating agent Substances 0.000 title claims description 161
- 238000001179 sorption measurement Methods 0.000 claims description 251
- 239000000758 substrate Substances 0.000 claims description 217
- 230000015572 biosynthetic process Effects 0.000 claims description 56
- 238000000034 method Methods 0.000 claims description 34
- 239000007788 liquid Substances 0.000 claims description 20
- 238000007599 discharging Methods 0.000 claims description 3
- 238000005192 partition Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 8
- 229920002120 photoresistant polymer Polymers 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000003028 elevating effect Effects 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000011344 liquid material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
- B05C11/1002—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Nonlinear Science (AREA)
- Coating Apparatus (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Computer Hardware Design (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Description
本發明是關於塗佈塗佈液於基板(substrate)上之塗佈裝置(coating machine)及塗佈方法(coating method)。The present invention relates to a coating machine and a coating method for applying a coating liquid onto a substrate.
在液晶顯示器(liquid crystal display)或電漿顯示器(plasma display)等的平面面板顯示器(flat panel display)使用有在玻璃基板(glass substrate)上塗佈有光阻(resist)液者(稱為塗佈基板)。該塗佈基板是藉由均勻地塗佈光阻液之塗佈裝置形成。In a flat panel display such as a liquid crystal display or a plasma display, a photoresist is applied to a glass substrate (referred to as a coating). Cloth substrate). The coated substrate is formed by a coating device that uniformly coats the photoresist.
該塗佈裝置具有:承載有基板的平台(stage);吐出有光阻液之塗佈單元(coating unit),藉由一邊由塗佈單元吐出光阻液,一邊使塗佈單元移動,以在基板上形成有均勻厚度的光阻液膜。The coating device has a stage on which a substrate is carried, a coating unit that discharges a photoresist, and the coating unit is moved while discharging the photoresist from the coating unit. A photoresist film having a uniform thickness is formed on the substrate.
具體上如下述專利文獻1所記載的,若在平台上供給有基板,則藉由使負壓產生於平台上的吸附孔,使基板被吸附保持在平台上。此時,為了避免空氣層以氣泡介於基板與平台之間,在承載基板時於使基板的中央部分彎曲的狀態下由該基板中央部分承載於平台。而且,於在平台上承載吸附有基板後,藉由塗佈單元移動使光阻液被吐出並在基板上形成有塗佈膜。Specifically, as described in Patent Document 1 below, when a substrate is supplied to the stage, the substrate is adsorbed and held on the stage by causing a negative pressure to be generated in the adsorption hole on the stage. At this time, in order to prevent the air layer from being interposed between the substrate and the stage by the air bubbles, the central portion of the substrate is carried by the central portion of the substrate while the substrate is being bent. Further, after the substrate is adsorbed on the stage, the resist liquid is discharged by the movement of the coating unit, and a coating film is formed on the substrate.
[專利文獻1]日本國特開2006-281091號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2006-281091
但是,在記載於上述專利文獻1的塗佈裝置中因在基板全體被吸附固定於平台上後塗佈單元移動,故有塗佈裝置的週期時間(cycle time)變長之問題。亦即,由於基板大型化等使得定位基板之微調整變的困難,故為了精度佳地將大型的基板全體承載並固定於平台上會花時間,有作為塗佈裝置全體之週期時間長期化的傾向。However, in the coating apparatus described in Patent Document 1, the coating unit moves after the entire substrate is adsorbed and fixed on the stage, so that the cycle time of the coating device becomes long. In other words, it is difficult to finely adjust the positioning substrate due to the increase in the size of the substrate. Therefore, it takes time to carry and fix the entire large-sized substrate on the platform for accuracy, and the cycle time of the entire coating device is long-term. tendency.
本發明乃是鑑於上述問題點所進行的創作,其目的為提供一種塗佈裝置及塗佈方法,即使是基板之固定於塗佈裝置中的平台需要時間的情形,也能抑制塗佈裝置全體的週期時間長期化。The present invention has been made in view of the above problems, and an object of the invention is to provide a coating apparatus and a coating method capable of suppressing the entire coating apparatus even when the stage of the substrate fixed to the coating apparatus takes time. The cycle time is long-term.
為了解決上述課題,本發明的塗佈裝置,包含:承載基板之平台;以及藉由一邊對被承載於前述平台的表面的基板相對地移動,一邊吐出塗佈液,在基板上形成塗佈膜之塗佈單元,其特徵為:在前述平台配設有吸附保持基板之基板吸附手段,前述基板吸附手段具有:吸附形成有塗佈開始時的初期膜之基板的初期膜形成區域之初期吸附部;以及吸附除了該初期膜形成區域之外的塗佈膜形成區域之主吸附部,在對應前述初期吸附部的基板的表面的吸附完了後,前述主吸附部的吸附動作完了前,前述塗佈單元開始初期膜的形成。In order to solve the above problems, the coating apparatus of the present invention includes: a stage on which a substrate is supported; and a coating liquid is formed by relatively moving a substrate supported on a surface of the stage, and a coating film is formed on the substrate. The coating unit is characterized in that a substrate adsorption means for arranging an adsorption holding substrate on the stage, the substrate adsorption means having an initial adsorption portion for adsorbing an initial film formation region of a substrate on which an initial film at the start of coating is formed And a main adsorption portion that adsorbs a coating film formation region other than the initial film formation region, and after the adsorption of the surface of the substrate corresponding to the initial adsorption portion is completed, the adsorption operation of the main adsorption portion is completed, and the coating is performed. The formation of the film at the beginning of the unit begins.
依照上述塗佈裝置,因吸附基板的前述基板吸附手段具有初期吸附部與主吸附部,故在藉由初期吸附部吸附有 基板的一部分後,可使塗佈單元移動並可對對應初期吸附部之基板部分開始塗佈。亦即,因在開始基板的吸附後,可立即使塗佈單元移動至對應前述初期吸附部之基板部分,故與如以往般在吸附固定基板全體後使塗佈動作開始的情形比較,可使作為塗佈裝置全體的週期時間縮短。According to the coating apparatus described above, since the substrate adsorption means for adsorbing the substrate has the initial adsorption portion and the main adsorption portion, the adsorption portion is adsorbed by the initial adsorption portion. After a part of the substrate, the coating unit can be moved and the coating of the substrate portion corresponding to the initial adsorption portion can be started. In other words, since the coating unit can be immediately moved to the substrate portion corresponding to the initial adsorption portion after the adsorption of the substrate is started, the coating operation can be started after the entire substrate is adsorbed and fixed as compared with the prior art. The cycle time of the entire coating apparatus is shortened.
而且能以如下之構成:在前述基板吸附手段的初期吸附部及主吸附部分別形成有開設於平台的表面而形成的吸引孔,前述基板吸附手段包含:使吸引力產生於前述吸引孔之吸引手段;以及對前述初期吸附部及主吸附部選擇性地使來自該吸引手段的吸引力產生之切換手段(switching means)。Further, in the initial stage adsorption unit and the main adsorption unit of the substrate adsorption means, a suction hole formed on a surface of the stage is formed, and the substrate adsorption means includes suction to attract the suction hole. And a switching means for selectively generating an attractive force from the suction means in the initial adsorption portion and the main adsorption portion.
依照該構成,在藉由操作切換手段使吸引力僅產生於前述初期吸附部,使基板的一部分吸附於初期吸附部後,也能使吸引力產生於主吸附部並吸附固定基板全體。因此,無須在初期吸附部與主吸附部的雙方各自配設吸引手段。According to this configuration, the suction force is generated only in the initial adsorption portion by the operation switching means, and a part of the substrate is adsorbed to the initial adsorption portion, and the suction force is generated in the main adsorption portion to adsorb and fix the entire substrate. Therefore, it is not necessary to arrange the suction means in each of the initial adsorption portion and the main adsorption portion.
而且也能以如下之構成:在前述基板吸附手段的初期吸附部及主吸附部分別形成有開設於平台的表面而形成的吸引孔,在前述基板吸附手段,使吸引力產生於前述初期吸附部的吸引口之吸引手段,與使吸引力產生於前述主吸附部的吸引口之吸引手段是對初期吸附部及主吸附部分別獨立配設。Further, in the initial adsorption unit and the main adsorption unit of the substrate adsorption means, a suction hole formed on the surface of the stage is formed, and the substrate adsorption means causes the suction force to be generated in the initial adsorption unit. The suction means of the suction port and the suction means for causing the suction force to be generated in the suction port of the main adsorption portion are independently disposed in the initial adsorption portion and the main adsorption portion.
依照該構成,可對前述基板吸附手段的初期吸附部及主吸附部以適合的時機(timing)對各個獨立地使吸引力產 生。According to this configuration, the initial adsorption portion and the main adsorption portion of the substrate adsorption means can be independently produced with an appropriate timing. Health.
而且也能以如下之構成:在前述初期吸附部及主吸附部形成有使基板吸附於前述平台的表面之吸附溝,該吸附溝是連通於前述吸引孔,並且開設於平台的表面而形成,該初期吸附部的吸附溝與主吸附部的吸附溝是藉由防止互相連結之隔間部分別獨立形成。Further, the initial adsorption unit and the main adsorption unit may be formed with an adsorption groove for adsorbing the substrate on the surface of the stage, and the adsorption groove is formed by being connected to the suction hole and formed on the surface of the stage. The adsorption groove of the initial adsorption portion and the adsorption groove of the main adsorption portion are independently formed by the partition portions that are prevented from being connected to each other.
依照該構成,因若使吸引力產生於吸引孔,則在連通於該吸引孔的吸附溝也產生吸引力,故面對吸附溝的基板部分全體被吸引至吸附溝側。而且,即使是氣泡介於基板與平台之間的情形也能藉由吸附溝使氣泡被吸引,可避免氣泡殘留在基板與平台之間的問題。而且,藉由初期吸附部的吸附溝與主吸附部的吸附溝分別獨立形成,在使吸引力產生於初期吸附部的情形下,可防止吸引力對應被吸附於主吸附部之基板部分作用。According to this configuration, when the suction force is generated in the suction hole, the suction force is also generated in the adsorption groove that communicates with the suction hole, so that the entire substrate portion facing the adsorption groove is attracted to the adsorption groove side. Moreover, even in the case where the bubble is interposed between the substrate and the stage, the bubble can be attracted by the adsorption groove, and the problem that the bubble remains between the substrate and the stage can be avoided. Further, the adsorption groove of the initial adsorption portion and the adsorption groove of the main adsorption portion are formed separately, and when the suction force is generated in the initial adsorption portion, the attraction force can be prevented from acting on the substrate portion adsorbed to the main adsorption portion.
而且也能以如下之構成:在前述基板吸附手段的初期吸附部及主吸附部具備保持基板的銷(pin)構件,該銷構件是分別被收容於平台內,並且可由平台的表面突出而配設,前述初期吸附部的銷構件是比前述主吸附部的銷構件還先被收容於平台內。Further, the initial adsorption unit and the main adsorption unit of the substrate adsorption means may include pin members for holding the substrate, and the pin members are respectively housed in the stage and may be protruded from the surface of the stage. The pin member of the initial adsorption portion is housed in the platform before the pin member of the main adsorption portion.
依照該構成,在將基板承載於平台時,可在最初將基板的一部分承載於初期吸附部。據此,可使初期吸附部中的基板的吸附比主吸附部中的基板的吸附還先開始。而且,藉由基板由初期吸附部被承載,接著主吸附部被承載,存在於基板與初期吸附部之間的空氣層會逸散至主吸附部側。據 此,可抑制空氣層以氣泡存在於基板與平台(初期吸附部)之間。According to this configuration, when the substrate is placed on the stage, a part of the substrate can be initially carried on the initial adsorption portion. Thereby, the adsorption of the substrate in the initial adsorption portion can be started earlier than the adsorption of the substrate in the main adsorption portion. Further, the substrate is carried by the initial adsorption portion, and then the main adsorption portion is carried, and the air layer existing between the substrate and the initial adsorption portion is dissipated to the main adsorption portion side. according to Thereby, it is possible to suppress the air layer from being present between the substrate and the stage (initial adsorption portion) by bubbles.
而且也能以如下之構成:前述主吸附部的銷構件是由前述初期吸附部側依次被收容於平台內。Further, the pin member of the main adsorption unit may be sequentially housed in the stage by the initial adsorption unit side.
依照該構成,因被承載於主吸附部的基板部分由初期吸附部側朝主吸附部側單向依次被承載,故存在於基板與平台之間的空氣層依次逸散至未承載側。據此,可抑制空氣層以氣泡存在於基板與平台之間。According to this configuration, since the substrate portion carried by the main adsorption portion is unidirectionally loaded from the initial adsorption portion side toward the main adsorption portion side, the air layer existing between the substrate and the stage sequentially escapes to the unloaded side. According to this, it is possible to suppress the air layer from being present between the substrate and the stage with bubbles.
而且,為了解決上述課題,本發明的塗佈方法是具有如下製程之塗佈裝置的塗佈方法:在平台的表面承載基板之基板承載製程;在被承載於前述平台的基板上,於使吐出塗佈液的塗佈單元停止的狀態下形成初期膜之初期膜形成製程;以及藉由在形成前述初期膜後,一邊由塗佈單元使塗佈液吐出,一邊對基板相對地使該塗佈單元移動,在基板上形成塗佈膜之塗佈膜形成製程,其特徵為:前述基板承載製程具有吸附基板於平台的表面之吸附製程,該吸附製程包含:吸附形成有前述初期膜之基板的初期膜形成區域之初期吸附製程;以及吸附除了該初期膜形成區域之外之基板的塗佈膜形成區域之主吸附製程,在前述初期吸附製程完了後前述主吸附製程完了前,開始前述初期膜形成製程。Further, in order to solve the above problems, the coating method of the present invention is a coating method of a coating apparatus having a process of: carrying a substrate carrying process on a surface of a stage; and discharging on a substrate carried on the stage The initial film formation process of the initial film is formed in a state in which the coating unit of the coating liquid is stopped; and the coating liquid is discharged by the coating unit after the formation of the initial film, and the coating is applied to the substrate. The unit is moved to form a coating film forming process of the coating film on the substrate, wherein the substrate carrying process has an adsorption process of adsorbing the substrate on the surface of the platform, and the adsorption process comprises: adsorbing the substrate on which the initial film is formed. An initial adsorption process of the initial film formation region; and a main adsorption process for adsorbing a coating film formation region of the substrate other than the initial film formation region, and the initial film is started before the main adsorption process is completed after the initial adsorption process is completed Form the process.
依照該構成,因在前述初期吸附製程完了後前述主吸附製程完了前,開始由塗佈單元進行之塗佈膜形成製程,故與如以往般在前述基板承載製程完了後塗佈膜形成製程 才開始的塗佈方法以較,可使塗佈裝置全體中的週期時間縮短。According to this configuration, since the coating film forming process by the coating unit is started before the main adsorption process is completed after the initial adsorption process is completed, the coating film formation process is completed after the substrate carrier process is completed as in the related art. The coating method that is only started can be shortened by the cycle time in the entire coating apparatus.
依照本發明的塗佈裝置及塗佈方法,即使是基板之固定於塗佈裝置中的平台需要時間的情形,也能抑制塗佈裝置全體的週期時間長期化。According to the coating apparatus and the coating method of the present invention, even if the stage of the substrate fixed to the coating apparatus takes time, the cycle time of the entire coating apparatus can be suppressed from becoming long.
使用圖面說明與本發明有關的實施的形態。The form of the embodiment related to the present invention will be described using the drawings.
圖1是概略地顯示本發明的一實施形態中的塗佈裝置之俯視圖。圖2是其側視圖,圖3是顯示在塗佈裝置承載有基板的一部分的狀態之圖。Fig. 1 is a plan view schematically showing a coating apparatus according to an embodiment of the present invention. Fig. 2 is a side view thereof, and Fig. 3 is a view showing a state in which a part of the substrate is carried by the coating device.
如圖1~圖3所示,塗佈裝置是將藥液或光阻液等的液狀物(以下稱為塗佈液)之塗佈膜形成於基板10上,具備:基台2;用以承載基板10之平台21;以及對該平台21可移動於特定方向(在圖1中為左右方向)而構成之塗佈單元30。As shown in FIG. 1 to FIG. 3, the coating device is formed by forming a coating film of a liquid material (hereinafter referred to as a coating liquid) such as a chemical liquid or a photoresist liquid on the substrate 10, and includes a base 2; The substrate 21 carrying the substrate 10; and the coating unit 30 configured to move the platform 21 in a specific direction (left-right direction in FIG. 1).
此外,在以下的說明中是以塗佈單元30移動的方向為X軸方向,以與X軸方向在水平面上正交的方向為Y軸方向,以正交於X軸及Y軸方向之雙方的方向為Z軸方向來進行說明。In the following description, the direction in which the coating unit 30 moves is the X-axis direction, the direction orthogonal to the X-axis direction on the horizontal plane is the Y-axis direction, and the two directions orthogonal to the X-axis and the Y-axis direction. The direction is described in the Z-axis direction.
在前述基台2於其中央部分配置有平台21。該平台21是將所搬進的基板10承載保持於其表面。而且,在該平台21配設有基板吸附手段40,藉由該基板吸附手段40可使基 板10吸附保持於平台21的表面。具體上,在該平台21形成有開設於其表面的複數個吸引孔41a、42a(參照圖4),此等吸引孔41a、42a與真空泵(vacuum pump)81(真空泵81a、81b)是經由配管84連接。而且,藉由於在平台21的表面承載有基板10的狀態下使真空泵81動作,在吸引孔41a、42a產生吸引力,使基板10被吸引至平台21的表面側而被吸附保持。在本實施形態中如圖3所示,後述的初期吸附部41是與真空泵81a連結,後述的主吸附部42是與真空泵81b連結,對初期吸附部41及主吸附部42分別獨立配設有真空泵81(真空泵81a、81b)。A platform 21 is disposed in the center portion of the base 2 described above. The platform 21 carries and holds the substrate 10 carried therein on its surface. Further, a substrate adsorption means 40 is disposed on the platform 21, and the base adsorption means 40 can be used to provide a base. The plate 10 is adsorbed and held on the surface of the stage 21. Specifically, the platform 21 is formed with a plurality of suction holes 41a and 42a (see FIG. 4) opened on the surface thereof, and the suction holes 41a and 42a and the vacuum pump 81 (vacuum pumps 81a and 81b) are connected via pipes. 84 connections. In addition, when the vacuum pump 81 is operated in a state where the substrate 10 is carried on the surface of the stage 21, an attraction force is generated in the suction holes 41a and 42a, and the substrate 10 is attracted to the surface side of the stage 21 to be adsorbed and held. In the present embodiment, as shown in FIG. 3, the initial adsorption unit 41 to be described later is connected to the vacuum pump 81a, and the main adsorption unit 42 to be described later is connected to the vacuum pump 81b, and the initial adsorption unit 41 and the main adsorption unit 42 are separately provided. Vacuum pump 81 (vacuum pumps 81a, 81b).
而且,前述基板吸附手段40如圖4所示是藉由初期吸附部41與主吸附部42構成。此處,圖4是顯示平台21之圖,圖4(a)是平台21的全體斜視圖,圖4(b)是其表面部分的擴大圖。該初期吸附部41是在由塗佈單元30進行之塗佈開始時於基板10上形成有初期膜,將形成有該初期膜的基板10的表面部分(圖3所示的初期膜形成區域11)吸附於平台21上。此外,因藉由塗佈單元30形成的初期膜為線狀形狀,故初期膜形成區域11為形成有初期膜的線狀形狀也可以,但也可以是包含該線狀形狀的規定的區域。亦即,為具有不產生塗佈不均,初期膜可穩定形成之程度的區域者也可以,在本實施形態中是顯示包含該線狀形狀之一定的區域的情形。Further, as shown in FIG. 4, the substrate adsorption means 40 is constituted by the initial adsorption unit 41 and the main adsorption unit 42. Here, FIG. 4 is a view showing the stage 21, FIG. 4(a) is an overall perspective view of the stage 21, and FIG. 4(b) is an enlarged view of a surface portion thereof. In the initial adsorption unit 41, an initial film is formed on the substrate 10 at the start of application by the coating unit 30, and a surface portion of the substrate 10 on which the initial film is formed (the initial film formation region 11 shown in FIG. 3) ) adsorbed on the platform 21 . In addition, since the initial film formed by the coating unit 30 has a linear shape, the initial film formation region 11 may have a linear shape in which an initial film is formed, but may be a predetermined region including the linear shape. In other words, the region having a degree that the initial film can be stably formed without causing coating unevenness may be used. In the present embodiment, a certain region including the linear shape may be displayed.
在該初期吸附部41如圖4(b)所示形成有吸引孔41a與吸附溝41b,藉由使真空泵81a動作可使吸引力產生於吸引 孔41a及吸附溝41b。具體上,吸附溝41b是在平台21的表面形成格子狀,俾連通吸引孔41a。而且,若在初期吸附部41承載有基板10(初期膜形成區域11),則變成吸引孔41a與吸附溝41b藉由該基板10覆蓋的狀態。藉由在該狀態下使真空泵81a動作,使吸引力作用於吸引孔41a及吸附溝41b,使基板10的初期膜形成區域11被吸附於初期吸附部41。而且,即使是在基板10的初期膜形成區域11與平台21的初期吸附部41之間存在氣泡的情形,也能藉由氣泡被吸引至遍及初期吸附部41的全面而形成的吸附溝41b,避免氣泡殘留在基板10的初期膜形成區域11與平台21的初期吸附部41之間。據此,無須為了避免氣泡的中介存在而由基板10的中央部分承載,可由基板10的端部之初期膜形成區域11承載。In the initial adsorption unit 41, as shown in Fig. 4(b), the suction hole 41a and the adsorption groove 41b are formed, and the suction pump 41a is operated to cause the suction force to be attracted. The hole 41a and the adsorption groove 41b. Specifically, the adsorption groove 41b is formed in a lattice shape on the surface of the stage 21, and is connected to the suction hole 41a. When the substrate 10 (initial film formation region 11) is carried by the initial adsorption unit 41, the suction hole 41a and the adsorption groove 41b are covered by the substrate 10. By operating the vacuum pump 81a in this state, the suction force acts on the suction hole 41a and the adsorption groove 41b, and the initial film formation region 11 of the substrate 10 is adsorbed to the initial adsorption portion 41. Further, even when air bubbles are present between the initial film formation region 11 of the substrate 10 and the initial adsorption portion 41 of the stage 21, the bubbles can be attracted to the adsorption grooves 41b formed over the entire initial adsorption portion 41. The air bubbles are prevented from remaining between the initial film formation region 11 of the substrate 10 and the initial adsorption portion 41 of the stage 21. Accordingly, it is not required to be carried by the central portion of the substrate 10 in order to avoid the intervening of bubbles, and may be carried by the initial film formation region 11 of the end portion of the substrate 10.
而且,前述主吸附部42是將除了形成有初期膜的部分之外的基板10的表面(圖3所示的塗佈膜形成區域12)吸附於平台21上。該主吸附部42具有與上述初期吸附部41同樣的構成,形成有吸引孔42a與形成格子狀俾連通該吸引孔42a之吸附溝42b。而且,藉由使真空泵81b動作,使基板10的塗佈膜形成區域12被吸附於主吸附部42。而且,即使是在基板10的塗佈膜形成區域12與平台21的主吸附部42之間存在氣泡的情形,也能藉由氣泡被吸引至吸附溝42b,避免氣泡殘留在基板10的塗佈膜形成區域12與平台21的主吸附部42之間。Further, the main adsorption unit 42 adsorbs the surface (the coating film formation region 12 shown in FIG. 3) of the substrate 10 except for the portion where the initial film is formed, on the stage 21. The main adsorption unit 42 has the same configuration as that of the initial adsorption unit 41, and has a suction hole 42a and a suction groove 42b that forms a lattice shape and communicates with the suction hole 42a. Moreover, the coating film formation region 12 of the substrate 10 is adsorbed to the main adsorption portion 42 by operating the vacuum pump 81b. Further, even in the case where air bubbles are present between the coating film forming region 12 of the substrate 10 and the main adsorption portion 42 of the stage 21, the bubbles can be attracted to the adsorption grooves 42b, thereby preventing the bubbles from remaining on the substrate 10. The film formation region 12 is between the main adsorption portion 42 of the stage 21.
而且如圖4(b)所示,在該初期吸附部41的吸附溝41b 與主吸附部42的吸附溝42b之間形成有隔間部43,吸附溝41b與吸附溝42b未互相連通連接而是分別獨立形成。據此,即使是使初期吸附部41側(或主吸附部42側)的真空泵81a(真空泵81b)動作的情形,也不會在主吸附部42(或初期吸附部41側)的吸附溝41b、42b產生吸引力。Further, as shown in FIG. 4(b), the adsorption groove 41b of the initial adsorption portion 41 is formed. A compartment portion 43 is formed between the adsorption groove 42b of the main adsorption portion 42, and the adsorption groove 41b and the adsorption groove 42b are not connected to each other but are formed separately. According to this, even when the vacuum pump 81a (vacuum pump 81b) on the side of the initial adsorption unit 41 (or the main adsorption unit 42 side) is operated, the adsorption groove 41b of the main adsorption unit 42 (or the initial adsorption unit 41 side) is not formed. 42b is attractive.
而且,在平台21配設有使基板10進行升降動作之基板升降機構。具體上,在平台21的表面,亦即初期吸附部41及主吸附部42形成有複數個銷孔(pin hole),在該銷孔埋設有可在Z軸方向進行升降動作之頂出銷(lift pin)51(本發明的銷構件)。亦即,藉由若在由平台21的表面使頂出銷51突出的狀態下基板10被搬進,則頂出銷51的尖端部分抵接基板10並可保持基板10,使頂出銷51下降並使其收容於銷孔,可將基板10承載於平台21的表面(初期吸附部41及主吸附部42)(參照圖3)。Further, a substrate elevating mechanism for elevating and lowering the substrate 10 is disposed on the stage 21. Specifically, a plurality of pin holes are formed in the initial adsorption portion 41 and the main adsorption portion 42 on the surface of the stage 21, and an ejector pin capable of lifting and lowering in the Z-axis direction is embedded in the pin hole ( Lift pin 51 (pin member of the present invention). That is, when the substrate 10 is carried in a state where the ejector pin 51 is protruded from the surface of the stage 21, the tip end portion of the ejector pin 51 abuts against the substrate 10 and can hold the substrate 10, so that the ejector pin 51 is pushed out. The substrate 10 is placed on the surface of the stage 21 (the initial adsorption unit 41 and the main adsorption unit 42) by being lowered and accommodated in the pin hole (see FIG. 3).
而且,藉由於在平台21的表面承載基板10的狀態下使頂出銷51上升,使頂出銷51的尖端部分抵接基板10,能以複數根頂出銷51的尖端部分保持基板10於預定的高度位置。據此,可極力地抑制與基板10的接觸部分而保持,可不使基板10損傷而平順地進行更換。Further, by raising the ejector pin 51 in a state where the substrate 10 is carried on the surface of the stage 21, the tip end portion of the ejector pin 51 abuts against the substrate 10, and the substrate 10 can be held at the tip end portion of the plurality of ejector pins 51. The predetermined height position. According to this, it is possible to suppress the contact portion with the substrate 10 as much as possible, and it is possible to smoothly replace the substrate 10 without damaging the substrate 10.
此處,在承載基板10的情形下,以初期吸附部41中的頂出銷51比主吸附部42中的頂出銷51還早的時機被收容於銷孔,被保持於頂出銷51的基板10是由初期吸附部41先被承載,接著被承載於主吸附部42。據此,藉由存在於基板10與初期吸附部41之間的空氣層逸散至主吸附部42 側,可抑制空氣層以氣泡介於基板10與初期吸附部41之間。Here, in the case of the carrier substrate 10, the timing at which the ejector pin 51 in the initial adsorption portion 41 is earlier than the ejector pin 51 in the main adsorption portion 42 is accommodated in the pin hole, and is held by the ejector pin 51. The substrate 10 is first carried by the initial adsorption unit 41 and then carried by the main adsorption unit 42. Accordingly, the air layer existing between the substrate 10 and the initial adsorption portion 41 is dissipated to the main adsorption portion 42. On the side, it is possible to suppress the air layer from interposing between the substrate 10 and the initial adsorption portion 41 with bubbles.
而且,針對主吸附部42中的頂出銷51也是由初期吸附部41側朝離開初期吸附部41側依次被收容於銷孔(參照圖3)。據此,基板10的塗佈膜形成區域12由初期吸附部41側朝未承載側(在圖3中為右側)單向依次被承載。因此,藉由存在於基板10與平台21之間的空氣層依次逸散至未承載側,可抑制空氣層以氣泡存在於基板10與平台21之間。In addition, the ejector pin 51 in the main adsorption unit 42 is also accommodated in the pin hole from the initial adsorption unit 41 side toward the initial adsorption unit 41 side (see FIG. 3). According to this, the coating film formation region 12 of the substrate 10 is unidirectionally carried by the initial adsorption portion 41 side toward the unloaded side (the right side in FIG. 3). Therefore, by sequentially dissipating the air layer existing between the substrate 10 and the stage 21 to the unloaded side, it is possible to suppress the air layer from being present between the substrate 10 and the stage 21 as bubbles.
而且,在平台21配設有基板10的定位機構(未圖示),可定位被承載於初期吸附部41的基板10而構成。亦即,被保持於頂出銷51的基板10若該基板10的一部分(初期膜形成區域11)被承載於初期吸附部41,則該一部分藉由定位機構定位。而且,在基板10的初期膜形成區域11藉由初期吸附部41定位的狀態下,使真空泵81a動作並使該初期膜形成區域11吸附保持於初期吸附部41。然後,藉由使真空泵81b動作使基板10吸附保持於主吸附部42。據此,基板10全體可精度佳地被吸附保持於平台21。Further, a positioning mechanism (not shown) of the substrate 10 is disposed on the stage 21, and the substrate 10 carried by the initial adsorption unit 41 can be positioned. In other words, when the substrate 10 held by the ejector pin 51 is placed on the initial adsorption portion 41 of the substrate 10 (the initial film formation region 11), the portion is positioned by the positioning mechanism. In the state in which the initial film formation region 11 of the substrate 10 is positioned by the initial adsorption portion 41, the vacuum pump 81a is operated to adsorb and hold the initial film formation region 11 to the initial adsorption portion 41. Then, the substrate 10 is adsorbed and held by the main adsorption unit 42 by operating the vacuum pump 81b. According to this, the entire substrate 10 can be adsorbed and held on the stage 21 with high precision.
而且,塗佈單元30是塗佈塗佈液於基板10上。該塗佈單元30如圖5所示,具有與基台2連結的腳部31和延伸於Y軸方向的開縫噴嘴部(slit nozzle part)34,在跨過基台2上於Y軸方向的狀態下可移動於X軸方向而被安裝。具體上,在基台2的Y軸方向兩端部分分別設置有延伸於X軸方向的軌條(rail)22,腳部31被滑動自如地安裝於該軌條22。而且,在腳部31安裝有線性馬達(linear motor)33,藉由驅動控制該線性馬達33使塗佈單元30移動於X軸方 向,可在任意的位置停止。Further, the coating unit 30 is coated with a coating liquid on the substrate 10. As shown in FIG. 5, the coating unit 30 has a leg portion 31 coupled to the base 2 and a slit nozzle portion 34 extending in the Y-axis direction, across the base 2 in the Y-axis direction. The state can be moved in the X-axis direction and installed. Specifically, rails 22 extending in the X-axis direction are respectively provided at both end portions of the base 2 in the Y-axis direction, and the leg portions 31 are slidably attached to the rails 22. Further, a linear motor 33 is attached to the leg portion 31, and the coating unit 30 is moved to the X-axis side by driving the linear motor 33. The direction can be stopped at any position.
具體上,該塗佈單元30是在初期狀態中停止於脫離平台21的位置,亦即退避位置(evacuation location)(圖9的位置A)。而且,在塗佈動作開始的情形下,移動至形成有初期膜的初期膜形成位置(圖9的位置C),可在該位置停止。Specifically, the coating unit 30 is stopped at the position of the detachment platform 21 in the initial state, that is, the evacuation position (position A in FIG. 9). Further, when the coating operation is started, the initial film formation position (position C in FIG. 9) in which the initial film is formed is moved to stop at this position.
在塗佈單元30的腳部31安裝有塗佈塗佈液之開縫噴嘴部34。具體上,在該腳部31配設有延伸於Z軸方向的軌條37與沿著該軌條37滑動之滑塊(slider)35,此等滑塊35與開縫噴嘴部34是被連結。而且,在滑塊35安裝有藉由伺服馬達36(參照圖6)驅動的滾珠螺桿(ball screw)機構,藉由驅動控制該伺服馬達36使滑塊35移動於Z軸方向,並且可在任意的位置停止。亦即,開縫噴嘴部34是對被保持於平台21的基板10可接離(attach and detach)地被支撐。A slit nozzle portion 34 to which a coating liquid is applied is attached to the leg portion 31 of the coating unit 30. Specifically, the leg portion 31 is provided with a rail 37 extending in the Z-axis direction and a slider 35 sliding along the rail 37, and the slider 35 and the slit nozzle portion 34 are connected. . Further, a ball screw mechanism driven by a servo motor 36 (refer to FIG. 6) is attached to the slider 35, and the servo motor 36 is driven to move the slider 35 in the Z-axis direction, and can be arbitrarily The position stops. That is, the slit nozzle portion 34 is supported by attaching and detaching the substrate 10 held by the stage 21.
開縫噴嘴部34是塗佈塗佈液並在基板10上形成塗佈膜。該開縫噴嘴部34是具有延伸於單向的形狀之柱狀構件,與塗佈單元30的行走(running)方向大致正交而配設。在該開縫噴嘴部34形成有延伸於長度方向的開縫噴嘴(slit nozzle)34a,供給至開縫噴嘴部34的塗佈液是由開縫噴嘴34a遍及長度方向一樣地被吐出。因此,藉由在由該開縫噴嘴34a使塗佈液吐出的狀態下使塗佈單元30行走於X軸方向,遍及開縫噴嘴34a的長度方向在基板10上形成有一定厚度的塗佈膜。The slit nozzle portion 34 is a coating liquid applied to form a coating film on the substrate 10. The slit nozzle portion 34 is a columnar member having a shape extending in a unidirectional direction, and is disposed substantially perpendicular to the running direction of the coating unit 30. In the slit nozzle portion 34, a slit nozzle 34a extending in the longitudinal direction is formed, and the coating liquid supplied to the slit nozzle portion 34 is discharged by the slit nozzle 34a in the same length direction. Therefore, the coating unit 30 is moved in the X-axis direction while the coating liquid is discharged by the slit nozzle 34a, and a coating film having a certain thickness is formed on the substrate 10 in the longitudinal direction of the slit nozzle 34a. .
而且,在腳部31安裝有高度位置檢測感測器32(參照 圖2)。該高度位置檢測感測器32是測定Z軸方向中的基板10的高度位置。具體上,在Z方向朝下輸出雷射光,透過接收藉由基板10反射的雷射光,可測定至基板10的Z方向距離。而且,由至該基板10的測定距離與開縫噴嘴部34的開縫噴嘴34a的高度位置的關係可算出基板10的高度位置。據此,可使基板10與開縫噴嘴部34的開縫噴嘴34a的距離一定而進行塗佈動作。Further, a height position detecting sensor 32 is attached to the leg portion 31 (refer to figure 2). The height position detecting sensor 32 measures the height position of the substrate 10 in the Z-axis direction. Specifically, the laser light is output downward in the Z direction, and the laser light reflected by the substrate 10 is received, whereby the Z-direction distance to the substrate 10 can be measured. Further, the height position of the substrate 10 can be calculated from the relationship between the measurement distance to the substrate 10 and the height position of the slit nozzle 34a of the slit nozzle portion 34. Thereby, the coating operation can be performed by making the distance between the substrate 10 and the slit nozzle 34a of the slit nozzle portion 34 constant.
而且,在腳部31於保持有基板10的高度位置安裝有異物檢測感測器39。該異物檢測感測器39是用以檢測在基板10上是否存在異物。具體上,異物感測器是藉由在Y軸方向一方側的腳部31發出雷射光之發光部,與在該Y軸方向他方側的腳部31接收來自前述發光部的雷射光之受光部構成,被安裝於比基板10的表面稍高的位置。然後,若在基板10上存在異物,則可透過藉由受光部接收的雷射光被遮蔽檢測出異物。據此,藉由在開縫噴嘴34a與基板10之間咬入異物,可防止開縫噴嘴34a或基板10受到損傷。Further, a foreign matter detecting sensor 39 is attached to the leg portion 31 at a height position at which the substrate 10 is held. The foreign matter detecting sensor 39 is for detecting whether or not foreign matter is present on the substrate 10. Specifically, the foreign matter sensor is a light-emitting portion that emits laser light by the leg portion 31 on one side in the Y-axis direction, and a light-receiving portion that receives laser light from the light-emitting portion on the leg portion 31 on the other side in the Y-axis direction. The configuration is mounted at a position slightly higher than the surface of the substrate 10. Then, if foreign matter is present on the substrate 10, the foreign matter can be detected by being shielded by the laser light received by the light receiving unit. According to this, it is possible to prevent the slit nozzle 34a or the substrate 10 from being damaged by biting foreign matter between the slit nozzle 34a and the substrate 10.
接著,針對上述塗佈裝置的控制系統之構成,使用圖6所示的方塊圖來說明。Next, the configuration of the control system of the above coating apparatus will be described using a block diagram shown in FIG. 6.
圖6是顯示配設於該塗佈裝置之控制裝置90的控制系統之方塊圖。如圖6所示,該塗佈裝置配設有控制上述的各種單元的驅動之控制裝置90。該控制裝置90具有:控制本體部91、驅動控制部92、輸入/輸出裝置控制部93、外部裝置控制部94。Figure 6 is a block diagram showing a control system of the control device 90 disposed in the coating device. As shown in Fig. 6, the coating device is provided with a control device 90 for controlling the driving of the various units described above. The control device 90 includes a control main unit 91, a drive control unit 92, an input/output device control unit 93, and an external device control unit 94.
控制本體部91具備:執行邏輯運算之週知的CPU;預先 記憶控制該CPU之種種的程式等之ROM(Read-Only Memory:唯讀記憶體);在裝置動作中一時地記憶種種的資料(data)之RAM(Random Access Memory:隨機存取記憶體);記憶種種的程式或OS(Operating System:作業系統)並且記憶生產程式等的各種資料之HDD(Hard Disk:硬碟)等。而且,控制本體部91具有:主控制部91a、運算判定部91b、記憶部91c。The control main unit 91 includes a well-known CPU that performs logical operations; A ROM (Read-Only Memory) that stores various programs such as the CPU, and a RAM (Random Access Memory) that memorizes various data at a time during device operation; It is a HDD (Hard Disk) that stores various programs such as a program or an OS (Operating System) and memorizes production programs. Further, the control main unit 91 includes a main control unit 91a, an arithmetic determination unit 91b, and a storage unit 91c.
主控制部91a是為了依照預先記憶的程式執行一連串的塗佈動作,透過驅動控制部92驅動控制各單元的伺服馬達36、線性馬達33等的驅動裝置。The main control unit 91a is a drive device that drives and controls the servo motor 36, the linear motor 33, and the like of each unit through the drive control unit 92 in order to execute a series of coating operations in accordance with a program stored in advance.
運算判定部91b是由各感測器等的計測結果進行運算及判定。在本實施形態中是根據藉由高度位置檢測感測器32測定的高度位置資料運算基板10表面至開縫噴嘴部34的開縫噴嘴34a的高度位置。然後,比較該運算結果與記憶於後述的記憶部91c的高度位置資料,經由主控制部91a控制,俾開縫噴嘴部34的開縫噴嘴34a的高度位置成為預定的高度位置。The calculation determination unit 91b performs calculation and determination by measurement results of the respective sensors and the like. In the present embodiment, the height position of the surface of the substrate 10 to the slit nozzle 34a of the slit nozzle portion 34 is calculated based on the height position data measured by the height position detecting sensor 32. Then, the calculation result is compared with the height position data stored in the memory unit 91c, which will be described later, and is controlled by the main control unit 91a, and the height position of the slit nozzle 34a of the slit nozzle portion 34 becomes a predetermined height position.
而且,由來自異物檢測感測器39的計測結果判定在基板10上是否存在異物。亦即,一邊使塗佈單元30移動,一邊藉由來自異物檢測感測器39的輸出信號判斷異物是否存在。具體上,藉由來自發光部的光一照射異物,在受光部的信號就產生變化,判斷為在基板10上存在異物。而且,在此情形下,藉由不會使塗佈單元30的移動開始而使塗佈動作中止,與此同時將發生異常顯示於觸控面板(touch panel)82上,對操作者進行警告。Moreover, it is determined by the measurement result from the foreign matter detecting sensor 39 whether or not foreign matter is present on the substrate 10. That is, while the application unit 30 is being moved, it is judged whether or not the foreign matter is present by the output signal from the foreign matter detecting sensor 39. Specifically, when the light from the light-emitting portion is irradiated with the foreign matter, the signal in the light-receiving portion changes, and it is determined that foreign matter is present on the substrate 10. Further, in this case, the coating operation is stopped without starting the movement of the coating unit 30, and an abnormality is displayed on the touch panel 82 at the same time, and the operator is warned.
記憶部91c是用以儲存有各種資料,並且一時地儲存運算結果等。具體上,記憶有進行塗佈動作時的基板10表面至開縫噴嘴部34的開縫噴嘴34a的高度位置資料。The memory unit 91c is for storing various materials, and stores calculation results and the like at one time. Specifically, the height position data of the surface of the substrate 10 at the time of the coating operation to the slit nozzle 34a of the slit nozzle portion 34 is stored.
驅動控制部92是根據來自主控制部91a的控制信號驅動控制線性馬達33、伺服馬達36等。具體上,藉由控制線性馬達33及伺服馬達36使塗佈單元30的移動及開縫噴嘴部34的升降動作等被驅動控制。The drive control unit 92 drives and controls the linear motor 33, the servo motor 36, and the like in accordance with a control signal from the main control unit 91a. Specifically, the linear motor 33 and the servo motor 36 are controlled to drive and control the movement of the coating unit 30 and the lifting operation of the slit nozzle portion 34.
輸入/輸出裝置控制部93是控制異物檢測感測器39、鍵盤(keyboard)83、觸控面板82等的各輸入/輸出裝置。具體上,若藉由在基板10上存在異物,在受光部的信號會產生變化,則輸入/輸出裝置控制部93將依照來自異物檢測感測器39的信號之信號輸出至控制本體部91。而且,在藉由控制本體部91判斷為異物存在的情形下,經由輸入/輸出裝置控制部93對操作者催促警告之警告顯示被進行於觸控面板82上。而且,可由鍵盤83及觸控面板82進行塗佈動作的條件設定等。The input/output device control unit 93 is an input/output device that controls the foreign matter detecting sensor 39, the keyboard 83, the touch panel 82, and the like. Specifically, when there is a foreign matter on the substrate 10 and the signal in the light receiving portion changes, the input/output device control unit 93 outputs a signal in accordance with the signal from the foreign matter detecting sensor 39 to the control main unit 91. When the control main unit 91 determines that there is a foreign object, the warning display for prompting the operator via the input/output device control unit 93 is performed on the touch panel 82. Further, the keyboard 83 and the touch panel 82 can be used to set conditions for the coating operation.
外部裝置控制部94是根據來自主控制部91a的控制信號進行外部裝置的驅動控制。在本實施形態中是與真空泵81(81a、81b)連接,藉由使該真空泵81驅動,俾可在初期吸附部41及主吸附部42中進行基板10的吸附保持等。The external device control unit 94 performs drive control of the external device based on a control signal from the main control unit 91a. In the present embodiment, the vacuum pump 81 (81a, 81b) is connected, and by driving the vacuum pump 81, the substrate 10 can be adsorbed and held in the initial adsorption unit 41 and the main adsorption unit 42.
接著,針對該塗佈裝置中的動作,一邊參照圖7、8所示的流程圖以及圖9所示的顯示塗佈單元30的位置關係之概略圖,一邊說明。此外,在圖9中是以實線表示位於退避位置(位置A)的塗佈單元30,以二點鏈線表示位於高度位置 測定開始位置(位置B)及初期膜形成位置(位置C)的塗佈單元30。Next, the operation of the coating apparatus will be described with reference to the flowcharts shown in FIGS. 7 and 8 and the schematic diagram of the positional relationship of the display coating unit 30 shown in FIG. 9 . Further, in FIG. 9, the coating unit 30 at the retracted position (position A) is indicated by a solid line, and is indicated by a two-dot chain line at a height position. The coating unit 30 that measures the start position (position B) and the initial film formation position (position C).
首先,在步驟S1中基板10的搬進被進行。具體上,在由平台21的表面突出複數根頂出銷51的狀態下待機,藉由未圖示的機械手(robot hand)使基板10被承載於頂出銷51的尖端部分。First, the loading of the substrate 10 is performed in step S1. Specifically, in a state in which a plurality of ejector pins 51 are protruded from the surface of the stage 21, the substrate 10 is placed on the tip end portion of the ejector pin 51 by a robot hand (not shown).
接著,在步驟S2~S3中在平台21上承載有基板10(基板承載製程)。具體上,藉由在步驟S2中由基板10被保持在頂出銷51的狀態,以初期吸附部41的頂出銷51比主吸附部42的頂出銷51還早一些的時機(以所承載的基板10不落下的程度)被收容,使基板10的初期膜形成區域11被承載於平台21的初期吸附部41(參照圖3)。據此,因存在於基板10與初期吸附部41之間的空氣層逸散至主吸附部42側,故空氣層以氣泡介於基板10與初期吸附部41之間被有效地抑制。而且,藉由若初期膜形成區域11被承載於初期吸附部41,則定位機構動作,使初期膜形成區域11被精度佳地定位。然後,藉由使真空泵81a動作使吸引力產生於初期吸附部41中的吸引孔41a及吸附溝41b,介於基板10與初期吸附部41之間的氣泡被吸引至吸引孔41a及吸附溝41b,並且基板10的初期膜形成區域11被吸附保持在初期吸附部41(初期吸附製程)。藉由在該基板10的端部之初期膜形成區域11被精度佳地定位的狀態下被固定,使基板10全體中的定位被精度佳地進行。Next, the substrate 10 (substrate carrying process) is carried on the stage 21 in steps S2 to S3. Specifically, in a state where the substrate 10 is held by the ejector pin 51 in step S2, the timing at which the ejector pin 51 of the initial adsorption portion 41 is earlier than the ejector pin 51 of the main adsorption portion 42 is The substrate 10 to be placed is placed so as not to fall, and the initial film formation region 11 of the substrate 10 is placed on the initial adsorption portion 41 of the stage 21 (see FIG. 3). As a result, since the air layer existing between the substrate 10 and the initial adsorption portion 41 is dissipated to the main adsorption portion 42 side, the air layer is effectively suppressed between the substrate 10 and the initial adsorption portion 41 by the air bubbles. Further, when the initial film formation region 11 is carried by the initial adsorption portion 41, the positioning mechanism operates to accurately position the initial film formation region 11. Then, the suction pump 41a and the adsorption groove 41b in the initial adsorption unit 41 are generated by the operation of the vacuum pump 81a, and the air bubbles interposed between the substrate 10 and the initial adsorption unit 41 are attracted to the suction hole 41a and the adsorption groove 41b. The initial film formation region 11 of the substrate 10 is adsorbed and held by the initial adsorption portion 41 (initial adsorption process). By fixing the initial film formation region 11 at the end portion of the substrate 10 in a state where it is accurately positioned, the positioning of the entire substrate 10 is accurately performed.
接者,在步驟S3中基板10全面的吸附被進行(主吸附 製程),並且與此同時進行,在S4中塗佈動作被進行。亦即,在步驟S2中因基板10的初期膜形成區域11被吸附在平台21的初期吸附部41,故將對應尚未被吸附的主吸附部42之基板10的表面(塗佈膜形成區域12)吸附至平台21的主吸附部42。具體上,藉由由主吸附部42的頂出銷51之中位於初期吸附部41側者依次被收容於平台21內,使基板10的塗佈膜形成區域12由初期吸附部41側依次被承載於主吸附部42。據此,因存在於基板10與平台21之間的空氣層依次逸散至未承載側,故空氣層以氣泡存在於基板10與平台21之間被有效地抑制。而且,因如上述基板10的初期膜形成區域11被精度佳地定位,故藉由由該狀態使真空泵81b動作,可使基板10的塗佈膜形成區域12吸附於主吸附部42並將基板10全體吸附固定於平台21。此時,介於基板10與主吸附部42之間的氣泡被吸引至吸引孔42a及吸附溝42b。In the step S3, the overall adsorption of the substrate 10 is performed (main adsorption) The process is performed at the same time, and the coating operation is performed in S4. In other words, in the step S2, since the initial film formation region 11 of the substrate 10 is adsorbed to the initial adsorption portion 41 of the stage 21, the surface of the substrate 10 corresponding to the main adsorption portion 42 that has not been adsorbed is applied (the coating film formation region 12). It is adsorbed to the main adsorption portion 42 of the stage 21. Specifically, the coating film formation region 12 of the substrate 10 is sequentially placed by the initial adsorption portion 41 side by being sequentially housed in the stage 21 from the initial adsorption portion 41 side of the ejection pin 51 of the main adsorption portion 42. It is carried on the main adsorption portion 42. Accordingly, since the air layer existing between the substrate 10 and the stage 21 is sequentially dissipated to the unloaded side, the air layer is effectively suppressed by the presence of bubbles between the substrate 10 and the stage 21. In addition, since the initial film formation region 11 of the substrate 10 is accurately positioned, the vacuum pump 81b is operated in this state, and the coating film formation region 12 of the substrate 10 can be adsorbed to the main adsorption portion 42 and the substrate. 10 total adsorption is fixed to the platform 21. At this time, the air bubbles interposed between the substrate 10 and the main adsorption portion 42 are attracted to the suction holes 42a and the adsorption grooves 42b.
而且,與此同時進行,根據圖8的流程圖,與基板10的初期膜形成區域11的吸附完了大致同時開始塗佈動作。At the same time, the coating operation is started substantially simultaneously with the adsorption of the initial film formation region 11 of the substrate 10 in accordance with the flowchart of FIG.
首先,在步驟S41中塗佈單元30的移動被進行。亦即,與對應初期吸附部41之基板10的表面的吸附完了大致同時開始塗佈單元30的移動。具體上,使塗佈單元30由退避位置(位置A)移動至在基板10上形成初期膜的位置(初期膜形成位置,圖9中的位置C)。First, the movement of the coating unit 30 is performed in step S41. That is, the movement of the coating unit 30 is started substantially simultaneously with the adsorption of the surface of the substrate 10 corresponding to the initial adsorption unit 41. Specifically, the coating unit 30 is moved from the retracted position (position A) to a position where the initial film is formed on the substrate 10 (initial film formation position, position C in FIG. 9).
在該移動的途中,在步驟S42中開始基板10的高度位置的測定。具體上如圖9所示,若塗佈單元30到達高度位 置測定開始位置(位置B),則開始基板10的高度位置的測定。亦即,在基板10的初期膜形成區域11位於高度位置檢測感測器32的正下方時,開始基板10的高度位置的測定。然後,伴隨著塗佈單元30的移動,連續地測定基板10的高度,依照該測定值開縫噴嘴部34的高度位置被調節,俾開縫噴嘴部34的開縫噴嘴34a與基板10的表面之距離成為一定。In the middle of the movement, the measurement of the height position of the substrate 10 is started in step S42. Specifically, as shown in FIG. 9, if the coating unit 30 reaches the height level When the measurement start position (position B) is set, the measurement of the height position of the substrate 10 is started. That is, when the initial film formation region 11 of the substrate 10 is positioned directly below the height position detecting sensor 32, the measurement of the height position of the substrate 10 is started. Then, the height of the substrate 10 is continuously measured in accordance with the movement of the coating unit 30, and the height position of the slit nozzle portion 34 is adjusted in accordance with the measured value, and the slit nozzle 34a of the slit nozzle portion 34 and the surface of the substrate 10 are slit. The distance becomes certain.
而且,與此同時進行,在步驟S34中藉由異物檢測感測器39開始進行異物檢測。亦即,在高度位置測定開始後,在基板10上是否不存在異物被檢測。然後,於在基板10上異物被檢測出的情形下,塗佈單元30的移動被停止,於異物不被檢測出的情形下,使其移動至初期膜形成位置。如此,塗佈單元30是一邊進行高度位置檢測及異物檢測,一邊行走於初期吸附部41上。Further, at the same time, the foreign matter detection is started by the foreign matter detecting sensor 39 in step S34. That is, whether or not foreign matter is present on the substrate 10 after the start of the height position measurement is detected. Then, when the foreign matter is detected on the substrate 10, the movement of the coating unit 30 is stopped, and when the foreign matter is not detected, the movement is moved to the initial film formation position. In this manner, the coating unit 30 travels on the initial adsorption unit 41 while performing height position detection and foreign matter detection.
接著,在步驟S44中形成有初期膜。具體上,若塗佈單元30到達初期膜形成位置(位置C),則塗佈單元30在該位置停止。然後,藉由在使塗佈單元30停止於初期膜形成位置的狀態下使預定極少量的塗佈液吐出,成為透過由開縫噴嘴34a吐出的塗佈液使開縫噴嘴34a與基板10被連結的狀態。亦即,在開縫噴嘴34a與基板10之間形成有由塗佈液構成的初期膜。如此,藉由遍及開縫噴嘴34a的長度方向形成有初期膜,完成初期膜形成製程。Next, an initial film is formed in step S44. Specifically, when the coating unit 30 reaches the initial film formation position (position C), the coating unit 30 stops at this position. Then, a predetermined amount of the coating liquid is discharged in a state where the coating unit 30 is stopped at the initial film formation position, and the coating liquid discharged through the slit nozzle 34a is transmitted so that the slit nozzle 34a and the substrate 10 are The status of the link. That is, an initial film made of a coating liquid is formed between the slit nozzle 34a and the substrate 10. As described above, the initial film formation process is completed by forming the initial film over the longitudinal direction of the slit nozzle 34a.
接著,在步驟S45中開始主塗佈(塗佈膜形成製程)。亦即,藉由一邊更使塗佈單元30由初期膜形成位置行走,一 邊吐出塗佈液,在對應主吸附部42的基板10的表面形成塗佈膜。此外,在開始該主塗佈動作的前後,步驟S3中的基板10的全面吸附完了。Next, main coating (coating film forming process) is started in step S45. That is, by further moving the coating unit 30 from the initial film formation position, one The coating liquid is discharged, and a coating film is formed on the surface of the substrate 10 corresponding to the main adsorption portion 42. Further, before and after the main coating operation is started, the entire adsorption of the substrate 10 in the step S3 is completed.
接著,在步驟S5中基板10的取出被進行。亦即,藉由S45中的主塗佈在基板10表面完成塗佈膜的形成後,藉由使初期吸附部41及主吸附部42的頂出銷51上升,以頂出銷51的尖端部分保持基板10。然後,基板10的遞送被進行於未圖示的機械手,由平台21的表面排出基板10。Next, the take-out of the substrate 10 is performed in step S5. In other words, after the formation of the coating film is completed on the surface of the substrate 10 by the main coating in S45, the initial adsorption portion 41 and the ejection pin 51 of the main adsorption portion 42 are raised to eject the tip end portion of the pin 51. The substrate 10 is held. Then, the delivery of the substrate 10 is performed on a robot (not shown), and the substrate 10 is discharged from the surface of the stage 21.
依照這種塗佈裝置及塗佈方法,因吸附基板的前述基板吸附手段40具有初期吸附部41與主吸附部42,故在藉由初期吸附部41吸附有基板10的一部分後,可使塗佈單元30移動並可對對應初期吸附部41之基板10的表面開始塗佈。亦即,因在基板的吸附開始後,可使塗佈單元30立即移動至對應前述初期吸附部41的基板10的表面,故與如以往般在吸附固定基板10全體後使塗佈動作開始的情形比較,可使作為塗佈裝置全體的週期時間縮短。According to the coating apparatus and the coating method, the substrate adsorption means 40 for adsorbing the substrate has the initial adsorption portion 41 and the main adsorption portion 42, so that a part of the substrate 10 is adsorbed by the initial adsorption portion 41, and then the coating can be performed. The cloth unit 30 moves and can start coating the surface of the substrate 10 corresponding to the initial adsorption portion 41. In other words, since the application unit 30 can be immediately moved to the surface of the substrate 10 corresponding to the initial adsorption unit 41 after the adsorption of the substrate is started, the coating operation is started after the entire substrate 10 is adsorbed and fixed as in the related art. In comparison with the situation, the cycle time as the entire coating apparatus can be shortened.
而且,在上述實施形態中雖然是針對各自配設使吸引力產生於初期吸附部41的吸引孔41a之真空泵81a與使吸引力產生於主吸附部42的吸引孔42a之真空泵81b的例子來說明,惟如圖10所示也可以為以一個真空泵81使吸引力產生於初期吸附部41及主吸附部42的吸引孔41a、42a。具體上也能以如下之構成:藉由在連結真空泵81與初期吸附部41及主吸附部42的吸引孔41a、42a之配管84安裝切換閥44,能以控制裝置自動地切換該切換閥44,選擇性地 使吸引力產生於初期吸附部41的吸引孔41a與主吸附部42的吸引孔42a。如此,藉由使真空泵81共通,可當作更廉價的塗佈裝置。In the above-described embodiment, the vacuum pump 81a that causes the suction force to be generated in the suction hole 41a of the initial adsorption unit 41 and the vacuum pump 81b that causes the suction force to be generated in the suction hole 42a of the main adsorption unit 42 are disposed. However, as shown in FIG. 10, the suction force may be generated in the suction holes 41a and 42a of the initial adsorption unit 41 and the main adsorption unit 42 by the vacuum pump 81. Specifically, the switching valve 44 can be attached to the piping 84 that connects the vacuum pump 81 and the initial suction unit 41 and the suction holes 41a and 42a of the main adsorption unit 42 to automatically switch the switching valve 44 by the control device. Selectively The suction force is generated in the suction hole 41a of the initial adsorption unit 41 and the suction hole 42a of the main adsorption unit 42. Thus, by making the vacuum pump 81 common, it can be regarded as a more inexpensive coating apparatus.
而且,在上述實施形態中雖然是針對以初期吸附部41的頂出銷51比主吸附部42的頂出銷51還早一些的時機被收容的例子來說明,惟所有的頂出銷51以相同的時機被收容者也可以。據此,可防止被保持於頂出銷51的尖端部分的基板10由被以早的時機收容的初期吸附部41的頂出銷51側落下。Further, in the above-described embodiment, the description is made with respect to an example in which the ejector pin 51 of the initial adsorption portion 41 is placed earlier than the ejector pin 51 of the main adsorption portion 42, but all the ejector pins 51 are The same timing can be accommodated by the occupant. According to this, it is possible to prevent the substrate 10 held by the tip end portion of the ejector pin 51 from falling off the ejector pin 51 side of the initial adsorption portion 41 that was accommodated at an early timing.
2‧‧‧基台2‧‧‧Abutment
10‧‧‧基板10‧‧‧Substrate
11‧‧‧初期膜形成區域11‧‧‧ Initial film formation area
12‧‧‧塗佈膜形成區域12‧‧‧ Coating film formation area
21‧‧‧平台21‧‧‧ platform
22、37‧‧‧軌條22, 37‧‧ ‧ rails
30‧‧‧塗佈單元30‧‧‧ Coating unit
31‧‧‧腳部31‧‧‧ feet
32‧‧‧高度位置檢測感測器32‧‧‧ Height position detection sensor
33‧‧‧線性馬達33‧‧‧Linear motor
34‧‧‧開縫噴嘴部34‧‧‧Slotted nozzle section
34a‧‧‧開縫噴嘴34a‧‧‧Slot nozzle
35‧‧‧滑塊35‧‧‧ Slider
36‧‧‧伺服馬達36‧‧‧Servo motor
39‧‧‧異物檢測感測器39‧‧‧ Foreign object detection sensor
40‧‧‧基板吸附手段40‧‧‧Substrate adsorption means
41‧‧‧初期吸附部41‧‧‧ Initial adsorption department
41a、42a‧‧‧吸引孔41a, 42a‧‧‧ attracting holes
41b、42b‧‧‧吸附溝41b, 42b‧‧ ‧ adsorption ditch
42‧‧‧主吸附部42‧‧‧Main adsorption department
51‧‧‧頂出銷51‧‧‧Top sales
81、81a、81b‧‧‧真空泵81, 81a, 81b‧‧‧ vacuum pump
82‧‧‧觸控面板82‧‧‧Touch panel
83‧‧‧鍵盤83‧‧‧ keyboard
84‧‧‧配管84‧‧‧Pipe
90‧‧‧控制裝置90‧‧‧Control device
91‧‧‧控制本體部91‧‧‧Control body
91a‧‧‧主控制部91a‧‧‧Main Control Department
91b‧‧‧運算判定部91b‧‧‧Decision Judgment Department
91c‧‧‧記憶部91c‧‧‧Memory Department
92‧‧‧驅動控制部92‧‧‧Drive Control Department
93‧‧‧輸入/輸出裝置控制部93‧‧‧Input/output device control unit
圖1是顯示與本發明的實施形態有關的塗佈裝置之俯視圖。Fig. 1 is a plan view showing a coating apparatus according to an embodiment of the present invention.
圖2是上述塗佈裝置之側視圖。Figure 2 is a side view of the above coating apparatus.
圖3是顯示在上述塗佈裝置承載有基板的一部分的狀態之圖。Fig. 3 is a view showing a state in which a part of a substrate is carried by the above coating apparatus.
圖4(a)、(b)是顯示上述塗佈裝置的平台之圖,(a)是顯示平台的全體之圖,(b)是其表面部分之擴大圖。4(a) and 4(b) are views showing a stage of the above coating apparatus, wherein (a) is a view showing the entire platform, and (b) is an enlarged view of a surface portion thereof.
圖5是顯示上述塗佈裝置中的塗佈單元的腳部的詳細之圖。Fig. 5 is a view showing details of a leg portion of a coating unit in the above coating device.
圖6是顯示上述塗佈裝置的控制系統之方塊圖。Fig. 6 is a block diagram showing a control system of the above coating apparatus.
圖7是顯示上述塗佈裝置的動作之流程圖。Fig. 7 is a flow chart showing the operation of the above coating apparatus.
圖8是顯示上述塗佈裝置的塗佈動作之流程圖。Fig. 8 is a flow chart showing the coating operation of the above coating apparatus.
圖9是顯示上述塗佈裝置的動作中的塗佈單元的位置 關係之圖。Figure 9 is a view showing the position of the coating unit in the operation of the above coating apparatus Diagram of the relationship.
圖10是顯示與其他的實施形態有關的塗佈裝置的真空泵與配管系統之概略圖。Fig. 10 is a schematic view showing a vacuum pump and a piping system of a coating device according to another embodiment.
10‧‧‧基板10‧‧‧Substrate
11‧‧‧塗佈裝置11‧‧‧ Coating device
12‧‧‧塗佈膜形成區域12‧‧‧ Coating film formation area
21‧‧‧平台21‧‧‧ platform
30‧‧‧塗佈單元30‧‧‧ Coating unit
34‧‧‧開縫噴嘴部34‧‧‧Slotted nozzle section
40‧‧‧基板吸附手段40‧‧‧Substrate adsorption means
41‧‧‧初期吸附部41‧‧‧ Initial adsorption department
42‧‧‧主吸附部42‧‧‧Main adsorption department
51‧‧‧頂出銷51‧‧‧Top sales
81、81a、81b‧‧‧真空泵81, 81a, 81b‧‧‧ vacuum pump
84‧‧‧配管84‧‧‧Pipe
Claims (7)
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JP2007291111A JP5148248B2 (en) | 2007-11-08 | 2007-11-08 | Coating apparatus and coating method |
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TW200618868A (en) * | 2004-08-31 | 2006-06-16 | Tokyo Ohka Kogyo Co Ltd | Stage for mounting substrate and method for attracting and separating substrate |
TW200706255A (en) * | 2005-03-31 | 2007-02-16 | Toray Eng Co Ltd | Applicator device |
TW200730261A (en) * | 2005-10-13 | 2007-08-16 | Tokyo Electron Ltd | Coating apparatus and coating method |
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JPH11125811A (en) * | 1997-10-24 | 1999-05-11 | Sharp Corp | Production of liquid crystal display element and apparatus for producing liquid crystal display element |
JP2006289162A (en) * | 2005-04-06 | 2006-10-26 | Hitachi Plant Technologies Ltd | Coater |
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TW200618868A (en) * | 2004-08-31 | 2006-06-16 | Tokyo Ohka Kogyo Co Ltd | Stage for mounting substrate and method for attracting and separating substrate |
TW200706255A (en) * | 2005-03-31 | 2007-02-16 | Toray Eng Co Ltd | Applicator device |
TW200730261A (en) * | 2005-10-13 | 2007-08-16 | Tokyo Electron Ltd | Coating apparatus and coating method |
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TW200922695A (en) | 2009-06-01 |
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