TWI458564B - Coating machine and fixing method of a substrate - Google Patents

Coating machine and fixing method of a substrate Download PDF

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Publication number
TWI458564B
TWI458564B TW097138880A TW97138880A TWI458564B TW I458564 B TWI458564 B TW I458564B TW 097138880 A TW097138880 A TW 097138880A TW 97138880 A TW97138880 A TW 97138880A TW I458564 B TWI458564 B TW I458564B
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substrate
pressure
holding
coating
platform
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TW097138880A
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TW200936251A (en
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Toshihiro Mori
Sadahiko Ito
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Toray Eng Co Ltd
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C5/00Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
    • B05C5/02Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C13/00Means for manipulating or holding work, e.g. for separate articles
    • B05C13/02Means for manipulating or holding work, e.g. for separate articles for particular articles
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Coating Apparatus (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

塗佈裝置及其基板保持方法Coating device and substrate holding method thereof

本發明是關於塗佈塗佈液於基板(substrate)上之塗佈裝置(coating machine)及其基板的保持方法。The present invention relates to a coating machine for applying a coating liquid onto a substrate and a method for holding the substrate.

在液晶顯示器(liquid crystal display)或電漿顯示器(plasma display)等的平面面板顯示器(flat panel display)使用有在玻璃基板(glass substrate)上塗佈有光阻(resist)液者(稱為塗佈基板)。該塗佈基板是藉由均勻地塗佈光阻液之塗佈裝置形成。In a flat panel display such as a liquid crystal display or a plasma display, a photoresist is applied to a glass substrate (referred to as a coating). Cloth substrate). The coated substrate is formed by a coating device that uniformly coats the photoresist.

該塗佈裝置具有:承載有基板的平台(stage);吐出有光阻液之塗佈單元(coating unit),藉由一邊由塗佈單元吐出光阻液,一邊使塗佈單元移動,以在基板上形成有均勻厚度的光阻液膜。The coating device has a stage on which a substrate is carried, a coating unit that discharges a photoresist, and the coating unit is moved while discharging the photoresist from the coating unit. A photoresist film having a uniform thickness is formed on the substrate.

在這種塗佈裝置中,使基板保持於平台之手段(means)一般已知有藉由在平台形成有吸附孔,使負壓產生於該吸附孔,使基板吸附保持於平台上(例如參照專利文獻1)。具體上,藉由吸附孔與負壓產生裝置被連接,設定該負壓產生裝置於低壓(高真空側),以在吸附孔產生負壓。而且,藉由基板一被供給至平台就以負壓產生裝置進行高速排氣,急速地使負壓產生於吸附孔,使吸附基板於平台所需的吸附時間縮短,謀求塗佈裝置的週期時間(cycle time)的提高。In such a coating apparatus, a means for holding a substrate on a stage is generally known to have a negative pressure generated in the adsorption hole by forming an adsorption hole in the platform, so that the substrate is adsorbed and held on the platform (for example, refer to Patent Document 1). Specifically, the suction pressure is connected to the negative pressure generating device, and the negative pressure generating device is set at a low pressure (high vacuum side) to generate a negative pressure in the adsorption hole. Further, when the substrate is supplied to the stage, the negative pressure generating means performs high-speed exhausting, and the negative pressure is rapidly generated in the adsorption hole, so that the adsorption time required for adsorbing the substrate on the stage is shortened, and the cycle time of the coating device is sought. (cycle time) improvement.

[專利文獻1]日本國特開2006-281091號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2006-281091

但是,在上述塗佈裝置中藉由以負壓產生裝置進行高速排氣,在吸附孔產生大的負壓(高真空側壓力)。若在這種大的吸引力產生的狀態下進行塗佈,則有在相當於吸附孔的基板部分中產生塗佈不均之虞的問題。However, in the above coating apparatus, high-pressure exhaust is performed by the negative pressure generating means, and a large negative pressure (high vacuum side pressure) is generated in the adsorption holes. When the coating is performed in such a state in which a large attraction force occurs, there is a problem in that coating unevenness occurs in the substrate portion corresponding to the adsorption hole.

因此,若設定(設定為大氣壓側)俾產生於吸附孔的負壓變弱,則在負壓產生裝置中無法進行高速排氣,使設定壓力產生於吸附孔的時間變長。亦即,使基板吸附於平台所需的時間變長,其結果有塗佈裝置的週期時間長期化之問題。Therefore, when the negative pressure generated in the adsorption hole is set to be set (at the atmospheric pressure side), high-speed exhaustion cannot be performed in the negative pressure generating device, and the set pressure is generated in the adsorption hole for a long time. That is, the time required for the substrate to be adsorbed to the stage becomes long, and as a result, there is a problem that the cycle time of the coating device is prolonged.

本發明乃是鑑於上述問題點所進行的創作,其目的為提供一種塗佈裝置及其基板保持方法,即使是設定吸附基板的吸引力為不產生塗佈不均程度的情形,也能抑制塗佈裝置的週期時間長期化。The present invention has been made in view of the above problems, and an object thereof is to provide a coating apparatus and a substrate holding method thereof, which can suppress coating even if the suction force of the adsorption substrate is set so that coating unevenness does not occur. The cycle time of the cloth device is long-term.

為了解決上述課題,本發明的塗佈裝置包含:承載基板之平台;使吸引力產生於形成於前述平台的表面之吸引孔,並使基板吸附保持於平台的表面之基板保持手段;以及一邊對被保持於前述平台的表面之基板相對地移動,一邊吐出塗佈液之塗佈單元,其特徵為:前述基板保持手段具有可調節對基板的吸引力之壓力調節部,該壓力調節部可調節成吸附剛被承載於平台的表面後的基板之初期壓,與藉由該初期壓使基板吸附後,維持基板被保持於平台的表 面的狀態之保持壓,該保持壓是設定為比前述初期壓小,前述基板保持手段具有:使吸引力產生於前述吸引孔之吸引力產生裝置,與連通並連接前述吸引力產生裝置與前述吸引孔之配管,前述壓力調節部分別各自具備:調節成前述初期壓之配管路徑,與調節成前述保持壓之配管路徑。In order to solve the above problems, the coating apparatus of the present invention includes: a stage on which a substrate is supported; a substrate holding means for causing an attraction force to be formed in a suction hole formed on a surface of the stage, and adsorbing and holding the substrate on a surface of the stage; A coating unit that ejects a coating liquid while being held by a substrate held on a surface of the platform, wherein the substrate holding means has a pressure adjusting portion that adjusts an attractive force to the substrate, and the pressure adjusting portion is adjustable The initial pressure of the substrate immediately after being adsorbed on the surface of the platform, and the table in which the substrate is held on the platform after the substrate is adsorbed by the initial pressure In the state of the surface, the holding pressure is set to be smaller than the initial pressure, and the substrate holding means includes an attraction force generating means for generating an attraction force in the suction hole, and is connected to the suction force generating means and the aforementioned Each of the pressure adjusting portions includes a piping path that is adjusted to the initial pressure and a piping path that is adjusted to the holding pressure.

依照該塗佈裝置,透過在吸附被承載於平台的基板的情形下,使負壓(比大氣壓小的壓力)產生於吸引孔並急速地吸附,在壓力到達初期壓後,藉由前述壓力調節部調節成比初期壓小的保持壓,可保持所吸附的基板於平台上。因此,因在藉由塗佈單元塗佈塗佈液於基板上的情形下,可在藉由比初期壓小的保持壓吸附保持的基板上進行塗佈,故與如以往般在吸附被承載於平台的基板之初期壓下進行塗佈的情形比較,可抑制在相當於吸引孔的部分產生塗佈不均。而且,因即使是藉由比初期壓小的保持壓保持基板於平台的構成,也能在吸附基板時以高速產生初期壓,故可解除塗佈裝置的週期時間長期化之問題。According to the coating apparatus, a negative pressure (a pressure smaller than atmospheric pressure) is generated in the suction hole and rapidly adsorbed while adsorbing the substrate carried on the stage, and the pressure is adjusted by the pressure after the initial pressure is reached. The portion is adjusted to a holding pressure smaller than the initial pressure to maintain the adsorbed substrate on the platform. Therefore, when the coating liquid is applied onto the substrate by the coating unit, the coating can be carried out on the substrate held by the pressure-holding holding with a smaller initial pressure, so that it is carried by adsorption as in the past. When coating is applied at the initial stage of the substrate of the stage, it is possible to suppress coating unevenness in the portion corresponding to the suction hole. Further, even if the substrate is held on the stage by the holding pressure smaller than the initial pressure, the initial pressure can be generated at a high speed when the substrate is adsorbed, so that the cycle time of the coating device can be released for a long period of time.

依照該構成,僅藉由切換配管路徑可容易切換吸引孔中的初期壓的產生與保持壓的產生。因此,可提高初期壓與保持壓的切換響應性。According to this configuration, the generation of the initial pressure and the generation of the holding pressure in the suction holes can be easily switched only by switching the piping paths. Therefore, the switching responsiveness of the initial pressure and the holding pressure can be improved.

而且能以如下之構成:在連結於前述吸引孔之附近的配管裝設有壓力計,在該壓力計到達初期壓的情形下被調節成前述保持壓。Further, the pressure gauge may be attached to a pipe connected to the vicinity of the suction hole, and the pressure may be adjusted to the holding pressure when the pressure gauge reaches the initial pressure.

依照該構成,因壓力計配設於配管的吸引孔附近,故與安裝於其他的配管部分的情形比較,可抑制壓力損失的 影響並精度佳地計測吸引孔中的壓力。According to this configuration, since the pressure gauge is disposed in the vicinity of the suction hole of the pipe, the pressure loss can be suppressed as compared with the case of being attached to another pipe portion. The pressure in the suction hole is measured and accurately measured.

為了解決上述課題,本發明的塗佈裝置的基板保持方法,是包含如下構件之塗佈裝置的基板保持方法:承載基板之平台;使吸引力產生於前述平台的表面並吸附保持基板之基板保持手段;以及一邊對被保持於前述平台的表面之基板相對地移動,一邊吐出塗佈液之塗佈單元,其特徵為:前述基板保持手段具有可藉由調節附加於基板的壓力調節對基板的吸引力之壓力調節部,在藉由該壓力調節部使對被吸附於平台的表面的基板之壓力到達預定的初期壓後,調節成比該初期壓小的保持壓並保持有基板,前述基板保持手段具有:使吸引力產生於前述吸引孔之吸引力產生裝置,與連通並連接前述吸引力產生裝置與前述吸引孔之配管,前述壓力調節部分別各自具備:調節成前述初期壓之配管路徑,與調節成前述保持壓之配管路徑。In order to solve the above problems, a substrate holding method of a coating apparatus according to the present invention is a substrate holding method including a coating device of a member: a stage on which a substrate is supported; a substrate that holds an attractive force on a surface of the stage and adsorbs and holds the substrate And a coating unit that discharges the coating liquid while relatively moving the substrate held on the surface of the platform, wherein the substrate holding means has a pressure adjustment to the substrate by adjusting a pressure applied to the substrate In the pressure-adjusting portion of the attraction, after the pressure of the substrate adsorbed on the surface of the stage reaches a predetermined initial pressure by the pressure adjusting unit, the substrate is adjusted to a holding pressure smaller than the initial pressure, and the substrate is held. The holding means includes: a suction force generating device that generates an attraction force in the suction hole, and a pipe that connects and connects the suction force generating device and the suction hole, and each of the pressure adjusting portions includes a pipe path that is adjusted to the initial pressure And the piping path adjusted to the aforementioned holding pressure.

依照該塗佈裝置的基板保持方法,透過在吸附被承載於平台的基板的情形下,使負壓產生於吸引孔並急速地吸附,在壓力到達初期壓後,藉由前述壓力調節部調節成比初期壓小的保持壓,與如以往般在吸附被承載於平台的基板之初期壓下進行塗佈的情形比較,可抑制在相當於吸引孔的部分產生塗佈不均。而且,因即使是藉由比初期壓小的保持壓保持基板於平台的構成,也能在吸附基板時以高速產生初期壓,故可解除塗佈裝置的週期時間長期化之問題。According to the substrate holding method of the coating apparatus, when the substrate supported on the stage is adsorbed, the negative pressure is generated in the suction hole and rapidly adsorbed, and after the pressure reaches the initial pressure, the pressure adjusting portion is adjusted by the pressure adjusting portion. The holding pressure is smaller than the initial pressure, and it is possible to suppress the occurrence of coating unevenness in the portion corresponding to the suction hole as compared with the case where the coating is applied at the initial stage of adsorbing the substrate placed on the stage as in the prior art. Further, even if the substrate is held on the stage by the holding pressure smaller than the initial pressure, the initial pressure can be generated at a high speed when the substrate is adsorbed, so that the cycle time of the coating device can be released for a long period of time.

依照本發明的塗佈裝置及其基板保持方法,即使是設定吸附基板的吸引力為不產生塗佈不均程度的情形,也能抑制塗佈裝置的週期時間長期化。According to the coating apparatus and the substrate holding method of the present invention, even if the suction force of the adsorption substrate is set so that the coating unevenness does not occur, the cycle time of the coating device can be suppressed from becoming long.

使用圖面說明與本發明有關的實施的形態。The form of the embodiment related to the present invention will be described using the drawings.

圖1是概略地顯示本發明的一實施形態中的塗佈裝置之斜視圖,圖2是顯示塗佈單元的腳部附近之圖,圖3是顯示塗佈裝置的配管系統之圖。Fig. 1 is a perspective view schematically showing a coating apparatus according to an embodiment of the present invention, Fig. 2 is a view showing a vicinity of a leg portion of the coating unit, and Fig. 3 is a view showing a piping system of the coating device.

如圖1~圖3所示,塗佈裝置是將藥液或光阻液等的液狀物(以下稱為塗佈液)之塗佈膜形成於基板10上,具備:基台2;用以承載基板10之平台21;以及對該平台21可移動於特定方向而構成之塗佈單元30。As shown in FIG. 1 to FIG. 3, the coating device is formed by forming a coating film of a liquid material (hereinafter referred to as a coating liquid) such as a chemical liquid or a photoresist liquid on the substrate 10, and includes a base 2; The substrate 21 carrying the substrate 10; and the coating unit 30 configured to move the platform 21 in a specific direction.

此外,在以下的說明中是以塗佈單元30移動的方向為X軸方向,以與X軸方向在水平面上正交的方向為Y軸方向,以正交於X軸及Y軸方向之雙方的方向為Z軸方向來進行說明。In the following description, the direction in which the coating unit 30 moves is the X-axis direction, the direction orthogonal to the X-axis direction on the horizontal plane is the Y-axis direction, and the two directions orthogonal to the X-axis and the Y-axis direction. The direction is described in the Z-axis direction.

在前述基台2於其中央部分配置有平台21。該平台21是承載所搬進的基板10。而且,在該平台21配設有基板保持手段40,藉由該基板保持手段40使基板10被保持。具體上,藉由使吸引力產生於形成在平台21的表面的複數個吸引孔21a,可使基板10吸附保持於平台21的表面。A platform 21 is disposed in the center portion of the base 2 described above. The platform 21 is a substrate 10 on which the loading is carried. Further, a substrate holding means 40 is disposed on the stage 21, and the substrate holding means 40 holds the substrate 10. Specifically, the substrate 10 can be adsorbed and held on the surface of the stage 21 by causing the attraction force to be generated in the plurality of suction holes 21a formed on the surface of the stage 21.

亦即,該基板保持手段40具有真空泵(vacuum pump)81(本發明的吸引力產生裝置)與連通並連接該真空泵81(參照圖3)與吸引孔21a之配管50,藉由使真空泵81動作,經由配管50使負壓(比大氣壓小的壓力)產生於吸引孔21a,可保持基板10。That is, the substrate holding means 40 has a vacuum pump (vacuum) (pump) 81 (the suction force generating device of the present invention) and the pipe 50 that communicates with and connects the vacuum pump 81 (see FIG. 3) and the suction hole 21a, and operates the vacuum pump 81 to make the negative pressure (less than atmospheric pressure) via the pipe 50. The pressure is generated in the suction hole 21a to hold the substrate 10.

而且,基板保持手段40具有壓力調節部41,在本實施形態中可藉由該壓力調節部41調節成初期壓與保持壓。此處,初期壓是指使剛被承載於平台21的表面後的基板10吸附於平台21的表面時的壓力,藉由真空泵81進行高速排氣,急速地使負壓產生於吸引孔21a並瞬間地吸附基板10用的壓力。而且,保持壓是指在藉由初期壓吸附基板10後,用以維持基板10被保持在平台21的表面之狀態的壓力,是比初期壓小,被吸附於平台21的基板10不會產生偏移的壓力。Further, the substrate holding means 40 has the pressure adjusting portion 41, and in the present embodiment, the pressure adjusting portion 41 can be adjusted to the initial pressure and the holding pressure. Here, the initial pressure is a pressure at which the substrate 10 immediately after being placed on the surface of the stage 21 is adsorbed on the surface of the stage 21, and the vacuum pump 81 performs high-speed exhaust, and the negative pressure is rapidly generated in the suction hole 21a. The pressure for the substrate 10 is adsorbed. Further, the holding pressure refers to a pressure for maintaining the state in which the substrate 10 is held on the surface of the stage 21 after the substrate 10 is initially pressure-adsorbed, and is smaller than the initial pressure, and the substrate 10 adsorbed on the stage 21 does not generate. Offset pressure.

壓力調節部41是調節成初期壓的配管(主配管51)與調節成保持壓的配管(副配管52)藉由各自的配管路徑構成。具體上如圖3所示,在調節成初期壓的主配管51配設有主閥(main valve)51a,藉由開關該主閥51a可連通或遮蔽真空泵81與吸引孔21a。因此,藉由在使該主閥51a全開的狀態下使真空泵81動作,以在吸引孔21a產生初期壓。據此,可對被承載於平台21的表面之基板10附加初期壓並吸附。The pressure adjusting unit 41 is configured such that a pipe (main pipe 51) adjusted to an initial pressure and a pipe (sub pipe 52) adjusted to maintain a pressure are constituted by respective pipe paths. Specifically, as shown in FIG. 3, a main valve 51a is disposed in the main pipe 51 adjusted to the initial pressure, and the vacuum pump 81 and the suction hole 21a can be communicated or shielded by the main valve 51a. Therefore, the vacuum pump 81 is operated in a state where the main valve 51a is fully opened, and an initial pressure is generated in the suction hole 21a. According to this, the initial pressure can be applied to the substrate 10 carried on the surface of the stage 21 and adsorbed.

而且,在調節成保持壓的副配管52配設有副閥(sub valve)52a與副調節器(sub regulator)52b。該副閥52a是與主閥51a相同,藉由開關該副閥52a,可透過副配管 52連通或遮蔽真空泵81與吸引孔21a。而且,副調節器52b是設定俾配管成為預定的壓力,在本實施形態中是設定俾副調節器52b的設定壓力成為保持壓。因此,因藉由在使副閥52a全開的狀態下使真空泵81動作,壓力藉由副調節器52b控制,故在吸引孔21a產生保持壓。此外,若在使主閥51a及副閥52a全開的狀態下使真空泵81動作,則藉由透過主配管51被吸引而在吸引孔21a產生初期壓。Further, the sub-pipe 52 adjusted to maintain the pressure is provided with a sub valve 52a and a sub regulator 52b. The sub-valve 52a is the same as the main valve 51a, and is permeable to the sub-pipe by switching the sub-valve 52a. 52 connects or shields the vacuum pump 81 from the suction hole 21a. Further, the sub-regulator 52b sets the 俾 pipe to a predetermined pressure, and in the present embodiment, the set pressure of the 俾 sub-regulator 52b is set to the holding pressure. Therefore, since the vacuum pump 81 is operated in a state where the sub valve 52a is fully opened, the pressure is controlled by the sub-regulator 52b, so that a holding pressure is generated in the suction hole 21a. When the vacuum pump 81 is operated in a state where the main valve 51a and the sub-valve 52a are fully opened, the initial pressure is generated in the suction hole 21a by being sucked through the main pipe 51.

而且,在配管50配設有壓力計53。該壓力計53是計測配管50內的壓力,在本實施形態中是配設於平台21正下方的吸引孔21a附近的配管50部分。據此,可抑制壓力損失等的影響,可精度佳地計測吸引孔21a的壓力狀態。Further, a pressure gauge 53 is disposed in the pipe 50. The pressure gauge 53 is a pressure in the measurement pipe 50, and in the present embodiment, is a portion of the pipe 50 disposed in the vicinity of the suction hole 21a directly below the stage 21. According to this, it is possible to suppress the influence of pressure loss or the like, and it is possible to accurately measure the pressure state of the suction hole 21a.

而且,在平台21配設有使基板10進行升降動作之基板升降機構。具體上,在平台21的表面形成有複數個銷孔(pin hole),在該銷孔埋設有可在Z軸方向進行升降動作之頂出銷(lift pin)(未圖示)。亦即,藉由若在由平台21的表面使頂出銷突出的狀態下基板10被搬進,則頂出銷的尖端部分抵接基板10並可保持基板10,使頂出銷下降並使其收容於銷孔,可將基板10承載於平台21的表面。Further, a substrate elevating mechanism for elevating and lowering the substrate 10 is disposed on the stage 21. Specifically, a plurality of pin holes are formed on the surface of the stage 21, and a lift pin (not shown) that can be lifted and lowered in the Z-axis direction is embedded in the pin hole. That is, when the substrate 10 is carried in a state where the ejector pin is protruded from the surface of the stage 21, the tip end portion of the ejector pin abuts against the substrate 10 and can hold the substrate 10, so that the ejector pin is lowered and It is housed in the pin hole, and the substrate 10 can be carried on the surface of the platform 21.

而且,藉由於在平台21的表面承載基板10的狀態下使頂出銷上升,使頂出銷的尖端部分抵接基板10,能以複數根頂出銷的尖端部分保持基板10於預定的高度位置。據此,可極力地抑制與基板10的接觸部分而保持,可不使基板10損傷而平順地進行更換。Further, by raising the ejector pin in a state where the substrate 10 is carried on the surface of the stage 21, the tip end portion of the ejector pin abuts against the substrate 10, and the substrate 10 can be held at a predetermined height by the tip end portions of the plurality of ejector pins. position. According to this, it is possible to suppress the contact portion with the substrate 10 as much as possible, and it is possible to smoothly replace the substrate 10 without damaging the substrate 10.

而且,塗佈單元30是塗佈塗佈液於基板10上。該塗佈 單元30如圖1、圖2所示,具有與基台2連結的腳部31和延伸於Y軸方向的開縫噴嘴部(slit nozzle part)34,在跨過基台2上於Y軸方向的狀態下可移動於X軸方向而被安裝。具體上,在基台2的Y軸方向兩端部分分別設置有延伸於X軸方向的軌條(rail)22,腳部31被滑動自如地安裝於該軌條22。而且,在腳部31安裝有線性馬達(linear motor)33,藉由驅動控制該線性馬達33使塗佈單元30移動於X軸方向,可在任意的位置停止。Further, the coating unit 30 is coated with a coating liquid on the substrate 10. The coating As shown in FIGS. 1 and 2, the unit 30 has a leg portion 31 coupled to the base 2 and a slit nozzle portion 34 extending in the Y-axis direction across the base 2 in the Y-axis direction. The state can be moved in the X-axis direction and installed. Specifically, rails 22 extending in the X-axis direction are respectively provided at both end portions of the base 2 in the Y-axis direction, and the leg portions 31 are slidably attached to the rails 22. Further, a linear motor 33 is attached to the leg portion 31, and the linear motor 33 is driven to move the coating unit 30 in the X-axis direction, and can be stopped at an arbitrary position.

在塗佈單元30的腳部31如圖2所示安裝有塗佈塗佈液之開縫噴嘴部34。具體上,在該腳部31配設有延伸於Z軸方向的軌條37與沿著該軌條37滑動之滑塊(slider)35,此等滑塊35與開縫噴嘴部34是被連結。而且,在滑塊35安裝有藉由伺服馬達36(參照圖4)驅動的滾珠螺桿(ball screw)機構,藉由驅動控制該伺服馬達36使滑塊35移動於Z軸方向,並且可在任意的位置停止。亦即,開縫噴嘴部34是對被保持於平台21的基板10可接離(attach and detach)地被支撐。A slit nozzle portion 34 to which a coating liquid is applied is attached to the leg portion 31 of the coating unit 30 as shown in Fig. 2 . Specifically, the leg portion 31 is provided with a rail 37 extending in the Z-axis direction and a slider 35 sliding along the rail 37, and the slider 35 and the slit nozzle portion 34 are connected. . Further, a ball screw mechanism driven by a servo motor 36 (refer to FIG. 4) is attached to the slider 35, and the servo motor 36 is driven to move the slider 35 in the Z-axis direction, and can be arbitrarily The position stops. That is, the slit nozzle portion 34 is supported by attaching and detaching the substrate 10 held by the stage 21.

開縫噴嘴部34是塗佈塗佈液並在基板10上形成塗佈膜。該開縫噴嘴部34是具有延伸於單向的形狀之柱狀構件,與塗佈單元30的行走(running)方向大致正交而配設。在該開縫噴嘴部34形成有延伸於長度方向的開縫噴嘴(slit nozzle)34a,供給至開縫噴嘴部34的塗佈液是由開縫噴嘴34a遍及長度方向一樣地被吐出。因此,藉由在由該開縫噴嘴34a使塗佈液吐出的狀態下使塗佈單元30行走於 X軸方向,遍及開縫噴嘴34a的長度方向在基板10上形成有一定厚度的塗佈膜。The slit nozzle portion 34 is a coating liquid applied to form a coating film on the substrate 10. The slit nozzle portion 34 is a columnar member having a shape extending in a unidirectional direction, and is disposed substantially perpendicular to the running direction of the coating unit 30. In the slit nozzle portion 34, a slit nozzle 34a extending in the longitudinal direction is formed, and the coating liquid supplied to the slit nozzle portion 34 is discharged by the slit nozzle 34a in the same length direction. Therefore, the coating unit 30 is moved in a state where the coating liquid is discharged by the slit nozzle 34a. In the X-axis direction, a coating film having a certain thickness is formed on the substrate 10 throughout the longitudinal direction of the slit nozzle 34a.

接著,針對上述塗佈裝置的控制系統之構成,使用圖4所示的方塊圖來說明。Next, the configuration of the control system of the above coating apparatus will be described using a block diagram shown in FIG. 4.

圖4是顯示配設於該塗佈裝置之控制裝置90的控制系統之方塊圖。如圖4所示,該塗佈裝置配設有控制上述的各種單元的驅動之控制裝置90。該控制裝置90具有:控制本體部91、驅動控制部92、壓力控制部93、輸入/輸出裝置控制部94、外部裝置控制部95。4 is a block diagram showing a control system of a control device 90 disposed in the coating device. As shown in Fig. 4, the coating device is provided with a control device 90 for controlling the driving of the various units described above. The control device 90 includes a control main unit 91, a drive control unit 92, a pressure control unit 93, an input/output device control unit 94, and an external device control unit 95.

控制本體部91具備:執行邏輯運算之週知的CPU;預先記憶控制該CPU之種種的程式等之ROM(Read-Only Memory:唯讀記憶體);在裝置動作中一時地記憶種種的資料(data)之RAM(Random Access Memory:隨機存取記憶體);記憶種種的程式或OS(Operating System:作業系統)並且記憶生產程式等的各種資料之HDD(Hard Disk:硬碟)等。而且,控制本體部91具有:主控制部91a、判定部91b、記憶部91c。The control main unit 91 includes a CPU that performs a logical operation, a ROM (Read-Only Memory) that stores various programs such as the CPU in advance, and a memory of various types of data during the operation of the device ( Data) RAM (Random Access Memory); HDD (Hard Disk) that stores various programs such as programs or OSs (Operating System) and memorizes production programs. Further, the control main unit 91 includes a main control unit 91a, a determination unit 91b, and a storage unit 91c.

主控制部91a是為了依照預先記憶的程式執行一連串的塗佈動作,透過驅動控制部92驅動控制各單元的伺服馬達36、線性馬達33等的驅動裝置。The main control unit 91a is a drive device that drives and controls the servo motor 36, the linear motor 33, and the like of each unit through the drive control unit 92 in order to execute a series of coating operations in accordance with a program stored in advance.

判定部91b是判定在吸附保持基板10的情形下,使吸引力產生的壓力狀態是否適當。亦即,判定藉由壓力計53檢測的壓力是否到達初期壓。具體上,在後述的記憶部91c記憶有預先設定的初期壓資料,判斷所檢測的壓力是否為該初期壓。在假設到達初期壓的情形下,透過後述的壓力控制 部93控制,俾主閥51a成為閉狀態。據此,藉由連通吸引孔21a與真空泵81的配管50僅被切換至副配管52,使產生於吸引孔21a的壓力被調節成以副調節器52b設定的保持壓。而且,在壓力計53未到達初期壓的情形下,主閥51a及副閥52a的狀態在原封不動的狀態下被維持。The determination unit 91b determines whether or not the pressure state of the suction force is appropriate in the case where the holding substrate 10 is adsorbed and held. That is, it is determined whether or not the pressure detected by the pressure gauge 53 reaches the initial pressure. Specifically, the memory unit 91c, which will be described later, stores predetermined initial pressure data, and determines whether or not the detected pressure is the initial pressure. Under the assumption that the initial pressure is reached, the pressure control described later is transmitted. The portion 93 controls the cymbal main valve 51a to be in a closed state. As a result, the pipe 50 that communicates with the vacuum pump 81 through the suction hole 21a is switched only to the sub-pipe 52, and the pressure generated in the suction hole 21a is adjusted to the holding pressure set by the sub-regulator 52b. Further, when the pressure gauge 53 does not reach the initial pressure, the state of the main valve 51a and the sub-valve 52a is maintained in a state of being intact.

記憶部91c是用以儲存有各種資料,並且一時地儲存運算結果等。具體上,記憶有初期壓、保持壓等的資料。The memory unit 91c is for storing various materials, and stores calculation results and the like at one time. Specifically, the memory has information such as initial pressure and holding pressure.

驅動控制部92是根據來自控制本體部91的控制信號驅動控制線性馬達33、伺服馬達36等。具體上,藉由控制線性馬達33及伺服馬達36使塗佈單元30的移動及開縫噴嘴部34的升降動作等被驅動控制。The drive control unit 92 drives and controls the linear motor 33, the servo motor 36, and the like in accordance with a control signal from the control main unit 91. Specifically, the linear motor 33 and the servo motor 36 are controlled to drive and control the movement of the coating unit 30 and the lifting operation of the slit nozzle portion 34.

壓力控制部93是檢測配管50內的壓力,而且,根據來自控制本體部91的控制信號控制產生於吸引孔21a的壓力。具體上,藉由來自壓力計53的信號檢測吸引孔21a附近的配管50內的壓力。而且,在透過壓力計53顯示初期壓,由控制本體部91傳來切換至保持壓的意旨之信號的情形下,藉由控制主閥51a的驅動,俾主閥51a由開狀態變成閉狀態,以控制配管50內(正確為吸引孔21a附近)成為保持壓。The pressure control unit 93 detects the pressure in the pipe 50, and controls the pressure generated in the suction hole 21a based on a control signal from the control body unit 91. Specifically, the pressure in the pipe 50 in the vicinity of the suction hole 21a is detected by a signal from the pressure gauge 53. When the initial pressure is transmitted through the pressure gauge 53, and the control body portion 91 transmits a signal for switching to the holding pressure, the main valve 51a is changed from the open state to the closed state by controlling the driving of the main valve 51a. The inside of the control pipe 50 (correctly in the vicinity of the suction hole 21a) becomes a holding pressure.

輸入/輸出裝置控制部94是控制鍵盤(keyboard)83、觸控面板(touch panel)82等的各輸入/輸出裝置。具體上,可由鍵盤83及觸控面板82進行塗佈動作的條件設定等,可適宜地進行初期壓、保持壓等的設定。而且,當由初期壓調節成保持壓,在配管50內應被調節但不成為保持壓 的情形下,在觸控面板上進行警告顯示並對操作者催促警告。The input/output device control unit 94 is a control input/output device such as a keyboard 83, a touch panel 82, and the like. Specifically, the keyboard 83 and the touch panel 82 can be used to set the conditions of the coating operation, etc., and the initial pressure, the holding pressure, and the like can be appropriately set. Further, when the initial pressure is adjusted to the holding pressure, it should be adjusted in the pipe 50 but does not become the holding pressure. In the case of a warning display on the touch panel and urge the operator to warn.

外部裝置控制部95是根據來自控制本體部91的控制信號進行外部裝置的驅動控制。在本實施形態中是與真空泵81連接,藉由使該真空泵81驅動,可產生負壓於吸引孔21a。The external device control unit 95 performs drive control of the external device based on a control signal from the control main unit 91. In the present embodiment, the vacuum pump 81 is connected, and by driving the vacuum pump 81, a negative pressure is generated in the suction hole 21a.

接著,針對該塗佈裝置中的動作,一邊參照圖5所示的流程圖,一邊說明。Next, the operation in the coating apparatus will be described with reference to the flowchart shown in FIG. 5.

首先,在步驟S1中基板10的搬進被進行。具體上,在由平台21的表面突出複數根頂出銷的狀態下待機,藉由未圖示的機械手(robot hand)使基板10被承載於頂出銷的尖端部分。First, the loading of the substrate 10 is performed in step S1. Specifically, in a state in which a plurality of ejector pins are protruded from the surface of the stage 21, the substrate 10 is placed on the tip end portion of the ejector pin by a robot hand (not shown).

接著,在步驟S2中基板10被承載於平台21。具體上,由在頂出銷的尖端部分承載有基板10的狀態使頂出銷下降並將基板10承載於平台21的表面。此時,藉由未圖示的定位手段使基板10被定位於預定的位置。Next, the substrate 10 is carried on the stage 21 in step S2. Specifically, the ejector pin is lowered and the substrate 10 is carried on the surface of the stage 21 by the state in which the substrate 10 is carried at the tip end portion of the ejector pin. At this time, the substrate 10 is positioned at a predetermined position by a positioning means (not shown).

接者,藉由步驟S3~S5使基板10被保持在平台21上。首先,藉由步驟S3使基板吸附動作被進行,基板10被吸附在平台21上。具體上,藉由在使主閥51a及副閥52a成開狀態的狀態下,使真空泵81驅動並進行高速排氣,急速地使吸引力產生於吸引孔21a。亦即,透過配管50內的大氣藉由真空泵81被由主配管51急速地吸引,在吸引孔21a急速地產生負壓,瞬間地基板10被吸附於平台21上。Then, the substrate 10 is held on the stage 21 by steps S3 to S5. First, the substrate adsorption operation is performed by the step S3, and the substrate 10 is adsorbed on the stage 21. Specifically, the vacuum pump 81 is driven and the high-speed exhaust is performed in a state where the main valve 51a and the sub-valve 52a are opened, and the suction force is rapidly generated in the suction hole 21a. In other words, the atmosphere in the through-pipe 50 is rapidly sucked by the main pipe 51 by the vacuum pump 81, and a negative pressure is rapidly generated in the suction hole 21a, and the substrate 10 is instantaneously adsorbed on the stage 21.

而且,配管50內的壓力是否到達初期壓被判斷(步驟S4)。具體上,壓力計53是否到達初期壓被判斷,在未到達 初期壓的情形下前進到NO的方向,基板吸附動作繼續被進行。Then, it is judged whether or not the pressure in the pipe 50 has reached the initial pressure (step S4). Specifically, whether the pressure gauge 53 reaches the initial pressure is judged, and does not arrive. In the case of the initial pressure, the process proceeds to the NO direction, and the substrate adsorption operation continues.

而且,在壓力計53到達初期壓的情形下前進到YES的方向,基板的吸附保持動作被進行(步驟S5)。具體上,主閥51a由開狀態被切換至閉狀態。亦即,藉由真空泵81與吸引孔21a被遮斷,吸引孔21a與真空泵81之配管路徑僅成為副配管52,吸引孔21a中的壓力被調節成以副調節器52b設定的保持壓。因此,基板10被以保持壓吸附保持在平台21上。When the pressure gauge 53 reaches the initial pressure, the process proceeds to the YES direction, and the adsorption holding operation of the substrate is performed (step S5). Specifically, the main valve 51a is switched from the open state to the closed state. In other words, the vacuum pump 81 and the suction hole 21a are blocked, and the piping path of the suction hole 21a and the vacuum pump 81 becomes only the sub-pipe 52, and the pressure in the suction hole 21a is adjusted to the holding pressure set by the sub-regulator 52b. Therefore, the substrate 10 is held on the stage 21 by maintaining pressure adsorption.

接著,在步驟S6中塗佈動作被進行。亦即,藉由一邊使塗佈單元30行走於特定的方向,一邊使塗佈液吐出,使塗佈膜形成於基板10的表面。Next, the coating operation is performed in step S6. In other words, the coating liquid is discharged while the coating unit 30 is traveling in a specific direction, and the coating film is formed on the surface of the substrate 10.

接著,在步驟S7中基板10的取出被進行。亦即,在藉由S6中的塗佈動作在基板10表面形成有塗佈膜後,使真空泵81停止,使吸引孔21a中的壓力返回到大氣壓。而且,藉由使頂出銷上升,以頂出銷的尖端部分保持基板10,基板10的遞送被進行於未圖示的機械手,由平台21的表面排出基板10。Next, the take-out of the substrate 10 is performed in step S7. In other words, after the coating film is formed on the surface of the substrate 10 by the coating operation in S6, the vacuum pump 81 is stopped, and the pressure in the suction hole 21a is returned to the atmospheric pressure. Further, by raising the ejector pin, the substrate 10 is held at the tip end portion of the ejector pin, and the delivery of the substrate 10 is performed on a robot (not shown), and the substrate 10 is discharged from the surface of the stage 21.

依照這種塗佈裝置及其基板保持方法,透過在吸附被承載於平台21的基板10的情形下,使負壓產生於吸引孔21a並急速地吸附,在吸附基板10的壓力到達初期壓後,藉由前述壓力調節部41調節成比初期壓小的保持壓,可保持所吸附的基板10於平台21上。因此,因在藉由塗佈單元30塗佈塗佈液於基板10上的情形下,可在藉由比初期壓小的 保持壓吸附保持的基板10上進行塗佈,故與如以往般在吸附被承載於平台21的基板10之初期壓下進行塗佈的情形比較,可抑制在相當於吸引孔21a的部分產生塗佈不均。而且,因即使是藉由比初期壓小的保持壓保持基板10於平台21的構成,也能在吸附基板10時以高速產生初期壓,故可解除塗佈裝置的週期時間長期化之問題。According to the coating apparatus and the substrate holding method thereof, in the case of adsorbing the substrate 10 carried on the stage 21, the negative pressure is generated in the suction hole 21a and rapidly adsorbed, and the pressure on the adsorption substrate 10 reaches the initial pressure. By the pressure adjusting portion 41 being adjusted to a holding pressure smaller than the initial pressure, the adsorbed substrate 10 can be held on the stage 21. Therefore, in the case where the coating liquid is applied onto the substrate 10 by the coating unit 30, it can be made smaller than the initial pressure. Since the coating is carried out on the substrate 10 which is held by the pressure-sucking, it is possible to suppress the coating of the portion corresponding to the suction hole 21a as compared with the case where the coating is applied to the substrate 10 which is carried by the stage 21 at the initial stage. Uneven cloth. Further, even if the substrate 10 is held on the stage 21 by a holding pressure smaller than the initial pressure, the initial pressure can be generated at a high speed when the substrate 10 is adsorbed, so that the problem of prolonging the cycle time of the coating device can be eliminated.

而且,在上述實施形態中雖然是針對藉由配設主配管51與副配管52並切換此等主配管51與副配管52的配管路徑,切換初期壓與保持壓的例子來說明,惟也可以是僅以具有主閥51a與調節器之一個配管50,藉由控制該調節器的調節切換初期壓與保持壓之構成。依照該構成,與上述實施形態比較,雖然關於切換初期壓與保持壓需要時間,但因配管路徑變成一個,故塗佈裝置全體的空間變成有利的構成。In the above-described embodiment, the main pipe 51 and the sub-pipe 52 are arranged to switch the piping paths of the main pipe 51 and the sub-pipe 52, and the initial pressure and the holding pressure are switched. It is a configuration in which only one of the main valve 51a and the regulator 50 is provided, and the initial pressure and the holding pressure are switched by controlling the adjustment of the regulator. According to this configuration, in comparison with the above-described embodiment, it takes time to switch the initial pressure and the holding pressure. However, since the piping path becomes one, the space of the entire coating apparatus becomes advantageous.

2‧‧‧基台2‧‧‧Abutment

10‧‧‧基板10‧‧‧Substrate

21‧‧‧平台21‧‧‧ platform

21a‧‧‧吸引孔21a‧‧‧Attraction hole

22、37‧‧‧軌條22, 37‧‧ ‧ rails

30‧‧‧塗佈單元30‧‧‧ Coating unit

31‧‧‧腳部31‧‧‧ feet

33‧‧‧線性馬達33‧‧‧Linear motor

34‧‧‧開縫噴嘴部34‧‧‧Slotted nozzle section

34a‧‧‧開縫噴嘴34a‧‧‧Slot nozzle

35‧‧‧滑塊35‧‧‧ Slider

36‧‧‧伺服馬達36‧‧‧Servo motor

40‧‧‧基板保持手段40‧‧‧Substrate retention means

41‧‧‧壓力調節部41‧‧‧ Pressure Regulatory Department

50‧‧‧配管50‧‧‧Pipe

51‧‧‧主配管51‧‧‧Main piping

51a‧‧‧主閥51a‧‧‧Main valve

52‧‧‧副配管52‧‧‧Sub-pipe

52a‧‧‧副閥52a‧‧‧Separate valve

52b‧‧‧副調節器52b‧‧‧Sub Regulator

53‧‧‧壓力計53‧‧‧ pressure gauge

81‧‧‧真空泵81‧‧‧Vacuum pump

82‧‧‧觸控面板82‧‧‧Touch panel

83‧‧‧鍵盤83‧‧‧ keyboard

90‧‧‧控制裝置90‧‧‧Control device

91‧‧‧控制本體部91‧‧‧Control body

91a‧‧‧主控制部91a‧‧‧Main Control Department

91b‧‧‧判定部91b‧‧‧Decision Department

91c‧‧‧記憶部91c‧‧‧Memory Department

92‧‧‧驅動控制部92‧‧‧Drive Control Department

93‧‧‧壓力控制部93‧‧‧Pressure Control Department

94‧‧‧輸入/輸出裝置控制部94‧‧‧Input/output device control unit

95‧‧‧外部裝置控制部95‧‧‧External Device Control

圖1是顯示與本發明的實施形態有關的塗佈裝置之斜視圖。Fig. 1 is a perspective view showing a coating apparatus according to an embodiment of the present invention.

圖2是顯示塗佈單元的腳部附近之概略圖。Fig. 2 is a schematic view showing the vicinity of a leg portion of a coating unit.

圖3是顯示塗佈裝置的真空泵與配管系統之概略圖。Fig. 3 is a schematic view showing a vacuum pump and a piping system of the coating device.

圖4是顯示上述塗佈裝置的控制系統之方塊圖。Fig. 4 is a block diagram showing a control system of the above coating apparatus.

圖5是顯示上述塗佈裝置的動作之流程圖。Fig. 5 is a flow chart showing the operation of the above coating apparatus.

10‧‧‧基板10‧‧‧Substrate

21‧‧‧平台21‧‧‧ platform

21a‧‧‧吸引孔21a‧‧‧Attraction hole

40‧‧‧基板保持手段40‧‧‧Substrate retention means

41‧‧‧壓力調節部41‧‧‧ Pressure Regulatory Department

50‧‧‧配管50‧‧‧Pipe

51‧‧‧主配管51‧‧‧Main piping

51a‧‧‧主閥51a‧‧‧Main valve

52‧‧‧副配管52‧‧‧Sub-pipe

52a‧‧‧副閥52a‧‧‧Separate valve

52b‧‧‧副調節器52b‧‧‧Sub Regulator

53‧‧‧壓力計53‧‧‧ pressure gauge

81‧‧‧真空泵81‧‧‧Vacuum pump

Claims (3)

一種塗佈裝置,包含:承載基板之平台;使吸引力產生於形成於該平台的表面之吸引孔,並使基板吸附保持於平台的表面之基板保持手段;以及一邊對被保持於該平台的表面之基板相對地移動,一邊吐出塗佈液之塗佈單元,其特徵為:該基板保持手段具有可調節對基板的吸引力之壓力調節部,該壓力調節部可調節成吸附剛被承載於平台的表面後的基板之初期壓,與藉由該初期壓使基板吸附後,維持基板被保持於平台的表面的狀態之保持壓,該保持壓是設定為比該初期壓小,該基板保持手段具有:使吸引力產生於該吸引孔之吸引力產生裝置,與連通並連接該吸引力產生裝置與該吸引孔之配管,該壓力調節部分別各自具備:調節成該初期壓之配管路徑,與調節成該保持壓之配管路徑。 A coating apparatus comprising: a platform for carrying a substrate; a substrate holding means for causing attraction to be formed on a surface of the platform, and holding the substrate on the surface of the platform; and holding the substrate on the platform a coating unit that ejects a coating liquid while moving relative to the surface of the substrate, wherein the substrate holding means has a pressure adjusting portion that can adjust an attractive force to the substrate, and the pressure adjusting portion can be adjusted so that the adsorption is just carried on The initial pressure of the substrate behind the surface of the platform, and the holding pressure in which the substrate is held by the surface of the stage after the substrate is adsorbed by the initial pressure, the holding pressure is set to be smaller than the initial pressure, and the substrate is held. The means includes: a suction force generating device that generates an attraction force in the suction hole, and a pipe that communicates and connects the attraction force generating device and the suction hole, each of the pressure adjustment portions: a pipe path that is adjusted to the initial pressure, And the piping path adjusted to the holding pressure. 如申請專利範圍第1項之塗佈裝置,其中在連結於該吸引孔之附近的配管裝設有壓力計,在該壓力計到達初期壓的情形下被調節成該保持壓。 A coating apparatus according to claim 1, wherein a pipe connected to the suction hole is provided with a pressure gauge, and the pressure gauge is adjusted to the holding pressure when the pressure gauge reaches an initial pressure. 一種塗佈裝置的基板保持方法,是包含如下構件之塗佈裝置的基板保持方法:承載基板之平台;使吸引力產生於該平台的表面並吸附保持基板之基板保持手段;以及一邊對被保持於該平台的表面之基板相對地移動,一邊吐出 塗佈液之塗佈單元,其特徵為:該基板保持手段具有可藉由調節附加於基板的壓力調節對基板的吸引力之壓力調節部,在藉由該壓力調節部使對被吸附於平台的表面的基板之壓力到達預定的初期壓後,調節成比該初期壓小的保持壓並保持有基板,該基板保持手段具有:使吸引力產生於該吸引孔之吸引力產生裝置,與連通並連接該吸引力產生裝置與該吸引孔之配管,該壓力調節部分別各自具備:調節成該初期壓之配管路徑,與調節成該保持壓之配管路徑。 A substrate holding method of a coating device is a substrate holding method of a coating device comprising: a platform for carrying a substrate; a substrate holding means for generating an attractive force on a surface of the platform and adsorbing and holding the substrate; and holding the substrate at one side The substrate on the surface of the platform moves relatively and spits out A coating unit for a coating liquid, characterized in that the substrate holding means has a pressure adjusting portion that can adjust an attractive force to the substrate by adjusting a pressure applied to the substrate, and the pair is adsorbed to the platform by the pressure adjusting portion After the pressure of the substrate on the surface reaches a predetermined initial pressure, the substrate is adjusted to have a holding pressure smaller than the initial pressure, and the substrate is held. The substrate holding means has an attraction generating device for causing an attractive force to be generated in the suction hole. And connecting the suction force generating device and the pipe for the suction hole, each of the pressure adjusting portions having a pipe path adjusted to the initial pressure and a pipe path adjusted to the holding pressure.
TW097138880A 2007-11-21 2008-10-09 Coating machine and fixing method of a substrate TWI458564B (en)

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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201509544A (en) * 2013-09-05 2015-03-16 Rich Chen Automatically Controlled Co Ltd Substrate coating device and coating method
CN106890764A (en) * 2017-03-15 2017-06-27 复旦大学 The frame adhesive automatic double surface gluer of touch screen
CN106881238A (en) * 2017-03-15 2017-06-23 复旦大学 The dispensing coating apparatus of touch screen
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KR102161090B1 (en) * 2018-11-14 2020-09-29 한국광기술원 Apparatus and Method for Coating a Substrate

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200618868A (en) * 2004-08-31 2006-06-16 Tokyo Ohka Kogyo Co Ltd Stage for mounting substrate and method for attracting and separating substrate
TW200706255A (en) * 2005-03-31 2007-02-16 Toray Eng Co Ltd Applicator device
TW200740530A (en) * 2006-02-27 2007-11-01 Dainippon Screen Mfg Coating device and coating method

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08138991A (en) * 1994-11-04 1996-05-31 Dainippon Screen Mfg Co Ltd Substrate holding device
JP3245550B2 (en) * 1997-07-11 2002-01-15 シャープ株式会社 Manufacturing method of liquid crystal display element
JP3642696B2 (en) * 1999-02-26 2005-04-27 大日本スクリーン製造株式会社 Substrate holding device and substrate processing apparatus using the same
JP2001127144A (en) * 1999-08-19 2001-05-11 Canon Inc Method and device for holding substrate with suction and exposing device and device manufacturing method using the device
JP4344063B2 (en) * 2000-03-08 2009-10-14 中外炉工業株式会社 Coating method using a die coater
JP2001332609A (en) * 2000-03-13 2001-11-30 Nikon Corp Apparatus for holding substrate and aligner
JP4681756B2 (en) * 2001-05-16 2011-05-11 キヤノン株式会社 Exposure apparatus and device manufacturing method
DE10235482B3 (en) * 2002-08-02 2004-01-22 Süss Microtec Lithography Gmbh Device for fixing thin and flexible substrates
JP4523442B2 (en) * 2005-02-10 2010-08-11 東京エレクトロン株式会社 Coating film forming apparatus, coating film forming method, and computer program
JP2007273693A (en) * 2006-03-31 2007-10-18 Nikon Corp Member, method, and device for holding substrate, and device and method for exposure

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200618868A (en) * 2004-08-31 2006-06-16 Tokyo Ohka Kogyo Co Ltd Stage for mounting substrate and method for attracting and separating substrate
TW200706255A (en) * 2005-03-31 2007-02-16 Toray Eng Co Ltd Applicator device
TW200740530A (en) * 2006-02-27 2007-11-01 Dainippon Screen Mfg Coating device and coating method

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