TW200914653A - Semiconductor wafer and its manufacturing method - Google Patents
Semiconductor wafer and its manufacturing method Download PDFInfo
- Publication number
- TW200914653A TW200914653A TW97131098A TW97131098A TW200914653A TW 200914653 A TW200914653 A TW 200914653A TW 97131098 A TW97131098 A TW 97131098A TW 97131098 A TW97131098 A TW 97131098A TW 200914653 A TW200914653 A TW 200914653A
- Authority
- TW
- Taiwan
- Prior art keywords
- wafer
- small
- wafers
- semiconductor wafer
- semiconductor
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76251—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Recrystallisation Techniques (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007218956 | 2007-08-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200914653A true TW200914653A (en) | 2009-04-01 |
Family
ID=40387121
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW97131098A TW200914653A (en) | 2007-08-24 | 2008-08-15 | Semiconductor wafer and its manufacturing method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP5294087B2 (fr) |
TW (1) | TW200914653A (fr) |
WO (1) | WO2009028399A1 (fr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8981519B2 (en) * | 2010-11-05 | 2015-03-17 | Sharp Kabushiki Kaisha | Semiconductor substrate, method of manufacturing semiconductor substrate, thin film transistor, semiconductor circuit, liquid crystal display apparatus, electroluminescence apparatus, wireless communication apparatus, and light emitting apparatus |
KR20150038335A (ko) * | 2012-07-30 | 2015-04-08 | 스미또모 가가꾸 가부시키가이샤 | 복합 기판의 제조 방법 및 반도체 결정층 형성 기판의 제조 방법 |
JP6854516B2 (ja) * | 2017-07-19 | 2021-04-07 | 株式会社テンシックス | 化合物半導体基板及びその製造方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0832038A (ja) * | 1994-07-15 | 1996-02-02 | Komatsu Electron Metals Co Ltd | 貼り合わせsoi基板の製造方法および貼り合わせsoi基板 |
JP3342442B2 (ja) * | 1999-07-30 | 2002-11-11 | キヤノン株式会社 | 半導体基板の作製方法及び半導体基板 |
JP3785067B2 (ja) * | 2001-08-22 | 2006-06-14 | 株式会社東芝 | 半導体素子の製造方法 |
JP4103447B2 (ja) * | 2002-04-30 | 2008-06-18 | 株式会社Ihi | 大面積単結晶シリコン基板の製造方法 |
WO2006114999A1 (fr) * | 2005-04-18 | 2006-11-02 | Kyoto University | Dispositif a semi-conducteurs de compose et son procede de fabrication |
-
2008
- 2008-08-15 TW TW97131098A patent/TW200914653A/zh unknown
- 2008-08-21 JP JP2009530076A patent/JP5294087B2/ja active Active
- 2008-08-21 WO PCT/JP2008/064945 patent/WO2009028399A1/fr active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2009028399A1 (fr) | 2009-03-05 |
JPWO2009028399A1 (ja) | 2010-12-02 |
JP5294087B2 (ja) | 2013-09-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI609435B (zh) | Composite substrate, semiconductor device and method for manufacturing semiconductor device | |
JP5163920B2 (ja) | ダイヤモンド単結晶基板の製造方法及びダイヤモンド単結晶基板 | |
WO2011037079A1 (fr) | Lingot de carbure de silicium, substrat de carbure de silicium, procédés de fabrication du lingot et du substrat, creuset et substrat semi-conducteur | |
TWI600178B (zh) | III -nitride composite substrate, a method of manufacturing the same, a laminated III-nitride compound substrate, a group III nitride semiconductor device, and a method of fabricating the same | |
KR102106424B1 (ko) | 다이아몬드 기판 및 다이아몬드 기판의 제조 방법 | |
TW201724177A (zh) | SiC複合基板之製造方法及半導體基板之製造方法 | |
JP2008301066A (ja) | タンタル酸リチウム(lt)又はニオブ酸リチウム(ln)単結晶複合基板 | |
TW201005140A (en) | Hybrid silicon wafer and method for manufacturing same | |
TWI609105B (zh) | β-Ga 2 O 3 Single crystal growth method, and β-Ga 2 O 3 Monocrystalline substrate and its manufacturing method (2) | |
WO2017047508A1 (fr) | PROCÉDÉ DE FABRICATION D'UN SUBSTRAT COMPOSITE DE SiC | |
TW201607662A (zh) | Iii族氮化物基板之製造方法 | |
TW201005135A (en) | Epitaxially coated silicon wafer with<110>orientation and method for producing it | |
WO2014105085A1 (fr) | Corps de diamant multicristallin | |
TW200914653A (en) | Semiconductor wafer and its manufacturing method | |
WO2018216657A1 (fr) | Procédé de production de tranche de sic, procédé de production de tranche épitaxiale et tranche épitaxiale | |
JP2013116826A (ja) | ムライトを主成分とする焼結体 | |
JP5620762B2 (ja) | Iii族窒化物半導体基板およびiii族窒化物半導体基板の製造方法 | |
CN107099844B (zh) | Ramo4基板及其制造方法 | |
JP6248395B2 (ja) | Iii族窒化物複合基板およびその製造方法、積層iii族窒化物複合基板、ならびにiii族窒化物半導体デバイスおよびその製造方法 | |
JP7341059B2 (ja) | 六方晶構造の二次元膜の製造方法 | |
TW201131630A (en) | Method for producing a semiconductor wafer | |
US20180190774A1 (en) | Diamond substrate and method for producing the same | |
JP2002198762A (ja) | 単結晶ウエハ及びその製造方法 | |
JP2020059648A (ja) | ダイヤモンド基板及びダイヤモンド基板の製造方法 | |
CN107119320B (zh) | Ramo4基板及其制造方法 |