TW200734653A - Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device - Google Patents

Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device

Info

Publication number
TW200734653A
TW200734653A TW096106770A TW96106770A TW200734653A TW 200734653 A TW200734653 A TW 200734653A TW 096106770 A TW096106770 A TW 096106770A TW 96106770 A TW96106770 A TW 96106770A TW 200734653 A TW200734653 A TW 200734653A
Authority
TW
Taiwan
Prior art keywords
measuring
testing
under
signal
test
Prior art date
Application number
TW096106770A
Other languages
English (en)
Inventor
Takahiro Yamaguchi
Satoshi Iwamoto
Masakatsu Suda
Masahiro Ishida
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200734653A publication Critical patent/TW200734653A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
TW096106770A 2006-02-27 2007-02-27 Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device TW200734653A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/362,536 US7398169B2 (en) 2006-02-27 2006-02-27 Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device

Publications (1)

Publication Number Publication Date
TW200734653A true TW200734653A (en) 2007-09-16

Family

ID=38445073

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096106770A TW200734653A (en) 2006-02-27 2007-02-27 Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device

Country Status (5)

Country Link
US (1) US7398169B2 (zh)
JP (1) JP5008654B2 (zh)
DE (1) DE112007000506T5 (zh)
TW (1) TW200734653A (zh)
WO (1) WO2007099878A1 (zh)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI690714B (zh) * 2018-06-07 2020-04-11 美商格芯（美國）集成電路科技有限公司 利用可變形頻率信號測試待測裝置的輸出訊號中的相位雜訊
CN112187573A (zh) * 2020-09-21 2021-01-05 英彼森半导体(珠海)有限公司 一种通信类器件的信号带宽测试电路
CN112367078A (zh) * 2020-02-17 2021-02-12 成都华微电子科技有限公司 一种扩频时钟信号测试装置和方法
TWI785539B (zh) * 2020-03-31 2022-12-01 日商愛德萬測試股份有限公司 測試器系統、測試器系統診斷方法及測試系統分析方法
US11733290B2 (en) 2020-03-31 2023-08-22 Advantest Corporation Flexible sideband support systems and methods

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7349818B2 (en) * 2005-11-10 2008-03-25 Teradyne, Inc. Determining frequency components of jitter
JP4135953B2 (ja) * 2005-12-05 2008-08-20 インターナショナル・ビジネス・マシーンズ・コーポレーション 波形測定装置及びその測定方法
US7421355B2 (en) * 2006-02-27 2008-09-02 Advantest Corporation Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device
US7398169B2 (en) * 2006-02-27 2008-07-08 Advantest Corporation Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
US7623984B2 (en) * 2007-03-23 2009-11-24 Advantest Corporation Test apparatus and electronic device
WO2008136301A1 (ja) * 2007-04-27 2008-11-13 Advantest Corporation 試験装置および試験方法
JPWO2009031404A1 (ja) * 2007-09-04 2010-12-09 株式会社アドバンテスト 伝送回路、送信器、受信器、および、試験装置
WO2009034967A1 (ja) * 2007-09-11 2009-03-19 Tokyo Electron Limited 情報処理装置、情報処理方法、及びプログラム
JP5171442B2 (ja) * 2008-07-08 2013-03-27 株式会社アドバンテスト マルチストローブ回路および試験装置
US7965093B2 (en) * 2009-02-13 2011-06-21 Advantest Corporation Test apparatus and test method for testing a device under test using a multi-strobe
US20110054827A1 (en) 2009-08-26 2011-03-03 Advantest Corporation, a Japanese Corporation Test apparatus and method for modulated signal
JP2011154009A (ja) * 2010-01-28 2011-08-11 Advantest Corp 試験装置、測定装置および電子デバイス
US20120001657A1 (en) * 2010-06-30 2012-01-05 Tektronix, Inc. Apparatus and method for improved edge triggering in a test and measurement instrument
JP5314732B2 (ja) * 2011-06-17 2013-10-16 株式会社アドバンテスト 試験装置
KR101998414B1 (ko) * 2012-05-18 2019-07-10 주식회사 케이티 Ｍ2ｍ 시스템에서 선택적으로 보안성 있는 시간 동기화를 위한 방법 및 장치
US10802074B2 (en) * 2018-01-02 2020-10-13 Jitterlabs Llc Method and apparatus for analyzing phase noise in a signal from an electronic device
JP7245623B2 (ja) * 2018-09-13 2023-03-24 株式会社アドバンテスト 装置、方法、およびプログラム
KR102278648B1 (ko) * 2020-02-13 2021-07-16 포스필 주식회사 피시험 디바이스를 테스트하기 위한 방법 및 장치
CN112720574B (zh) * 2020-12-03 2022-04-08 埃夫特智能装备股份有限公司 一种工业机器人抖动程度测量方法
CN114034914A (zh) * 2021-11-22 2022-02-11 广东电网有限责任公司广州供电局 一种电网电压有效值短时波动的检测方法及装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5578935A (en) * 1995-05-25 1996-11-26 Texas Instruments Incorporated Undersampling digitizer with a sampling circuit positioned on an integrated circuit
JP3331109B2 (ja) * 1996-01-23 2002-10-07 株式会社アドバンテスト 半導体試験装置の比較器
JP3413342B2 (ja) 1997-04-15 2003-06-03 株式会社アドバンテスト ジッタ測定方法及び半導体試験装置
TW559668B (en) 1999-02-08 2003-11-01 Advantest Corp Apparatus for and method of measuring a jitter
US6586924B1 (en) * 1999-08-16 2003-07-01 Advantest Corporation Method for correcting timing for IC tester and IC tester having correcting function using the correcting method
JP4445114B2 (ja) 2000-01-31 2010-04-07 株式会社アドバンテスト ジッタ測定装置及びその方法
JP2004093345A (ja) 2002-08-30 2004-03-25 Renesas Technology Corp ジッタ測定回路
JP4152710B2 (ja) 2002-10-01 2008-09-17 株式会社アドバンテスト ジッタ測定装置、及び試験装置
JP2005189093A (ja) 2003-12-25 2005-07-14 Advantest Corp 試験装置
US7398169B2 (en) * 2006-02-27 2008-07-08 Advantest Corporation Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI690714B (zh) * 2018-06-07 2020-04-11 美商格芯（美國）集成電路科技有限公司 利用可變形頻率信號測試待測裝置的輸出訊號中的相位雜訊
CN112367078A (zh) * 2020-02-17 2021-02-12 成都华微电子科技有限公司 一种扩频时钟信号测试装置和方法
TWI785539B (zh) * 2020-03-31 2022-12-01 日商愛德萬測試股份有限公司 測試器系統、測試器系統診斷方法及測試系統分析方法
US11619667B2 (en) 2020-03-31 2023-04-04 Advantest Corporation Enhanced loopback diagnostic systems and methods
US11733290B2 (en) 2020-03-31 2023-08-22 Advantest Corporation Flexible sideband support systems and methods
CN112187573A (zh) * 2020-09-21 2021-01-05 英彼森半导体(珠海)有限公司 一种通信类器件的信号带宽测试电路

Also Published As

Publication number Publication date
WO2007099878A1 (ja) 2007-09-07
US7398169B2 (en) 2008-07-08
DE112007000506T5 (de) 2008-12-18
US20070203659A1 (en) 2007-08-30
JPWO2007099878A1 (ja) 2009-07-16
JP5008654B2 (ja) 2012-08-22

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