TW200718958A - IC tester - Google Patents

IC tester

Info

Publication number
TW200718958A
TW200718958A TW095142055A TW95142055A TW200718958A TW 200718958 A TW200718958 A TW 200718958A TW 095142055 A TW095142055 A TW 095142055A TW 95142055 A TW95142055 A TW 95142055A TW 200718958 A TW200718958 A TW 200718958A
Authority
TW
Taiwan
Prior art keywords
voltage
tester
offset voltage
measurement
dut
Prior art date
Application number
TW095142055A
Other languages
English (en)
Other versions
TWI310839B (en
Inventor
Hideki Naganuma
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of TW200718958A publication Critical patent/TW200718958A/zh
Application granted granted Critical
Publication of TWI310839B publication Critical patent/TWI310839B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
TW095142055A 2005-11-14 2006-11-14 Ic tester TWI310839B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005328882A JP2007132905A (ja) 2005-11-14 2005-11-14 Ｉｃテスタ

Publications (2)

Publication Number Publication Date
TW200718958A true TW200718958A (en) 2007-05-16
TWI310839B TWI310839B (en) 2009-06-11

Family

ID=38076143

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095142055A TWI310839B (en) 2005-11-14 2006-11-14 Ic tester

Country Status (4)

Country Link
JP (1) JP2007132905A (zh)
KR (1) KR100827736B1 (zh)
CN (1) CN1967277A (zh)
TW (1) TWI310839B (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4569647B2 (ja) * 2008-03-18 2010-10-27 ソニー株式会社 Ａｄ変換装置、ａｄ変換方法、固体撮像素子、およびカメラシステム
CN110728935B (zh) * 2019-09-29 2022-10-04 昆山国显光电有限公司 显示面板的检测方法及检测装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0568135U (ja) * 1992-02-20 1993-09-10 横河電機株式会社 Ｄａ変換器のテスト装置
JPH06213970A (ja) * 1992-11-30 1994-08-05 Yokogawa Electric Corp Ｉｃテスト装置
JPH11112344A (ja) * 1997-09-30 1999-04-23 Nec Corp 減算回路を備える低電圧ａ／ｄ変換器
JP2002098738A (ja) * 2000-09-27 2002-04-05 Yokogawa Electric Corp Ｉｃテスタ
JP3983123B2 (ja) * 2002-07-11 2007-09-26 シャープ株式会社 半導体検査装置及び半導体検査方法
US6639539B1 (en) * 2002-10-22 2003-10-28 Bei Technologies, Inc. System and method for extending the dynamic range of an analog-to-digital converter
JP2005229257A (ja) * 2004-02-12 2005-08-25 Toshiba Corp アナログ／デジタルコンバータおよびそれを搭載したマイクロコンピュータ
JP2005265612A (ja) * 2004-03-18 2005-09-29 Kawasaki Microelectronics Kk テスト回路
JP2005300287A (ja) * 2004-04-09 2005-10-27 Yokogawa Electric Corp Ｉｃテスタ

Also Published As

Publication number Publication date
CN1967277A (zh) 2007-05-23
KR20070051659A (ko) 2007-05-18
TWI310839B (en) 2009-06-11
JP2007132905A (ja) 2007-05-31
KR100827736B1 (ko) 2008-05-07

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees