TW200745575A - IC tester - Google Patents

IC tester

Info

Publication number
TW200745575A
TW200745575A TW095144129A TW95144129A TW200745575A TW 200745575 A TW200745575 A TW 200745575A TW 095144129 A TW095144129 A TW 095144129A TW 95144129 A TW95144129 A TW 95144129A TW 200745575 A TW200745575 A TW 200745575A
Authority
TW
Taiwan
Prior art keywords
tester
dut
converter
output
reference voltage
Prior art date
Application number
TW095144129A
Other languages
Chinese (zh)
Other versions
TWI310840B (en
Inventor
Hideki Naganuma
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of TW200745575A publication Critical patent/TW200745575A/en
Application granted granted Critical
Publication of TWI310840B publication Critical patent/TWI310840B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

This invention aims to provide an IC tester capable of conducting a high-resolution and high-accuracy measurement without using an offset subtracter. This invention makes some improvement to an IC tester that measures the output of a DUT (device under test) by an A/D converter. The IC tester of this invention is characterized by including a voltage generation section that variably provides the A/D converter with an upper limit reference voltage and an lower limit reference voltage based on the output of the DUT.
TW095144129A 2005-11-29 2006-11-29 Ic tester TWI310840B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005343096A JP2007147469A (en) 2005-11-29 2005-11-29 Ic tester

Publications (2)

Publication Number Publication Date
TW200745575A true TW200745575A (en) 2007-12-16
TWI310840B TWI310840B (en) 2009-06-11

Family

ID=38125659

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095144129A TWI310840B (en) 2005-11-29 2006-11-29 Ic tester

Country Status (4)

Country Link
JP (1) JP2007147469A (en)
KR (1) KR100798837B1 (en)
CN (1) CN1975450A (en)
TW (1) TWI310840B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101354414B (en) * 2007-07-26 2011-03-16 联华电子股份有限公司 System and method for detecting defect with multi-step output function
CN109343516A (en) * 2018-12-11 2019-02-15 广西玉柴机器股份有限公司 A method of measurement assessment engine controller AD conversion precision

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5810919A (en) * 1981-07-13 1983-01-21 Nippon Telegr & Teleph Corp <Ntt> Analog-to-digital converter
JPH03205921A (en) * 1990-01-08 1991-09-09 Hitachi Denshi Ltd Digitizer circuit
JP3144563B2 (en) * 1991-02-18 2001-03-12 横河電機株式会社 Waveform measuring device
KR100499368B1 (en) * 1997-12-30 2005-09-14 엘지전자 주식회사 Apparatus for regulating reference voltage of analog/digital convertor
KR20000004592A (en) * 1998-06-30 2000-01-25 김영환 Analog-to-digital converting apparatus utilizing comparison window of variable size
JP2002098738A (en) * 2000-09-27 2002-04-05 Yokogawa Electric Corp Ic tester
JP3874164B2 (en) * 2000-10-26 2007-01-31 横河電機株式会社 IC tester
JP2002250754A (en) * 2001-02-26 2002-09-06 Yokogawa Electric Corp Semiconductor test apparatus
JP4059174B2 (en) * 2003-09-09 2008-03-12 村田機械株式会社 Image processing device
JP2005229257A (en) * 2004-02-12 2005-08-25 Toshiba Corp Analog/digital converter and microcomputer mounted with it
JP2005265612A (en) * 2004-03-18 2005-09-29 Kawasaki Microelectronics Kk Test circuit
JP2005300287A (en) * 2004-04-09 2005-10-27 Yokogawa Electric Corp Ic tester

Also Published As

Publication number Publication date
JP2007147469A (en) 2007-06-14
KR100798837B1 (en) 2008-01-28
KR20070056929A (en) 2007-06-04
CN1975450A (en) 2007-06-06
TWI310840B (en) 2009-06-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees