ATE314658T1 - Vorrichtung zum messen des ruhestromes einer elektronischen vorrichtung - Google Patents

Vorrichtung zum messen des ruhestromes einer elektronischen vorrichtung

Info

Publication number
ATE314658T1
ATE314658T1 AT02447125T AT02447125T ATE314658T1 AT E314658 T1 ATE314658 T1 AT E314658T1 AT 02447125 T AT02447125 T AT 02447125T AT 02447125 T AT02447125 T AT 02447125T AT E314658 T1 ATE314658 T1 AT E314658T1
Authority
AT
Austria
Prior art keywords
current
measuring
quiz
electronic device
drawn
Prior art date
Application number
AT02447125T
Other languages
English (en)
Inventor
Hans Manhaeve
Stefaan Kerckenaere
Bohumil Straka
Original Assignee
Star Test N V Q
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Star Test N V Q filed Critical Star Test N V Q
Application granted granted Critical
Publication of ATE314658T1 publication Critical patent/ATE314658T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3173—Marginal testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
AT02447125T 2002-07-03 2002-07-03 Vorrichtung zum messen des ruhestromes einer elektronischen vorrichtung ATE314658T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP02447125A EP1378758B1 (de) 2002-07-03 2002-07-03 Vorrichtung zum Messen des Ruhestromes einer elektronischen Vorrichtung

Publications (1)

Publication Number Publication Date
ATE314658T1 true ATE314658T1 (de) 2006-01-15

Family

ID=29719827

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02447125T ATE314658T1 (de) 2002-07-03 2002-07-03 Vorrichtung zum messen des ruhestromes einer elektronischen vorrichtung

Country Status (4)

Country Link
US (2) US6927592B2 (de)
EP (2) EP1635183B1 (de)
AT (1) ATE314658T1 (de)
DE (2) DE60223730T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100395817C (zh) * 2001-11-14 2008-06-18 松下电器产业株式会社 编码设备、解码设备和解码方法
US6941235B2 (en) * 2003-10-28 2005-09-06 International Business Machines Corporation Method and system for analyzing quiescent power plane current (IDDQ) test data in very-large scale integrated (VLSI) circuits
GB2431739A (en) * 2005-10-27 2007-05-02 Wolfson Microelectronics Plc Switch current sensing circuit
WO2008069025A1 (ja) * 2006-11-29 2008-06-12 Nec Corporation 半導体装置
US7812628B2 (en) * 2006-12-13 2010-10-12 Renesas Electronics Corporation Method of on-chip current measurement and semiconductor IC
US9651596B2 (en) * 2013-08-30 2017-05-16 Keysight Technologies, Inc. System and apparatus for measuring capacitance
EP3673276B1 (de) 2017-09-25 2023-06-07 Siemens Mobility Pty Ltd. Einbettung und detektion von codes in überwachungs-signaturen
US11668733B2 (en) * 2018-11-09 2023-06-06 Keithley Instruments, Llc Multi-stage current measurement architecture
CN115357086B (zh) * 2022-08-29 2024-03-08 上海壁仞智能科技有限公司 带隙基准电路及其操作方法、电子装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3754442A (en) * 1970-12-01 1973-08-28 Instrulab Inc Temperature measuring system producing linear output signal from non-linear sensing resistance
NL8900050A (nl) * 1989-01-10 1990-08-01 Philips Nv Inrichting voor het meten van een ruststroom van een geintegreerde monolitische digitale schakeling, geintegreerde monolitische digitale schakeling voorzien van een dergelijke inrichting en testapparaat voorzien van een dergelijke inrichting.
US5392293A (en) * 1993-02-26 1995-02-21 At&T Corp. Built-in current sensor for IDDQ testing
US5483170A (en) * 1993-08-24 1996-01-09 New Mexico State University Technology Transfer Corp. Integrated circuit fault testing implementing voltage supply rail pulsing and corresponding instantaneous current response analysis
EP0672911A1 (de) 1994-02-25 1995-09-20 ALCATEL BELL Naamloze Vennootschap Prüfeinrichtung für Ruheversorgungsstrom
US5731700A (en) * 1994-03-14 1998-03-24 Lsi Logic Corporation Quiescent power supply current test method and apparatus for integrated circuits
US5721495A (en) * 1995-10-24 1998-02-24 Unisys Corporation Circuit for measuring quiescent current
KR100198617B1 (ko) * 1995-12-27 1999-06-15 구본준 모오스 캐패시터의 누설전압감지회로
DE69733789T2 (de) * 1996-06-05 2006-06-01 Interuniversitair Micro-Electronica Centrum Vzw Hochauflösendes Stromversorgungsprüfsystem
US6239604B1 (en) 1996-10-04 2001-05-29 U.S. Philips Corporation Method for inspecting an integrated circuit by measuring a voltage drop in a supply line of sub-circuit thereof
US5914615A (en) * 1997-04-29 1999-06-22 Hewlett-Packard Company Method of improving the quality and efficiency of Iddq testing
WO2000048011A1 (en) * 1999-02-10 2000-08-17 Koninklijke Philips Electronics N.V. An arrangement for transient-current testing of a digital electronic cmos circuit
US6496028B1 (en) * 1999-05-11 2002-12-17 Interuniversitair Micro-Elektronica Centrum Method and apparatus for testing electronic devices
US6859058B2 (en) * 1999-05-11 2005-02-22 Interuniversitair Microelektronica Centrum (Imec Uzw) Method and apparatus for testing electronic devices
EP1107013B1 (de) 1999-09-22 2006-06-07 Interuniversitair Micro-Elektronica Centrum Verfahren und Vorrichtung zum Testen von Anschlüssen
US6342790B1 (en) * 2000-04-13 2002-01-29 Pmc-Sierra, Inc. High-speed, adaptive IDDQ measurement
US6424211B1 (en) * 2000-06-26 2002-07-23 Microchip Technology Incorporated Digital trimming of OP AMP offset voltage and quiescent current using non-volatile memory
US6664801B1 (en) * 2001-05-21 2003-12-16 Lsi Logic Corporation IDDQ test methodology based on the sensitivity of fault current to power supply variations

Also Published As

Publication number Publication date
DE60208357D1 (de) 2006-02-02
US20050156619A1 (en) 2005-07-21
DE60223730T2 (de) 2008-10-30
EP1635183B1 (de) 2007-11-21
US6927592B2 (en) 2005-08-09
US20040046576A1 (en) 2004-03-11
EP1378758A1 (de) 2004-01-07
DE60223730D1 (de) 2008-01-03
EP1635183A1 (de) 2006-03-15
DE60208357T2 (de) 2006-09-14
US7315180B2 (en) 2008-01-01
EP1378758B1 (de) 2005-12-28

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Legal Events

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