TW200602653A - Testing device and testing method - Google Patents

Testing device and testing method

Info

Publication number
TW200602653A
TW200602653A TW094120154A TW94120154A TW200602653A TW 200602653 A TW200602653 A TW 200602653A TW 094120154 A TW094120154 A TW 094120154A TW 94120154 A TW94120154 A TW 94120154A TW 200602653 A TW200602653 A TW 200602653A
Authority
TW
Taiwan
Prior art keywords
pattern row
output
obtains
testing
header
Prior art date
Application number
TW094120154A
Other languages
English (en)
Other versions
TWI317429B (en
Inventor
Satoshi Ozora
Tetsuro Nakagawa
Makoto Tsunoda
Nobumasa Takaiwa
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2004179857A external-priority patent/JP4511880B2/ja
Priority claimed from JP2004183067A external-priority patent/JP4511882B2/ja
Priority claimed from JP2004192195A external-priority patent/JP4340595B2/ja
Priority claimed from JP2004212234A external-priority patent/JP4511889B2/ja
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200602653A publication Critical patent/TW200602653A/zh
Application granted granted Critical
Publication of TWI317429B publication Critical patent/TWI317429B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW094120154A 2004-06-17 2005-06-17 Te sting device and testing method TWI317429B (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2004179857A JP4511880B2 (ja) 2004-06-17 2004-06-17 試験装置及び試験方法
JP2004183067A JP4511882B2 (ja) 2004-06-21 2004-06-21 試験装置及び試験方法
JP2004192195A JP4340595B2 (ja) 2004-06-29 2004-06-29 試験装置及び試験方法
JP2004212234A JP4511889B2 (ja) 2004-07-20 2004-07-20 試験装置及び試験方法

Publications (2)

Publication Number Publication Date
TW200602653A true TW200602653A (en) 2006-01-16
TWI317429B TWI317429B (en) 2009-11-21

Family

ID=35509821

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094120154A TWI317429B (en) 2004-06-17 2005-06-17 Te sting device and testing method

Country Status (5)

Country Link
US (1) US7286950B2 (zh)
EP (1) EP1757947A4 (zh)
KR (1) KR100856608B1 (zh)
TW (1) TWI317429B (zh)
WO (1) WO2005124378A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI405994B (zh) * 2008-06-10 2013-08-21 Advantest Corp 測試模組、測試裝置以及測試方法

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007172778A (ja) * 2005-12-26 2007-07-05 Nec Electronics Corp メモリテスト回路及びメモリテスト方法
JP4750730B2 (ja) * 2006-02-28 2011-08-17 パナソニック株式会社 データ解析装置、及びデータ解析方法
WO2007102485A1 (ja) * 2006-03-06 2007-09-13 Anritsu Corporation 試験信号発生装置
US7725782B2 (en) * 2007-01-04 2010-05-25 Gm Global Technology Operations, Inc. Linked random access memory (RAM) interleaved pattern persistence strategy
JP5113624B2 (ja) * 2007-05-24 2013-01-09 株式会社アドバンテスト 試験装置
US7890288B1 (en) * 2007-11-05 2011-02-15 Anadigics, Inc. Timing functions to optimize code-execution time
US7797593B2 (en) * 2007-12-18 2010-09-14 Faraday Technology Corp. Method and apparatus for memory AC timing measurement
KR101213164B1 (ko) 2008-09-04 2012-12-24 가부시키가이샤 어드밴티스트 시험 장치 및 시험 방법
JP2014109453A (ja) * 2012-11-30 2014-06-12 Renesas Electronics Corp 半導体装置
US9600385B2 (en) * 2014-02-25 2017-03-21 Arrow Devices Pvt Ltd Analyzing behavior of a device under test
CN104637544B (zh) * 2015-01-31 2017-11-24 上海华虹宏力半导体制造有限公司 存储器的测试电路及测试方法
JP6688665B2 (ja) * 2016-04-11 2020-04-28 横河電機株式会社 機器保全装置、機器保全方法、機器保全プログラム及び記録媒体
US9760477B1 (en) * 2016-04-12 2017-09-12 Linkedin Corporation Self-healing job executor pool
KR102039112B1 (ko) * 2017-06-20 2019-10-31 포스필 주식회사 피시험 디바이스를 테스트하기 위한 프로세서 기반의 계측 방법 및 이를 이용한 계측 장치
CN113450866B (zh) * 2020-03-27 2022-04-12 长鑫存储技术有限公司 存储器测试方法
US12320841B2 (en) * 2020-11-19 2025-06-03 Advantest Test Solutions, Inc. Wafer scale active thermal interposer for device testing
CN114036885B (zh) * 2021-11-08 2025-09-30 上海兆芯集成电路股份有限公司 内建自测试的方法及互连接口
TWI892900B (zh) * 2023-04-28 2025-08-01 南亞科技股份有限公司 記憶體及記憶體測試方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1266515A (en) * 1986-09-04 1990-03-06 Nec Corporation Start pattern detecting apparatus
JPH09288153A (ja) 1996-04-19 1997-11-04 Advantest Corp 半導体試験装置
JPH11101850A (ja) 1997-09-26 1999-04-13 Ando Electric Co Ltd Ｉｃ試験装置
JP3214830B2 (ja) 1998-02-27 2001-10-02 アジレント・テクノロジー株式会社 Ｉｃテスト用データ処理装置
JP2002139557A (ja) * 2000-11-02 2002-05-17 Mitsubishi Electric Corp 半導体装置
JP3937034B2 (ja) * 2000-12-13 2007-06-27 株式会社日立製作所 半導体集積回路のテスト方法及びテストパターン発生回路
US6658363B2 (en) * 2001-01-18 2003-12-02 Hewlett-Packard Development Company, L.P. Digital data pattern detection methods and arrangements

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI405994B (zh) * 2008-06-10 2013-08-21 Advantest Corp 測試模組、測試裝置以及測試方法
US8949062B2 (en) 2008-06-10 2015-02-03 Advantest Corporation Test module, test apparatus, and test method

Also Published As

Publication number Publication date
KR100856608B1 (ko) 2008-09-03
EP1757947A1 (en) 2007-02-28
WO2005124378A1 (ja) 2005-12-29
EP1757947A4 (en) 2010-07-14
TWI317429B (en) 2009-11-21
KR20070020161A (ko) 2007-02-20
US20060036389A1 (en) 2006-02-16
US7286950B2 (en) 2007-10-23

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees