EP1582882A3 - Method of measuring duty cycle - Google Patents

Method of measuring duty cycle Download PDF

Info

Publication number
EP1582882A3
EP1582882A3 EP05002024A EP05002024A EP1582882A3 EP 1582882 A3 EP1582882 A3 EP 1582882A3 EP 05002024 A EP05002024 A EP 05002024A EP 05002024 A EP05002024 A EP 05002024A EP 1582882 A3 EP1582882 A3 EP 1582882A3
Authority
EP
European Patent Office
Prior art keywords
duty cycle
signal
state
input signal
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05002024A
Other languages
German (de)
French (fr)
Other versions
EP1582882A2 (en
Inventor
Raoul J. Belleau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of EP1582882A2 publication Critical patent/EP1582882A2/en
Publication of EP1582882A3 publication Critical patent/EP1582882A3/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Manipulation Of Pulses (AREA)

Abstract

A method for measuring the duty cycle of a signal. The method is fast enough to allow duty cycle measurements of semi-conductor components during production. The method can also be performed inexpensively using automatic test equipment. A comparator in a digital channel is used to sense the state of an input signal at multiple points across the period of the signal. Fail processing circuitry within the tester is used to count the number of samples for which the input signal is in a logic HI state. This value is scaled by the total number of samples taken to produce a single number indicative of the duty cycle of the signal.
EP05002024A 2004-03-31 2005-02-01 Method of measuring duty cycle Withdrawn EP1582882A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/815,024 US7151367B2 (en) 2004-03-31 2004-03-31 Method of measuring duty cycle
US815024 2004-03-31

Publications (2)

Publication Number Publication Date
EP1582882A2 EP1582882A2 (en) 2005-10-05
EP1582882A3 true EP1582882A3 (en) 2005-11-09

Family

ID=34887734

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05002024A Withdrawn EP1582882A3 (en) 2004-03-31 2005-02-01 Method of measuring duty cycle

Country Status (5)

Country Link
US (1) US7151367B2 (en)
EP (1) EP1582882A3 (en)
JP (1) JP5430816B2 (en)
CN (1) CN100380620C (en)
TW (1) TWI263790B (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7151367B2 (en) * 2004-03-31 2006-12-19 Teradyne, Inc. Method of measuring duty cycle
US20060019088A1 (en) * 2004-07-20 2006-01-26 Xiaojia Wang Adhesive layer composition for in-mold decoration
JP2006118880A (en) * 2004-10-19 2006-05-11 Sharp Corp Inspection method and inspection device for semiconductor integrated circuit
US20060204795A1 (en) * 2005-03-14 2006-09-14 Alfred E. Mann Foundation For Scientific Research Energy storage device charging system
US20070075753A1 (en) * 2005-09-30 2007-04-05 Rachael Parker Duty cycle measurement circuit
JP2007225414A (en) * 2006-02-23 2007-09-06 Yokogawa Electric Corp Inspection method and device of semiconductor device
US7333905B2 (en) * 2006-05-01 2008-02-19 International Business Machines Corporation Method and apparatus for measuring the duty cycle of a digital signal
US7330061B2 (en) * 2006-05-01 2008-02-12 International Business Machines Corporation Method and apparatus for correcting the duty cycle of a digital signal
US7363178B2 (en) * 2006-05-01 2008-04-22 International Business Machines Corporation Method and apparatus for measuring the relative duty cycle of a clock signal
US7595675B2 (en) * 2006-05-01 2009-09-29 International Business Machines Corporation Duty cycle measurement method and apparatus that operates in a calibration mode and a test mode
US7646177B2 (en) * 2006-05-01 2010-01-12 International Business Machines Corporation Design structure for a duty cycle measurement apparatus that operates in a calibration mode and a test mode
US7420400B2 (en) * 2006-05-01 2008-09-02 International Business Machines Corporation Method and apparatus for on-chip duty cycle measurement
KR100728986B1 (en) 2006-06-02 2007-06-15 주식회사 하이닉스반도체 A duty checking circuit of internal clock
US8032850B2 (en) * 2007-11-12 2011-10-04 International Business Machines Corporation Structure for an absolute duty cycle measurement circuit
US7904264B2 (en) 2007-11-12 2011-03-08 International Business Machines Corporation Absolute duty cycle measurement
US7917318B2 (en) * 2007-11-20 2011-03-29 International Business Machines Corporation Structure for a duty cycle measurement circuit
US7895005B2 (en) * 2007-11-20 2011-02-22 International Business Machines Corporation Duty cycle measurement for various signals throughout an integrated circuit device
US8041537B2 (en) * 2008-06-27 2011-10-18 International Business Machines Corporation Clock duty cycle measurement with charge pump without using reference clock calibration
CN102103168A (en) * 2009-12-22 2011-06-22 比亚迪股份有限公司 PWM (Pulse-Width Modulation) wave detecting method and device
TWI426283B (en) * 2010-12-22 2014-02-11 Inventec Corp Duty cycle measuring systems and methods for the same
US8664978B2 (en) * 2011-08-30 2014-03-04 Taiwan Semiconductor Manufacturing Company, Ltd. Methods and apparatus for time to current conversion
DE102014011706A1 (en) * 2014-08-05 2016-02-11 Wabco Gmbh Method for determining the duty cycle of a pulse width modulated signal by means of a vehicle control unit and vehicle control unit
CN104316775B (en) * 2014-10-29 2017-06-06 上海大学 Pulse signal cycle and dutycycle method for continuous measuring
US20220341990A1 (en) * 2019-09-23 2022-10-27 Palitronica Inc. A method and apparatus for detection of counterfeit parts, compromised or tampered components or devices, tampered systems such as local communication networks, and for secure identification of components

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4475086A (en) * 1982-03-31 1984-10-02 Eastman Kodak Company Duty cycle detector
EP0480726A2 (en) * 1990-10-12 1992-04-15 Westinghouse Electric Corporation Pulse analysis system and method
US6597749B1 (en) * 1999-11-19 2003-07-22 Atmel Corporation Digital frequency monitoring

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4792932A (en) * 1987-01-16 1988-12-20 Teradyne, Inc. Time measurement in automatic test equipment
JPH04130282A (en) * 1990-09-21 1992-05-01 Mitsubishi Electric Corp Maximum repetition frequency measurement method
JPH04270975A (en) * 1991-02-27 1992-09-28 Advantest Corp Ic testing device
US5367200A (en) * 1993-11-29 1994-11-22 Northern Telecom Limited Method and apparatus for measuring the duty cycle of a digital signal
JPH088668A (en) * 1994-06-22 1996-01-12 Fujitsu Ltd Output waveform duty control circuit
JP3516778B2 (en) * 1995-07-19 2004-04-05 株式会社アドバンテスト Frequency measurement method for semiconductor test equipment
JP3331109B2 (en) * 1996-01-23 2002-10-07 株式会社アドバンテスト Semiconductor test equipment comparator
JPH10116875A (en) * 1996-10-08 1998-05-06 Mitsubishi Electric Corp Semiconductor production system
JP3199027B2 (en) * 1998-05-11 2001-08-13 日本電気株式会社 Duty measurement circuit, data identification system, data signal reproduction system, duty measurement method, data identification method, and data signal reproduction method
JP2000252800A (en) * 1999-02-26 2000-09-14 Ando Electric Co Ltd Comparator for differential signal and method for comparing differential signals
JP3488153B2 (en) * 1999-10-27 2004-01-19 Ｎｅｃマイクロシステム株式会社 Clock duty inspection circuit and microcomputer capable of clock duty inspection
US6687844B1 (en) * 2000-09-28 2004-02-03 Intel Corporation Method for correcting clock duty cycle skew by adjusting a delayed clock signal according to measured differences in time intervals between phases of original clock signal
JP2002125249A (en) * 2000-10-18 2002-04-26 Sony Corp Signal inspection device and signal inspection method
EP1152530B1 (en) * 2000-11-24 2003-04-02 Agilent Technologies, Inc. (a Delaware corporation) Circuit for providing a logical output signal in accordance with crossing points of differential signals
US6441600B1 (en) * 2001-01-19 2002-08-27 International Business Machines Corporation Apparatus for measuring the duty cycle of a high speed clocking signal
KR100429116B1 (en) * 2001-05-14 2004-04-28 삼성전자주식회사 System and method for automatically analyzing and managing loss factors in test process of semiconductor Integrated Circuit devices
US7016805B2 (en) * 2001-12-14 2006-03-21 Wavecrest Corporation Method and apparatus for analyzing a distribution
JP2003215108A (en) * 2002-01-29 2003-07-30 Yoshikazu Ichiyama Inductance difference detecting circuit, and magnetic flaw detector and metal piece detection device using the inductance difference detecting circuit
JP3981281B2 (en) * 2002-02-14 2007-09-26 松下電器産業株式会社 Semiconductor integrated circuit design method and test method
JP3868843B2 (en) * 2002-04-23 2007-01-17 株式会社アドバンテスト Edge conversion circuit and semiconductor test apparatus equipped with edge conversion circuit
US7151367B2 (en) * 2004-03-31 2006-12-19 Teradyne, Inc. Method of measuring duty cycle

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4475086A (en) * 1982-03-31 1984-10-02 Eastman Kodak Company Duty cycle detector
EP0480726A2 (en) * 1990-10-12 1992-04-15 Westinghouse Electric Corporation Pulse analysis system and method
US6597749B1 (en) * 1999-11-19 2003-07-22 Atmel Corporation Digital frequency monitoring

Also Published As

Publication number Publication date
JP2005292135A (en) 2005-10-20
CN100380620C (en) 2008-04-09
TW200532226A (en) 2005-10-01
JP5430816B2 (en) 2014-03-05
US20050225314A1 (en) 2005-10-13
US7151367B2 (en) 2006-12-19
CN1677639A (en) 2005-10-05
TWI263790B (en) 2006-10-11
EP1582882A2 (en) 2005-10-05

Similar Documents

Publication Publication Date Title
EP1582882A3 (en) Method of measuring duty cycle
WO2008042168A3 (en) Tester input/output sharing
WO2007148268A3 (en) Semiconductor device with test structure and semiconductor device test method
TW200710372A (en) Distance measuring apparatus
TW200739092A (en) Measuring apparatus, testing apparatus, and electronic device
WO2008002316A3 (en) Calibrating a testing device
DE602005002931D1 (en) Testing a test object with sampling of the clock signal and the data signal
HK1133334A1 (en) Efficient clock calibration in electronic equipment
TW200736639A (en) Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
US8060326B2 (en) Measuring apparatus, measuring method and test apparatus
CN110596439A (en) Digital trigger detection method
US8860455B2 (en) Methods and systems to measure a signal on an integrated circuit die
AU2003267684A1 (en) Method and apparatus for determining iddq
TW200626919A (en) Scan test circuit
WO2003036313A1 (en) Clock/skew measurement apparatus and clock/skew measurement method
CN103135650A (en) Current/frequency conversion circuit linearity and symmetry digital compensation method
TW200702686A (en) Method of testing non-componented large printed circuit boards using a finger tester
WO2007011452A3 (en) An apparatus and method for obtaining a device signal value using a ternary search process
CN106950486A (en) Grouping time measuring module of automatic test equipment and method thereof
WO2008114307A1 (en) Delay circuit and method for testing the circuit
WO2008114602A1 (en) Test equipment and electronic device
DE602004022878D1 (en) EVALUATION OF AN OUTPUT SIGNAL OF A JUST TESTED BLOCK
TW200708747A (en) Time jitter injection testing circuit and related testing method
CN106918731A (en) A kind of digital oscilloscope and its signal frequency measuring method
WO2009069496A1 (en) Methods for analyzing and adjusting semiconductor device, and semiconductor system

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA HR LV MK YU

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA HR LV MK YU

17P Request for examination filed

Effective date: 20060207

AKX Designation fees paid

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN

18D Application deemed to be withdrawn

Effective date: 20090901