SG71084A1 - Semiconductor test system - Google Patents

Semiconductor test system

Info

Publication number
SG71084A1
SG71084A1 SG1998000346A SG1998000346A SG71084A1 SG 71084 A1 SG71084 A1 SG 71084A1 SG 1998000346 A SG1998000346 A SG 1998000346A SG 1998000346 A SG1998000346 A SG 1998000346A SG 71084 A1 SG71084 A1 SG 71084A1
Authority
SG
Singapore
Prior art keywords
test system
semiconductor test
semiconductor
test
Prior art date
Application number
SG1998000346A
Other languages
English (en)
Inventor
Robert F Sauer
Kiyoshi Fukushima
Hiroaki Yamoto
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG71084A1 publication Critical patent/SG71084A1/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
SG1998000346A 1997-02-19 1998-02-17 Semiconductor test system SG71084A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/802,857 US5951704A (en) 1997-02-19 1997-02-19 Test system emulator

Publications (1)

Publication Number Publication Date
SG71084A1 true SG71084A1 (en) 2000-03-21

Family

ID=25184908

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1998000346A SG71084A1 (en) 1997-02-19 1998-02-17 Semiconductor test system

Country Status (9)

Country Link
US (1) US5951704A (ko)
JP (1) JP3383562B2 (ko)
KR (1) KR100495851B1 (ko)
CN (1) CN1109897C (ko)
DE (1) DE19806808A1 (ko)
GB (1) GB2323689B (ko)
MY (1) MY130839A (ko)
SG (1) SG71084A1 (ko)
TW (1) TW498478B (ko)

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US7428066B2 (en) * 2001-04-09 2008-09-23 Canon Kabushiki Kaisha Printing apparatus and method for verifying a printer controller
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US8103497B1 (en) * 2002-03-28 2012-01-24 Cypress Semiconductor Corporation External interface for event architecture
KR20030082135A (ko) * 2002-04-16 2003-10-22 삼성전자주식회사 반도체 소자의 테스트 프로그램 에뮬레이터 및 에뮬레이션방법
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US7460988B2 (en) 2003-03-31 2008-12-02 Advantest Corporation Test emulator, test module emulator, and record medium storing program therein
US20040225459A1 (en) * 2003-02-14 2004-11-11 Advantest Corporation Method and structure to develop a test program for semiconductor integrated circuits
US7159145B2 (en) * 2003-05-12 2007-01-02 Infineon Technologies Ag Built-in self test system and method
US20040239635A1 (en) * 2003-05-23 2004-12-02 Lerner Ronald L. Apparatus and method for loop-back testing in a system test/emulation environment
US20050108596A1 (en) * 2003-09-25 2005-05-19 Deaton Craig F. Method of verifying circuitry used for testing a new logic component prior to the first release of the component
US7613950B2 (en) * 2004-02-27 2009-11-03 Hewlett-Packard Development Company, L.P. Detecting floating point hardware failures
KR100604888B1 (ko) * 2004-07-16 2006-07-31 삼성전자주식회사 개선된 테스트 회로를 구비하는 집적회로 장치 및집적회로 장치 테스트 방법
US8046187B2 (en) * 2005-02-24 2011-10-25 International Business Machines Corporation Test systems for media drives of data storage systems
US20060247911A1 (en) * 2005-04-28 2006-11-02 Schweitzer Engineering Labs., Inc. Systems and methods for learning and mimicking the communications of intelligent electronic devices
US20070135956A1 (en) * 2005-12-13 2007-06-14 Taiwan Semiconductor Manufacturing Co., Ltd. Data location systems and methods
US7906982B1 (en) 2006-02-28 2011-03-15 Cypress Semiconductor Corporation Interface apparatus and methods of testing integrated circuits using the same
CN100479393C (zh) * 2006-06-13 2009-04-15 华为技术有限公司 一种实现测试执行器测试的方法
KR100809598B1 (ko) * 2006-06-20 2008-03-04 삼성전자주식회사 가상 테스트가 가능한 반도체 테스트 시스템 및 그것의반도체 테스트 방법
US20080154574A1 (en) * 2006-12-21 2008-06-26 Buechler Jodi A Application emulation on a non-production computer system
US20090119542A1 (en) * 2007-11-05 2009-05-07 Advantest Corporation System, method, and program product for simulating test equipment
US20090119084A1 (en) * 2007-11-05 2009-05-07 Advantest Corporation System, method, and program product for simulating test equipment
KR20110003182A (ko) 2009-07-03 2011-01-11 삼성전자주식회사 인쇄 회로 기판 설계 방법 및 인쇄 회로 기판을 포함하는 패키지 테스트 디바이스
US8499199B2 (en) 2010-09-08 2013-07-30 Lsi Corporation GPU computational assist for drive media waveform generation of media emulators
US10776233B2 (en) 2011-10-28 2020-09-15 Teradyne, Inc. Programmable test instrument
US9759772B2 (en) 2011-10-28 2017-09-12 Teradyne, Inc. Programmable test instrument
CN103440133A (zh) * 2013-08-30 2013-12-11 上海高清数字科技产业有限公司 一种芯片测试软件的开发方法和系统
CN105334450A (zh) * 2015-11-30 2016-02-17 英业达科技有限公司 信号检测装置及方法
CN108628734B (zh) * 2017-03-21 2023-03-28 中兴通讯股份有限公司 一种功能程序调试方法和终端
KR102039112B1 (ko) 2017-06-20 2019-10-31 포스필 주식회사 피시험 디바이스를 테스트하기 위한 프로세서 기반의 계측 방법 및 이를 이용한 계측 장치
CN110879542A (zh) * 2019-10-18 2020-03-13 中国电力科学研究院有限公司 一种用于仿真柔性直流电力系统的系统及方法
CN114077538A (zh) * 2020-08-19 2022-02-22 富泰华工业（深圳）有限公司 程序调试方法、装置及可读存储介质
KR102432940B1 (ko) * 2020-10-29 2022-08-18 에스케이하이닉스 주식회사 반도체 테스트 시스템
TWI811607B (zh) * 2020-12-31 2023-08-11 新唐科技股份有限公司 微控制器、微控制器的測試方法以及包含微控制器的系統
WO2022176054A1 (ja) * 2021-02-17 2022-08-25 三菱電機株式会社 データ照合装置、データ照合システム、及びデータ照合方法
CN113485157B (zh) * 2021-07-01 2023-04-07 杭州加速科技有限公司 晶圆仿真测试方法、装置及晶圆测试方法
CN113868068B (zh) * 2021-12-01 2022-03-18 统信软件技术有限公司 一种内核性能测试方法、计算设备及存储介质
CN117742218B (zh) * 2023-12-27 2024-08-20 深圳宇凡微电子有限公司 一种单片机功能检测方法及系统

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Also Published As

Publication number Publication date
GB2323689A (en) 1998-09-30
DE19806808A1 (de) 1998-10-08
TW498478B (en) 2002-08-11
GB9802551D0 (en) 1998-04-01
MY130839A (en) 2007-07-31
KR19980071453A (ko) 1998-10-26
CN1109897C (zh) 2003-05-28
JP3383562B2 (ja) 2003-03-04
KR100495851B1 (ko) 2005-09-26
JPH10320229A (ja) 1998-12-04
CN1195776A (zh) 1998-10-14
GB2323689B (en) 2001-07-25
US5951704A (en) 1999-09-14

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