SG169982A1 - Plasma processing reactor with multiple capacitive and inductive power sources - Google Patents
Plasma processing reactor with multiple capacitive and inductive power sourcesInfo
- Publication number
- SG169982A1 SG169982A1 SG201101058-4A SG2011010584A SG169982A1 SG 169982 A1 SG169982 A1 SG 169982A1 SG 2011010584 A SG2011010584 A SG 2011010584A SG 169982 A1 SG169982 A1 SG 169982A1
- Authority
- SG
- Singapore
- Prior art keywords
- plasma processing
- bottom electrode
- power sources
- inductive power
- electrode
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F5/00—Electrolytic stripping of metallic layers or coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B6/00—Cleaning by electrostatic means
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F1/00—Electrolytic cleaning, degreasing, pickling or descaling
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F3/00—Electrolytic etching or polishing
- C25F3/16—Polishing
- C25F3/30—Polishing of semiconducting materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32642—Focus rings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32853—Hygiene
- H01J37/32862—In situ cleaning of vessels and/or internal parts
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Public Health (AREA)
- Epidemiology (AREA)
- Health & Medical Sciences (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
- Cleaning In General (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/355,458 US8012306B2 (en) | 2006-02-15 | 2006-02-15 | Plasma processing reactor with multiple capacitive and inductive power sources |
Publications (1)
Publication Number | Publication Date |
---|---|
SG169982A1 true SG169982A1 (en) | 2011-04-29 |
Family
ID=38367027
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG201101058-4A SG169982A1 (en) | 2006-02-15 | 2007-02-15 | Plasma processing reactor with multiple capacitive and inductive power sources |
Country Status (10)
Country | Link |
---|---|
US (3) | US8012306B2 (ja) |
EP (1) | EP1993745B1 (ja) |
JP (3) | JP5336199B2 (ja) |
KR (2) | KR101391006B1 (ja) |
CN (1) | CN101557885B (ja) |
AT (1) | ATE552923T1 (ja) |
MY (1) | MY151896A (ja) |
SG (1) | SG169982A1 (ja) |
TW (1) | TWI354309B (ja) |
WO (1) | WO2007095388A2 (ja) |
Families Citing this family (68)
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2006
- 2006-02-15 US US11/355,458 patent/US8012306B2/en active Active
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2007
- 2007-02-15 KR KR1020087020075A patent/KR101391006B1/ko active IP Right Grant
- 2007-02-15 SG SG201101058-4A patent/SG169982A1/en unknown
- 2007-02-15 AT AT07751025T patent/ATE552923T1/de active
- 2007-02-15 MY MYPI20083099 patent/MY151896A/en unknown
- 2007-02-15 EP EP07751025A patent/EP1993745B1/en active Active
- 2007-02-15 JP JP2008555398A patent/JP5336199B2/ja active Active
- 2007-02-15 CN CN200780005750.6A patent/CN101557885B/zh active Active
- 2007-02-15 WO PCT/US2007/004235 patent/WO2007095388A2/en active Application Filing
- 2007-02-15 TW TW096105721A patent/TWI354309B/zh active
- 2007-02-15 KR KR1020137025015A patent/KR101455954B1/ko active IP Right Grant
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- 2012-06-21 JP JP2012139706A patent/JP5470421B2/ja active Active
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Also Published As
Publication number | Publication date |
---|---|
JP5336199B2 (ja) | 2013-11-06 |
KR101391006B1 (ko) | 2014-04-30 |
EP1993745A4 (en) | 2010-03-17 |
US20110277784A1 (en) | 2011-11-17 |
WO2007095388A2 (en) | 2007-08-23 |
TWI354309B (en) | 2011-12-11 |
US20120279659A1 (en) | 2012-11-08 |
KR20130124394A (ko) | 2013-11-13 |
EP1993745A2 (en) | 2008-11-26 |
CN101557885A (zh) | 2009-10-14 |
MY151896A (en) | 2014-07-14 |
US20070186855A1 (en) | 2007-08-16 |
JP5470421B2 (ja) | 2014-04-16 |
US8906197B2 (en) | 2014-12-09 |
JP2013080956A (ja) | 2013-05-02 |
KR20080094794A (ko) | 2008-10-24 |
TW200811905A (en) | 2008-03-01 |
JP2012212916A (ja) | 2012-11-01 |
WO2007095388A3 (en) | 2007-12-13 |
JP2009527128A (ja) | 2009-07-23 |
EP1993745B1 (en) | 2012-04-11 |
ATE552923T1 (de) | 2012-04-15 |
JP5518174B2 (ja) | 2014-06-11 |
US8337623B2 (en) | 2012-12-25 |
CN101557885B (zh) | 2015-03-11 |
US8012306B2 (en) | 2011-09-06 |
KR101455954B1 (ko) | 2014-10-31 |
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