SG166718A1 - A method and an apparatus for growing a silicon single crystal from a melt - Google Patents
A method and an apparatus for growing a silicon single crystal from a meltInfo
- Publication number
- SG166718A1 SG166718A1 SG201001623-6A SG2010016236A SG166718A1 SG 166718 A1 SG166718 A1 SG 166718A1 SG 2010016236 A SG2010016236 A SG 2010016236A SG 166718 A1 SG166718 A1 SG 166718A1
- Authority
- SG
- Singapore
- Prior art keywords
- melt
- single crystal
- silicon single
- free surface
- heat shield
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/28—Controlling or regulating
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/203—Controlling or regulating the relationship of pull rate (v) to axial thermal gradient (G)
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/206—Controlling or regulating the thermal history of growing the ingot
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B21/00—Unidirectional solidification of eutectic materials
- C30B21/06—Unidirectional solidification of eutectic materials by pulling from a melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B27/00—Single-crystal growth under a protective fluid
- C30B27/02—Single-crystal growth under a protective fluid by pulling from a melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B28/00—Production of homogeneous polycrystalline material with defined structure
- C30B28/04—Production of homogeneous polycrystalline material with defined structure from liquids
- C30B28/10—Production of homogeneous polycrystalline material with defined structure from liquids by pulling from a melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B30/00—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions
- C30B30/04—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions using magnetic fields
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1004—Apparatus with means for measuring, testing, or sensing
- Y10T117/1008—Apparatus with means for measuring, testing, or sensing with responsive control means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1068—Seed pulling including heating or cooling details [e.g., shield configuration]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP09006477A EP2270264B1 (en) | 2009-05-13 | 2009-05-13 | A method and an apparatus for growing a silicon single crystal from melt |
Publications (1)
Publication Number | Publication Date |
---|---|
SG166718A1 true SG166718A1 (en) | 2010-12-29 |
Family
ID=40973246
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG201001623-6A SG166718A1 (en) | 2009-05-13 | 2010-03-08 | A method and an apparatus for growing a silicon single crystal from a melt |
Country Status (8)
Country | Link |
---|---|
US (2) | US8460462B2 (zh) |
EP (1) | EP2270264B1 (zh) |
JP (1) | JP5618614B2 (zh) |
KR (1) | KR101301892B1 (zh) |
CN (1) | CN101886289B (zh) |
AT (1) | ATE539182T1 (zh) |
SG (1) | SG166718A1 (zh) |
TW (1) | TWI424102B (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100983195B1 (ko) * | 2007-12-28 | 2010-09-20 | 주식회사 실트론 | 2차원 선결함이 제어된 실리콘 잉곳, 웨이퍼, 에피택셜웨이퍼와, 그 제조방법 및 제조장치 |
JP5904079B2 (ja) * | 2012-10-03 | 2016-04-13 | 信越半導体株式会社 | シリコン単結晶育成装置及びシリコン単結晶育成方法 |
CN107779946A (zh) * | 2016-08-25 | 2018-03-09 | 上海新昇半导体科技有限公司 | 热屏组件及单晶提拉炉热场结构 |
KR101871059B1 (ko) * | 2016-11-17 | 2018-07-20 | 에스케이실트론 주식회사 | 단결정 잉곳 성장장치 |
KR101892107B1 (ko) * | 2017-06-01 | 2018-08-27 | 에스케이실트론 주식회사 | 실리콘 단결정 성장 장치 및 이를 이용한 실리콘 단결정 성장 방법 |
JP6977619B2 (ja) * | 2018-02-28 | 2021-12-08 | 株式会社Sumco | シリコン単結晶の酸素濃度推定方法、およびシリコン単結晶の製造方法 |
CN112095143B (zh) * | 2019-06-18 | 2021-08-10 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
CN112095142B (zh) * | 2019-06-18 | 2021-08-10 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
CN112095153B (zh) * | 2019-06-18 | 2021-05-11 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
CN112680793B (zh) * | 2019-10-17 | 2022-02-01 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
CN112680788B (zh) * | 2019-10-17 | 2022-02-01 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
DE112021000109T5 (de) * | 2020-08-10 | 2022-06-02 | Xi an ESWIN Material Technology Co., Ltd. | Montagehülse einer einkristall-ziehvorrichtung und einkristall-ziehvorrichtung |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5004519A (en) * | 1986-12-12 | 1991-04-02 | Texas Instruments Incorporated | Radiation heat shield for silicon melt-in manufacturing of single crystal silicon |
US5394825A (en) * | 1992-02-28 | 1995-03-07 | Crystal Systems, Inc. | Method and apparatus for growing shaped crystals |
DE4442829A1 (de) | 1994-12-01 | 1996-06-05 | Wacker Siltronic Halbleitermat | Vorrichtung und Verfahren zur Herstellung eines Einkristalls |
JP2940437B2 (ja) * | 1995-06-01 | 1999-08-25 | 信越半導体株式会社 | 単結晶の製造方法及び装置 |
JPH09208385A (ja) * | 1996-01-30 | 1997-08-12 | Mitsubishi Materials Corp | シリコン単結晶の育成方法及びその装置 |
JPH10167891A (ja) | 1996-12-04 | 1998-06-23 | Komatsu Electron Metals Co Ltd | 単結晶シリコンの製造装置および製造方法 |
JP3550487B2 (ja) * | 1997-11-06 | 2004-08-04 | 東芝セラミックス株式会社 | 横磁界下シリコン単結晶引上装置 |
JP2000026484A (ja) | 1998-07-10 | 2000-01-25 | Kao Corp | リン酸エステルの製法 |
JP3589077B2 (ja) * | 1999-03-17 | 2004-11-17 | 信越半導体株式会社 | シリコン単結晶の製造方法ならびにこの方法で製造された単結晶およびシリコンウエーハ |
WO2000055393A1 (fr) * | 1999-03-17 | 2000-09-21 | Shin-Etsu Handotai Co., Ltd. | Appareil et procede de production d'un cristal unique de silicium, cristal unique et tranche obtenus selon ce procede |
JP4408148B2 (ja) | 1999-06-17 | 2010-02-03 | Sumco Techxiv株式会社 | 単結晶製造方法およびその装置 |
JP4776065B2 (ja) | 2000-09-19 | 2011-09-21 | Sumco Techxiv株式会社 | Cz法単結晶引上げ装置 |
CN1215203C (zh) * | 2001-11-01 | 2005-08-17 | 北京有色金属研究总院 | 直拉硅单晶炉热屏方法及热屏蔽器 |
JP4153293B2 (ja) | 2002-12-17 | 2008-09-24 | コバレントマテリアル株式会社 | シリコン単結晶引上方法 |
CN1233883C (zh) * | 2003-10-15 | 2005-12-28 | 浙江大学 | 一种磁场下生长低缺陷密度直拉硅单晶的方法 |
JP2006069841A (ja) * | 2004-09-02 | 2006-03-16 | Sumco Corp | 磁場印加式シリコン単結晶の引上げ方法 |
US7427325B2 (en) * | 2005-12-30 | 2008-09-23 | Siltron, Inc. | Method for producing high quality silicon single crystal ingot and silicon single crystal wafer made thereby |
JP4829176B2 (ja) * | 2007-06-08 | 2011-12-07 | シルトロニック・ジャパン株式会社 | 単結晶の製造方法 |
-
2009
- 2009-05-13 AT AT09006477T patent/ATE539182T1/de active
- 2009-05-13 EP EP09006477A patent/EP2270264B1/en active Active
-
2010
- 2010-03-08 SG SG201001623-6A patent/SG166718A1/en unknown
- 2010-03-30 CN CN201010154972.8A patent/CN101886289B/zh active Active
- 2010-04-01 KR KR1020100029964A patent/KR101301892B1/ko active IP Right Grant
- 2010-04-23 TW TW099112843A patent/TWI424102B/zh active
- 2010-04-23 US US12/765,896 patent/US8460462B2/en active Active
- 2010-05-11 JP JP2010109256A patent/JP5618614B2/ja active Active
-
2013
- 2013-04-08 US US13/858,137 patent/US8679251B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
TW201040329A (en) | 2010-11-16 |
TWI424102B (zh) | 2014-01-21 |
JP5618614B2 (ja) | 2014-11-05 |
JP2010265168A (ja) | 2010-11-25 |
US20130220216A1 (en) | 2013-08-29 |
KR20100122852A (ko) | 2010-11-23 |
CN101886289A (zh) | 2010-11-17 |
CN101886289B (zh) | 2013-09-25 |
EP2270264B1 (en) | 2011-12-28 |
US8460462B2 (en) | 2013-06-11 |
ATE539182T1 (de) | 2012-01-15 |
US20100288185A1 (en) | 2010-11-18 |
US8679251B2 (en) | 2014-03-25 |
KR101301892B1 (ko) | 2013-09-04 |
EP2270264A1 (en) | 2011-01-05 |
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