SG158756A1 - Hole inspection method and apparatus - Google Patents
Hole inspection method and apparatusInfo
- Publication number
- SG158756A1 SG158756A1 SG200805209-4A SG2008052094A SG158756A1 SG 158756 A1 SG158756 A1 SG 158756A1 SG 2008052094 A SG2008052094 A SG 2008052094A SG 158756 A1 SG158756 A1 SG 158756A1
- Authority
- SG
- Singapore
- Prior art keywords
- hole
- extremities
- internal surface
- flat image
- inspection apparatus
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2425—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures of screw-threads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG200805209-4A SG158756A1 (en) | 2008-07-10 | 2008-07-10 | Hole inspection method and apparatus |
US13/003,247 US9874436B2 (en) | 2008-07-10 | 2009-07-09 | Hole inspection method and apparatus |
TW098123166A TWI486576B (zh) | 2008-07-10 | 2009-07-09 | 孔洞檢測方法及其裝置 |
DE112009001650.2T DE112009001650B4 (de) | 2008-07-10 | 2009-07-09 | Lochinspektionsverfahren und -vorrichtung |
CN200980135804.XA CN102171553B (zh) | 2008-07-10 | 2009-07-09 | 孔洞检测方法及其装置 |
PCT/SG2009/000246 WO2010005399A2 (en) | 2008-07-10 | 2009-07-09 | Hole inspection method and apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG200805209-4A SG158756A1 (en) | 2008-07-10 | 2008-07-10 | Hole inspection method and apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
SG158756A1 true SG158756A1 (en) | 2010-02-26 |
Family
ID=41507617
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200805209-4A SG158756A1 (en) | 2008-07-10 | 2008-07-10 | Hole inspection method and apparatus |
Country Status (6)
Country | Link |
---|---|
US (1) | US9874436B2 (de) |
CN (1) | CN102171553B (de) |
DE (1) | DE112009001650B4 (de) |
SG (1) | SG158756A1 (de) |
TW (1) | TWI486576B (de) |
WO (1) | WO2010005399A2 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG158756A1 (en) * | 2008-07-10 | 2010-02-26 | Visionxtreme Pte Ltd | Hole inspection method and apparatus |
JP5601984B2 (ja) * | 2010-11-16 | 2014-10-08 | 東洋鋼鈑株式会社 | 多孔板表面検査方法及び多孔板表面検査装置 |
CN104062304B (zh) * | 2014-07-16 | 2017-07-07 | 必诺机械(东莞)有限公司 | 一种小开口大内腔产品内部检测装置和检测方法 |
JP6509146B2 (ja) * | 2016-02-24 | 2019-05-08 | 株式会社豊田中央研究所 | 検査装置および検査方法 |
CN105891218A (zh) * | 2016-05-09 | 2016-08-24 | 成都慧信实验设备有限公司 | 检测电子元件表面缺陷的装置 |
US10302598B2 (en) | 2016-10-24 | 2019-05-28 | General Electric Company | Corrosion and crack detection for fastener nuts |
AT521298A1 (de) * | 2018-06-04 | 2019-12-15 | Alicona Imaging Gmbh | Verfahren zur optischen Erfassung der Geometrie eines Werkstücks |
CN110793968A (zh) * | 2018-08-02 | 2020-02-14 | 由田新技股份有限公司 | 辨识孔壁瑕疵的检测设备 |
CN109099839B (zh) * | 2018-08-23 | 2021-02-12 | 武汉中观自动化科技有限公司 | 一种用于测量工件表面圆孔的扫描仪辅助配件及方法 |
CN109341570B (zh) * | 2018-09-19 | 2020-09-08 | 中船重工鹏力(南京)智能装备系统有限公司 | 一种基于机器视觉的内螺纹检测方法及系统 |
DE102019134884A1 (de) * | 2019-12-18 | 2021-06-24 | Rheinmetall Air Defence Ag | Detektionsvorrichtung und Verfahren zur Detektion von Störfaktoren in einem Waffenrohr oder Laderohr einer Rohrwaffe |
CN113237409B (zh) * | 2021-06-29 | 2023-04-11 | 中国航发贵州黎阳航空动力有限公司 | 一种台阶孔深度测量装置 |
CN114964032B (zh) * | 2022-05-18 | 2023-07-18 | 北京理工大学 | 基于机器视觉的盲孔深度测量方法及装置 |
US20240027360A1 (en) * | 2022-07-25 | 2024-01-25 | Perfect Point EDM | Handheld fastener removal inspection device |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61270600A (ja) * | 1985-05-23 | 1986-11-29 | Osaka Gas Co Ltd | 壁面検査装置 |
US4914289A (en) * | 1988-10-26 | 1990-04-03 | Inex-Vistech Technologies Incorporated | Article inspection system for analyzing end and adjacent sides |
JP2500961B2 (ja) * | 1990-11-27 | 1996-05-29 | 大日本スクリーン製造株式会社 | プリント基板の座残り検査方法 |
US5812693A (en) * | 1994-10-17 | 1998-09-22 | Chrysler Corporation | Integrated machine vision inspection and rework system -- CIP |
JPH08178858A (ja) * | 1994-12-26 | 1996-07-12 | Nec Corp | スルーホール検査装置 |
JPH09196856A (ja) * | 1996-01-23 | 1997-07-31 | Tsubakimoto Chain Co | 表面検査方法、表面検査装置及びプリズム |
US6324298B1 (en) * | 1998-07-15 | 2001-11-27 | August Technology Corp. | Automated wafer defect inspection system and a process of performing such inspection |
JP3592615B2 (ja) | 1999-06-07 | 2004-11-24 | カネボウ株式会社 | 物品の内面検査装置 |
DE10052184A1 (de) * | 2000-10-20 | 2002-05-02 | Datacard Corp | Prüfverfahren |
JP3965549B2 (ja) * | 2001-03-16 | 2007-08-29 | 凸版印刷株式会社 | 容器の異物や汚れ検査方法および装置 |
JP4066409B2 (ja) * | 2002-02-25 | 2008-03-26 | 株式会社ロゼフテクノロジー | タップ穴検査方法およびその装置 |
US7643137B2 (en) * | 2003-03-26 | 2010-01-05 | Nikon Corporation | Defect inspection apparatus, defect inspection method and method of inspecting hole pattern |
JP2005181144A (ja) * | 2003-12-19 | 2005-07-07 | Chuo Motor Wheel Co Ltd | 車両用ホイールリムの溶接部検出装置 |
DE102005023353A1 (de) * | 2004-06-08 | 2006-01-05 | Micro-Epsilon Messtechnik Gmbh & Co Kg | Vorrichtung und Verfahren zum Prüfen von Oberflächen in Inneren von Löchern |
FI117650B (fi) * | 2004-10-27 | 2006-12-29 | Mapvision Ltd Oy | Symmetria-akselin määrittäminen |
US7292331B2 (en) * | 2005-03-15 | 2007-11-06 | Microview Technologies Pte Ltd | Inspection lighting head system and method of operation |
JP2006305608A (ja) * | 2005-04-28 | 2006-11-09 | Toshiba Corp | レーザ加工装置、及びレーザ加工方法 |
JP2007010620A (ja) * | 2005-07-04 | 2007-01-18 | Fanuc Ltd | ねじ部検査装置及びねじ部検査方法 |
US7436509B2 (en) * | 2006-10-23 | 2008-10-14 | Emhart Glass S.A. | Machine for inspecting glass containers |
JP5124147B2 (ja) * | 2007-02-01 | 2013-01-23 | 三洋電機株式会社 | カメラ校正装置及び方法並びに車両 |
US8014586B2 (en) * | 2007-05-24 | 2011-09-06 | Applied Vision Corporation | Apparatus and methods for container inspection |
CN101109716B (zh) * | 2007-08-01 | 2012-05-02 | 北京理工大学 | 孔内表面的光学检测方法 |
US8395661B1 (en) * | 2009-02-16 | 2013-03-12 | Seektech, Inc. | Pipe inspection system with selective image capture |
SG158756A1 (en) * | 2008-07-10 | 2010-02-26 | Visionxtreme Pte Ltd | Hole inspection method and apparatus |
-
2008
- 2008-07-10 SG SG200805209-4A patent/SG158756A1/en unknown
-
2009
- 2009-07-09 DE DE112009001650.2T patent/DE112009001650B4/de not_active Expired - Fee Related
- 2009-07-09 WO PCT/SG2009/000246 patent/WO2010005399A2/en active Application Filing
- 2009-07-09 US US13/003,247 patent/US9874436B2/en not_active Expired - Fee Related
- 2009-07-09 TW TW098123166A patent/TWI486576B/zh not_active IP Right Cessation
- 2009-07-09 CN CN200980135804.XA patent/CN102171553B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE112009001650T5 (de) | 2011-04-21 |
DE112009001650B4 (de) | 2017-08-03 |
CN102171553B (zh) | 2015-05-27 |
CN102171553A (zh) | 2011-08-31 |
TWI486576B (zh) | 2015-06-01 |
US20110128368A1 (en) | 2011-06-02 |
US9874436B2 (en) | 2018-01-23 |
WO2010005399A2 (en) | 2010-01-14 |
TW201011281A (en) | 2010-03-16 |
WO2010005399A3 (en) | 2010-04-15 |
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