SG158756A1 - Hole inspection method and apparatus - Google Patents

Hole inspection method and apparatus

Info

Publication number
SG158756A1
SG158756A1 SG200805209-4A SG2008052094A SG158756A1 SG 158756 A1 SG158756 A1 SG 158756A1 SG 2008052094 A SG2008052094 A SG 2008052094A SG 158756 A1 SG158756 A1 SG 158756A1
Authority
SG
Singapore
Prior art keywords
hole
extremities
internal surface
flat image
inspection apparatus
Prior art date
Application number
SG200805209-4A
Other languages
English (en)
Inventor
Victor Vertoprakhov
Yew Tian Poh
Original Assignee
Visionxtreme Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Visionxtreme Pte Ltd filed Critical Visionxtreme Pte Ltd
Priority to SG200805209-4A priority Critical patent/SG158756A1/en
Priority to US13/003,247 priority patent/US9874436B2/en
Priority to TW098123166A priority patent/TWI486576B/zh
Priority to DE112009001650.2T priority patent/DE112009001650B4/de
Priority to CN200980135804.XA priority patent/CN102171553B/zh
Priority to PCT/SG2009/000246 priority patent/WO2010005399A2/en
Publication of SG158756A1 publication Critical patent/SG158756A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2425—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures of screw-threads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SG200805209-4A 2008-07-10 2008-07-10 Hole inspection method and apparatus SG158756A1 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
SG200805209-4A SG158756A1 (en) 2008-07-10 2008-07-10 Hole inspection method and apparatus
US13/003,247 US9874436B2 (en) 2008-07-10 2009-07-09 Hole inspection method and apparatus
TW098123166A TWI486576B (zh) 2008-07-10 2009-07-09 孔洞檢測方法及其裝置
DE112009001650.2T DE112009001650B4 (de) 2008-07-10 2009-07-09 Lochinspektionsverfahren und -vorrichtung
CN200980135804.XA CN102171553B (zh) 2008-07-10 2009-07-09 孔洞检测方法及其装置
PCT/SG2009/000246 WO2010005399A2 (en) 2008-07-10 2009-07-09 Hole inspection method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200805209-4A SG158756A1 (en) 2008-07-10 2008-07-10 Hole inspection method and apparatus

Publications (1)

Publication Number Publication Date
SG158756A1 true SG158756A1 (en) 2010-02-26

Family

ID=41507617

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200805209-4A SG158756A1 (en) 2008-07-10 2008-07-10 Hole inspection method and apparatus

Country Status (6)

Country Link
US (1) US9874436B2 (de)
CN (1) CN102171553B (de)
DE (1) DE112009001650B4 (de)
SG (1) SG158756A1 (de)
TW (1) TWI486576B (de)
WO (1) WO2010005399A2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG158756A1 (en) * 2008-07-10 2010-02-26 Visionxtreme Pte Ltd Hole inspection method and apparatus
JP5601984B2 (ja) * 2010-11-16 2014-10-08 東洋鋼鈑株式会社 多孔板表面検査方法及び多孔板表面検査装置
CN104062304B (zh) * 2014-07-16 2017-07-07 必诺机械（东莞）有限公司 一种小开口大内腔产品内部检测装置和检测方法
JP6509146B2 (ja) * 2016-02-24 2019-05-08 株式会社豊田中央研究所 検査装置および検査方法
CN105891218A (zh) * 2016-05-09 2016-08-24 成都慧信实验设备有限公司 检测电子元件表面缺陷的装置
US10302598B2 (en) 2016-10-24 2019-05-28 General Electric Company Corrosion and crack detection for fastener nuts
AT521298A1 (de) * 2018-06-04 2019-12-15 Alicona Imaging Gmbh Verfahren zur optischen Erfassung der Geometrie eines Werkstücks
CN110793968A (zh) * 2018-08-02 2020-02-14 由田新技股份有限公司 辨识孔壁瑕疵的检测设备
CN109099839B (zh) * 2018-08-23 2021-02-12 武汉中观自动化科技有限公司 一种用于测量工件表面圆孔的扫描仪辅助配件及方法
CN109341570B (zh) * 2018-09-19 2020-09-08 中船重工鹏力（南京）智能装备系统有限公司 一种基于机器视觉的内螺纹检测方法及系统
DE102019134884A1 (de) * 2019-12-18 2021-06-24 Rheinmetall Air Defence Ag Detektionsvorrichtung und Verfahren zur Detektion von Störfaktoren in einem Waffenrohr oder Laderohr einer Rohrwaffe
CN113237409B (zh) * 2021-06-29 2023-04-11 中国航发贵州黎阳航空动力有限公司 一种台阶孔深度测量装置
CN114964032B (zh) * 2022-05-18 2023-07-18 北京理工大学 基于机器视觉的盲孔深度测量方法及装置
US20240027360A1 (en) * 2022-07-25 2024-01-25 Perfect Point EDM Handheld fastener removal inspection device

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61270600A (ja) * 1985-05-23 1986-11-29 Osaka Gas Co Ltd 壁面検査装置
US4914289A (en) * 1988-10-26 1990-04-03 Inex-Vistech Technologies Incorporated Article inspection system for analyzing end and adjacent sides
JP2500961B2 (ja) * 1990-11-27 1996-05-29 大日本スクリーン製造株式会社 プリント基板の座残り検査方法
US5812693A (en) * 1994-10-17 1998-09-22 Chrysler Corporation Integrated machine vision inspection and rework system -- CIP
JPH08178858A (ja) * 1994-12-26 1996-07-12 Nec Corp スルーホール検査装置
JPH09196856A (ja) * 1996-01-23 1997-07-31 Tsubakimoto Chain Co 表面検査方法、表面検査装置及びプリズム
US6324298B1 (en) * 1998-07-15 2001-11-27 August Technology Corp. Automated wafer defect inspection system and a process of performing such inspection
JP3592615B2 (ja) 1999-06-07 2004-11-24 カネボウ株式会社 物品の内面検査装置
DE10052184A1 (de) * 2000-10-20 2002-05-02 Datacard Corp Prüfverfahren
JP3965549B2 (ja) * 2001-03-16 2007-08-29 凸版印刷株式会社 容器の異物や汚れ検査方法および装置
JP4066409B2 (ja) * 2002-02-25 2008-03-26 株式会社ロゼフテクノロジー タップ穴検査方法およびその装置
US7643137B2 (en) * 2003-03-26 2010-01-05 Nikon Corporation Defect inspection apparatus, defect inspection method and method of inspecting hole pattern
JP2005181144A (ja) * 2003-12-19 2005-07-07 Chuo Motor Wheel Co Ltd 車両用ホイールリムの溶接部検出装置
DE102005023353A1 (de) * 2004-06-08 2006-01-05 Micro-Epsilon Messtechnik Gmbh & Co Kg Vorrichtung und Verfahren zum Prüfen von Oberflächen in Inneren von Löchern
FI117650B (fi) * 2004-10-27 2006-12-29 Mapvision Ltd Oy Symmetria-akselin määrittäminen
US7292331B2 (en) * 2005-03-15 2007-11-06 Microview Technologies Pte Ltd Inspection lighting head system and method of operation
JP2006305608A (ja) * 2005-04-28 2006-11-09 Toshiba Corp レーザ加工装置、及びレーザ加工方法
JP2007010620A (ja) * 2005-07-04 2007-01-18 Fanuc Ltd ねじ部検査装置及びねじ部検査方法
US7436509B2 (en) * 2006-10-23 2008-10-14 Emhart Glass S.A. Machine for inspecting glass containers
JP5124147B2 (ja) * 2007-02-01 2013-01-23 三洋電機株式会社 カメラ校正装置及び方法並びに車両
US8014586B2 (en) * 2007-05-24 2011-09-06 Applied Vision Corporation Apparatus and methods for container inspection
CN101109716B (zh) * 2007-08-01 2012-05-02 北京理工大学 孔内表面的光学检测方法
US8395661B1 (en) * 2009-02-16 2013-03-12 Seektech, Inc. Pipe inspection system with selective image capture
SG158756A1 (en) * 2008-07-10 2010-02-26 Visionxtreme Pte Ltd Hole inspection method and apparatus

Also Published As

Publication number Publication date
DE112009001650T5 (de) 2011-04-21
DE112009001650B4 (de) 2017-08-03
CN102171553B (zh) 2015-05-27
CN102171553A (zh) 2011-08-31
TWI486576B (zh) 2015-06-01
US20110128368A1 (en) 2011-06-02
US9874436B2 (en) 2018-01-23
WO2010005399A2 (en) 2010-01-14
TW201011281A (en) 2010-03-16
WO2010005399A3 (en) 2010-04-15

Similar Documents

Publication Publication Date Title
SG158756A1 (en) Hole inspection method and apparatus
SG10201900569TA (en) A microscope module for imaging a sample
ATE419519T1 (de) Verfahren und vorrichtung zur optischen inspektion eines gegenstands
TW200801582A (en) Image inspecting device and method for a head-mounted display
EP1956410A3 (de) Vorrichtung und Verfahren zur 4D-Lichtfelderfassung einer Szene
EP2442095A3 (de) Lochprüfung
WO2014117954A8 (en) Method for identifying objects in a subject's ear
EP2557001A3 (de) Detektionsvorrichtung und -verfahren
CL2007001329A1 (es) Sistema y metodo para detectar una pieza danada o perdida de una maquina, donde comprende un aparato de captura de imagen de una maquina contra un fondo,el cual se mueve en relacion a la maquina en el tiempo;y un procesador para las imagenes capturadas para determinar si una o mas piezas de la maquina estan danadas o perdidas.
TW200714397A (en) Laser repair apparatus
MX2016017009A (es) Dispositivo de examen y metodo para examinar paredes internas en un cuerpo hueco.
ATE543155T1 (de) Bildverarbeitungsverfahren, bildverarbeitungsprogramm, bildverarbeitungseinrichtung und kamera
WO2007012839A3 (en) Light measurement method and apparatus
ATE537426T1 (de) Automatische inspektionsvorrichtung für stents und verfahren zur automatischen inspektion
WO2010072920A8 (fr) Procede de controle non destructif d'une piece mecanique
TW200745536A (en) End section inspecting apparatus
TW200712479A (en) Surface defect inspection apparatus and surface defect inspection method
EP2402734A3 (de) Mikrofeinteilchenanalysevorrichtung und -verfahren
EP2354782A3 (de) Fehlererkennungsvorrichtung und Fehlererkennungsverfahren
WO2012117353A3 (en) Method and apparatus for measuring the thickness of a transparent object in an automatic production line
SG169314A1 (en) Method and device for detecting defects in an object
WO2010078456A3 (en) Illuminated optical apparatus
TW200802666A (en) Wafer bevel inspection mechanism
ATE522880T1 (de) Verfahren und gerät zur identifizierung eines individuums mittels optischer erfassung eines körperabdruckbildes
WO2010004205A3 (fr) Procede et dispositif optique pour analyser une marque sur une paroi courbe translucide ou transparente