ATE419519T1 - Verfahren und vorrichtung zur optischen inspektion eines gegenstands - Google Patents
Verfahren und vorrichtung zur optischen inspektion eines gegenstandsInfo
- Publication number
- ATE419519T1 ATE419519T1 AT05783093T AT05783093T ATE419519T1 AT E419519 T1 ATE419519 T1 AT E419519T1 AT 05783093 T AT05783093 T AT 05783093T AT 05783093 T AT05783093 T AT 05783093T AT E419519 T1 ATE419519 T1 AT E419519T1
- Authority
- AT
- Austria
- Prior art keywords
- light
- image
- shade pattern
- detected image
- detecting
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 238000007689 inspection Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9081—Inspection especially designed for plastic containers, e.g. preforms
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/40—Analysis of texture
- G06T7/41—Analysis of texture based on statistical description of texture
- G06T7/42—Analysis of texture based on statistical description of texture using transform domain methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
- G01N2021/8832—Structured background, e.g. for transparent objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8896—Circuits specially adapted for system specific signal conditioning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/IB2005/002664 WO2007029048A1 (en) | 2005-09-09 | 2005-09-09 | Method and apparatus for visually inspecting an object |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE419519T1 true ATE419519T1 (de) | 2009-01-15 |
Family
ID=36190736
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT05783093T ATE419519T1 (de) | 2005-09-09 | 2005-09-09 | Verfahren und vorrichtung zur optischen inspektion eines gegenstands |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8254659B2 (de) |
| EP (1) | EP1931973B1 (de) |
| CN (1) | CN101297192B (de) |
| AT (1) | ATE419519T1 (de) |
| DE (1) | DE602005012163D1 (de) |
| TW (1) | TW200728712A (de) |
| WO (1) | WO2007029048A1 (de) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2546758C (en) * | 2006-05-12 | 2009-07-07 | Alberta Research Council Inc. | A system and a method for detecting a damaged or missing machine part |
| DE102009020919A1 (de) * | 2009-05-12 | 2010-11-18 | Krones Ag | Vorrichtung zum Erkennen von Erhebungen und/oder Vertiefungen auf Flaschen, insbesondere in einer Etikettiermaschine |
| DE102009020920A1 (de) * | 2009-05-12 | 2010-11-18 | Krones Ag | Inspektionsvorrichtung zur Erkennung von Embossings und/oder Etiketten auf transparenten Gefäßen, insbesondere Getränkeflaschen |
| IT1394886B1 (it) * | 2009-07-17 | 2012-07-20 | Sacmi | Sistema di ispezione e pesatura di oggetti, in particolare preforme. |
| FR2958751B1 (fr) * | 2010-04-13 | 2012-05-25 | Iris Inspection Machines | Procede de detection de defauts dans des articles verriers et installation pour la mise en oeuvre dudit procede |
| US20120127290A1 (en) * | 2010-05-20 | 2012-05-24 | Tsuyoshi Tojo | Liquid medicine identification apparatus and liquid medicine identification method |
| GB2482473A (en) * | 2010-06-29 | 2012-02-08 | Constar Internat Uk Ltd | Inspection of articles |
| US20120098959A1 (en) * | 2010-10-20 | 2012-04-26 | Glasstech, Inc. | Method and apparatus for measuring transmitted optical distortion in glass sheets |
| CN102519979B (zh) * | 2011-12-10 | 2013-12-04 | 山东明佳包装检测科技有限公司 | Pet瓶检测定位中消除水珠影响的方法 |
| US20140286563A1 (en) * | 2013-03-19 | 2014-09-25 | Industrial Video Solutions, Inc. | Accurate detection of low-contrast defects in transparent material |
| CH707559A2 (de) * | 2013-03-22 | 2014-09-30 | Finatec Holding Ag | Verfahren und System zur Prüfung der Farbbeschaffenheit von Preforms. |
| CN105444683B (zh) * | 2014-08-26 | 2018-07-03 | 达观科技有限公司 | 透光膜的检测系统及其检测方法 |
| US20160178535A1 (en) * | 2014-12-17 | 2016-06-23 | Xerox Corporation | Inspection Device And Method |
| FI20155171A (fi) * | 2015-03-13 | 2016-09-14 | Conexbird Oy | Kontin tarkastusjärjestely, -menetelmä, -laitteisto ja -ohjelmisto |
| CH711104A2 (de) * | 2015-05-18 | 2016-11-30 | Finatec Holding Ag | Prüfverfahren und Prüfsystem zur Prüfung von Werkstücken. |
| US9851200B2 (en) | 2015-06-26 | 2017-12-26 | Glasstech, Inc. | Non-contact gaging system and method for contoured panels having specular surfaces |
| US9952039B2 (en) | 2015-06-26 | 2018-04-24 | Glasstech, Inc. | System and method for measuring reflected optical distortion in contoured panels having specular surfaces |
| US9933251B2 (en) | 2015-06-26 | 2018-04-03 | Glasstech, Inc. | Non-contact gaging system and method for contoured glass sheets |
| US9952037B2 (en) | 2015-06-26 | 2018-04-24 | Glasstech, Inc. | System and method for developing three-dimensional surface information corresponding to a contoured sheet |
| US9470641B1 (en) * | 2015-06-26 | 2016-10-18 | Glasstech, Inc. | System and method for measuring reflected optical distortion in contoured glass sheets |
| US9841276B2 (en) | 2015-06-26 | 2017-12-12 | Glasstech, Inc. | System and method for developing three-dimensional surface information corresponding to a contoured glass sheet |
| CN107121443B (zh) * | 2016-02-24 | 2021-02-12 | 贝克顿迪金森法国公司 | 用于检测透明量筒中的颗粒的检查系统和方法 |
| US10422755B2 (en) * | 2016-12-07 | 2019-09-24 | Applied Vision Corporation | Identifying defects in transparent containers |
| US20190238796A1 (en) | 2017-05-11 | 2019-08-01 | Jacob Nathaniel Allen | Object Inspection System And Method For Inspecting An Object |
| DE102019208295A1 (de) | 2019-06-06 | 2020-12-10 | Krones Ag | Verfahren und Vorrichtung zur optischen Inspektion von Behältern |
| DE102019208299A1 (de) | 2019-06-06 | 2020-12-10 | Krones Ag | Verfahren und Vorrichtung zur optischen Inspektion von Behältern |
| CN110243831B (zh) * | 2019-06-06 | 2022-02-15 | 锐捷网络股份有限公司 | 表面缺陷采集系统、表面缺陷检测方法、装置及存储介质 |
| DE102019208296A1 (de) | 2019-06-06 | 2020-12-10 | Krones Ag | Verfahren und Vorrichtung zur optischen Inspektion von Behältern |
| CN111107257A (zh) * | 2020-01-20 | 2020-05-05 | 成都德图福思科技有限公司 | 针对透明介质表面刻蚀或浮雕图案进行高对比度成像的方法 |
| CN112955844A (zh) * | 2020-06-30 | 2021-06-11 | 深圳市大疆创新科技有限公司 | 目标跟踪方法、设备、系统及存储介质 |
| DE102022104990A1 (de) | 2022-03-03 | 2023-09-07 | Emhart Glass Sa | VORRICHTUNG UND VERFAHREN ZUM INSPIZIEREN VON GEFÄßEN |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06100555B2 (ja) * | 1990-12-19 | 1994-12-12 | 東洋ガラス株式会社 | 透明物体の欠陥検査方法とその装置 |
| US5291560A (en) * | 1991-07-15 | 1994-03-01 | Iri Scan Incorporated | Biometric personal identification system based on iris analysis |
| US5659626A (en) * | 1994-10-20 | 1997-08-19 | Calspan Corporation | Fingerprint identification system |
| DE19741384A1 (de) * | 1997-09-19 | 1999-03-25 | Heuft Systemtechnik Gmbh | Verfahren zum Erkennen von diffus streuenden Materialien, Verunreinigungen und sonstigen Fehlern bei transparenten Gegenständen |
| US6304323B1 (en) | 1998-11-30 | 2001-10-16 | Kirin Techno-System Corporation | Method for detecting defect in bottle |
| US6100990A (en) * | 1999-06-14 | 2000-08-08 | Ford Motor Company | Method and apparatus for determining reflective optical quality using gray-scale patterns |
| US7196782B2 (en) * | 2000-09-20 | 2007-03-27 | Kla-Tencor Technologies Corp. | Methods and systems for determining a thin film characteristic and an electrical property of a specimen |
| US6424414B1 (en) * | 2000-10-16 | 2002-07-23 | Agr International, Inc. | Method and apparatus for detecting refractive defects in transparent containers |
| JP2004146782A (ja) * | 2002-08-29 | 2004-05-20 | Advanced Lcd Technologies Development Center Co Ltd | 結晶化状態のｉｎ−ｓｉｔｕモニタリング方法 |
| DE60314450T2 (de) * | 2002-12-16 | 2008-02-21 | Philips Intellectual Property & Standards Gmbh | Verfahren zum filtern von bildern mit streifenstrukturen |
| EP1479454B2 (de) | 2003-05-22 | 2011-01-26 | M. & G. Polymers U.S.A. LLC | Vorrichtung und Verfahren zur Qualitätsüberprüfung von Vorformlingen aus Kunststoff |
| CN1272734C (zh) * | 2004-05-20 | 2006-08-30 | 上海交通大学 | 基于非负矩阵分解的相关反馈图像检索方法 |
| US7251033B1 (en) * | 2004-06-02 | 2007-07-31 | Advanced Micro Devices, Inc. | In-situ reticle contamination detection system at exposure wavelength |
| US7463367B2 (en) * | 2004-07-13 | 2008-12-09 | Micron Technology, Inc. | Estimating overlay error and optical aberrations |
-
2005
- 2005-09-09 DE DE602005012163T patent/DE602005012163D1/de active Active
- 2005-09-09 EP EP05783093A patent/EP1931973B1/de active Active
- 2005-09-09 AT AT05783093T patent/ATE419519T1/de not_active IP Right Cessation
- 2005-09-09 US US11/991,716 patent/US8254659B2/en active Active
- 2005-09-09 CN CN200580051960XA patent/CN101297192B/zh active Active
- 2005-09-09 WO PCT/IB2005/002664 patent/WO2007029048A1/en active Application Filing
-
2006
- 2006-09-05 TW TW095132685A patent/TW200728712A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| EP1931973A1 (de) | 2008-06-18 |
| CN101297192A (zh) | 2008-10-29 |
| TW200728712A (en) | 2007-08-01 |
| CN101297192B (zh) | 2012-05-30 |
| EP1931973B1 (de) | 2008-12-31 |
| WO2007029048A1 (en) | 2007-03-15 |
| DE602005012163D1 (de) | 2009-02-12 |
| US20080310701A1 (en) | 2008-12-18 |
| US8254659B2 (en) | 2012-08-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |