SG155148A1 - Anisotropic silicon etchant composition - Google Patents
Anisotropic silicon etchant compositionInfo
- Publication number
- SG155148A1 SG155148A1 SG200901380-6A SG2009013806A SG155148A1 SG 155148 A1 SG155148 A1 SG 155148A1 SG 2009013806 A SG2009013806 A SG 2009013806A SG 155148 A1 SG155148 A1 SG 155148A1
- Authority
- SG
- Singapore
- Prior art keywords
- compound
- ingredients
- silicon
- alkaline compound
- quaternary ammonium
- Prior art date
Links
- 239000000203 mixture Substances 0.000 title abstract 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title abstract 2
- 229910052710 silicon Inorganic materials 0.000 title abstract 2
- 239000010703 silicon Substances 0.000 title abstract 2
- 150000001875 compounds Chemical class 0.000 abstract 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 4
- 239000004615 ingredient Substances 0.000 abstract 4
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 abstract 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 abstract 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 abstract 2
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 abstract 2
- -1 alkyl silicate Chemical class 0.000 abstract 2
- 239000004927 clay Substances 0.000 abstract 2
- 150000003242 quaternary ammonium salts Chemical class 0.000 abstract 2
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 abstract 1
- 239000005909 Kieselgur Substances 0.000 abstract 1
- 239000002253 acid Substances 0.000 abstract 1
- 229910021529 ammonia Inorganic materials 0.000 abstract 1
- 239000000908 ammonium hydroxide Substances 0.000 abstract 1
- 239000008119 colloidal silica Substances 0.000 abstract 1
- 229910021485 fumed silica Inorganic materials 0.000 abstract 1
- 229910010272 inorganic material Inorganic materials 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 150000002894 organic compounds Chemical class 0.000 abstract 1
- 125000001453 quaternary ammonium group Chemical group 0.000 abstract 1
- 239000000741 silica gel Substances 0.000 abstract 1
- 229910002027 silica gel Inorganic materials 0.000 abstract 1
- RMAQACBXLXPBSY-UHFFFAOYSA-N silicic acid Chemical compound O[Si](O)(O)O RMAQACBXLXPBSY-UHFFFAOYSA-N 0.000 abstract 1
- 125000000123 silicon containing inorganic group Chemical group 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 239000002210 silicon-based material Substances 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
- C09K13/06—Etching, surface-brightening or pickling compositions containing an inorganic acid with organic material
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/02—Etching, surface-brightening or pickling compositions containing an alkali metal hydroxide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30604—Chemical etching
- H01L21/30608—Anisotropic liquid etching
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Inorganic Chemistry (AREA)
- Weting (AREA)
- ing And Chemical Polishing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008047979A JP5302551B2 (ja) | 2008-02-28 | 2008-02-28 | シリコン異方性エッチング液組成物 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG155148A1 true SG155148A1 (en) | 2009-09-30 |
Family
ID=41012473
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200901380-6A SG155148A1 (en) | 2008-02-28 | 2009-02-26 | Anisotropic silicon etchant composition |
Country Status (6)
Country | Link |
---|---|
US (1) | US20090218542A1 (ja) |
JP (1) | JP5302551B2 (ja) |
KR (2) | KR101217431B1 (ja) |
CN (1) | CN101519592B (ja) |
SG (1) | SG155148A1 (ja) |
TW (1) | TWI390019B (ja) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102576674A (zh) * | 2009-10-02 | 2012-07-11 | 三菱瓦斯化学株式会社 | 硅蚀刻液和蚀刻方法 |
JP2011124546A (ja) * | 2009-10-14 | 2011-06-23 | Rohm & Haas Electronic Materials Llc | 半導体ウェハを清浄化しマイクロエッチングする方法 |
US7994062B2 (en) * | 2009-10-30 | 2011-08-09 | Sachem, Inc. | Selective silicon etch process |
DE102009060931A1 (de) * | 2009-12-23 | 2011-06-30 | Gebr. Schmid GmbH & Co., 72250 | Verfahren und Vorrichtung zur Behandlung von Siliziumsubstraten |
EP2355138B1 (en) | 2010-01-28 | 2016-08-24 | Canon Kabushiki Kaisha | Liquid composition, method of producing silicon substrate, and method of producing liquid discharge head substrate |
US20120112321A1 (en) * | 2010-11-04 | 2012-05-10 | Solarworld Industries America, Inc. | Alkaline etching liquid for texturing a silicon wafer surface |
US20110244184A1 (en) * | 2010-04-01 | 2011-10-06 | Solarworld Industries America, Inc. | Alkaline etching solution for texturing a silicon wafer surface |
EP2372779B9 (en) * | 2010-04-01 | 2015-01-07 | SolarWorld Industries America, Inc. | Alkaline etching liquid for texturing a silicon wafer surface |
WO2011146206A1 (en) * | 2010-05-18 | 2011-11-24 | Asia Union Electronic Chemical Corporation | Improved chemistries for the texturing of silicon substrates |
EP2618367B1 (en) * | 2010-09-17 | 2016-10-19 | Mitsubishi Gas Chemical Company, Inc. | Silicon etching fluid and method for producing transistor using same |
JP5869368B2 (ja) * | 2011-03-04 | 2016-02-24 | 富士フイルム株式会社 | キャパシタ構造の形成方法及びこれに用いられるシリコンエッチング液 |
US8771531B2 (en) * | 2011-04-19 | 2014-07-08 | Canon Kabushiki Kaisha | Method of producing substrate for liquid ejection head |
JP2012227304A (ja) * | 2011-04-19 | 2012-11-15 | Hayashi Junyaku Kogyo Kk | エッチング液組成物およびエッチング方法 |
KR20120136881A (ko) * | 2011-06-10 | 2012-12-20 | 동우 화인켐 주식회사 | 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법 |
KR20120136882A (ko) * | 2011-06-10 | 2012-12-20 | 동우 화인켐 주식회사 | 결정성 실리콘 웨이퍼의 텍스쳐 에칭액 조성물 및 텍스쳐 에칭방법 |
JP2015008167A (ja) * | 2011-10-28 | 2015-01-15 | 三菱電機株式会社 | シリコン基板のエッチング方法およびシリコン基板のエッチング液 |
JP5439466B2 (ja) * | 2011-12-26 | 2014-03-12 | 富士フイルム株式会社 | シリコンエッチング方法、これに用いられるシリコンエッチング液、及びそのキット |
JP5575822B2 (ja) * | 2012-02-08 | 2014-08-20 | 第一工業製薬株式会社 | テクスチャー形成用エッチング液 |
JP6142880B2 (ja) * | 2013-01-15 | 2017-06-07 | 三菱瓦斯化学株式会社 | シリコンエッチング液およびエッチング方法並びに微小電気機械素子 |
TWI471457B (zh) * | 2013-02-22 | 2015-02-01 | Uwin Nanotech Co Ltd | 金屬剝除添加劑、含其之組合物、及使用該組合物以剝除金屬的方法 |
JP5945066B2 (ja) | 2013-03-19 | 2016-07-05 | 長州産業株式会社 | 光起電力素子の製造方法 |
JP6406908B2 (ja) | 2014-07-18 | 2018-10-17 | キヤノン株式会社 | シリコン基板をエッチングするエッチング方法、及び前記エッチング方法を含む液体吐出ヘッドの製造方法 |
US9873833B2 (en) * | 2014-12-29 | 2018-01-23 | Versum Materials Us, Llc | Etchant solutions and method of use thereof |
US10400167B2 (en) | 2015-11-25 | 2019-09-03 | Versum Materials Us, Llc | Etching compositions and methods for using same |
CA3049418C (en) * | 2017-01-18 | 2022-05-03 | Arconic Inc. | Methods of preparing 7xxx aluminum alloys for adhesive bonding, and products relating to the same |
JP6813548B2 (ja) * | 2018-09-14 | 2021-01-13 | 株式会社東芝 | 添加剤、添加剤分散液、エッチング原料ユニット、添加剤供給装置、エッチング装置、及びエッチング方法 |
WO2020129737A1 (ja) * | 2018-12-18 | 2020-06-25 | 株式会社トクヤマ | シリコンエッチング液 |
US11168253B2 (en) | 2019-01-08 | 2021-11-09 | Samsung Electronics Co., Ltd. | Silicon layer etchant composition and method of forming pattern by using the same |
KR20220033141A (ko) * | 2020-09-09 | 2022-03-16 | 동우 화인켐 주식회사 | 실리콘 식각액 조성물, 이를 이용한 패턴 형성 방법 및 어레이 기판의 제조 방법, 및 이에 따라 제조된 어레이 기판 |
WO2022190903A1 (ja) * | 2021-03-11 | 2022-09-15 | 富士フイルム株式会社 | 半導体処理用組成物、被処理物の処理方法 |
JP7490834B2 (ja) * | 2022-01-31 | 2024-05-27 | 花王株式会社 | 樹脂マスクの剥離方法 |
CN115287071B (zh) * | 2022-07-06 | 2023-08-25 | 湖北兴福电子材料股份有限公司 | 一种无c高选择性氮化硅蚀刻液 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5548694B2 (ja) * | 1972-11-27 | 1980-12-08 | ||
US4007464A (en) * | 1975-01-23 | 1977-02-08 | International Business Machines Corporation | Ink jet nozzle |
US4137123A (en) * | 1975-12-31 | 1979-01-30 | Motorola, Inc. | Texture etching of silicon: method |
JP3027030B2 (ja) * | 1991-06-19 | 2000-03-27 | 株式会社豊田中央研究所 | シリコンの異方性エッチング液 |
JP3444009B2 (ja) * | 1995-03-20 | 2003-09-08 | 日産自動車株式会社 | シリコン半導体の異方性エッチング方法 |
JP3525612B2 (ja) * | 1996-03-12 | 2004-05-10 | セイコーエプソン株式会社 | シリコンウェハーの加工方法及びそのシリコンウェハーを用いた電子機器 |
JP3970145B2 (ja) * | 2002-09-26 | 2007-09-05 | 株式会社豊田中央研究所 | シリコン異方性エッチング液及びそれを用いた半導体装置の製造方法 |
KR100491979B1 (ko) * | 2003-06-27 | 2005-05-27 | 한국전자통신연구원 | 초미세 채널 전계 효과 트랜지스터 및 그 제조방법 |
JP3994992B2 (ja) * | 2004-08-13 | 2007-10-24 | 三菱瓦斯化学株式会社 | シリコン微細加工に用いる異方性エッチング剤組成物及びエッチング方法 |
JP4517867B2 (ja) * | 2005-01-31 | 2010-08-04 | 株式会社Sumco | シリコンウェーハ表面形状制御用エッチング液及び該エッチング液を用いたシリコンウェーハの製造方法 |
JP5109261B2 (ja) * | 2006-02-10 | 2012-12-26 | 三菱瓦斯化学株式会社 | シリコン微細加工に用いるシリコン異方性エッチング剤組成物 |
US8961677B2 (en) * | 2006-04-26 | 2015-02-24 | Silbond Corporation | Suspension of nanoparticles and method for making the same |
MY150000A (en) * | 2006-05-02 | 2013-11-15 | Mimasu Semiconductor Ind Co | Process for producing semiconductor substrate, semiconductor substrate for solar application and etching solution |
-
2008
- 2008-02-28 JP JP2008047979A patent/JP5302551B2/ja active Active
-
2009
- 2009-02-17 KR KR1020090012908A patent/KR101217431B1/ko active IP Right Grant
- 2009-02-24 TW TW098105810A patent/TWI390019B/zh active
- 2009-02-25 CN CN2009100066008A patent/CN101519592B/zh active Active
- 2009-02-26 SG SG200901380-6A patent/SG155148A1/en unknown
- 2009-02-26 US US12/393,090 patent/US20090218542A1/en not_active Abandoned
-
2011
- 2011-04-26 KR KR1020110038898A patent/KR20110049763A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
CN101519592A (zh) | 2009-09-02 |
KR20090093814A (ko) | 2009-09-02 |
TW200944581A (en) | 2009-11-01 |
KR20110049763A (ko) | 2011-05-12 |
JP2009206335A (ja) | 2009-09-10 |
US20090218542A1 (en) | 2009-09-03 |
TWI390019B (zh) | 2013-03-21 |
JP5302551B2 (ja) | 2013-10-02 |
CN101519592B (zh) | 2013-06-05 |
KR101217431B1 (ko) | 2013-01-02 |
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