SG115831A1 - Polishing composition and polishing method - Google Patents

Polishing composition and polishing method

Info

Publication number
SG115831A1
SG115831A1 SG200502192A SG200502192A SG115831A1 SG 115831 A1 SG115831 A1 SG 115831A1 SG 200502192 A SG200502192 A SG 200502192A SG 200502192 A SG200502192 A SG 200502192A SG 115831 A1 SG115831 A1 SG 115831A1
Authority
SG
Singapore
Prior art keywords
polishing
composition
polishing composition
polishing method
Prior art date
Application number
SG200502192A
Other languages
English (en)
Inventor
Oh Junhui
Kawamura Atsunori
Matsuda Tsuyoshi
Hirano Tatsuhiko
Sakai Kenji
Hori Katsunobu
Original Assignee
Fujimi Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujimi Inc filed Critical Fujimi Inc
Publication of SG115831A1 publication Critical patent/SG115831A1/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1454Abrasive powders, suspensions and pastes for polishing
    • C09K3/1463Aqueous liquid suspensions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321After treatment
    • H01L21/32115Planarisation
    • H01L21/3212Planarisation by chemical mechanical polishing [CMP]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
SG200502192A 2004-03-24 2005-03-22 Polishing composition and polishing method SG115831A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004087261A JP4644434B2 (ja) 2004-03-24 2004-03-24 研磨用組成物

Publications (1)

Publication Number Publication Date
SG115831A1 true SG115831A1 (en) 2005-10-28

Family

ID=34858438

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200502192A SG115831A1 (en) 2004-03-24 2005-03-22 Polishing composition and polishing method

Country Status (7)

Country Link
US (1) US7550388B2 (zh)
EP (1) EP1580248A1 (zh)
JP (1) JP4644434B2 (zh)
KR (1) KR101110719B1 (zh)
CN (2) CN1837320B (zh)
SG (1) SG115831A1 (zh)
TW (2) TWI466991B (zh)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4316406B2 (ja) * 2004-03-22 2009-08-19 株式会社フジミインコーポレーテッド 研磨用組成物
JP4814502B2 (ja) * 2004-09-09 2011-11-16 株式会社フジミインコーポレーテッド 研磨用組成物及びそれを用いた研磨方法
JP2006086462A (ja) * 2004-09-17 2006-03-30 Fujimi Inc 研磨用組成物およびそれを用いた配線構造体の製造法
US8551202B2 (en) * 2006-03-23 2013-10-08 Cabot Microelectronics Corporation Iodate-containing chemical-mechanical polishing compositions and methods
US20090302266A1 (en) * 2006-04-03 2009-12-10 Jsr Corporation Aqueous dispersion for chemical mechanical polishing, chemical mechanical polishing method, and kit for preparing aqueous dispersion for chemical mechanical polishing
KR100948814B1 (ko) * 2006-09-27 2010-03-24 테크노세미켐 주식회사 텅스텐 배선 형성용 슬러리 조성물 및 이를 이용한 반도체소자의 제조 방법
US20080096385A1 (en) * 2006-09-27 2008-04-24 Hynix Semiconductor Inc. Slurry composition for forming tungsten pattern and method for manufacturing semiconductor device using the same
TW200916564A (en) * 2007-01-31 2009-04-16 Advanced Tech Materials Stabilization of polymer-silica dispersions for chemical mechanical polishing slurry applications
JP2008290169A (ja) * 2007-05-23 2008-12-04 Tdk Corp アルミナ膜研磨用組成物およびそれを用いる化学機械研磨方法
CN103045099B (zh) * 2007-09-14 2015-03-25 安集微电子(上海)有限公司 用于抛光多晶硅的化学机械抛光液
US7922926B2 (en) * 2008-01-08 2011-04-12 Cabot Microelectronics Corporation Composition and method for polishing nickel-phosphorous-coated aluminum hard disks
KR101686255B1 (ko) * 2008-10-03 2016-12-13 바스프 에스이 향상된 성능의 화학적 기계적 연마(cmp) 연마 용액
KR101279964B1 (ko) * 2008-12-29 2013-07-05 제일모직주식회사 구리 배선 연마용 cmp 슬러리 조성물 및 이를 이용한 연마 방법
US8226841B2 (en) * 2009-02-03 2012-07-24 Cabot Microelectronics Corporation Polishing composition for nickel-phosphorous memory disks
DE102009028762A1 (de) * 2009-08-20 2011-03-03 Rena Gmbh Verfahren zum Ätzen von Siliziumoberflächen
JP5587620B2 (ja) * 2010-01-25 2014-09-10 株式会社フジミインコーポレーテッド 研磨用組成物及びそれを用いた研磨方法
JP5516184B2 (ja) * 2010-07-26 2014-06-11 信越化学工業株式会社 合成石英ガラス基板の製造方法
CN101934493B (zh) * 2010-08-10 2011-07-13 天津中环领先材料技术有限公司 超薄区熔硅抛光片的抛光工艺
US9039914B2 (en) 2012-05-23 2015-05-26 Cabot Microelectronics Corporation Polishing composition for nickel-phosphorous-coated memory disks
US9388330B2 (en) * 2012-12-17 2016-07-12 Fuji Engineering Co., Ltd. Bag containing blasting material
KR102209690B1 (ko) * 2014-06-27 2021-01-29 동우 화인켐 주식회사 금속막의 식각액 조성물 및 이를 이용한 액정표시장치용 어레이 기판의 제조방법
MY186924A (en) * 2015-04-06 2021-08-26 Cmc Mat Inc Cmp composition and methods for polishing rigid disks
KR102463863B1 (ko) 2015-07-20 2022-11-04 삼성전자주식회사 연마용 조성물 및 이를 이용한 반도체 장치의 제조 방법
KR102522528B1 (ko) * 2016-09-21 2023-04-17 가부시끼가이샤 레조낙 슬러리 및 연마 방법
CN108250977B (zh) * 2016-12-28 2021-08-27 安集微电子科技(上海)股份有限公司 一种用于阻挡层平坦化的化学机械抛光液
CN107474744A (zh) * 2017-08-04 2017-12-15 江苏云瀚股份有限公司 一种汽车用玻璃剥光剂及其制备方法
US11273120B2 (en) * 2019-11-18 2022-03-15 Actera Ingredients, Inc. Hair treatments
MX2023009458A (es) * 2021-02-19 2023-08-25 Procter & Gamble Composiciones para el cuidado bucal que comprenden peroxido y alumina.
CN115873508A (zh) * 2022-12-26 2023-03-31 博力思(天津)电子科技有限公司 去除速率高且表面粗糙度低的SiC衬底抛光液及抛光工艺

Family Cites Families (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5428721A (en) * 1990-02-07 1995-06-27 Kabushiki Kaisha Toshiba Data processing apparatus for editing image by using image conversion
US5391258A (en) * 1993-05-26 1995-02-21 Rodel, Inc. Compositions and methods for polishing
US5575885A (en) * 1993-12-14 1996-11-19 Kabushiki Kaisha Toshiba Copper-based metal polishing solution and method for manufacturing semiconductor device
JP3556978B2 (ja) 1993-12-14 2004-08-25 株式会社東芝 銅系金属の研磨方法
JP3397501B2 (ja) 1994-07-12 2003-04-14 株式会社東芝 研磨剤および研磨方法
US5858813A (en) * 1996-05-10 1999-01-12 Cabot Corporation Chemical mechanical polishing slurry for metal layers and films
US6126853A (en) * 1996-12-09 2000-10-03 Cabot Microelectronics Corporation Chemical mechanical polishing slurry useful for copper substrates
US6309560B1 (en) 1996-12-09 2001-10-30 Cabot Microelectronics Corporation Chemical mechanical polishing slurry useful for copper substrates
US5954997A (en) * 1996-12-09 1999-09-21 Cabot Corporation Chemical mechanical polishing slurry useful for copper substrates
US5759917A (en) * 1996-12-30 1998-06-02 Cabot Corporation Composition for oxide CMP
US6432828B2 (en) * 1998-03-18 2002-08-13 Cabot Microelectronics Corporation Chemical mechanical polishing slurry useful for copper substrates
WO2000013217A1 (fr) 1998-08-31 2000-03-09 Hitachi Chemical Company, Ltd. Liquide abrasif pour le polissage de metaux et procede correspondant
US6004188A (en) * 1998-09-10 1999-12-21 Chartered Semiconductor Manufacturing Ltd. Method for forming copper damascene structures by using a dual CMP barrier layer
JP3781906B2 (ja) 1998-09-18 2006-06-07 株式会社ホンダアクセス フロアマット用止め具
JP4053165B2 (ja) * 1998-12-01 2008-02-27 株式会社フジミインコーポレーテッド 研磨用組成物およびそれを用いた研磨方法
KR100597449B1 (ko) * 1998-12-28 2006-07-06 히다치 가세고교 가부시끼가이샤 금속용 연마액 재료, 금속용 연마액, 그 제조방법 및그것을 사용한 연마방법
JP2003507894A (ja) * 1999-08-13 2003-02-25 キャボット マイクロエレクトロニクス コーポレイション 化学機械的研磨系及びその使用方法
TW501197B (en) 1999-08-17 2002-09-01 Hitachi Chemical Co Ltd Polishing compound for chemical mechanical polishing and method for polishing substrate
KR100512453B1 (ko) 1999-08-26 2005-09-07 히다치 가세고교 가부시끼가이샤 화학기계연마용 연마제 및 연마방법
JP3902897B2 (ja) * 1999-11-15 2007-04-11 日立化成工業株式会社 金属用研磨液を用いた基板の研磨方法
US20020013122A1 (en) * 1999-12-22 2002-01-31 Nikon Corporation Process and apparatus for chemimechanically polishing a substrate
JP2002075927A (ja) * 2000-08-24 2002-03-15 Fujimi Inc 研磨用組成物およびそれを用いた研磨方法
JP2002110596A (ja) * 2000-10-02 2002-04-12 Mitsubishi Electric Corp 半導体加工用研磨剤およびこれに用いる分散剤、並びに上記半導体加工用研磨剤を用いた半導体装置の製造方法
US6623355B2 (en) * 2000-11-07 2003-09-23 Micell Technologies, Inc. Methods, apparatus and slurries for chemical mechanical planarization
JP3768401B2 (ja) * 2000-11-24 2006-04-19 Necエレクトロニクス株式会社 化学的機械的研磨用スラリー
JP2002164307A (ja) * 2000-11-24 2002-06-07 Fujimi Inc 研磨用組成物およびそれを用いた研磨方法
JP2002231666A (ja) * 2001-01-31 2002-08-16 Fujimi Inc 研磨用組成物およびそれを用いた研磨方法
US7279119B2 (en) * 2001-06-14 2007-10-09 Ppg Industries Ohio, Inc. Silica and silica-based slurry
SG144688A1 (en) * 2001-07-23 2008-08-28 Fujimi Inc Polishing composition and polishing method employing it
US20050028449A1 (en) 2001-09-03 2005-02-10 Norihiko Miyata Polishing composition
JP2003100678A (ja) 2001-09-26 2003-04-04 Sumitomo Bakelite Co Ltd 研磨用組成物
TWI314950B (en) * 2001-10-31 2009-09-21 Hitachi Chemical Co Ltd Polishing slurry and polishing method
TWI259201B (en) * 2001-12-17 2006-08-01 Hitachi Chemical Co Ltd Slurry for metal polishing and method of polishing with the same
JP2003257910A (ja) * 2001-12-28 2003-09-12 Fujikoshi Mach Corp 基板における銅層の研磨方法
US20030219982A1 (en) * 2002-05-23 2003-11-27 Hitachi Chemical Co., Ltd CMP (chemical mechanical polishing) polishing liquid for metal and polishing method
EP1517972A4 (en) 2002-06-07 2009-12-16 Showa Denko Kk METAL POLISHING COMPOSITION, POLISHING METHOD USING THE SAME, AND METHOD OF PRODUCING SEMICONDUCTOR WAFER USING THE POLISHING METHOD
TWI257126B (en) * 2002-07-25 2006-06-21 Hitachi Chemical Co Ltd Slurry and polishing method
JP4083502B2 (ja) * 2002-08-19 2008-04-30 株式会社フジミインコーポレーテッド 研磨方法及びそれに用いられる研磨用組成物
JP3981616B2 (ja) * 2002-10-02 2007-09-26 株式会社フジミインコーポレーテッド 研磨用組成物
WO2005031836A1 (ja) 2003-09-30 2005-04-07 Fujimi Incorporated 研磨用組成物及び研磨方法
TWI347969B (en) * 2003-09-30 2011-09-01 Fujimi Inc Polishing composition

Also Published As

Publication number Publication date
TWI447213B (zh) 2014-08-01
JP2005277043A (ja) 2005-10-06
TW200533735A (en) 2005-10-16
US7550388B2 (en) 2009-06-23
CN1837320A (zh) 2006-09-27
TWI466991B (zh) 2015-01-01
CN1837320B (zh) 2012-05-09
KR20060044569A (ko) 2006-05-16
JP4644434B2 (ja) 2011-03-02
TW201341516A (zh) 2013-10-16
CN101638556A (zh) 2010-02-03
KR101110719B1 (ko) 2012-02-29
EP1580248A1 (en) 2005-09-28
CN101638556B (zh) 2012-12-26
US20050215060A1 (en) 2005-09-29

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