SG10202006953QA - Electrical contactor and electrical connecting apparatus - Google Patents

Electrical contactor and electrical connecting apparatus

Info

Publication number
SG10202006953QA
SG10202006953QA SG10202006953QA SG10202006953QA SG10202006953QA SG 10202006953Q A SG10202006953Q A SG 10202006953QA SG 10202006953Q A SG10202006953Q A SG 10202006953QA SG 10202006953Q A SG10202006953Q A SG 10202006953QA SG 10202006953Q A SG10202006953Q A SG 10202006953QA
Authority
SG
Singapore
Prior art keywords
electrical
connecting apparatus
contactor
electrical connecting
electrical contactor
Prior art date
Application number
SG10202006953QA
Other languages
English (en)
Inventor
KISHI Yasutaka
Wakazawa Masahiro
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of SG10202006953QA publication Critical patent/SG10202006953QA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06727—Cantilever beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Multi-Conductor Connections (AREA)
  • Connections Arranged To Contact A Plurality Of Conductors (AREA)
SG10202006953QA 2019-08-09 2020-07-21 Electrical contactor and electrical connecting apparatus SG10202006953QA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019147759A JP7353859B2 (ja) 2019-08-09 2019-08-09 電気的接触子及び電気的接続装置

Publications (1)

Publication Number Publication Date
SG10202006953QA true SG10202006953QA (en) 2021-03-30

Family

ID=74358283

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202006953QA SG10202006953QA (en) 2019-08-09 2020-07-21 Electrical contactor and electrical connecting apparatus

Country Status (6)

Country Link
US (1) US11372022B2 (ja)
JP (1) JP7353859B2 (ja)
KR (1) KR102424122B1 (ja)
CN (1) CN112345802A (ja)
SG (1) SG10202006953QA (ja)
TW (1) TWI787636B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1646397S (ja) * 2019-05-21 2019-11-25

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07109780B2 (ja) * 1991-02-19 1995-11-22 山一電機株式会社 電気部品用ソケットにおけるコンタクト
JP2004340617A (ja) * 2003-05-13 2004-12-02 Micronics Japan Co Ltd 通電試験用電気的接続装置
EP1624308B1 (en) * 2003-05-13 2007-06-20 Kabushiki Kaisha Nihon Micronics Probe for testing electric conduction
JP2004340654A (ja) 2003-05-14 2004-12-02 Micronics Japan Co Ltd 通電試験用プローブ
JP4571511B2 (ja) * 2005-01-07 2010-10-27 株式会社日本マイクロニクス 通電試験用プローブ
JP4932499B2 (ja) * 2005-01-14 2012-05-16 株式会社日本マイクロニクス 通電試験用プローブ
JP4571007B2 (ja) 2005-04-22 2010-10-27 株式会社日本マイクロニクス 通電試験用プローブ
JP2007113946A (ja) 2005-10-18 2007-05-10 Micronics Japan Co Ltd 通電試験用プローブ
JP4841620B2 (ja) * 2006-03-15 2011-12-21 株式会社日本マイクロニクス 通電試験用プローブおよびプローブ組立体
TW200815763A (en) * 2006-09-26 2008-04-01 Nihon Micronics Kabushiki Kaisha Electrical test probe and electrical test probe assembly
JP5113392B2 (ja) * 2007-01-22 2013-01-09 株式会社日本マイクロニクス プローブおよびそれを用いた電気的接続装置
JP2008203036A (ja) * 2007-02-19 2008-09-04 Micronics Japan Co Ltd 電気的接続装置
JP5046909B2 (ja) * 2007-12-21 2012-10-10 株式会社日本マイクロニクス 電気試験用接触子、これを用いる電気的接続装置、及び接触子の製造方法
JP5438908B2 (ja) * 2008-03-11 2014-03-12 株式会社日本マイクロニクス 電気的試験用接触子、これを用いた電気的接続装置及び接触子の製造方法
JP2009229410A (ja) * 2008-03-25 2009-10-08 Micronics Japan Co Ltd 電気試験用接触子及びその製造方法
KR100947862B1 (ko) * 2008-06-30 2010-03-18 한국기계연구원 힌지 구조를 갖는 캔틸레버형 미세 접촉 프로브
KR101019554B1 (ko) 2008-11-18 2011-03-08 주식회사 코디에스 프로브 및 그의 제조방법
JP2011215069A (ja) * 2010-04-01 2011-10-27 Tokyo Electron Ltd プローブ
JP5878719B2 (ja) * 2011-09-27 2016-03-08 株式会社日本マイクロニクス 同一箇所から分離可能なカンチレバー型プローブ
JP5886694B2 (ja) * 2012-06-14 2016-03-16 株式会社日本マイクロニクス カンチレバー型プローブとそれを備えるプローブカード又はプローブユニット
JP5968158B2 (ja) 2012-08-10 2016-08-10 株式会社日本マイクロニクス コンタクトプローブ及びプローブカード
CN204441545U (zh) * 2015-01-07 2015-07-01 番禺得意精密电子工业有限公司 电连接器
EP3051562B1 (en) * 2015-01-30 2018-12-26 Tyco Electronics Austria GmbH Spring Member for an Electric Switching Device such as a Cradle Relay
JP6584816B2 (ja) * 2015-04-20 2019-10-02 日置電機株式会社 プローブユニットおよびプローブユニット製造方法
JP6378642B2 (ja) * 2015-04-23 2018-08-22 モレックス エルエルシー コネクタ
CN114441813A (zh) * 2018-01-11 2022-05-06 欧姆龙株式会社 探针、检查工具、检查单元和检查装置

Also Published As

Publication number Publication date
TW202119040A (zh) 2021-05-16
US11372022B2 (en) 2022-06-28
CN112345802A (zh) 2021-02-09
TWI787636B (zh) 2022-12-21
KR102424122B1 (ko) 2022-07-22
US20210041480A1 (en) 2021-02-11
JP2021028602A (ja) 2021-02-25
KR20210018086A (ko) 2021-02-17
JP7353859B2 (ja) 2023-10-02

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