SG10201403132RA - Inspection apparatus for article storage facility - Google Patents

Inspection apparatus for article storage facility

Info

Publication number
SG10201403132RA
SG10201403132RA SG10201403132RA SG10201403132RA SG10201403132RA SG 10201403132R A SG10201403132R A SG 10201403132RA SG 10201403132R A SG10201403132R A SG 10201403132RA SG 10201403132R A SG10201403132R A SG 10201403132RA SG 10201403132R A SG10201403132R A SG 10201403132RA
Authority
SG
Singapore
Prior art keywords
supported
support portion
transport container
placement support
inactive gas
Prior art date
Application number
SG10201403132RA
Other languages
English (en)
Inventor
Otsuka Hiroshi
Kawamura Shinsuke
Yoshimoto Tadahiro
Original Assignee
Daifuku Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daifuku Kk filed Critical Daifuku Kk
Publication of SG10201403132RA publication Critical patent/SG10201403132RA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004Gaseous mixtures, e.g. polluted air
    • G01N33/0009General constructional details of gas analysers, e.g. portable test equipment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67769Storage means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67253Process monitoring, e.g. flow or thickness monitoring
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/6735Closed carriers
    • H01L21/67389Closed carriers characterised by atmosphere control
    • H01L21/67393Closed carriers characterised by atmosphere control characterised by the presence of atmosphere modifying elements inside or attached to the closed carrierl

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Combustion & Propulsion (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Warehouses Or Storage Devices (AREA)
SG10201403132RA 2013-06-26 2014-06-11 Inspection apparatus for article storage facility SG10201403132RA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013134265A JP5888288B2 (ja) 2013-06-26 2013-06-26 物品保管設備の検査装置

Publications (1)

Publication Number Publication Date
SG10201403132RA true SG10201403132RA (en) 2015-01-29

Family

ID=52114279

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201403132RA SG10201403132RA (en) 2013-06-26 2014-06-11 Inspection apparatus for article storage facility

Country Status (6)

Country Link
US (1) US9541534B2 (ko)
JP (1) JP5888288B2 (ko)
KR (1) KR102230532B1 (ko)
CN (1) CN104249898B (ko)
SG (1) SG10201403132RA (ko)
TW (1) TWI610865B (ko)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5984030B2 (ja) * 2013-03-05 2016-09-06 村田機械株式会社 測定ユニット及びパージガスの流量測定方法
JP6660937B2 (ja) * 2015-03-18 2020-03-11 株式会社日立ハイテクノロジーズ 点検デバイス
WO2016152276A1 (ja) * 2015-03-26 2016-09-29 村田機械株式会社 物品の支持装置及び支持方法
JP2016213377A (ja) * 2015-05-12 2016-12-15 村田機械株式会社 パージノズル
JP6540221B2 (ja) * 2015-05-18 2019-07-10 村田機械株式会社 パージ装置及びパージストッカ
CN107851596A (zh) * 2015-08-04 2018-03-27 村田机械株式会社 净化装置、净化储料器以及净化气体的供给方法
JP6414525B2 (ja) * 2015-09-02 2018-10-31 株式会社ダイフク 保管設備
JP6455404B2 (ja) * 2015-11-17 2019-01-23 株式会社ダイフク 容器搬送設備
JP6551240B2 (ja) * 2016-01-06 2019-07-31 株式会社ダイフク 物品収納棚、及び、それを備えた物品収納設備
JP6638457B2 (ja) * 2016-02-18 2020-01-29 株式会社デンソー 搬送装置
JP6460015B2 (ja) * 2016-03-07 2019-01-30 株式会社ダイフク 容器搬送設備
JP6477579B2 (ja) * 2016-04-20 2019-03-06 株式会社ダイフク 容器支持棚
JP6579067B2 (ja) * 2016-09-09 2019-09-25 株式会社ダイフク 流量測定装置及び流量測定システム
JP6631446B2 (ja) * 2016-09-09 2020-01-15 株式会社ダイフク 物品収納設備
JP6614174B2 (ja) * 2017-02-08 2019-12-04 株式会社ダイフク 流量測定システム
JP6794898B2 (ja) * 2017-03-29 2020-12-02 株式会社ダイフク 収納棚
KR102021007B1 (ko) * 2017-11-06 2019-09-11 크린팩토메이션 주식회사 웨이퍼 내장 용기용 퍼지 선반에서의 퍼지 가스 누설 검사 디바이스
US10703563B2 (en) * 2017-11-10 2020-07-07 Taiwan Semiconductor Manufacturing Co., Ltd. Stocker
KR102123583B1 (ko) * 2019-04-15 2020-06-26 주식회사 아셀 유량측정장치
WO2022074937A1 (ja) * 2020-10-05 2022-04-14 村田機械株式会社 流量測定装置
JP7371663B2 (ja) * 2021-04-27 2023-10-31 株式会社ダイフク 検査システム
KR102547919B1 (ko) * 2021-07-28 2023-06-26 주식회사 에스에프에이 웨이퍼 보관용기 적재 시스템

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US5472086A (en) * 1994-03-11 1995-12-05 Holliday; James E. Enclosed sealable purgible semiconductor wafer holder
CN100449682C (zh) * 2001-05-17 2009-01-07 株式会社荏原制作所 衬底传送容器
US20040191032A1 (en) * 2002-07-19 2004-09-30 R. Foulke Development Company, Llc Bi-directional arm and storage system
CN100560443C (zh) * 2004-04-18 2009-11-18 安堤格里斯公司 具有流体密封流路的基板容器
US7328727B2 (en) * 2004-04-18 2008-02-12 Entegris, Inc. Substrate container with fluid-sealing flow passageway
JP4126619B2 (ja) * 2006-06-27 2008-07-30 株式会社ダイフク 物品保管設備
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JP4670808B2 (ja) * 2006-12-22 2011-04-13 ムラテックオートメーション株式会社 コンテナの搬送システム及び測定用コンテナ
JP2010052920A (ja) * 2008-08-29 2010-03-11 Dainippon Screen Mfg Co Ltd 収容器搬送装置
JP5106363B2 (ja) * 2008-12-02 2012-12-26 ミライアル株式会社 ウエハ収納容器
JP5155848B2 (ja) * 2008-12-18 2013-03-06 日本ケンブリッジフィルター株式会社 Foup用n2パージ装置
JP2011187539A (ja) * 2010-03-05 2011-09-22 Sinfonia Technology Co Ltd ガス注入装置、ガス排出装置、ガス注入方法及びガス排出方法
KR101708087B1 (ko) * 2010-04-22 2017-02-17 신에츠 폴리머 가부시키가이샤 기판 수납 용기
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JP5779957B2 (ja) * 2011-04-20 2015-09-16 東京エレクトロン株式会社 ローディングユニット及び処理システム
JP5327655B2 (ja) * 2011-05-31 2013-10-30 株式会社ダイフク 搬送設備
JP5984030B2 (ja) * 2013-03-05 2016-09-06 村田機械株式会社 測定ユニット及びパージガスの流量測定方法
US9257320B2 (en) * 2013-06-05 2016-02-09 GlobalFoundries, Inc. Wafer carrier purge apparatuses, automated mechanical handling systems including the same, and methods of handling a wafer carrier during integrated circuit fabrication

Also Published As

Publication number Publication date
CN104249898B (zh) 2017-09-26
TWI610865B (zh) 2018-01-11
JP5888288B2 (ja) 2016-03-16
TW201505936A (zh) 2015-02-16
CN104249898A (zh) 2014-12-31
JP2015012040A (ja) 2015-01-19
KR20150001624A (ko) 2015-01-06
KR102230532B1 (ko) 2021-03-19
US20150000372A1 (en) 2015-01-01
US9541534B2 (en) 2017-01-10

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