RU2646545C1 - Полупроводниковый резистор - Google Patents

Полупроводниковый резистор Download PDF

Info

Publication number
RU2646545C1
RU2646545C1 RU2016149196A RU2016149196A RU2646545C1 RU 2646545 C1 RU2646545 C1 RU 2646545C1 RU 2016149196 A RU2016149196 A RU 2016149196A RU 2016149196 A RU2016149196 A RU 2016149196A RU 2646545 C1 RU2646545 C1 RU 2646545C1
Authority
RU
Russia
Prior art keywords
layer
semiconductor
semiconductor layer
insulating layer
resistor
Prior art date
Application number
RU2016149196A
Other languages
English (en)
Russian (ru)
Inventor
Виктор Александрович Лобцов
Александр Иванович Щепихин
Наталья Усмановна Новойдарская
Александр Феликсович Комиссаров
Original Assignee
ООО "Тонкопленочные технологии"
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ООО "Тонкопленочные технологии" filed Critical ООО "Тонкопленочные технологии"
Priority to RU2016149196A priority Critical patent/RU2646545C1/ru
Priority to PCT/RU2016/000911 priority patent/WO2018111137A1/fr
Application granted granted Critical
Publication of RU2646545C1 publication Critical patent/RU2646545C1/ru

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/84Types of semiconductor device ; Multistep manufacturing processes therefor controllable by variation of applied mechanical force, e.g. of pressure
RU2016149196A 2016-12-14 2016-12-14 Полупроводниковый резистор RU2646545C1 (ru)

Priority Applications (2)

Application Number Priority Date Filing Date Title
RU2016149196A RU2646545C1 (ru) 2016-12-14 2016-12-14 Полупроводниковый резистор
PCT/RU2016/000911 WO2018111137A1 (fr) 2016-12-14 2016-12-22 Résistance à semi-conducteurs

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
RU2016149196A RU2646545C1 (ru) 2016-12-14 2016-12-14 Полупроводниковый резистор

Publications (1)

Publication Number Publication Date
RU2646545C1 true RU2646545C1 (ru) 2018-03-05

Family

ID=61568844

Family Applications (1)

Application Number Title Priority Date Filing Date
RU2016149196A RU2646545C1 (ru) 2016-12-14 2016-12-14 Полупроводниковый резистор

Country Status (2)

Country Link
RU (1) RU2646545C1 (fr)
WO (1) WO2018111137A1 (fr)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS621259A (ja) * 1985-06-26 1987-01-07 Sharp Corp 半導体抵抗素子の形成方法
RU2367062C1 (ru) * 2008-05-15 2009-09-10 Общество с ограниченной ответственностью "Сенсор" Полупроводниковый резистор
RU2367061C1 (ru) * 2008-05-15 2009-09-10 Общество с ограниченной ответственностью "Сенсор" Высокоточный тензодатчик
US20140159180A1 (en) * 2012-12-06 2014-06-12 Agency For Science, Technology And Research Semiconductor resistor structure and semiconductor photomultiplier device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1101081A1 (ru) * 1982-07-26 1994-05-15 А.А. Кремнев Полупроводниковый резистор с температурной компенсацией и способ его изготовления
JPS63266863A (ja) * 1987-04-24 1988-11-02 Hitachi Ltd 半導体抵抗体
KR0150122B1 (ko) * 1995-05-31 1998-12-01 김광호 반도체 저항 소자 및 그 제조 방법
KR102089505B1 (ko) * 2011-09-23 2020-03-16 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS621259A (ja) * 1985-06-26 1987-01-07 Sharp Corp 半導体抵抗素子の形成方法
RU2367062C1 (ru) * 2008-05-15 2009-09-10 Общество с ограниченной ответственностью "Сенсор" Полупроводниковый резистор
RU2367061C1 (ru) * 2008-05-15 2009-09-10 Общество с ограниченной ответственностью "Сенсор" Высокоточный тензодатчик
US20140159180A1 (en) * 2012-12-06 2014-06-12 Agency For Science, Technology And Research Semiconductor resistor structure and semiconductor photomultiplier device

Also Published As

Publication number Publication date
WO2018111137A1 (fr) 2018-06-21

Similar Documents

Publication Publication Date Title
US8033722B2 (en) Thermocouple for gas turbine environments
RU2367062C1 (ru) Полупроводниковый резистор
CN102891251B (zh) 一种石墨烯霍尔元件的封装结构及封装方法
CN110767652B (zh) 具有自散热功能的惠斯通电桥结构及制造方法
RU2367061C1 (ru) Высокоточный тензодатчик
RU2646545C1 (ru) Полупроводниковый резистор
CN108807626B (zh) 发光元件
EP3178097B1 (fr) Varistance à revêtement multicouche et son procédé de fabrication
RU2655698C1 (ru) Полупроводниковый резистор
US10497636B2 (en) Passivation for silicon carbide (SiC) device and method for fabricating same
JP6017160B2 (ja) ホール素子
CN103680787A (zh) 一种柔性精密电阻器及其制备方法
TW200636252A (en) Method of measuring semiconductor wafers with an oxide enhanced probe
RU2513654C2 (ru) Термометр сопротивления
JP6098208B2 (ja) サーミスタ素子及びその製造方法
JP2020129602A (ja) 抵抗器
JP7115610B1 (ja) 薄膜トランジスタ、および、薄膜トランジスタの製造方法
CN202853819U (zh) 高温多晶硅压力传感器
JP2008294288A (ja) 薄膜サーミスタ素子及びその製造方法
CN105934813A (zh) 半导体装置
CN117346911A (zh) 一种薄膜热电偶及其制备方法
CN203631217U (zh) 一种柔性精密电阻器
RU2550090C2 (ru) Тонкопленочный вариконд
JP2011171596A (ja) 薄膜サーミスタ素子
WO2011107554A3 (fr) Substrat conducteur transparent pour dispositifs optoélectroniques