RU2493573C2 - Детектор излучений и способ изготовления детектора излучений - Google Patents
Детектор излучений и способ изготовления детектора излучений Download PDFInfo
- Publication number
- RU2493573C2 RU2493573C2 RU2011101443/28A RU2011101443A RU2493573C2 RU 2493573 C2 RU2493573 C2 RU 2493573C2 RU 2011101443/28 A RU2011101443/28 A RU 2011101443/28A RU 2011101443 A RU2011101443 A RU 2011101443A RU 2493573 C2 RU2493573 C2 RU 2493573C2
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- Prior art keywords
- groove
- radiation detector
- barrier material
- radiation
- detector
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- 230000005855 radiation Effects 0.000 title claims abstract description 77
- 238000004519 manufacturing process Methods 0.000 title claims description 22
- 239000000463 material Substances 0.000 claims abstract description 58
- 230000004888 barrier function Effects 0.000 claims abstract description 34
- 239000004065 semiconductor Substances 0.000 claims abstract description 22
- 238000006243 chemical reaction Methods 0.000 claims abstract description 6
- 239000000758 substrate Substances 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 14
- 238000002591 computed tomography Methods 0.000 claims description 13
- 238000003384 imaging method Methods 0.000 claims description 13
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- 229910052750 molybdenum Inorganic materials 0.000 claims description 3
- 239000011733 molybdenum Substances 0.000 claims description 3
- 238000002600 positron emission tomography Methods 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 3
- 229910052721 tungsten Inorganic materials 0.000 claims description 3
- 239000010937 tungsten Substances 0.000 claims description 3
- 238000002603 single-photon emission computed tomography Methods 0.000 claims description 2
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 4
- 230000002829 reductive effect Effects 0.000 abstract description 4
- 239000000126 substance Substances 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- 230000003595 spectral effect Effects 0.000 description 7
- 238000000708 deep reactive-ion etching Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 5
- 239000011701 zinc Substances 0.000 description 5
- 238000005530 etching Methods 0.000 description 4
- 230000002401 inhibitory effect Effects 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 230000002285 radioactive effect Effects 0.000 description 4
- 229910004613 CdTe Inorganic materials 0.000 description 3
- 230000003321 amplification Effects 0.000 description 3
- 230000000873 masking effect Effects 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229920006332 epoxy adhesive Polymers 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 238000007641 inkjet printing Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- SKJCKYVIQGBWTN-UHFFFAOYSA-N (4-hydroxyphenyl) methanesulfonate Chemical compound CS(=O)(=O)OC1=CC=C(O)C=C1 SKJCKYVIQGBWTN-UHFFFAOYSA-N 0.000 description 1
- 229910004611 CdZnTe Inorganic materials 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 229920006335 epoxy glue Polymers 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP08158304 | 2008-06-16 | ||
| EP08158304.9 | 2008-06-16 | ||
| PCT/IB2009/052442 WO2010004453A2 (en) | 2008-06-16 | 2009-06-09 | Radiation detector and a method of manufacturing a radiation detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| RU2011101443A RU2011101443A (ru) | 2012-07-27 |
| RU2493573C2 true RU2493573C2 (ru) | 2013-09-20 |
Family
ID=41507503
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2011101443/28A RU2493573C2 (ru) | 2008-06-16 | 2009-06-09 | Детектор излучений и способ изготовления детектора излучений |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8564084B2 (enExample) |
| EP (1) | EP2291680B1 (enExample) |
| JP (1) | JP5580300B2 (enExample) |
| CN (2) | CN110398769B (enExample) |
| RU (1) | RU2493573C2 (enExample) |
| WO (1) | WO2010004453A2 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU174187U1 (ru) * | 2016-12-29 | 2017-10-06 | Общество с ограниченной ответственностью "Научно-технический центр "МТ" (ООО "НТЦ-МТ") | Составное фотосчитывающее устройство с композитными дистанционерами для рентгеночувствительных панелей |
| RU2776102C1 (ru) * | 2021-03-29 | 2022-07-13 | Объединенный Институт Ядерных Исследований (Оияи) | Способ позиционирования сцинтилляционных ячеек в сегментированных детекторах и устройство для его осуществления |
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| CN103135121B (zh) * | 2011-11-28 | 2017-04-26 | Ge医疗系统环球技术有限公司 | 用于消除串扰的线段形模块ct探测器和方法 |
| JP5788859B2 (ja) * | 2012-12-28 | 2015-10-07 | 株式会社島津製作所 | 散乱x線除去用グリッド |
| KR101408138B1 (ko) | 2013-03-14 | 2014-06-17 | 한국원자력연구원 | 인쇄형 방사선 영상 센서, 이를 구비하는 방사선 영상 장치 및 이의 제조 방법 |
| RU2554889C2 (ru) * | 2013-06-11 | 2015-06-27 | Евгений Николаевич Галашов | Способ изготовления детектирующей матрицы рентгеновского излучения |
| DE102014201772B4 (de) | 2014-01-31 | 2017-10-12 | Siemens Healthcare Gmbh | Direktkonvertierender Röntgenstrahlungsdetektor, CT-System und Verfahren hierzu |
| US9459355B1 (en) * | 2015-06-30 | 2016-10-04 | General Electric Company | Radiation detector with stacked barrier layers and method of forming the same |
| WO2017063157A1 (en) | 2015-10-14 | 2017-04-20 | Shenzhen Xpectvision Technology Co., Ltd. | X-ray detectors capable of limiting diffusion of charge carriers |
| US10393891B2 (en) | 2016-05-03 | 2019-08-27 | Redlen Technologies, Inc. | Sub-pixel segmentation for semiconductor radiation detectors and methods of fabricating thereof |
| CN207098052U (zh) * | 2017-02-17 | 2018-03-13 | 全普光电科技(上海)有限公司 | 一种天线结构以及超薄手机 |
| CN108186041B (zh) * | 2018-01-22 | 2020-12-04 | 苏州晶特晶体科技有限公司 | 一种一体化doi影像强化pet环形阵列结构及加工方法 |
| FR3079909B1 (fr) | 2018-04-05 | 2022-10-14 | Microoled | Dispositif electroluminescent a resolution et fiabilite ameliorees |
| US11169286B2 (en) | 2018-06-18 | 2021-11-09 | Redlen Technologies, Inc. | Methods of calibrating semiconductor radiation detectors using K-edge filters |
| CN112673286B (zh) * | 2018-09-10 | 2024-11-01 | 皇家飞利浦有限公司 | 双传感器子像素辐射探测器 |
| EP3620826A1 (en) * | 2018-09-10 | 2020-03-11 | Koninklijke Philips N.V. | Multi-piece mono-layer radiation detector |
| US10928527B2 (en) | 2018-11-09 | 2021-02-23 | Redlen Technologies, Inc. | Charge sharing correction methods for pixelated radiation detector arrays |
| WO2020198931A1 (en) * | 2019-03-29 | 2020-10-08 | Shenzhen Xpectvision Technology Co., Ltd. | Radiation detectors with scintillators |
| US11372120B2 (en) | 2019-08-26 | 2022-06-28 | Redlen Technologies, Inc. | Charge sharing correction methods for sub-pixellated radiation detector arrays |
| WO2023087123A1 (en) * | 2021-11-16 | 2023-05-25 | Shenzhen Xpectvision Technology Co., Ltd. | Image sensors with shielded electronics layers |
| KR102767167B1 (ko) * | 2022-11-30 | 2025-02-13 | 주식회사 비투지홀딩스 | 방사선 디텍터 |
| CN119213560A (zh) * | 2023-08-07 | 2024-12-27 | 深圳帧观德芯科技有限公司 | 用于侧面入射成像且具有位于辐射吸收层中的辐射阻挡板的图像传感器 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003004855A (ja) * | 2001-06-26 | 2003-01-08 | Hamamatsu Photonics Kk | 放射線検出器 |
| US6867862B2 (en) * | 2002-11-20 | 2005-03-15 | Mehrdad Nikoonahad | System and method for characterizing three-dimensional structures |
| US20050233493A1 (en) * | 2002-12-09 | 2005-10-20 | Augusto Carlos J | CMOS image sensor |
| RU2310189C2 (ru) * | 2003-06-27 | 2007-11-10 | Университет Тсингхуа | Система досмотра багажа с использованием гамма-излучения |
| WO2008004547A1 (en) * | 2006-07-03 | 2008-01-10 | Hamamatsu Photonics K.K. | Photodiode array |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58142283A (ja) * | 1982-02-19 | 1983-08-24 | Toshiba Corp | 放射線検出器 |
| JPS58180068A (ja) * | 1982-04-15 | 1983-10-21 | Toshiba Corp | 半導体放射線検出器の製造方法 |
| JPS5964587A (ja) | 1982-10-05 | 1984-04-12 | Tohoku Metal Ind Ltd | 単結晶の製造方法 |
| JPS5965487A (ja) | 1982-10-07 | 1984-04-13 | Toshiba Corp | 高密度実装用放射線検出素子 |
| JPS6328076A (ja) | 1986-07-21 | 1988-02-05 | Matsushita Electric Ind Co Ltd | 半導体放射線検出器 |
| JP2611295B2 (ja) | 1987-12-28 | 1997-05-21 | 株式会社日立製作所 | 放射線検出器およびその製造方法 |
| JPH02218990A (ja) * | 1989-02-20 | 1990-08-31 | Shimadzu Corp | 放射線検出素子アレイおよび放射線画像撮影装置 |
| JPH05326572A (ja) * | 1992-05-25 | 1993-12-10 | Matsushita Electron Corp | 電荷転送装置 |
| JP3235717B2 (ja) * | 1995-09-28 | 2001-12-04 | キヤノン株式会社 | 光電変換装置及びx線撮像装置 |
| GB2318448B (en) * | 1996-10-18 | 2002-01-16 | Simage Oy | Imaging detector and method of production |
| US6236051B1 (en) * | 1998-03-27 | 2001-05-22 | Kabushiki Kaisha Toshiba | Semiconductor radiation detector |
| US6069362A (en) * | 1998-05-14 | 2000-05-30 | The University Of Akron | Multi-density and multi-atomic number detector media for applications |
| GB2350767A (en) * | 1999-06-03 | 2000-12-06 | Canon Res Ct Europ Ltd | X-ray CCD detector having a second scintillator layer on back-thinned substrate |
| JP2003505705A (ja) * | 1999-07-26 | 2003-02-12 | エッジ メディカル デバイシス リミティド | X線画像化用ディジタル検出器 |
| JP2001296363A (ja) * | 2000-04-14 | 2001-10-26 | Fuji Photo Film Co Ltd | 放射線検出装置 |
| JP2001305234A (ja) * | 2000-04-25 | 2001-10-31 | Nikon Corp | 半導体電子線検出器 |
| JP2001318153A (ja) * | 2000-05-01 | 2001-11-16 | Fuji Photo Film Co Ltd | 放射線画像変換スクリーンおよびその製造方法 |
| JP2002372586A (ja) * | 2001-06-13 | 2002-12-26 | Canon Inc | 放射線撮像ユニット、装置及びシステム |
| JP4707885B2 (ja) * | 2001-06-26 | 2011-06-22 | 浜松ホトニクス株式会社 | 光検出素子 |
| JP4482253B2 (ja) * | 2001-09-12 | 2010-06-16 | 浜松ホトニクス株式会社 | ホトダイオードアレイ、固体撮像装置、及び、放射線検出器 |
| JP2003086827A (ja) | 2001-09-12 | 2003-03-20 | Hamamatsu Photonics Kk | ホトダイオードアレイ、固体撮像装置、及び、放射線検出器 |
| US20030178570A1 (en) * | 2002-03-25 | 2003-09-25 | Hitachi Metals, Ltd. | Radiation detector, manufacturing method thereof and radiation CT device |
| EP1761954A1 (en) * | 2004-06-18 | 2007-03-14 | Koninklijke Philips Electronics N.V. | X-ray image detector |
| EP1779138A2 (en) * | 2004-08-12 | 2007-05-02 | Philips Intellectual Property & Standards GmbH | Anti-scatter-grid for a radiation detector |
| JP2006059901A (ja) * | 2004-08-18 | 2006-03-02 | Toshiba Corp | 放射線検出器 |
| US20080258067A1 (en) * | 2004-08-20 | 2008-10-23 | Koninklijke Philips Electronics N.V. | Microelectronic System with a Passivation Layer |
| US7260174B2 (en) * | 2004-09-13 | 2007-08-21 | General Electric Company | Direct conversion energy discriminating CT detector with over-ranging correction |
| JP2006145431A (ja) * | 2004-11-22 | 2006-06-08 | Ge Medical Systems Global Technology Co Llc | 放射線検出器、放射線撮像装置、放射線ct装置及び放射線検出器の製造方法 |
| US7193289B2 (en) * | 2004-11-30 | 2007-03-20 | International Business Machines Corporation | Damascene copper wiring image sensor |
| BRPI0610720B1 (pt) * | 2005-04-22 | 2018-01-16 | Koninklijke Philips N. V. | pixel detector para uso em conjunto com um cintilador que converte uma partícula de radiação para uma rajada de luz, detector de radiação, sistema de geração de imagem de tomografia por emissão de pósitron de duração de trajetória (tof-pet), 5 método executado em conjunto com um cintilador que converte uma partícula de radiação para uma rajada de luz, e detector de radiação que inclui um cintilador e circuitos |
| US7212604B2 (en) * | 2005-06-29 | 2007-05-01 | General Electric Company | Multi-layer direct conversion computed tomography detector module |
| US7259377B2 (en) * | 2005-12-15 | 2007-08-21 | General Electric Company | Diode design to reduce the effects of radiation damage |
| CN100483149C (zh) * | 2005-12-31 | 2009-04-29 | 同方威视技术股份有限公司 | 一种用于辐射成像的多阵列探测器模块结构 |
| DE102006027820B4 (de) * | 2006-06-16 | 2008-04-03 | All Welding Technologies Ag | Kammeranordnung zur Verwendung bei der Elektronenstrahlbearbeitung |
| DE102006033716A1 (de) * | 2006-07-20 | 2008-02-14 | Siemens Ag | Röntgendiagnostikeinrichtung mit einem digitalen Röntgendetektor und integrierter Dosismessung |
| DE102010004890A1 (de) * | 2010-01-18 | 2011-07-21 | Siemens Aktiengesellschaft, 80333 | Photodiodenarray, Strahlendetektor und Verfahren zur Herstellung eines solchen Photodiodenarrays und eines solchen Strahlendetektors |
-
2009
- 2009-06-09 US US12/996,400 patent/US8564084B2/en not_active Expired - Fee Related
- 2009-06-09 CN CN201910645070.5A patent/CN110398769B/zh active Active
- 2009-06-09 RU RU2011101443/28A patent/RU2493573C2/ru active
- 2009-06-09 WO PCT/IB2009/052442 patent/WO2010004453A2/en not_active Ceased
- 2009-06-09 EP EP20090786416 patent/EP2291680B1/en active Active
- 2009-06-09 JP JP2011513102A patent/JP5580300B2/ja active Active
- 2009-06-09 CN CN2009801225245A patent/CN102066976A/zh active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003004855A (ja) * | 2001-06-26 | 2003-01-08 | Hamamatsu Photonics Kk | 放射線検出器 |
| US6867862B2 (en) * | 2002-11-20 | 2005-03-15 | Mehrdad Nikoonahad | System and method for characterizing three-dimensional structures |
| US20050233493A1 (en) * | 2002-12-09 | 2005-10-20 | Augusto Carlos J | CMOS image sensor |
| RU2310189C2 (ru) * | 2003-06-27 | 2007-11-10 | Университет Тсингхуа | Система досмотра багажа с использованием гамма-излучения |
| WO2008004547A1 (en) * | 2006-07-03 | 2008-01-10 | Hamamatsu Photonics K.K. | Photodiode array |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU174187U1 (ru) * | 2016-12-29 | 2017-10-06 | Общество с ограниченной ответственностью "Научно-технический центр "МТ" (ООО "НТЦ-МТ") | Составное фотосчитывающее устройство с композитными дистанционерами для рентгеночувствительных панелей |
| RU2776102C1 (ru) * | 2021-03-29 | 2022-07-13 | Объединенный Институт Ядерных Исследований (Оияи) | Способ позиционирования сцинтилляционных ячеек в сегментированных детекторах и устройство для его осуществления |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102066976A (zh) | 2011-05-18 |
| JP5580300B2 (ja) | 2014-08-27 |
| WO2010004453A2 (en) | 2010-01-14 |
| JP2011525238A (ja) | 2011-09-15 |
| CN110398769B (zh) | 2024-03-22 |
| RU2011101443A (ru) | 2012-07-27 |
| US20110079865A1 (en) | 2011-04-07 |
| US8564084B2 (en) | 2013-10-22 |
| WO2010004453A3 (en) | 2010-06-10 |
| EP2291680B1 (en) | 2015-05-06 |
| CN110398769A (zh) | 2019-11-01 |
| EP2291680A2 (en) | 2011-03-09 |
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