PL392794A1 - Sposób kontrolowania folii polaryzującej - Google Patents

Sposób kontrolowania folii polaryzującej

Info

Publication number
PL392794A1
PL392794A1 PL392794A PL39279409A PL392794A1 PL 392794 A1 PL392794 A1 PL 392794A1 PL 392794 A PL392794 A PL 392794A PL 39279409 A PL39279409 A PL 39279409A PL 392794 A1 PL392794 A1 PL 392794A1
Authority
PL
Poland
Prior art keywords
polarizing films
controlling
controlling polarizing
films
polarizing
Prior art date
Application number
PL392794A
Other languages
English (en)
Polish (pl)
Inventor
Atsuhiko Shinozuka
Toshiyuki Kasai
Hisanori Yamane
Original Assignee
Sumitomo Chemical Company, Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Company, Limited filed Critical Sumitomo Chemical Company, Limited
Publication of PL392794A1 publication Critical patent/PL392794A1/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors

Landscapes

  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Textile Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
PL392794A 2008-03-31 2009-03-26 Sposób kontrolowania folii polaryzującej PL392794A1 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008090436A JP2009244064A (ja) 2008-03-31 2008-03-31 偏光フィルムの検査方法

Publications (1)

Publication Number Publication Date
PL392794A1 true PL392794A1 (pl) 2011-02-28

Family

ID=41135381

Family Applications (1)

Application Number Title Priority Date Filing Date
PL392794A PL392794A1 (pl) 2008-03-31 2009-03-26 Sposób kontrolowania folii polaryzującej

Country Status (8)

Country Link
JP (1) JP2009244064A (enrdf_load_stackoverflow)
KR (1) KR20110000564A (enrdf_load_stackoverflow)
CN (1) CN101981438A (enrdf_load_stackoverflow)
CZ (1) CZ2010740A3 (enrdf_load_stackoverflow)
PL (1) PL392794A1 (enrdf_load_stackoverflow)
SK (1) SK50392010A3 (enrdf_load_stackoverflow)
TW (1) TW200946994A (enrdf_load_stackoverflow)
WO (1) WO2009123002A1 (enrdf_load_stackoverflow)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5306053B2 (ja) * 2009-05-19 2013-10-02 三菱レイヨン株式会社 連続する多孔質電極基材の外観欠陥自動検査方法とその記録媒体を添付してなる多孔質電極基材の巻体
JP4503693B1 (ja) * 2009-10-13 2010-07-14 日東電工株式会社 連続ウェブ形態の切込線入り光学フィルム積層体の連続ロール並びにその製造方法及び製造装置
JP4503692B1 (ja) * 2009-10-13 2010-07-14 日東電工株式会社 液晶表示素子を連続製造する装置において用いられる情報格納読出演算システム及び情報格納読出演算システムの製造方法
JP4503690B1 (ja) * 2009-10-13 2010-07-14 日東電工株式会社 液晶表示素子を連続製造する装置に用いられる情報格納読出システム、及び、前記情報格納読出システムを製造する方法及び装置
EP2518557A4 (en) * 2009-12-25 2015-11-11 Nitto Denko Corp METHOD FOR THE CONTINUOUS MANUFACTURING OF LIQUID CRYSTAL DISPLAY ELEMENTS AND APPARATUS
JP5569791B2 (ja) * 2010-04-14 2014-08-13 住友化学株式会社 光学フィルム作製用原反フィルム、および光学フィルムの製造方法
JP5966307B2 (ja) * 2011-10-12 2016-08-10 日立化成株式会社 光導波路の製造方法
KR102000959B1 (ko) * 2012-03-23 2019-07-17 도레이 카부시키가이샤 피측장 제품의 검사 방법 및 검사 장치
JP6177017B2 (ja) * 2013-06-12 2017-08-09 住友化学株式会社 欠陥検査システム
JP6250317B2 (ja) * 2013-07-08 2017-12-20 住友化学株式会社 欠陥検査方法
JP6421519B2 (ja) * 2014-09-25 2018-11-14 大日本印刷株式会社 包装材料
WO2016056253A1 (ja) 2014-10-10 2016-04-14 住友化学株式会社 セパレータ原反の製造方法、セパレータの製造方法、セパレータ原反、及びセパレータ原反製造装置
JP6641093B2 (ja) * 2015-03-20 2020-02-05 住友化学株式会社 光学フィルム及び積層光学フィルムの欠陥検査方法
JP6749894B2 (ja) * 2015-04-09 2020-09-02 住友化学株式会社 積層光学フィルムの欠陥検査方法、光学フィルムの欠陥検査方法及び積層光学フィルムの製造方法
JP6484127B2 (ja) 2015-06-26 2019-03-13 シグマ紙業株式会社 識別子を含む媒体
CN104949996A (zh) * 2015-06-29 2015-09-30 广东溢达纺织有限公司 不停机自动标识纺织面料疵点的方法及系统
CN106353332B (zh) * 2015-07-15 2019-05-28 明眼有限公司 利用图案透光板的偏光膜检查装置
JP6010674B1 (ja) * 2015-09-18 2016-10-19 住友化学株式会社 フィルム製造方法及びフィルム製造装置
JP6556008B2 (ja) * 2015-09-30 2019-08-07 日東電工株式会社 長尺状偏光子の検査方法
CN206583816U (zh) * 2015-12-15 2017-10-24 住友化学株式会社 缺陷检查用拍摄装置、缺陷检查系统以及膜制造装置
KR101955757B1 (ko) * 2016-06-08 2019-03-07 삼성에스디아이 주식회사 필름 처리장치 및 처리방법
JP2018054356A (ja) * 2016-09-27 2018-04-05 株式会社日本マイクロニクス ガス検知用フィルム、ガス検知装置、及びガス検知方法
KR102475056B1 (ko) * 2017-03-03 2022-12-06 스미또모 가가꾸 가부시키가이샤 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트
KR102438892B1 (ko) * 2017-03-03 2022-08-31 스미또모 가가꾸 가부시키가이샤 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법
JP7299219B2 (ja) * 2018-07-30 2023-06-27 日本化薬株式会社 マーキング装置、マーキング方法、偏光板の製造方法および偏光板
WO2021117274A1 (ja) * 2019-12-10 2021-06-17 日東電工株式会社 機能フィルムの検査方法、検査システム及び原反ロール
CN111781209A (zh) * 2020-05-26 2020-10-16 纽聚技术有限公司 连续物料检测系统及方法、物料缺陷检测系统
JP7587966B2 (ja) * 2020-11-19 2024-11-21 住友化学株式会社 積層光学フィルムの製造方法、印字装置及び積層光学フィルムの製造装置
CN115870233A (zh) * 2022-09-30 2023-03-31 杭州利珀科技有限公司 偏光膜rtp前制程与rtp制程的联动方法及系统
CN116215088A (zh) * 2023-02-24 2023-06-06 安徽利珀科技有限公司 一种智能打标控制系统

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001305070A (ja) * 2000-04-19 2001-10-31 Sumitomo Chem Co Ltd シート状製品の欠陥マーキング方法および装置
JP4343456B2 (ja) * 2001-04-03 2009-10-14 大日本印刷株式会社 シート状製品の欠陥マーキング方法および装置
JP3974400B2 (ja) * 2002-01-07 2007-09-12 日東電工株式会社 シート状成形体の検査結果記録方法及び検査結果記録システム及びロール状成形体
JP4233813B2 (ja) * 2002-06-17 2009-03-04 日東電工株式会社 シート状成形体の加工方法
JP2005062165A (ja) * 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置
JP2005114624A (ja) * 2003-10-09 2005-04-28 Nitto Denko Corp シート状製品の検査方法及びシート状製品の検査システム及びシート状製品及び枚葉物
TWI269116B (en) * 2004-09-24 2006-12-21 Optimax Tech Corp Improved method for printing patterns on optical film
JP2006194721A (ja) * 2005-01-13 2006-07-27 Nagase & Co Ltd 欠陥マーキング装置
JP2009069142A (ja) * 2007-08-23 2009-04-02 Nitto Denko Corp 積層フィルムの欠陥検査方法およびその装置

Also Published As

Publication number Publication date
WO2009123002A1 (ja) 2009-10-08
TW200946994A (en) 2009-11-16
KR20110000564A (ko) 2011-01-03
JP2009244064A (ja) 2009-10-22
CN101981438A (zh) 2011-02-23
CZ2010740A3 (cs) 2010-11-24
SK50392010A3 (sk) 2011-03-04

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