PH12020050163B1 - Electrical contactor and electrical connecting apparatus - Google Patents

Electrical contactor and electrical connecting apparatus

Info

Publication number
PH12020050163B1
PH12020050163B1 PH1/2020/050163A PH12020050163A PH12020050163B1 PH 12020050163 B1 PH12020050163 B1 PH 12020050163B1 PH 12020050163 A PH12020050163 A PH 12020050163A PH 12020050163 B1 PH12020050163 B1 PH 12020050163B1
Authority
PH
Philippines
Prior art keywords
body portion
extending
electrical
upward
supporting portion
Prior art date
Application number
PH1/2020/050163A
Other languages
English (en)
Other versions
PH12020050163A1 (en
Inventor
Eichi Osato
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of PH12020050163A1 publication Critical patent/PH12020050163A1/en
Publication of PH12020050163B1 publication Critical patent/PH12020050163B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0458—Details related to environmental aspects, e.g. temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
PH1/2020/050163A 2019-04-04 2020-05-25 Electrical contactor and electrical connecting apparatus PH12020050163B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019072224A JP7301582B2 (ja) 2019-04-04 2019-04-04 電気的接触子及び電気的接続装置

Publications (2)

Publication Number Publication Date
PH12020050163A1 PH12020050163A1 (en) 2021-06-14
PH12020050163B1 true PH12020050163B1 (en) 2024-01-12

Family

ID=72662250

Family Applications (1)

Application Number Title Priority Date Filing Date
PH1/2020/050163A PH12020050163B1 (en) 2019-04-04 2020-05-25 Electrical contactor and electrical connecting apparatus

Country Status (5)

Country Link
US (1) US11340289B2 (https=)
JP (1) JP7301582B2 (https=)
CN (1) CN111796124A (https=)
MY (1) MY200425A (https=)
PH (1) PH12020050163B1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7485945B2 (ja) * 2020-09-08 2024-05-17 山一電機株式会社 検査用ケルビンコンタクト及び検査用ケルビンソケット並びに検査用ケルビンコンタクトの製造方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3094007B2 (ja) * 1998-06-02 2000-10-03 日本電子材料株式会社 プローブ及びこのプローブを用いたプローブカード
JP3810977B2 (ja) * 2000-02-25 2006-08-16 株式会社エンプラス 電気部品用ソケット
JP2002365308A (ja) 2001-06-08 2002-12-18 Japan Electronic Materials Corp 垂直ブレード型プローブ、垂直ブレード型プローブユニット及びそれを用いた垂直ブレード型プローブカード
US7265565B2 (en) * 2003-02-04 2007-09-04 Microfabrica Inc. Cantilever microprobes for contacting electronic components and methods for making such probes
JP2004117081A (ja) * 2002-09-25 2004-04-15 Japan Electronic Materials Corp 垂直型プローブユニット及びこれを用いた垂直型プローブカード
SG118181A1 (en) * 2003-03-25 2006-01-27 Fci Asia Technology Pte Ltd High density electrical connector
JP2005141986A (ja) 2003-11-05 2005-06-02 Yamaichi Electronics Co Ltd 半導体装置用ソケット
US7192320B2 (en) * 2004-03-26 2007-03-20 Silicon Pipe, Inc. Electrical interconnection devices incorporating redundant contact points for reducing capacitive stubs and improved signal integrity
JP4571640B2 (ja) * 2004-07-05 2010-10-27 株式会社日本マイクロニクス 接触子ブロック及び電気的接続装置
JP2006162422A (ja) * 2004-12-07 2006-06-22 Japan Electronic Materials Corp プローブカード
JP2006337080A (ja) * 2005-05-31 2006-12-14 Micronics Japan Co Ltd 通電試験用プローブ
JP5123489B2 (ja) * 2006-04-07 2013-01-23 株式会社日本マイクロニクス 電気的接続装置
JP2010008388A (ja) 2008-06-30 2010-01-14 Rika Denshi Co Ltd Ｉｃソケット
US9329204B2 (en) * 2009-04-21 2016-05-03 Johnstech International Corporation Electrically conductive Kelvin contacts for microcircuit tester
JP2011153998A (ja) 2010-01-28 2011-08-11 Nhk Spring Co Ltd コンタクトプローブおよびプローブユニット
JP2014516158A (ja) 2011-05-27 2014-07-07 ジェイエフ マイクロテクノロジ・スンディリアン・ブルハド 電気相互接続アッセンブリー
JP5429308B2 (ja) * 2011-07-11 2014-02-26 株式会社デンソー 電子装置
JP2013171685A (ja) * 2012-02-20 2013-09-02 Molex Inc コネクタ
US9281577B2 (en) * 2013-12-30 2016-03-08 Lennox Industries Inc. Control signal routing apparatus
WO2018003507A1 (ja) * 2016-06-28 2018-01-04 株式会社日本マイクロニクス 電気的接続装置及び接触子
KR101683070B1 (ko) * 2016-09-27 2016-12-06 주식회사 제이앤에프이 카메라 모듈 검사용 Face-Front 소켓

Also Published As

Publication number Publication date
CN111796124A (zh) 2020-10-20
MY200425A (en) 2023-12-26
JP2020169928A (ja) 2020-10-15
PH12020050163A1 (en) 2021-06-14
US11340289B2 (en) 2022-05-24
JP7301582B2 (ja) 2023-07-03
US20200319245A1 (en) 2020-10-08

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