TW200624815A - Electrical contact testing probe - Google Patents

Electrical contact testing probe

Info

Publication number
TW200624815A
TW200624815A TW094133932A TW94133932A TW200624815A TW 200624815 A TW200624815 A TW 200624815A TW 094133932 A TW094133932 A TW 094133932A TW 94133932 A TW94133932 A TW 94133932A TW 200624815 A TW200624815 A TW 200624815A
Authority
TW
Taiwan
Prior art keywords
continuous
testing probe
area
pedestal
electrical contact
Prior art date
Application number
TW094133932A
Other languages
Chinese (zh)
Other versions
TWI277738B (en
Inventor
Hideki Hirakawa
Akira Souma
Yoshikazu Urushiyama
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200624815A publication Critical patent/TW200624815A/en
Application granted granted Critical
Publication of TWI277738B publication Critical patent/TWI277738B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

A continuity testing probe includes an arm area which extends in a first direction, and a needlepoint area continuous to one side in a second direction intersecting one direction of the arm area. The continuity testing probe has a board shape whose thickness direction is permitted to be a direction that intersects with the first and the second directions. The needlepoint area includes a pedestal part continuous to the arm area, and a contact part continuous to the pedestal part. The contact part includes a base part which forms a part of the pedestal part, and a protruding part which is continuous to the base part and protrudes in the second direction from the pedestal part. Thus, the contact part is prevented from being damaged.
TW094133932A 2005-01-14 2005-09-29 Continuity testing probe TWI277738B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2005/000715 WO2006075408A1 (en) 2005-01-14 2005-01-14 Continuity testing probe

Publications (2)

Publication Number Publication Date
TW200624815A true TW200624815A (en) 2006-07-16
TWI277738B TWI277738B (en) 2007-04-01

Family

ID=36677444

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094133932A TWI277738B (en) 2005-01-14 2005-09-29 Continuity testing probe

Country Status (3)

Country Link
JP (1) JP4932499B2 (en)
TW (1) TWI277738B (en)
WO (1) WO2006075408A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112345911A (en) * 2019-08-09 2021-02-09 日本麦可罗尼克斯股份有限公司 Electrical contact and electrical connection device
US11372022B2 (en) 2019-08-09 2022-06-28 Kabushiki Kaisha Nihon Micronics Electrical contactor and electrical connecting apparatus

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200815763A (en) 2006-09-26 2008-04-01 Nihon Micronics Kabushiki Kaisha Electrical test probe and electrical test probe assembly
JP5123514B2 (en) * 2006-10-02 2013-01-23 株式会社日本マイクロニクス Probe for current test and probe assembly for current test
JP5123508B2 (en) * 2006-09-26 2013-01-23 株式会社日本マイクロニクス Probe for current test and probe assembly for current test
JP5123533B2 (en) 2007-02-01 2013-01-23 株式会社日本マイクロニクス Probe for energization test and manufacturing method thereof
JP5087371B2 (en) * 2007-11-19 2012-12-05 株式会社日本マイクロニクス Manufacturing method of electrical test contact
JP5614917B2 (en) * 2008-03-07 2014-10-29 株式会社オプトニクス精密 Metal probe
JP5438908B2 (en) * 2008-03-11 2014-03-12 株式会社日本マイクロニクス Contact for electrical test, electrical connection device using the contact, and method for manufacturing contact
JP2009229410A (en) * 2008-03-25 2009-10-08 Micronics Japan Co Ltd Contactor for electric test and method of manufacturing the same
JP5631131B2 (en) 2010-09-17 2014-11-26 株式会社日本マイクロニクス Probe for probe test and probe assembly
JP2013217935A (en) * 2013-06-14 2013-10-24 Japan Electronic Materials Corp Contact probe

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4527267B2 (en) * 2000-11-13 2010-08-18 東京エレクトロン株式会社 Contactor manufacturing method
CN100343676C (en) * 2003-05-13 2007-10-17 日本麦可罗尼克斯股份有限公司 Probe for testing electric conduction

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112345911A (en) * 2019-08-09 2021-02-09 日本麦可罗尼克斯股份有限公司 Electrical contact and electrical connection device
US11372022B2 (en) 2019-08-09 2022-06-28 Kabushiki Kaisha Nihon Micronics Electrical contactor and electrical connecting apparatus
TWI787636B (en) * 2019-08-09 2022-12-21 日商日本麥克隆尼股份有限公司 Electrical contacts and electrical connection devices

Also Published As

Publication number Publication date
WO2006075408A1 (en) 2006-07-20
JP4932499B2 (en) 2012-05-16
TWI277738B (en) 2007-04-01
JPWO2006075408A1 (en) 2008-06-12

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