DE602008004998D1 - Einrichtung mit einem kontaktdetektor - Google Patents
Einrichtung mit einem kontaktdetektorInfo
- Publication number
- DE602008004998D1 DE602008004998D1 DE602008004998T DE602008004998T DE602008004998D1 DE 602008004998 D1 DE602008004998 D1 DE 602008004998D1 DE 602008004998 T DE602008004998 T DE 602008004998T DE 602008004998 T DE602008004998 T DE 602008004998T DE 602008004998 D1 DE602008004998 D1 DE 602008004998D1
- Authority
- DE
- Germany
- Prior art keywords
- test sample
- probe
- cantilever arms
- supporting body
- contact detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Measuring Leads Or Probes (AREA)
- Geophysics And Detection Of Objects (AREA)
- Push-Button Switches (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07388012A EP1970714A1 (de) | 2007-03-12 | 2007-03-12 | Vorrichtung mit Kontaktdetektor |
PCT/DK2008/000100 WO2008110174A1 (en) | 2007-03-12 | 2008-03-12 | Device including a contact detector |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602008004998D1 true DE602008004998D1 (de) | 2011-03-31 |
Family
ID=38222460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602008004998T Active DE602008004998D1 (de) | 2007-03-12 | 2008-03-12 | Einrichtung mit einem kontaktdetektor |
Country Status (8)
Country | Link |
---|---|
US (1) | US8058886B2 (de) |
EP (2) | EP1970714A1 (de) |
JP (1) | JP5665319B2 (de) |
KR (1) | KR101461694B1 (de) |
CN (1) | CN101657729B (de) |
AT (1) | ATE498843T1 (de) |
DE (1) | DE602008004998D1 (de) |
WO (1) | WO2008110174A1 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2237052A1 (de) | 2009-03-31 | 2010-10-06 | Capres A/S | Automatisierte Mehrpunktsondenmanipulation |
EP2498081A1 (de) | 2011-03-08 | 2012-09-12 | Capres A/S | Messung des Hall-Effekts in einer einzigen Position |
EP2469271A1 (de) | 2010-12-21 | 2012-06-27 | Capres A/S | Messung des Hall-Effekts in einer einzigen Position |
US9644939B2 (en) | 2010-12-21 | 2017-05-09 | Capres A/S | Single-position hall effect measurements |
CN102169159A (zh) * | 2011-01-04 | 2011-08-31 | 豪勉科技股份有限公司 | 具应变规的点测装置 |
ITUD20110166A1 (it) * | 2011-10-18 | 2013-04-19 | Applied Materials Italia Srl | Dispositivo di test per collaudare piastre per circuiti elettronici e relativo procedimento |
EP2677324A1 (de) | 2012-06-20 | 2013-12-25 | Capres A/S | Tiefgeätzte Mehrpunktsonde |
US9118331B2 (en) * | 2013-01-18 | 2015-08-25 | National University Corporation Shizuoka University | Contact state detection apparatus |
TWI526132B (zh) * | 2013-12-13 | 2016-03-11 | Mpi Corp | Correction film structure |
CN104931741B (zh) * | 2014-03-19 | 2018-05-29 | 中国科学院苏州纳米技术与纳米仿生研究所 | 微探针及其制备方法 |
KR102660769B1 (ko) * | 2017-11-15 | 2024-04-24 | 카프레스 에이/에스 | 테스트 샘플의 전기적 특성을 테스트하기 위한 프로브 및 연관된 근접성 검출기 |
CN108120858B (zh) * | 2017-12-20 | 2020-05-26 | 中国科学院半导体研究所 | 自激励自检测探针及其制作方法 |
KR102088205B1 (ko) * | 2019-08-30 | 2020-03-16 | 주식회사 프로이천 | 디스플레이 패널 검사용 프로브 핀 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5266801A (en) * | 1989-06-05 | 1993-11-30 | Digital Instruments, Inc. | Jumping probe microscope |
US5907095A (en) * | 1996-06-17 | 1999-05-25 | Industrial Technology Research Institute | High-sensitivity strain probe |
JPH10311843A (ja) * | 1997-03-10 | 1998-11-24 | Nikon Corp | カンチレバー及びその製造方法 |
US7063541B2 (en) * | 1997-03-17 | 2006-06-20 | Formfactor, Inc. | Composite microelectronic spring structure and method for making same |
JP3768639B2 (ja) * | 1997-03-18 | 2006-04-19 | キヤノン株式会社 | カンチレバー型プローブ及び該プローブを備えた走査型プローブ顕微鏡 |
JP3309816B2 (ja) * | 1998-01-22 | 2002-07-29 | 松下電器産業株式会社 | 微細表面形状測定装置及び触針製造方法 |
US6148622A (en) * | 1998-04-03 | 2000-11-21 | Alliedsignal Inc. | Environmental control system no condenser high pressure water separation system |
US7304486B2 (en) * | 1998-07-08 | 2007-12-04 | Capres A/S | Nano-drive for high resolution positioning and for positioning of a multi-point probe |
ATE373830T1 (de) * | 1998-07-08 | 2007-10-15 | Capres Aps | Mehrspitzenfühler |
AU2003206667A1 (en) * | 2002-01-07 | 2003-07-24 | Capres A/S | Electrical feedback detection system for multi-point probes |
JP2004093352A (ja) * | 2002-08-30 | 2004-03-25 | Seiko Instruments Inc | 極微小多探針プローブの製造方法及び表面特性解析装置 |
JP2005227139A (ja) * | 2004-02-13 | 2005-08-25 | Kyoto Univ | 原子間力顕微鏡用カンチレバー |
JP5192232B2 (ja) | 2004-06-21 | 2013-05-08 | カプレス・アクティーゼルスカブ | プローブの位置合せを行なう方法 |
JP2006284599A (ja) * | 2006-05-29 | 2006-10-19 | Sii Nanotechnology Inc | カンチレバーを用いて試料面の情報を取得する装置 |
-
2007
- 2007-03-12 EP EP07388012A patent/EP1970714A1/de not_active Ceased
-
2008
- 2008-03-12 US US12/531,024 patent/US8058886B2/en active Active
- 2008-03-12 DE DE602008004998T patent/DE602008004998D1/de active Active
- 2008-03-12 AT AT08715577T patent/ATE498843T1/de not_active IP Right Cessation
- 2008-03-12 JP JP2009553010A patent/JP5665319B2/ja active Active
- 2008-03-12 WO PCT/DK2008/000100 patent/WO2008110174A1/en active Application Filing
- 2008-03-12 CN CN2008800116937A patent/CN101657729B/zh active Active
- 2008-03-12 KR KR1020097021130A patent/KR101461694B1/ko active IP Right Grant
- 2008-03-12 EP EP08715577A patent/EP2132578B1/de active Active
Also Published As
Publication number | Publication date |
---|---|
CN101657729B (zh) | 2012-03-21 |
US20100141291A1 (en) | 2010-06-10 |
KR101461694B1 (ko) | 2014-11-20 |
EP2132578B1 (de) | 2011-02-16 |
US8058886B2 (en) | 2011-11-15 |
ATE498843T1 (de) | 2011-03-15 |
JP2010520998A (ja) | 2010-06-17 |
EP1970714A1 (de) | 2008-09-17 |
CN101657729A (zh) | 2010-02-24 |
EP2132578A1 (de) | 2009-12-16 |
KR20100015473A (ko) | 2010-02-12 |
JP5665319B2 (ja) | 2015-02-04 |
WO2008110174A1 (en) | 2008-09-18 |
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