PE20161181A1 - Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo - Google Patents
Aparato de visualizacion de ubicacion de muestreo y metodo de muestreoInfo
- Publication number
- PE20161181A1 PE20161181A1 PE2016001434A PE2016001434A PE20161181A1 PE 20161181 A1 PE20161181 A1 PE 20161181A1 PE 2016001434 A PE2016001434 A PE 2016001434A PE 2016001434 A PE2016001434 A PE 2016001434A PE 20161181 A1 PE20161181 A1 PE 20161181A1
- Authority
- PE
- Peru
- Prior art keywords
- sampling
- location
- sample
- specimen
- display apparatus
- Prior art date
Links
- 238000005070 sampling Methods 0.000 title abstract 6
- 238000000034 method Methods 0.000 title abstract 2
- 239000002184 metal Substances 0.000 abstract 1
- 239000002994 raw material Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B09—DISPOSAL OF SOLID WASTE; RECLAMATION OF CONTAMINATED SOIL
- B09B—DISPOSAL OF SOLID WASTE NOT OTHERWISE PROVIDED FOR
- B09B3/00—Destroying solid waste or transforming solid waste into something useful or harmless
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B09—DISPOSAL OF SOLID WASTE; RECLAMATION OF CONTAMINATED SOIL
- B09B—DISPOSAL OF SOLID WASTE NOT OTHERWISE PROVIDED FOR
- B09B5/00—Operations not covered by a single other subclass or by a single other group in this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
- G06T1/0007—Image acquisition
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
- H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3141—Constructional details thereof
- H04N9/315—Modulator illumination systems
- H04N9/3161—Modulator illumination systems using laser light sources
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
- G01N2001/282—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on with mapping; Identification of areas; Spatial correlated pattern
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Theoretical Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Optics & Photonics (AREA)
- Sampling And Sample Adjustment (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
Abstract
DE ACUERDO CON EL METODO DE MUESTREO DEL ASPECTO DE LA PRESENTE INVENCION, LA COORDENADA DE LA UBICACION DEL MUESTREO EN EL ESPECIMEN DEL MUESTREO SE GENERA ALEATORIAMENTE MEDIANTE EL CONTROLADOR, TAL COMO UNA COMPUTADORA PERSONAL, DE LA VISUALIZACION DE UBICACION DE MUESTREO. EN BASE A LA INFORMACION DE UBICACION, LA UBICACION DE MUESTREO SE MUESTRA EN EL ESPECIMEN DEL MUESTREO, QUE ES UNA PARTE DE LA MATERIA PRIMA RECICLADA, MEDIANTE LUZ LASER. DEBIDO A ESTO SE PUEDE EXCLUIR DE FORMA CONFIABLE LA ARBITRARIEDAD, EN LA QUE EL OPERADO SELECCIONADA ARTIFICIALMENTE LA UBICACION DE MUESTREO, DURANTE EL MUESTREO INCREMENTAL PARA ESTABLECER LA CALIDAD PROMEDIO DEL ESPECIMEN, TAL COMO EL CONTENIDO PROMEDIO DEL METAL VALIOSO
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014071988A JP6291972B2 (ja) | 2014-03-31 | 2014-03-31 | サンプリング位置表示装置、サンプリング方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
PE20161181A1 true PE20161181A1 (es) | 2016-10-22 |
Family
ID=54239659
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PE2016001434A PE20161181A1 (es) | 2014-03-31 | 2014-06-16 | Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo |
Country Status (9)
Country | Link |
---|---|
US (1) | US10330572B2 (es) |
EP (1) | EP3128308B1 (es) |
JP (1) | JP6291972B2 (es) |
KR (1) | KR102222783B1 (es) |
CN (1) | CN105814428B (es) |
CA (1) | CA2938816C (es) |
MX (1) | MX358956B (es) |
PE (1) | PE20161181A1 (es) |
WO (1) | WO2015151301A1 (es) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6709644B2 (ja) * | 2016-03-14 | 2020-06-17 | パンパシフィック・カッパー株式会社 | 分析用試料の調整方法 |
CN114134024B (zh) * | 2021-11-10 | 2023-09-29 | 天津津科生物科技有限责任公司 | 一种微生物检测取样装置及操作方法 |
CN114950587A (zh) * | 2022-05-16 | 2022-08-30 | 中国科学院上海微系统与信息技术研究所 | 一种基于机器视觉的微流控芯片自动加样采样系统 |
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-
2014
- 2014-03-31 JP JP2014071988A patent/JP6291972B2/ja active Active
- 2014-06-16 PE PE2016001434A patent/PE20161181A1/es unknown
- 2014-06-16 MX MX2016011778A patent/MX358956B/es active IP Right Grant
- 2014-06-16 KR KR1020167026536A patent/KR102222783B1/ko active IP Right Grant
- 2014-06-16 CA CA2938816A patent/CA2938816C/en active Active
- 2014-06-16 CN CN201480066552.0A patent/CN105814428B/zh active Active
- 2014-06-16 US US15/119,243 patent/US10330572B2/en active Active
- 2014-06-16 EP EP14887947.1A patent/EP3128308B1/en active Active
- 2014-06-16 WO PCT/JP2014/065867 patent/WO2015151301A1/ja active Application Filing
Also Published As
Publication number | Publication date |
---|---|
CN105814428A (zh) | 2016-07-27 |
CN105814428B (zh) | 2019-04-02 |
EP3128308A4 (en) | 2017-12-27 |
EP3128308A1 (en) | 2017-02-08 |
WO2015151301A1 (ja) | 2015-10-08 |
KR20160138969A (ko) | 2016-12-06 |
US20170010190A1 (en) | 2017-01-12 |
EP3128308B1 (en) | 2021-10-20 |
KR102222783B1 (ko) | 2021-03-03 |
CA2938816C (en) | 2021-07-13 |
MX2016011778A (es) | 2016-10-28 |
CA2938816A1 (en) | 2015-10-08 |
US10330572B2 (en) | 2019-06-25 |
JP2015194381A (ja) | 2015-11-05 |
MX358956B (es) | 2018-09-10 |
JP6291972B2 (ja) | 2018-03-14 |
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