MX358956B - Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo. - Google Patents

Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo.

Info

Publication number
MX358956B
MX358956B MX2016011778A MX2016011778A MX358956B MX 358956 B MX358956 B MX 358956B MX 2016011778 A MX2016011778 A MX 2016011778A MX 2016011778 A MX2016011778 A MX 2016011778A MX 358956 B MX358956 B MX 358956B
Authority
MX
Mexico
Prior art keywords
sampling
display device
specimen
position display
sampling position
Prior art date
Application number
MX2016011778A
Other languages
English (en)
Other versions
MX2016011778A (es
Inventor
Nitta Akira
Onishi Michiaki
Tomioka Kenichi
tsutsui Tomohiro
Takagi Makoto
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Publication of MX2016011778A publication Critical patent/MX2016011778A/es
Publication of MX358956B publication Critical patent/MX358956B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B09—DISPOSAL OF SOLID WASTE; RECLAMATION OF CONTAMINATED SOIL
    • B09B—DISPOSAL OF SOLID WASTE NOT OTHERWISE PROVIDED FOR
    • B09B3/00—Destroying solid waste or transforming solid waste into something useful or harmless
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B09—DISPOSAL OF SOLID WASTE; RECLAMATION OF CONTAMINATED SOIL
    • B09B—DISPOSAL OF SOLID WASTE NOT OTHERWISE PROVIDED FOR
    • B09B5/00—Operations not covered by a single other subclass or by a single other group in this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N9/00—Details of colour television systems
    • H04N9/12—Picture reproducers
    • H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
    • H04N9/3141—Constructional details thereof
    • H04N9/315—Modulator illumination systems
    • H04N9/3161—Modulator illumination systems using laser light sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
    • G01N2001/282—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on with mapping; Identification of areas; Spatial correlated pattern

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)

Abstract

De acuerdo con el método de muestreo del aspecto de la presente invención, la coordenada (información de ubicación) de la ubicación de muestreo en el espécimen de muestreo (G) se genera aleatoriamente por el controlador (12), tal como una computadora personal, de la visualización de ubicación de muestreo (10). Basado en la información de ubicación, la ubicación de muestreo se visualiza en el espécimen de muestreo (G), el cual es parte de la materia prima reciclada, por luz láser. Debido a esto, se puede excluir de manera confiable la arbitrariedad, en la cual el operador selecciona artificialmente la ubicación de muestreo, durante muestreo incremental para establecer la calidad promedio del espécimen de muestreo (G), tal como el contenido promedio de metal valioso.
MX2016011778A 2014-03-31 2014-06-16 Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo. MX358956B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014071988A JP6291972B2 (ja) 2014-03-31 2014-03-31 サンプリング位置表示装置、サンプリング方法
PCT/JP2014/065867 WO2015151301A1 (ja) 2014-03-31 2014-06-16 サンプリング位置表示装置、サンプリング方法

Publications (2)

Publication Number Publication Date
MX2016011778A MX2016011778A (es) 2016-10-28
MX358956B true MX358956B (es) 2018-09-10

Family

ID=54239659

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016011778A MX358956B (es) 2014-03-31 2014-06-16 Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo.

Country Status (9)

Country Link
US (1) US10330572B2 (es)
EP (1) EP3128308B1 (es)
JP (1) JP6291972B2 (es)
KR (1) KR102222783B1 (es)
CN (1) CN105814428B (es)
CA (1) CA2938816C (es)
MX (1) MX358956B (es)
PE (1) PE20161181A1 (es)
WO (1) WO2015151301A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6709644B2 (ja) * 2016-03-14 2020-06-17 パンパシフィック・カッパー株式会社 分析用試料の調整方法
CN114134024B (zh) * 2021-11-10 2023-09-29 天津津科生物科技有限责任公司 一种微生物检测取样装置及操作方法
CN114950587A (zh) * 2022-05-16 2022-08-30 中国科学院上海微系统与信息技术研究所 一种基于机器视觉的微流控芯片自动加样采样系统

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH087115B2 (ja) * 1989-02-03 1996-01-29 株式会社栗本鐵工所 試料採取方法
JPH05265637A (ja) * 1992-03-16 1993-10-15 Toshiba Corp ３次元ポインティング装置
JP3000327B2 (ja) * 1993-10-20 2000-01-17 株式会社エーゼット 天井取付け器具の取付け位置を床面から表示する装置
JP2939179B2 (ja) * 1995-06-08 1999-08-25 株式会社ジャパンエナジー 粒子充填監視方法
JPH10332588A (ja) * 1997-05-27 1998-12-18 Nkk Corp 固体試料のレーザ気化分析方法
US6800744B1 (en) * 1997-07-02 2004-10-05 Genome Therapeutics Corporation Nucleic acid and amino acid sequences relating to Streptococcus pneumoniae for diagnostics and therapeutics
JP3377431B2 (ja) * 1998-03-03 2003-02-17 シャープ株式会社 ３次元位置方向指示装置
JP2002518188A (ja) * 1998-06-16 2002-06-25 ビズパック・（オーストラリア）・プロプライエタリー・リミテッド パンチング装置
JP4126786B2 (ja) * 1998-11-24 2008-07-30 株式会社日立製作所 試料作成装置および方法
JP2000180330A (ja) * 1998-12-14 2000-06-30 Edison Haado Kk 硬度計
JP2001218546A (ja) * 2000-02-08 2001-08-14 Uehiko Kondo レーザー光による鳥類撃退装置
JP2003106962A (ja) * 2001-09-28 2003-04-09 Dowa Mining Co Ltd リサイクル原料の分析用サンプルおよびその調製法
US7264966B2 (en) 2002-01-23 2007-09-04 Olympus Optical Co., Ltd. Method of isolating cell or sample to be analyzed in cell
JP3820227B2 (ja) * 2002-01-23 2006-09-13 オリンパス株式会社 細胞単離方法
EP1535056A1 (de) * 2002-07-31 2005-06-01 Solvias AG Vorrichtung und messverfahren
US6956208B2 (en) * 2003-03-17 2005-10-18 Indiana University Research And Technology Corporation Method and apparatus for controlling position of a laser of a MALDI mass spectrometer
WO2005026238A1 (ja) * 2003-09-11 2005-03-24 Nikon Corporation 高分子結晶の加工方法、高分子結晶の加工装置、及び高分子結晶の観察装置
US7167774B2 (en) * 2003-11-07 2007-01-23 Ping Du Computer-guided sample handling
ATE457232T1 (de) * 2003-12-26 2010-02-15 Toyo Boseki Wärmeschrumpfbare polyesterfolie und wärmeschrumpfbares etikett
CN1307413C (zh) * 2005-01-25 2007-03-28 中国科学院武汉岩土力学研究所 岩土孔隙介质飞秒激光冷切割的方法
NZ562745A (en) * 2005-04-26 2010-07-30 Univ Massey Oxidisable lipid encapsulated in a complex of casein and whey protein
JP4866098B2 (ja) * 2006-02-21 2012-02-01 大学共同利用機関法人自然科学研究機構 質量分析装置
JP5177961B2 (ja) * 2006-05-16 2013-04-10 出光興産株式会社 難燃性樹脂組成物用再生ポリカーボネート原料の製造方法およびポリカーボネート系難燃性樹脂組成物
US7545498B2 (en) * 2006-12-18 2009-06-09 Palo Alto Research Center Incorporated System and method for removing auto-fluorescence through the use of multiple detection channels
JP5020742B2 (ja) * 2007-08-27 2012-09-05 日本電子株式会社 Ｍａｌｄｉイオン源を備えた質量分析装置およびｍａｌｄｉイオン源用サンプルプレート
US8363259B2 (en) * 2008-05-24 2013-01-29 Activiews Ltd. Method for producing printed patches for optical and high-contrast guidance
US20110174191A1 (en) * 2008-07-03 2011-07-21 Kenji Umemura Composition cured by applying heat/pressure thereto
US20100157086A1 (en) * 2008-12-15 2010-06-24 Illumina, Inc Dynamic autofocus method and system for assay imager
CN102256696B (zh) * 2008-12-16 2016-06-08 Hrd有限公司 蜡的高剪切氧化
SG196813A1 (en) * 2009-01-13 2014-02-13 Ams Technologies Int 2012 Ltd Solvent and acid stable membranes, methods of manufacture thereof and methods of use thereof inter alia for separating metal ions from liquid process streams
JP5201047B2 (ja) 2009-03-25 2013-06-05 三菱マテリアル株式会社 リサイクル原料のサンプリング装置、リサイクル原料のサンプリング方法及びリサイクル原料の評価用サンプル
TW201100622A (en) * 2009-06-16 2011-01-01 Nien Made Entpr Co Ltd Curtain manufacture and its manufacturing method
JP2011126677A (ja) 2009-12-18 2011-06-30 Mitsubishi Materials Corp 飛散防止装置、および破砕サンプリング設備
JP5542530B2 (ja) * 2010-06-04 2014-07-09 株式会社日立ソリューションズ サンプリング位置決定装置
DE102010052976A1 (de) * 2010-11-30 2012-05-31 Bruker Daltonik Gmbh Unterstützung der händischen Präparation von Proben auf einem Probenträger für eine Ionisierung mit matrix-unterstützter Laserdesorption
US8319181B2 (en) * 2011-01-30 2012-11-27 Fei Company System and method for localization of large numbers of fluorescent markers in biological samples
CN103245286B (zh) * 2012-02-09 2015-09-02 中国科学院西安光学精密机械研究所 光学元件表面灰尘位置测试方法及装置
US8687180B2 (en) * 2012-06-07 2014-04-01 Molecular Devices, Llc System, method, and device for determining a focal position of an objective in a microscopy imaging system
CN103234798B (zh) * 2013-05-06 2015-06-03 秦皇岛出入境检验检疫局煤炭检测技术中心 一种煤炭标准样品高均匀性定量缩分分装工艺

Also Published As

Publication number Publication date
US20170010190A1 (en) 2017-01-12
KR20160138969A (ko) 2016-12-06
CA2938816A1 (en) 2015-10-08
CA2938816C (en) 2021-07-13
EP3128308B1 (en) 2021-10-20
KR102222783B1 (ko) 2021-03-03
MX2016011778A (es) 2016-10-28
PE20161181A1 (es) 2016-10-22
CN105814428A (zh) 2016-07-27
JP2015194381A (ja) 2015-11-05
EP3128308A1 (en) 2017-02-08
CN105814428B (zh) 2019-04-02
US10330572B2 (en) 2019-06-25
WO2015151301A1 (ja) 2015-10-08
EP3128308A4 (en) 2017-12-27
JP6291972B2 (ja) 2018-03-14

Similar Documents

Publication Publication Date Title
CL2017001891A1 (es) Métodos para identificación de segmentos de video y opción de visualizacion para ver desde una fuente alternativa y/o en un dispositivo alternativo
MX2016006160A (es) Retroalimentacion desde un soplete de soldadura de un sistema de soldadura.
MX2017003204A (es) Medoto, aparato y programa informatico para visualizar una imagen.
BR112017008180A2 (pt) sistema e método para revisar dados de soldagem
EP2930578A3 (en) Failure cause classification apparatus
CA2961701C (en) Method and system for determining the local quality of surface data extracted from volume data
MX361954B (es) Sistema y método para presentador visual de soplete de soldadura.
WO2016074795A3 (de) Anzeigevorrichtung und verfahren zum betreiben einer solchen anzeigevorrichtung
IN2014MN01752A (es)
MX355082B (es) Metodo y aparato de control de visualizacion, dispositivo electronico.
FR3022340B1 (fr) Procede et dispositif de determination d'une consigne de controle d'un aeronef, produit programme d'ordinateur et aeronef associes
MX364891B (es) Método y dispositivo para procesar una parte de un contenido de video inmersivo de acuerdo con la posición de partes de referencia.
EP2752741A3 (en) Electronic apparatus and method for determining validity of touch key input used for the electronic apparatus
MX2022000529A (es) Aparato y metodo de analisis de ruptura.
MX2016011778A (es) Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo.
WO2018088905A8 (en) METHOD AND APPARATUS FOR SCANNING METAL WASTE
EP2919451A3 (en) Image processing apparatus, image processing method, and program
WO2018080225A3 (ko) 시식성 파리의 종 구별용 snp 마커 및 이의 용도
TR201908074T4 (tr) Bir şebekede verinin işlenmesine yönelik yöntem ve ilişkili mobil cihaz.
EP2993645A3 (en) Image processing program, information processing system, information processing apparatus, and image processing method
PL3575407T3 (pl) Sposób oznaczania udziału frakcji bezkomórkowych kwasów nukleinowych z wcześniej określonego źródła w próbce biologicznej
MX2016013877A (es) Composiciones y metodos para mejorar y/o predecir la amplificacion de adn.
MX2015003760A (es) Metodo y dispositivo para visualizar una imagen.
CA2863566C (en) Augmented reality method and apparatus for assisting an operator to perform a task on a moving object
EP2930542A3 (en) Method for controlling quality of operation of a PAM system, corresponding computer program product, non-transitory computer-readable carrier medium and quality control device

Legal Events

Date Code Title Description
FG Grant or registration