MX358956B - Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo. - Google Patents

Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo.

Info

Publication number
MX358956B
MX358956B MX2016011778A MX2016011778A MX358956B MX 358956 B MX358956 B MX 358956B MX 2016011778 A MX2016011778 A MX 2016011778A MX 2016011778 A MX2016011778 A MX 2016011778A MX 358956 B MX358956 B MX 358956B
Authority
MX
Mexico
Prior art keywords
sampling
display device
specimen
position display
sampling position
Prior art date
Application number
MX2016011778A
Other languages
English (en)
Other versions
MX2016011778A (es
Inventor
Nitta Akira
Onishi Michiaki
Tomioka Kenichi
tsutsui Tomohiro
Takagi Makoto
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Publication of MX2016011778A publication Critical patent/MX2016011778A/es
Publication of MX358956B publication Critical patent/MX358956B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B09—DISPOSAL OF SOLID WASTE; RECLAMATION OF CONTAMINATED SOIL
    • B09B—DISPOSAL OF SOLID WASTE
    • B09B3/00—Destroying solid waste or transforming solid waste into something useful or harmless
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B09—DISPOSAL OF SOLID WASTE; RECLAMATION OF CONTAMINATED SOIL
    • B09B—DISPOSAL OF SOLID WASTE
    • B09B5/00—Operations not covered by a single other subclass or by a single other group in this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N9/00—Details of colour television systems
    • H04N9/12—Picture reproducers
    • H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
    • H04N9/3141—Constructional details thereof
    • H04N9/315—Modulator illumination systems
    • H04N9/3161—Modulator illumination systems using laser light sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
    • G01N2001/282—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on with mapping; Identification of areas; Spatial correlated pattern

Abstract

De acuerdo con el método de muestreo del aspecto de la presente invención, la coordenada (información de ubicación) de la ubicación de muestreo en el espécimen de muestreo (G) se genera aleatoriamente por el controlador (12), tal como una computadora personal, de la visualización de ubicación de muestreo (10). Basado en la información de ubicación, la ubicación de muestreo se visualiza en el espécimen de muestreo (G), el cual es parte de la materia prima reciclada, por luz láser. Debido a esto, se puede excluir de manera confiable la arbitrariedad, en la cual el operador selecciona artificialmente la ubicación de muestreo, durante muestreo incremental para establecer la calidad promedio del espécimen de muestreo (G), tal como el contenido promedio de metal valioso.
MX2016011778A 2014-03-31 2014-06-16 Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo. MX358956B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014071988A JP6291972B2 (ja) 2014-03-31 2014-03-31 サンプリング位置表示装置、サンプリング方法
PCT/JP2014/065867 WO2015151301A1 (ja) 2014-03-31 2014-06-16 サンプリング位置表示装置、サンプリング方法

Publications (2)

Publication Number Publication Date
MX2016011778A MX2016011778A (es) 2016-10-28
MX358956B true MX358956B (es) 2018-09-10

Family

ID=54239659

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2016011778A MX358956B (es) 2014-03-31 2014-06-16 Aparato de visualizacion de ubicacion de muestreo y metodo de muestreo.

Country Status (9)

Country Link
US (1) US10330572B2 (es)
EP (1) EP3128308B1 (es)
JP (1) JP6291972B2 (es)
KR (1) KR102222783B1 (es)
CN (1) CN105814428B (es)
CA (1) CA2938816C (es)
MX (1) MX358956B (es)
PE (1) PE20161181A1 (es)
WO (1) WO2015151301A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
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JP6709644B2 (ja) * 2016-03-14 2020-06-17 パンパシフィック・カッパー株式会社 分析用試料の調整方法
CN114134024B (zh) * 2021-11-10 2023-09-29 天津津科生物科技有限责任公司 一种微生物检测取样装置及操作方法
CN114950587A (zh) * 2022-05-16 2022-08-30 中国科学院上海微系统与信息技术研究所 一种基于机器视觉的微流控芯片自动加样采样系统

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Also Published As

Publication number Publication date
CA2938816C (en) 2021-07-13
CN105814428A (zh) 2016-07-27
PE20161181A1 (es) 2016-10-22
KR20160138969A (ko) 2016-12-06
MX2016011778A (es) 2016-10-28
JP2015194381A (ja) 2015-11-05
JP6291972B2 (ja) 2018-03-14
EP3128308B1 (en) 2021-10-20
WO2015151301A1 (ja) 2015-10-08
EP3128308A1 (en) 2017-02-08
KR102222783B1 (ko) 2021-03-03
US10330572B2 (en) 2019-06-25
US20170010190A1 (en) 2017-01-12
EP3128308A4 (en) 2017-12-27
CA2938816A1 (en) 2015-10-08
CN105814428B (zh) 2019-04-02

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