NO20020323D0 - Inspeksjonsanordning for komponenter - Google Patents

Inspeksjonsanordning for komponenter

Info

Publication number
NO20020323D0
NO20020323D0 NO20020323A NO20020323A NO20020323D0 NO 20020323 D0 NO20020323 D0 NO 20020323D0 NO 20020323 A NO20020323 A NO 20020323A NO 20020323 A NO20020323 A NO 20020323A NO 20020323 D0 NO20020323 D0 NO 20020323D0
Authority
NO
Norway
Prior art keywords
inspection device
video camera
component inspection
component
different
Prior art date
Application number
NO20020323A
Other languages
English (en)
Other versions
NO20020323L (no
Inventor
Peter Bollinger
Original Assignee
Merten Kg Pulsotronic
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Merten Kg Pulsotronic filed Critical Merten Kg Pulsotronic
Publication of NO20020323D0 publication Critical patent/NO20020323D0/no
Publication of NO20020323L publication Critical patent/NO20020323L/no

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0812—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement

Landscapes

  • Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Adjustment And Processing Of Grains (AREA)
  • Beans For Foods Or Fodder (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
  • Ceramic Capacitors (AREA)
  • Studio Devices (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Sorting Of Articles (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Transplanting Machines (AREA)
  • Supply And Installment Of Electrical Components (AREA)
NO20020323A 1999-07-23 2002-01-21 Inspeksjonsanordning for komponenter NO20020323L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19934619A DE19934619A1 (de) 1999-07-23 1999-07-23 Inspektionsvorrichtung für Bauteile
PCT/EP2000/006117 WO2001008461A1 (de) 1999-07-23 2000-06-30 Inspektionsvorrichtung für bauteile

Publications (2)

Publication Number Publication Date
NO20020323D0 true NO20020323D0 (no) 2002-01-21
NO20020323L NO20020323L (no) 2002-03-19

Family

ID=7915831

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20020323A NO20020323L (no) 1999-07-23 2002-01-21 Inspeksjonsanordning for komponenter

Country Status (17)

Country Link
US (1) US7019771B1 (no)
EP (1) EP1198979B1 (no)
JP (1) JP4415155B2 (no)
KR (1) KR20020024308A (no)
CN (1) CN1364403A (no)
AT (1) ATE233988T1 (no)
AU (1) AU5535800A (no)
CA (1) CA2380276A1 (no)
CZ (1) CZ2002256A3 (no)
DE (2) DE19934619A1 (no)
HK (1) HK1048044B (no)
IL (2) IL147678A0 (no)
MY (1) MY122774A (no)
NO (1) NO20020323L (no)
SK (1) SK842002A3 (no)
TW (1) TW508984B (no)
WO (1) WO2001008461A1 (no)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004008082A1 (de) * 2004-02-19 2005-09-08 Marconi Communications Gmbh Verfahren zum Bestücken eines Schaltungsträgers
JP4652883B2 (ja) * 2005-04-28 2011-03-16 日本発條株式会社 測定装置及び測定方法
US20080141795A1 (en) * 2006-12-13 2008-06-19 Gagnon Daniel F Micro-surface inspection tool
JP5094428B2 (ja) * 2008-01-09 2012-12-12 ヤマハ発動機株式会社 部品認識装置および実装機
JP5094534B2 (ja) * 2008-04-30 2012-12-12 富士機械製造株式会社 電子部品の実装装置
JP4897076B2 (ja) * 2010-08-19 2012-03-14 日本発條株式会社 測定装置及び測定方法
JP2012042436A (ja) * 2010-08-23 2012-03-01 Hitachi High-Technologies Corp Ｆｐｄモジュールの位置決めマーク認識装置及びｆｐｄモジュールの組立装置
DE102010053912B4 (de) * 2010-12-09 2013-01-31 Mühlbauer Ag Optische Untersuchungseinrichtung und optisches Untersuchungsverfahren
JP5963500B2 (ja) * 2012-03-29 2016-08-03 ヤマハ発動機株式会社 電子部品装着装置
JP5954757B2 (ja) * 2015-01-09 2016-07-20 上野精機株式会社 外観検査装置
JP6786593B2 (ja) * 2015-08-26 2020-11-18 アーベーベー・シュバイツ・アーゲーＡＢＢ Ｓｃｈｗｅｉｚ ＡＧ 多視点による対象検査装置及び方法
CH711570B1 (de) 2015-09-28 2019-02-15 Besi Switzerland Ag Vorrichtung für die Montage von Bauelementen auf einem Substrat.

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4914513A (en) * 1988-08-02 1990-04-03 Srtechnologies, Inc. Multi-vision component alignment system
JPH03203399A (ja) * 1989-12-29 1991-09-05 Matsushita Electric Ind Co Ltd 部品装着装置
US4959898A (en) * 1990-05-22 1990-10-02 Emhart Industries, Inc. Surface mount machine with lead coplanarity verifier
NL9100215A (nl) * 1991-02-07 1992-09-01 Asm Lithography Bv Inrichting voor het repeterend afbeelden van een maskerpatroon op een substraat.
SE515418C2 (sv) * 1994-10-12 2001-07-30 Mydata Automation Ab Metod och anordning att avbilda i en rad fasthållna komponenter för automatisk utvärdering av komponenternas lägen samt användning av en sådan anordning
JP3647146B2 (ja) * 1996-06-20 2005-05-11 松下電器産業株式会社 電子部品実装装置および電子部品実装方法
JPH10313197A (ja) * 1997-05-13 1998-11-24 Kiyoshi Matsumoto 表面実装用電子部品位置決め装置
AU8472898A (en) * 1997-06-30 1999-01-19 Semiconductor Technologies & Instruments, Inc. Method and apparatus for inspecting a workpiece
US6072898A (en) * 1998-01-16 2000-06-06 Beaty; Elwin M. Method and apparatus for three dimensional inspection of electronic components
DE19821800A1 (de) * 1998-05-15 1999-12-02 Foerderung Angewandter Informa Verfahren und Vorrichtung zum Prüfen von Seitensichten und Draufsicht von Objekten aus einer Sichtposition
US6410872B2 (en) * 1999-03-26 2002-06-25 Key Technology, Inc. Agricultural article inspection apparatus and method employing spectral manipulation to enhance detection contrast ratio
US6879390B1 (en) * 2000-08-10 2005-04-12 Kla-Tencor Technologies Corporation Multiple beam inspection apparatus and method
JP2003130808A (ja) * 2001-10-29 2003-05-08 Hitachi Ltd 欠陥検査方法及びその装置
US6813016B2 (en) * 2002-03-15 2004-11-02 Ppt Vision, Inc. Co-planarity and top-down examination method and optical module for electronic leaded components

Also Published As

Publication number Publication date
DE19934619A1 (de) 2001-01-25
CN1364403A (zh) 2002-08-14
JP4415155B2 (ja) 2010-02-17
ATE233988T1 (de) 2003-03-15
IL147678A (en) 2006-07-05
NO20020323L (no) 2002-03-19
JP2003517723A (ja) 2003-05-27
HK1048044B (zh) 2003-07-18
CA2380276A1 (en) 2001-02-01
AU5535800A (en) 2001-02-13
HK1048044A1 (en) 2003-03-14
DE50001407D1 (de) 2003-04-10
EP1198979A1 (de) 2002-04-24
KR20020024308A (ko) 2002-03-29
EP1198979B1 (de) 2003-03-05
SK842002A3 (en) 2002-10-08
MY122774A (en) 2006-05-31
WO2001008461A1 (de) 2001-02-01
CZ2002256A3 (cs) 2002-06-12
US7019771B1 (en) 2006-03-28
IL147678A0 (en) 2002-08-14
TW508984B (en) 2002-11-01

Similar Documents

Publication Publication Date Title
NO20020323D0 (no) Inspeksjonsanordning for komponenter
CA2554639A1 (en) Method and system for inspecting surfaces
EP1151283A4 (en) INSPECTION SYSTEM FOR THE SURFACE OF CYLINDRICAL OBJECTS
ATE557271T1 (de) Mehransichtsgerät
PT704172E (pt) Metodos e aparelho para inspeccionar a aparencia de objectos substancialmente circulares
TW200639492A (en) Visual inspection apparatus and method of inspecting display panel using the visual inspection apparatus
DE60144371D1 (de) Gerichtete beleuchtung und verfahren zur erkennung dreidimensionaler information
MY134609A (en) Dynamic three dimensional vision inspection system
NO20004759L (no) Fremgangsmate og anordning for a analysere den tredimensjonale fordeling av en komponent i en prove
JP2007524943A (ja) 照明アーチファクトの画像減算
SE8901948D0 (sv) Bordformad jigg foer positionering av element paa en haallare
EP0871027A3 (en) Inspection of print circuit board assembly
ATE325394T1 (de) Erfassen und greifen von gegenst nden
JPH08137091A (ja) マスク外観検査装置
DE60039534D1 (de) Verfahren und vorrichtung zur echtzeitbildeinfügung in video
DE602004023532D1 (de) Verfahren und einrichtung zur erfassung eines weitwinkelbildes und einer interessierenden region davon
AU2003254551A1 (en) Method and device for detecting surface defects on workpieces or components having a shiny surface
KR960019631A (ko) 테이프캐리어패키지의 외관검사장치 및 검사방법
DE50109820D1 (de) Vorrichtung und Verfahren zur Erfassung der Geometrie von Werkstücken
TW200608034A (en) Circuit board inspecting apparatus and circuit board inspecting method
SE9403478D0 (sv) Avbildning av komponenter
ES2108617B1 (es) Procedimiento y maquina para deteccion automatica de grietas en piezas ferricas.
JP2000310698A (ja) ディジタルラインカメラによる放射性廃棄物を保管するドラム缶の外観検査方法及び装置
NL1025018A1 (nl) Werkwijze en masker voor het karakteriseren van een lenssysteem.
JP2004226129A (ja) 外観検査装置

Legal Events

Date Code Title Description
FC2A Withdrawal, rejection or dismissal of laid open patent application